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2results about How to "Realize continuous observation" patented technology

Simple device suitable for angle offset quantitative measurement of I-beam shed

ActiveCN224398654URealize continuous observationAdjust support measures in a timely mannerAngles/taper measurementsIncline measurementSteel frameContinuous monitoring
The utility model discloses a simple and easy device suitable for angle deviation quantitative measurement of I -steel frame shed, include: bush, bar piece and clamp, both ends of bar piece all have the sliding joint of bush, one end of bush away from bar piece is equipped with clamp, and the inside of bar piece is equipped with the liquid storage cavity, is equipped with the liquid of color in the liquid storage cavity, is equipped with the scale on the outer surface of bar piece, and bar piece adopts transparent material to make, the utility model discloses can accurately show the shed leg angle deviation condition, not only can realize the real -time continuous monitoring of roadway surrounding rock, can effectively avoid the error produced in the operation process to can provide decision basis for roadway support personnel to provide convenience and security guarantee for roadway staff.
Owner:SHAN XI HUA JIN JI NING MEI YE YOU XIAN ZE REN GONG SI +1

Femtosecond ultrafast diffraction imaging system and method based on X-ray free electron laser

The invention provides a femtosecond ultrafast diffraction imaging system and method based on X-ray free electron laser, and relates to the field of X-ray free electron laser. The femtosecond ultrafast diffraction imaging system of the X-ray free electron laser comprises an X-ray light source used for emitting the X-ray free electron laser; the light path focusing mechanism is arranged on the X-ray free electron laser light path and is used for focusing the X-ray free electron laser; the light control mechanism is arranged on the light path of the X-ray free electron laser focused by the light path focusing mechanism and forms a light control slit; the sample target is arranged at the focal point of the X-ray free electron laser; the sample target is arranged at the focal point of the X-ray free electron laser; the single-photon response detection mechanism is arranged in a diffraction light path generated after the sample is bombarded by the X-ray free electron laser and is used for collecting a diffraction pattern; and the phase workstation is electrically connected with the single-photon response detection mechanism and is used for acquiring diffraction pattern data and performing phase recovery.
Owner:SHANGHAI TECH UNIV