160 results about "Real-time testing" patented technology

The invention provides a manufacturing-oriented test process digital twinning and dynamic optimization management method, which relates to the technical field of testing, and comprises the following steps of: acquiring real-time test data through a multi-source data acquisition device, and establishing a test process digital model; constructing a test process digital twin system; establishing a test process prediction model by using a deep learning algorithm; comparing and analyzing the real-time data and the prediction result, and identifying abnormity and optimization opportunities; generating and implementing a test process optimization scheme; and closed-loop optimization management is realized through feedback control. According to the method, the efficiency and quality of the test process are improved.

The invention relates to an efficient test optimization method, system and device for chip test equipment, and the method comprises the steps: obtaining the equipment state data and test management information of the chip test equipment, carrying out the test unit division of the equipment state data based on the test management information, and obtaining the regional test information; acquiring real-time operation data of the chip test equipment, and performing matching analysis on the real-time operation data and the regional test information to obtain a real-time test task group; acquiring chip performance data acquired by the chip test equipment, performing load prediction on the regional test information to obtain a test load trend, and performing resource planning analysis with a real-time test task group to obtain an initial test scheme; performing exception identification on the chip performance data to obtain chip exception information; and performing global optimization on the initial test scheme according to the priority test sequence to obtain a global test strategy. According to the invention, fine management of different test tasks can be realized.

The invention discloses a real-time test analysis method and system for the dynamic performance of an electric reactor in an electronic switch, and relates to the technical field of intelligent operation and maintenance, and the method comprises the steps: collecting the operation data of the electric reactor through a data collection unit, describing the dynamic behavior of the electric reactor through an R-L series model, and extracting the characteristics of the operation data of the electric reactor; constructing a physical information neural network, inputting operation data features, and outputting a data predictor and a physical predictor in parallel; training a neural network model by adopting the optimized multi-task loss function; the performance indexes of the reactor are extracted based on neural network output, and when physical parameter abnormity and conservative constraint violation are identified, an alarm is automatically triggered; according to the method, through multi-branch, dynamic optimization and closed-loop feedback, the method has high sensitivity, high interpretability and self-adaptive optimization capacity on the state, risk and change of the reactor, and the full-life-cycle management level of the electronic switch reactor is remarkably improved.

The invention discloses a method for testing dynamic comprehensive data of an electric cylinder in real time, and relates to the technical field of mechatronics test.The method comprises the steps that vibration signals, temperature data and electromagnetic interference data of the electric cylinder are collected and preprocessed, and a multi-modal data stream is generated; defining a spline basis function based on the vibration signal, and extracting a transient feature tensor of the vibration signal by using the spline basis function; constructing a transient environment state transition model based on the multi-modal data stream, inputting the transient characteristic tensor, the temperature data and the electromagnetic interference data into the transient environment state transition model, and generating a displacement compensation amount and a hidden state sequence; and constructing a digital simulation model, inputting the displacement compensation amount into the digital simulation model, and generating multi-physics field coupling simulation displacement. By constructing the spline basis function and the transient environment state transition model, the problem of vibration signal feature distortion is solved, and the extraction precision and the time resolution of the transient impact features are remarkably improved.

The invention relates to the technical field of transistor detection, in particular to a quick test method and system for an MOSFET device. The method comprises the following steps: acquiring and integrating multi-source parallel data of the MOSFET device to obtain real-time I-V characteristic data of the device; performing MOSFET device performance prediction based on the real-time device I-V characteristic data to obtain MOSFET device performance prediction data; screening according to the performance prediction data of the MOSFET device to obtain performance data of a primarily screened qualified device; performing adjustment based on the performance data of the preliminarily screened qualified device to obtain an MOSFET device test scheme; acquiring real-time test data of the MOSFET device, and screening qualified devices to obtain performance data of re-screened qualified devices; and performing device test summarization based on the performance data of the primarily screened qualified device and the performance data of the secondarily screened qualified device to obtain an MOSFET device test report. According to the invention, the test period can be shortened.

The invention discloses a simulation IC test method and system based on load transient response, and aims to improve the performance evaluation precision of a simulation IC under a complex load condition. The method comprises the following steps: firstly, acquiring transient response waveforms and response delay characteristics of an analog IC (Integrated Circuit) in various load jump modes, and constructing a mapping matrix between a load current step change rate and response delay time; in the real-time test, response delay time in a future preset time period is predicted according to the step change rate of the current load current. When the steady-state time window exists, a fixed sampling time sequence is set based on the window to generate a first test waveform; and if the steady-state window does not exist, correcting the transient waveform, and generating a compensated second test waveform. And then time sequence decomposition is carried out on the test waveform, and a load transient stability evaluation matrix is constructed, so that the dynamic performance of the simulation IC is accurately evaluated, and a detailed performance test report is output.

The invention discloses a stability precision real-time testing method and system based on a photoelectric pod sensor. Belongs to the technical field of photoelectric equipment detection. The technical problem that real-time and high-precision stable precision index measurement cannot be realized in the prior art is solved. The method comprises the following steps: S1, gyroscope zero drift calibration: obtaining a gyroscope zero drift mean value based on time drift; s2, gyro signal preprocessing: preprocessing the gyro original signal through the gyro zero drift mean value to obtain corrected gyro angular velocity data; s3, stability precision dynamic calculation based on time window integration: in a preset sliding time window, calculating the corrected gyro angular velocity data to obtain an angle root-mean-square value of stability precision, and taking the angle root-mean-square value of the stability precision as a stability precision index of a sensor of the photoelectric pod; and S4, stable precision value transmission: reporting a stable precision index to an upper computer through an interface.

The utility model belongs to the technical field of thin film materials. The utility model discloses an online friction coefficient testing device which is used for testing the friction coefficient of a film in production in real time and comprises a support, a testing sliding block and a sensing module. The support is close to the film. The test slide block is attached to the film surface of the film and moves relative to the film when the film is conveyed; one end of the sensing module is connected to the support, the other end of the sensing module is connected to the testing sliding block, and the sensing module is used for testing the force borne by the testing sliding block. The utility model further discloses a friction coefficient testing system. According to the online friction coefficient testing device, the friction coefficient of the film can be tested in real time, normal operation of a film preparation process is guaranteed, and subsequent detection on film performance is reduced.

The invention relates to the technical field of anomaly detection, and discloses an industrial equipment time sequence anomaly detection method and device. The method comprises the following steps: preprocessing collected time series data of industrial equipment to obtain preprocessed time series data; encoding and decoding the preprocessed time sequence data to obtain reconstructed time sequence data; carrying out loss value calculation according to the reconstructed time sequence data to obtain total loss; performing optimization processing on preset anomaly detection model parameters according to the total loss to obtain an anomaly detection model; and performing anomaly detection on the real-time test data according to the anomaly detection model to obtain an anomaly detection result. According to the invention, the accuracy of the time sequence anomaly detection of the industrial equipment is improved.

The invention relates to the technical field of building thermotechnical testing, solves the technical problem that in the prior art, due to the fact that an experimental environment lacks the sky background radiation cold effect, the accuracy of enclosure structure performance testing is low, and provides an enclosure structure performance testing method and system coupled with the sky cold and hot radiation effect. The method comprises the following steps: establishing an equivalent sky effective temperature control model according to a meteorological database; acquiring test environment parameters through a test environment parameter control module according to the equivalent sky effective temperature control model; acquiring real-time test data of the enclosure structure test piece under the control of the test environment parameters through a test data acquisition module according to the test environment parameters; and analyzing the real-time test data through a test data analysis module to obtain a test result. The controllable equivalent sky effective temperature model is introduced, and the problems that in the prior art, the sky background radiation cold effect is lacked, and the deviation between the test result and the actual building service environment is large are effectively solved.

Various embodiments of the teachings herein include methods for calculating the remaining useful life of an electronic system. An example includes: determining multiple degradation distribution models of the electronic system using historical data for a multiplicity of electronic units representing a degradation level of the electronic system; processing the historical data using a proportional hazards degradation model to obtain a reliability function for the electronic units; using real-time test data to perform calculation using a corresponding degradation distribution model to obtain a degradation index value for the electronic units; and using the degradation index value to calculate the remaining useful life of the electronic system using the reliability function and the current test time point.

The invention discloses a dynamic balance test control method and system of a flexible rotor, and belongs to the technical field of dynamic balance test control of the flexible rotor, and the method comprises the steps: obtaining a horizontal phase difference between an input end and an output end of a tested rotor and a vertical phase difference between the input end and the output end of the tested rotor, and judging whether a dynamic balance test is carried out or not; obtaining design parameters, a theoretical first critical rotating speed and a theoretical second critical rotating speed of the tested rotor, and obtaining working condition information of the tested rotor; constructing a dynamic balance test control database; constructing a dynamic balance test control model; obtaining a real-time test value; inputting the real-time test value into a dynamic balance parameter adjustment module to obtain a dynamic balance test adjustment parameter; inputting the real-time test result and the working condition information of the tested rotor into a dynamic balance parameter compensation module to obtain a dynamic balance compensation control parameter; the method has the effect of judging whether the dynamic balance test is carried out, and solves the problems of whether the dynamic balance test is carried out and ineffective test behaviors which excessively depend on the dynamic balance test in the prior art.

The invention discloses a processor chip power consumption test method and test system, and belongs to the technical field of processor chips, and the method comprises the steps: collecting and processing the real-time test data of a processor chip, and determining the feature test data of the processor chip; training a processor chip power consumption test prediction model, analyzing the processor chip feature test data, predicting processor chip power consumption, and determining a processor chip power consumption prediction result; and displaying the power consumption test condition of the processor chip in a visual form, managing and controlling the processor chip, and adjusting the set dynamic power consumption threshold value by using the dynamic adjustment coefficient. The problem that the power consumption test effect of the processor chip is poor due to the fact that the power consumption characteristic of the processor chip cannot be comprehensively evaluated and the processor chip cannot be effectively controlled in the prior art is solved. The power consumption characteristic of the processor chip can be comprehensively evaluated, the processor chip can be effectively controlled, and the power consumption test effect of the processor chip can be improved.

The invention discloses a flash memory grade test method, device and equipment and a medium. The method comprises the following steps: acquiring real-time test values respectively corresponding to flash memory core parameters and test environment parameters of flash memory equipment; wherein the flash memory core parameters comprise erasing times, and the test environment parameters comprise temperature parameters; performing normalization operation based on the real-time test value to obtain a normalized weight coefficient; dividing a preset value interval to obtain a plurality of weight subintervals, and determining a target original bit error rate grading threshold list based on the normalized weight coefficient and the plurality of weight subintervals; and obtaining a real-time original bit error rate, and determining a target flash memory level of the flash memory device based on the real-time original bit error rate and the target original bit error rate grading threshold list. According to the technical scheme, the dynamic influences of the flash memory core parameters and the test environment parameters are integrated, a real-time dynamic grading mode is constructed, and accurate judgment of the flash memory grade of the flash memory equipment is achieved.

The invention, which relates to the technical field of earphone quality, discloses an Internet-based intelligent earphone quality analysis and test system comprising a data acquisition module, an electric quantity interval setting module, a data analysis module, a correction coefficient acquisition module and a test value correction module. The change conditions of test values of various test parameters of the earphone under different electric quantities of the earphone are analyzed, and when the various test parameters of the earphone are detected, the real-time test values of the various test parameters of the earphone are corrected and calculated according to the correction coefficients corresponding to the various test parameters respectively; and then actual test values corresponding to the test parameters are obtained, so that the situation that the test results of the test parameters of the earphone are inaccurate due to inconsistent electric quantity is avoided, the probability of misjudgment is reduced, and the accuracy of earphone quality analysis and test is further improved.

The invention relates to the technical field of cable detection, and discloses an automatic cable test method and system based on multi-modal data fusion, and the method comprises the steps: synchronously collecting an electrical performance test signal and structural integrity image data of a cable, and generating a time-aligned synchronous test data set; respectively extracting electrical parameter characteristics and structural form characteristics from the synchronous test data set, and generating a multi-modal characteristic set by establishing an association mapping relation between the electrical parameter characteristics and the structural form characteristics; constructing a dynamic association network between features based on historical fault data, identifying a degradation feature mode representing progressive degradation of performance from the multi-modal feature set, and generating a feature degradation track describing a performance degradation rate and path; according to the method, dynamic risk assessment and grading are completed by integrating the life prediction result and the feature abnormal points in the real-time test, and finally a quality assessment and early warning report with both accuracy and timeliness is output.

The invention discloses a chip packaging positioning system and method based on big data, and relates to the technical field of chip packaging positioning, and the system comprises a chip positioning event obtaining module, a characterization positioning difference value analysis module, a target type chip marking module, a data association model construction module and a real-time early warning response module. The chip positioning event acquisition module is used for acquiring chip positioning events of various types of chips before packaging recorded by the chip packaging system, and the characterization positioning difference value analysis module analyzes a positioning result and characterization positioning difference values of the corresponding types of chips; the target type chip marking module is used for marking a chip type corresponding to the characterization positioning difference value greater than or equal to the characterization positioning difference value threshold as a target type chip, and the data association model building module is used for building a data association model of a test result and a positioning result; and the real-time early warning response module inputs a real-time test result to carry out early warning response of a positioning mode on the chips of the same type after the chip function test link is executed and before packaging and positioning.

The invention relates to a relay protection inspection system architecture and method based on cloud edge collaboration. The objective of the invention is to solve the technical problems of low automation degree and insufficient test coverage rate of the existing relay protection test. According to the technical scheme, the system comprises a cloud end and a side end, the cloud end is deployed on a wave recording master station, the side end comprises a relay protection device, edge wave recording equipment and an automatic testing device, and the resource advantages of wave recording networking of secondary equipment are utilized to be responsible for collection, preprocessing and real-time testing of local data; the relay protection inspection method comprises the steps of data acquisition, state pre-evaluation of the relay protection device, automatic testing and formation of a test report, a positive interaction mode of information exchange is formed between the master station and the secondary equipment through cloud-side cooperation, optimal use of equipment resources of the whole network is facilitated, and the service life of the equipment resources of the whole network is prolonged. And the overall analysis and fault early warning functions of the master station are enhanced, and real-time pre-evaluation, automatic testing and intelligent operation and maintenance of the equipment state are realized in combination with cloud computing, edge computing, an improved BP neural network and an evidence theory.

A set of test methods for performing a live test of service in a production environment, where the service is provided by a set of configured instances in the production environment and each configured instance is composed of a set of components. The methods including a method that includes instantiating components under test from the set of components to setup paths that are to be taken by test traffic, instantiating test configuration components for the service, executing a test case on a created path, generating a snapshot of a first serving component from the set of components, replacing a tested component under test with a second serving component cloned from the snapshot, relocating the service to the second serving component, replacing the serving component of the snapshot with a new component under test to create a new path to be tested, and determining whether all paths have been tested.

The invention relates to a high code coverage rate fuzzy test method based on a parallel strategy. The method comprises the following steps: deploying a plurality of fuzzy test examples running in parallel; acquiring an execution path and state data of the target program in real time through a dynamic instrumentation technology; dynamically evaluating the seed priority based on the central management system; distributing a high-priority seed to each fuzzy test instance through a feedback driving mechanism, and optimizing file operation and multi-thread synchronization; and dynamically adjusting the seed priority and the test strategy according to the real-time test data. The method has the advantages that system calling and resource contention are effectively reduced, the test efficiency and coverage rate are improved, and efficient cooperation and intelligent test strategy adjustment are achieved through the design of a multi-thread synchronization mechanism and a central management system.

The invention discloses an off-grid inverter parallel operation test system, and the system comprises an isolation type programmable DC power supply module which is used for providing an independent DC power supply for a plurality of inverters; the dynamic load device comprises a plurality of independently controlled load units and is used for simulating the operation states of the inverter under different load conditions; the data acquisition device is used for acquiring output parameters of the plurality of inverters; the fault injection and fault tolerance device is used for injecting a fault signal to test and analyze the fault tolerance performance of the system in the parallel operation process of the plurality of inverters; the upper computer system is connected with the data acquisition device, the dynamic load device, the fault injection and fault tolerance device and the isolated programmable direct-current power supply module, and is used for carrying out data processing and display on the parallel operation performance of the inverter; the plurality of inverters simulate off-grid parallel operation in a parallel connection mode; and the parallel operation performance of the inverter is tested and analyzed in real time through the upper computer system.

A method for generating a real-time test environment activity view for a functional simulation is described. In some embodiments, the method includes retrieving a unique identifier (ID) associated with each of a plurality of testbench components present in a test environment from a real-time test environment activity viewer log file. The method further includes iteratively fetching from the real-time test environment activity viewer log file, a set of information corresponding to an activity associated with each of the plurality of testbench components based on the associated unique ID. The method further includes contemporaneously generating at each iteration, a real-time test environment activity view for each of the plurality of testbench components based on the associated set of information. The method further includes contemporaneously rendering at each iteration, the real-time test environment activity view for each of the plurality of testbench components via a Graphical User Interface (GUI).

The application relates to the fields of artificial intelligence and digital medicine, and proposes a deep learning model self-adaptive testing method based on artificial intelligence and related equipment.The method comprises the following steps: obtaining a deep learning model and test data, the deep learning model can obtain feature representation and classification results of any test data; a first data set for storing the feature representation and the classification results is created; real-time test batches are input into the deep learning model to obtain real-time feature representation and real-time classification results of the test data; the first data set is queried based on the real-time feature representation to construct a feature consistency loss; proxy feature representation of each category in the first data set is calculated to construct a feature uniformity loss; the deep learning model and the first data set are updated based on the feature consistency loss and the feature uniformity loss; and the self-adaptive testing of the deep learning model is completed until a preset condition is met. The application can improve the precision of the deep learning model applied to the field of digital medicine on medical test data.

There is provided an architecture, methods and a system for live testing in a production environment. The architecture comprises a platform independent Test Planner for generating a test package in response to receiving an event. Generating a test package comprises selecting test goals, generating a test suite and generating a test plan. The architecture comprises a platform dependent Test Execution Framework (TEF) for executing the test package in an environment serving live traffic. Executing the test package comprises initializing the test plan, starting the test plan and reporting the successful completion of the test plan, reporting the suspension of the test plan and waiting for further instructions, or reporting a failure of the test plan and executing a corresponding contingency plan.

The present invention relates to the field of transistor detection technology, and in particular to a fast testing method and system for MOSFET devices. The method comprises the following steps: obtaining and integrating multi-source parallel data of MOSFET devices to obtain real-time device I-V characteristic data; predicting MOSFET device performance based on real-time device I-V characteristic data to obtain MOSFET device performance prediction data; screening according to MOSFET device performance prediction data to obtain preliminary screening qualified device performance data; adjusting based on preliminary screening qualified device performance data to obtain MOSFET device test plan; obtaining real-time MOSFET device test data, and screening qualified devices to obtain re-screening qualified device performance data; summarizing device tests based on preliminary screening qualified device performance data and re-screening qualified device performance data to obtain MOSFET device test report. The present invention can shorten the test cycle.

The embodiment of the specification provides an ATE embedded wafer defect detection method and device based on PSO-SVM, wherein the method comprises the following steps: acquiring historical data, marking the historical data to determine marked historical data, and establishing a benchmark defect detection model; integrating the marked historical data to determine an original data set, and performing feature engineering and data normalization on the original data set to determine target data; performing PSO-SVM joint optimization training based on the target data and the benchmark defect detection model to determine an SVM defect detection model; acquiring real-time test data, performing defect detection based on the real-time test data and the SVM defect detection model, and determining a defect detection result. By constructing a high-dimensional feature vector based on dynamic electrical parameters generated in a CP test process, and performing efficient classification by using a PSO-SVM model, early and intelligent identification of wafer defects is realized.

Embodiments of the innovation relate to, in client device, a method for transitioning a first environment of a client device to a second environment. The method comprises receiving a first disk image to create the first environment executed, and displayed to an end-user, by the client device and a second disk image to create the second environment executed by the client device and identifying a change to the first environment. The method also comprises updating the second environment with the identified change to the first environment and swapping the second environment with the first environment, the second environment displayed to the end-user by the client device. As such, the client device provides for the real-time testing and evaluation of software updates in an environment directly subjected to a real user workflow, as well as an ease of migration to the client device when a user decides to update their software.

During a live test of changes to a current set of event processing filters, a computer system may determine a selected set of event processing filters with which to evaluate a live event (either a current set of event processing filters or a new set of event processing filters in one example). The computer system evaluates the live event according to the selected set of event processing filters. Based on the evaluation, the computer system updates metrics for events evaluated during the live test. The metrics may include a first set of metrics for events evaluated during the live test using the current set of event processing filters and a second set of metrics for events evaluated using the new set of event processing filters. The metrics may be used to decide whether to promote the new set of event processing filters to the current set of event processing filters.

The invention relates to the technical field of databases, the scheme can be applied to the fields of finance and medical treatment, and the invention provides an automation method and device for database exception testing, equipment and a medium, and the method comprises the steps: obtaining a predefined fault scene template; wherein the fault scene template comprises target fault object configuration information, load configuration information and fault type configuration information; determining a target fault object according to the target fault object configuration information; initiating a service load to the target fault object according to the load configuration information to obtain standard test data; injecting a fault into the target fault object according to the fault type configuration information to obtain real-time test data; and comparing the standard test data with the real-time test data to obtain a corresponding target test result. According to the embodiment of the invention, the abnormity test can be automatically carried out on the target fault object through the predefined fault scene template, and the automatic mode can effectively improve the test efficiency and the test accuracy.

The application provides a multi-machine flow connection and bidirectional real-time testing method for high-speed railway operating line large-core optical cable, and the method comprises the following steps: generating a core-level flow beat mark by obtaining a completed connection event of each optical fiber core, determining a set of optical fiber cores that have completed fusion in the current batch according to the mark, and constructing a core-level operation time window with a clear time boundary based on the core number scale; dividing a head-tail edge section and a middle stable section in the time window, judging whether the bidirectional real-time testing is allowed to be performed according to the testable margin index of the middle stable section, and adding an operating line allowed attribute to the time window; controlling the collaborative operation of multiple fusion equipment within the time window boundary, and triggering the bidirectional real-time testing at the starting position of the middle stable section when the allowed condition is met. The scheme realizes efficient, orderly and verifiable connection of the large-core optical cable within a limited time window, and improves the safety and reliability of the optical cable construction of the high-speed railway operating line.