Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Partial-compensation aspherical reflector surface shape detection method

A technology of reflecting mirror surface and detection method, which is applied to measurement devices, instruments, optical devices, etc., can solve the problems of inability to measure the compensation effect of the compensator alone, complicated processing and adjustment, difficult processing and adjustment, etc., and achieves simple experimental operation. Ease of operation, short test time, simple data processing and mathematical operations

Inactive Publication Date: 2012-06-20
CHANGCHUN INST OF OPTICS FINE MECHANICS & PHYSICS CHINESE ACAD OF SCI
View PDF4 Cites 39 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, for the design of a large deviation and high steepness concave aspheric compensator, generally several lenses are needed to completely correct the spherical aberration; the design of a convex aspheric compensator is much more complicated than that of a concave aspheric compensator. The aspheric compensator must be composed of at least two lenses, and sometimes the compensator itself may contain aspheric elements, and to achieve high-precision detection of the aspheric surface, another set of compensators must be designed for it, so processing and assembly posed a lot of difficulties
The design, processing and assembly of optical compensators are complex and difficult, and the compensation effect of the compensator cannot be measured separately

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Partial-compensation aspherical reflector surface shape detection method
  • Partial-compensation aspherical reflector surface shape detection method
  • Partial-compensation aspherical reflector surface shape detection method

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0027] Such as Figure 2-Figure 4 As shown, the device for realizing the method for detecting the surface shape of partially compensated aspheric mirrors of the present invention includes a laser interferometer 1 , a partially compensated element 2 , a standard spherical mirror 3 , an adjustment mechanism 4 , an adjustment structure 5 , and an adjustment structure 6 .

[0028] Such as figure 1 As shown, the partial compensation aspheric surface shape detection method of the present invention is as follows:

[0029] 1) First, design a monolithic lens as part of the compensation element 2 according to the mathematical equation of the aspheric mirror to be tested.

[0030] The design principle of the partial compensation element 2 is that the standard plane or standard spherical wave emitted by the interferometer 1 passes through the partial compensation element 2, and the outgoing wave surface is incident on the aspheric mirror to be tested and then reflected with the reference...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention relates to a partial-compensation aspherical reflector surface shape detection method, which comprises the following steps of demarcating partial-compensation elements to obtain demarcated phase distribution Wb; using the demarcated phase distribution Wb, sphere theory wavefront Wq and aspherical theory wavefront Wf to obtain phase distribution Wy of digital virtual sample plates; measuring an aspherical reflector surface to be measured to obtain phase distribution Wa; and reducing the phase distribution Wy from the measured phase distribution Wa to achieve surface shape error distribution Wm of the aspherical surface. The partial-compensation aspherical reflector surface shape detection method can accurately measure optical aspherical surface shapes by using a single partial-compensation element, thereby reducing design difficulty of a compensator, simplifying structure of the compensator and being clear in physical definition, simple in data processing and arithmetical operation, simple and practical in experimental operation, low in detection cost and short in test time.

Description

technical field [0001] The invention relates to a method for detecting the surface shape of an optical aspheric reflector. Background technique [0002] The measurement of aspheric surface shape has always been a difficult point and hot spot in optical inspection. For quadric surfaces, the aberration-free point method can be used to measure aspheric surfaces. The aberration-free point method is a classic and reliable method for testing quadric surfaces. The advantage is that the theoretical error of the design is zero, but the disadvantage is that a large-diameter Hindle sphere or a large-diameter auxiliary plane is required, especially when testing a convex aspheric surface, the diameter of the auxiliary mirror is often several times that of the mirror to be tested, which causes material damage. and technical difficulty. In addition, when using this method to detect the reflective system, the center of the aspheric surface cannot be detected. [0003] At present, the use ...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): G01B11/24
Inventor 王孝坤闫锋郑立功张学军
Owner CHANGCHUN INST OF OPTICS FINE MECHANICS & PHYSICS CHINESE ACAD OF SCI
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products