1177 results about "Waveplate" patented technology

The present disclosure relates to an active graded magnetic compensation system and method for an unshielded SERF magnetometer. The system comprises: a detection laser, a half-wave plate, a magnetic field compensation coil, a magnetic field modulation coil, a non-magnetic heating assembly, an alkali-metal atomic vapor cell, a polarizing beam splitter prism, a balanced photodetector, a graded feedback control module, a pump laser, a quarter-wave plate, a focusing lens and a photodetector. By means of the present disclosure, a graded compensation system is used to realize high-precision compensation for a magnetic field within a large dynamic range in a geomagnetic environment, thereby ensuring that an instrument carries out high-sensitivity magnetic field measurement under geomagnetic conditions.

The invention discloses a light spot shaping device based on wave plate polarization conversion and a use method, and relates to the technical field of laser processing, the device divides random polarized light into S / P light through a first polarization beam splitter (PBS), converts the S light into P light through a first 1 / 2 wave plate, modulates the S light through a conventional silicon-based liquid crystal spatial light modulator (LCoS SLM), and converts the P light into the S light through a second 1 / 2 wave plate. And the beams are combined by the second PBS. The method comprises the steps of light splitting, polarization conversion, phase modulation, beam combining, beam expanding and focusing and the like. The double 1 / 2 wave plates are combined with the conventional PBS, the laser energy utilization rate is higher than 85%, commercial SLM equipment is adapted, the machining efficiency of the shaped annular light spots is remarkably improved compared with that of Gaussian beams, the method is suitable for laser welding and metal 3D printing, and the problems of energy waste and high cost are solved.

The invention relates to the technical field of laser ranging, in particular to a double-optical-comb hybrid ranging device which comprises a signal detection optical path system and a signal demodulation optical path system. Wherein the signal detection optical path system comprises a first optical frequency comb, a first optical isolator, a first optical collimator, a first beam splitter prism, a reference mirror, a Faraday rotator, a convergence mirror and a target reflector; the signal demodulation optical path system comprises a second optical frequency comb, a second optical isolator, a second optical collimator, a half-wave plate, a second beam splitter prism, a third beam splitter prism, a first polarization controller, a first photoelectric detector, a reflector, a polarization beam splitter prism, a second polarization controller and a second photoelectric detector. A third polarization controller; and a third photoelectric detector. According to the invention, three ranging technologies of asynchronous optical sampling ranging, multi-heterodyne interference ranging and synthetic wavelength ranging are fused, and the problem that a large ranging range and high ranging precision cannot be simultaneously considered in the ranging process is solved.

The utility model discloses a visual system which comprises a lens cone, a lens group and a spacing element group, wherein the lens group and the spacing element group are assembled in the lens cone; the lens group comprises a first lens with positive focal power, a reflective polarization element, a first quarter-wave plate, a second lens with positive focal power, a third lens with negative focal power, a partial reflection element and a second quarter-wave plate which are sequentially arranged from the first side to the second side along the optical axis. The fourth lens has negative focal power; the spacing element group comprises a first spacing element, a second spacing element, a third spacing element and a fourth spacing element; wherein the number of the lenses with focal power in the lens group is four; the effective focal length f1 of the first lens and the effective focal length f of the visual system satisfy 1.5 lt; f1 / flt; 1.9); the combined focal length FG1 of the first lens, the reflective polarizing element and the first quarter-wave plate and the inner diameter d1s of the first side surface of the first spacing element meet the following conditions: 2.35 lt; fG1 / d1slt, FG1 / d1slt; and 2.75%.

The invention discloses a grating displacement encoder grating spacing error in-situ detection and self-compensation method, and belongs to the technical field of optical measurement, and the method comprises the steps: generating elliptically polarized light, modulating the elliptically polarized light into S polarized light, reflecting the S polarized light through a polarization beam splitter, converting the S polarized light into circularly polarized light through a quarter-wave plate, and enabling the circularly polarized light to enter a diffraction grating ruler; the diffraction grating ruler diffracts incident light to form first-order diffraction light and second-order diffraction light; processing and interference detection are carried out on the first-order diffraction light, and precise displacement conversion is carried out in combination with the Doppler effect of grating displacement; constructing an auto-collimation angle detection sensing module by using second-order diffraction light, and converting the distance manufacturing deviation of diffraction gratings by detecting the tiny change of a diffraction angle; and compensating the displacement measurement error of the grating encoder in real time according to the real-time detection result of the grating spacing manufacturing deviation. According to the invention, the off-line detection time and cost of the grating are greatly saved.

The invention provides a visual system. The visual system comprises a lens cone, a lens group and a spacing element group, the lens group and the spacing element group are arranged in the lens cone, and the lens group is composed of four lenses, a polaroid, a reflective polarizing element, a quarter-wave plate and a reflective element. The four lenses are sequentially a first lens with positive focal power, a second lens with negative focal power, a third lens with negative focal power and a fourth lens with positive focal power from the first side to the second side; f23 / d3s is more than or equal to-9.75 and less than or equal to-8.72; f / (CP1 + EP13) is more than 5.00 and less than 5.40. The problem that stray light is serious due to the fact that a four-piece type visual system in the prior art is provided with a bonding lens and a reflecting part to meet the requirement for structure compactness is solved.

The utility model discloses an optical imaging system. The optical imaging system comprises a lens cone, an imaging group and a second spacing element, wherein the imaging group and the second spacing element are arranged in the lens cone. The imaging group sequentially comprises a linear polarization film, a reflective polarization element, a quarter-wave plate, a first lens, a second lens, a third lens, a fourth lens and a partial reflection layer from the first side to the second side along the optical axis; wherein the first lens and the second lens are glued, and the third lens and the fourth lens are glued. The second spacer element is disposed on the second side of the second lens and is in contact with the second side of the second lens. Wherein the outer diameter D0m of the second side end face of the lens barrel and the outer diameter D2m of the second side face of the second spacing element meet the condition that D0m-D2m is larger than or equal to 4.51 mm and smaller than or equal to 5.8 mm; the inner diameter d2m of the second side surface of the second spacing element, the inner diameter d2s of the first side surface of the second spacing element, and the axial distance T23 from the second side surface of the second lens to the first side surface of the third lens satisfy the following formula: (d2m-d2s) / T23 is greater than or equal to 0.97 and less than or equal to 2.79.

The invention relates to the technical field of optical measurement, in particular to a grating interference measuring device and method based on large-size light spots. The device comprises a light source module which adopts a laser light source with high stability, and the laser light source comprises a wavelength locking device; the collimation and beam expansion module is connected with the light source module; the light splitting module adopts a combined structure of a polarization splitting prism and a lambda / 4 wave plate; the reference grating module comprises a reference grating and a three-dimensional precision adjustment platform; the measuring grating module comprises a measuring grating and a self-adaptive height adjusting mechanism; the imaging module comprises a large-view-field telecentric imaging lens group and a high-speed CMOS image sensor; and a data processing module. One-time measurement of the surface of a large-area object is achieved through the collimation and beam expanding module, efficiency is improved, local interference errors are reduced, the stable laser light source and the reasonable design module are adopted, environmental influences are reduced, optical design is optimized, aberration is reduced, automatic and intelligent measurement is achieved, and convenience and efficiency are improved.

The invention discloses a high-speed high-resolution compressed sensing imaging system and an imaging method. Light of an object is emitted to the polarization splitting prism to be transmitted and reflected after passing through the first-stage imaging module, the transmitted light is reflected back to the polarization splitting prism after being coded and modulated by the spatial light modulator, and then the transmitted light enters the target surface of the camera through the second-stage imaging module to form a coded imaging image; the reflected light is transmitted to the hollow ridge reflecting prism through the quarter-wave plate, is reflected back to the quarter-wave plate through the hollow ridge reflecting prism, then sequentially passes through the quarter-wave plate, the polarization splitting prism and the secondary imaging module and then enters the target surface of the camera to form a common imaging image, and then coded imaging data is matched with common imaging data; and decoding reconstruction is carried out by adopting an alternating direction multiplier method of a point spread function integrated with the first-stage imaging module and the second-stage imaging module. Compared with a traditional imaging mode, the method can break through the imaging frame rate limit of a camera, and has the advantages of high imaging resolution and small data volume.

A visual optical system comprises a first optical system and a second optical system. The first optical system comprises a first lens having a positive refractive power, a reflective polarizing element, a quarter-wave plate, a second lens having a refractive power and a third lens having a positive refractive power. The second optical system comprises, sequentially along a second optical axis from the first side to the second side, first to sixth lens elements. An effective focal length f3′ of the third lens, a distance TD′ from a first-side surface of the first lens to a second-side surface of the third lens on the first optical axis, an effective focal length f1 of the first lens element and a distance TD from a first-side surface of the first lens element to a second-side surface of the sixth lens element on the second optical axis satisfy: 1.9<(f3′ / TD′) / (|f1| / TD)<5.7.

The invention provides a 2-micron high-order Poincare sphere vector vortex ultrafast laser polarization detection method, which comprises the following steps of: performing out-cavity and out-cavity beam splitting on 2-micron high-order Poincare sphere vector vortex ultrafast laser through a beam splitting module, directly detecting light intensity spatial distribution by one beam, and dynamically regulating and controlling the out-cavity of a polarization state by the other beam after the other beam enters a polarization regulation and control module; the computer communicates with the ESP32 development board to control the hollow rotary displacement table to change the forward included angle between the fast axis and the x axis of the vortex quarter-wave plate so as to change the polarization state of incident light; through the ultrafast laser polarization beam splitter, the polarization state of passing light is limited, and horizontal line polarized light perpendicular to a beam splitting surface passes through the ultrafast laser polarization beam splitter; dynamically detecting real-time data of light intensity which is dynamically adjusted outside the cavity through the polarization regulation and control module each time through a light intensity detection module; and the polarization analysis module receives regulation and control parameters of the polarization regulation and control module and light intensity parameters of the power detection module, analyzes the polarization state of a light beam input into the system, and completes 2-micron high-order Poincare sphere vector vortex ultrafast laser polarization detection.

The utility model discloses an optical system. The optical system sequentially comprises a first lens, a reflective polarizing element, a first quarter-wave plate, a second lens, a third lens, a partial reflection element, a second quarter-wave plate, a polarizing film and a fourth lens from a first side to a second side along an optical axis, the first lens has positive focal power, and the first side surface of the first lens is a convex surface; the second lens has negative focal power, the first side surface of the second lens is a plane, and the second side surface is a concave surface; the second side surface of the third lens is a convex surface; the first side surface of the fourth lens is a plane; the effective focal length f1 of the first lens and the effective focal length f2 of the second lens meet the following formula:-0.7 lt; f1 / f2lt; -0.15, < = 0.15; the combined focal length fz2 of the second quarter-wave plate, the polaroid and the fourth lens and the curvature radius R8 of the second side face of the fourth lens meet the condition that fz2 / R8 is larger than or equal to-2.0 and smaller than or equal to-1.5.

The invention belongs to the technical field of optical imaging, and discloses a multifunctional image edge enhancement device based on spiral phase contrast imaging, which comprises a light source system, an optical imaging system and an edge enhancement detection system which are arranged in sequence, the light source system is used for generating collimated linear polarization laser; the optical imaging system comprises a first 4-f system and a round hole diaphragm which are sequentially arranged on a light path; a sample to be tested is arranged between the light source system and the first 4-f system; the edge enhancement detection system comprises a first lens, a vortex wave plate, a second lens and an imaging unit which are sequentially arranged on a light path; the first lens and the second lens form a second 4-f system; linearly polarized laser output by the light source system is transmitted by a to-be-detected sample, enters the first lens after passing through the first 4-f system and the round hole diaphragm, and then is imaged on the imaging unit after passing through the vortex wave plate and the second lens in sequence. According to the invention, edge enhancement can be realized, and the contrast and resolution of the image are improved.

The utility model relates to a device for measuring the three-dimensional shape of a sample with non-uniform reflectivity. The device comprises a structured light illumination element DLP, a collimating lens group, a polarizing beam splitter, a 1 / 4 wave plate, a motor, a dispersion tube lens, an objective lens, an objective table for placing the sample to be measured, a focusing lens, a dichroic mirror, a first optical filter, a first camera, a total reflection prism, a second optical filter, a second camera and a microprocessor, the 1 / 4 wave plate, the motor, the dispersion tube lens, the objective lens, the objective table, the focusing lens, the first camera and the second camera are perpendicular to the same optical axis, and the structured light illumination element DLP, the polaroid and the collimating lens group are parallel to the same optical axis and are perpendicular to the optical axis reflected by a tested sample. According to the utility model, the structure is simple, the first camera and the second camera can rapidly acquire images of two wavebands of a sample with non-uniform reflectivity based on the structured light illumination element DLP, and the microprocessor rapidly measures the height difference of the sample with non-uniform reflectivity based on the images of the two wavebands.

The invention discloses a method and device for measuring a crystal electro-optical coefficient at low voltage, and relates to the technical field of photoelectric coefficient measurement, and the method comprises the steps: employing a wavelength tunable laser as an incident light source of a crystal electro-optical coefficient detection system; before an incident light source is input into a to-be-measured laser crystal, a wave plate is added to serve as a phase compensator to generate phase delay phi 1, and meanwhile the to-be-measured laser crystal generates phase delay phi 2 under the action of direct-current voltage; when the crystal electro-optical coefficient detection system is a half-wave voltage detection system; adjusting the wavelength of the tunable laser so that 3pi / 4 is less than or equal to phi1lt; pi; when the crystal electro-optical coefficient detection system is a full-wave voltage detection system, the wavelength of the tunable laser is adjusted to enable 7pi / 4 to be smaller than or equal to phi1lt; 2pi. As the used light source is the wavelength tunable laser, phi 1 can be adjusted in a large range by changing the wavelength, so that phi 2 and the test voltage are changed, the purpose of measuring the electro-optical coefficient of the crystal at low voltage is achieved, and the test safety is improved.

The invention relates to the technical field of optical element surface shape dynamic measurement scheme design, in particular to an element surface shape dynamic measurement system based on a metasurface. According to the scheme, polarized light emitted by a laser is split into reference light and test light, the test light passes through a quarter-wave plate twice to realize polarization orthogonalization, and the test light is combined with the reference light to form elliptically polarized light; synchronously capturing component intensities of left-handed / right-handed circular polarized light and orthogonal line polarized light by using a detector, and resolving a phase difference delta in real time by combining a Stokes parameter; environmental interference is eliminated based on a common-path design, a polarization beam-splitting element is omitted, and the architecture is simplified; accurate dynamic measurement of the surface shape of the measured piece is realized by deducting the inherent surface shape error of the system. The system provided by the invention has the advantages of strong anti-interference performance, high measurement efficiency, remarkable cost reduction and the like, and is suitable for precise optical manufacturing and on-line detection scenes.

The invention relates to a dual-wavelength vortex light interference displacement measurement system and a dual-wavelength vortex light interference displacement measurement method for compensating installation and adjustment errors through image recognition, and belongs to the technical field of optical precision measurement of precision measurement. Comprising a laser light source A, a beam expander A, a collimating mirror A, a vortex wave plate A, a laser light source B, a beam expander B, a collimating mirror B, a vortex wave plate B, a beam splitter prism A, a reflector A, a reflector B, a beam splitter prism B, a reflector C, a displacement table and a camera. An image recognition method is used for processing a dual-wavelength vortex light interferogram, displacement calculation is carried out according to the overall intensity change distribution of the interferogram, and different from traditional angle recognition extraction, the method is used for solving the problem that a measurement result is affected by system errors existing in a measurement system. The traditional angle identification precision is reduced due to interference pattern distortion, so that the measurement precision is influenced, the error influence is effectively reduced, the accuracy of the measurement result is ensured, and the micro-displacement measurement method is novel, effective, high in precision and large in range.

In one or more embodiments, an optical system may include a first lens, a second lens, and a stack of reflective polarizer and quarter waveplate between the first lens and the second lens. The stack of reflective polarizer and quarter waveplate may be directly on the first lens, and a half mirror lens by the second lens may be a side opposite the first lens.

A visual optical system is provided, including a first optical system and a second optical system, the first optical system sequentially includes: a first element group, a second element group and a third element group, the first element group including a first lens element, a reflective polarizing element and a quarter wave plate; and the second optical system sequentially includes: a first lens, a second lens er, a third lens and a fourth; where, a distance TDm from a first side surface of the first element group to a second side surface of the third element group on the first optical axis and a distance TDe from a first surface of the first lens to a second surface of the fourth lens on the second optical axis satisfy: 5.0<TDm / TDe<15.0.

The invention discloses a semiconductor laser, which comprises a laser light source; the polarizer comprises an incident side, a first reflection light-emitting side, a second reflection light-emitting side and a transmission light-emitting side; the first wave plate is arranged on the first reflection light emitting side; the second wave plate is arranged on the transmission light-emitting side; during working, laser emitted by the laser light source comprises first polarized light and second polarized light, the polarization directions of the first polarized light and the second polarized light are perpendicular to each other, and the laser enters the polarizer from the incidence side; the first polarized light is reflected by the polarizer, passes through the first wave plate to be subjected to polarization turning and is emitted along a first emergent light path, and part of light reflected back along the first emergent light path on the working surface passes through the first wave plate to be subjected to polarization turning again and passes through the polarizer to be emitted from a second reflection emergent light side; the second polarized light passes through the polarizer and the second wave plate to be subjected to polarization turning and is emitted out along a second emergent light path, and part of light reflected back along the second emergent light path on the working surface is subjected to polarization turning through the second wave plate again, then enters the polarizer and is reflected out from the second reflection emergent light side.

A zero-optical-path-difference double-frequency heterodyne grating ruler comprises a light source, a signal detecting and processing system, a polarization splitting prism, a first quarter-wave plate, a rectangular prism, a second quarter-wave plate, a third quarter-wave plate, a total reflection mirror, a long-strip prism, a reference grating and a 45-degree-placed polaroid. The two measuring light paths of the system always keep zero optical path difference, so that the measuring precision can be ensured, and the environmental stability of the system is also remarkably improved. And a high-precision and high-robustness measurement scheme is provided for precision equipment such as a photoetching machine and a precision motion platform.

The embodiment of the invention provides a chip atomic clock based on a speed grating spectrum and an implementation method. Comprising a multi-frequency coherent laser source, a quarter-wave plate, an atomic gas chamber, a photoelectric detector, a band-pass filter, a microwave modulation and demodulation module, a crystal oscillator, a phase-locked loop module, a bias-tree module, a DC modulation and demodulation module and a servo control module. The multi-frequency coherent laser source is sequentially connected with the quarter-wave plate, the atomic gas chamber, the photoelectric detector and the band-pass filter, the first output end of the band-pass filter is sequentially connected with the microwave modulation and demodulation module, the crystal oscillator and the phase-locked loop module, and meanwhile the microwave modulation and demodulation module is connected with the phase-locked loop module. And the second output end of the band-pass filter is connected with the DC modulation-demodulation module and the servo control module in sequence. And the bias-tree module is connected with the servo control module and the phase-locked loop module and feeds back a coupled signal to the multi-frequency coherent laser source so as to complete whole clock locking. The atomic clock is used for achieving the effect of improving the spectral line signal-to-noise ratio.

The invention relates to the technical field of interferometers, in particular to an interferometer light path calibration method and method.The interferometer light path calibration method comprises the steps that an interferometer is started, a measurement light beam and a reference light beam generated by the interferometer are combined through a polarization splitting prism and then are emitted towards an observation screen, and a measurement light spot and a reference light spot are formed on the observation screen; adjusting a reflector group of the interferometer to enable the measurement light spot to coincide with the reference light spot; the observation screen is removed, an optical fiber is connected, and the combined light beams are coupled into the optical fiber; the output end of the optical fiber is connected to detection equipment, a light current signal is obtained through detection of the detection equipment, and the ratio of an alternating-current voltage component to a direct-current voltage component is shown; and a lambda / 4 wave plate in the interferometer is adjusted until the ratio reaches a preset condition, and calibration is completed. The method is accurate and reliable, is simple and convenient to operate, has repeatability, can give consideration to space alignment and polarization matching, and facilitates the improvement of the stability and measurement precision of an interference system.

The invention discloses a dynamic tunable zero-level electro-optical wave plate system, a device and a preparation method, and belongs to the technical field of optical devices. The invention provides a dynamic tunable zero-order electro-optical wave plate system, and the system comprises a zero-order electro-optical wave plate device which comprises a wave plate substrate made of an electro-optical crystal of a non-centrosymmetric structure, and an electrode disposed on the wave plate substrate; the output end of the adjustable voltage source is electrically connected with the electrode; wherein the adjustable voltage source is configured to be capable of outputting a half-wave working voltage corresponding to a target working wavelength, so that the zero-order electro-optical wave plate device works at the target working wavelength as a half-wave plate. According to the invention, self-adaptive matching of a single device to a plurality of working wavelengths is realized, the problem that the working wavelength of the device is single due to material dispersion is solved, and meanwhile, the processing difficulty of an ultrathin structure required by a specific wave band is avoided.

The invention discloses a surface topography measurement device and method based on polarization phase shift. The device comprises a laser module, a polarization beam splitting and interference module, a polarization beam combining and imaging module, a polarization image acquisition module and a control and reconstruction module. The laser module comprises a monochromatic tunable laser, an optical fiber collimating amplifier and a polarizer; the polarization beam splitting and interference module comprises a polarization beam splitting prism, a first quarter-wave plate, a plane mirror and a second quarter-wave plate; the polarization beam combining and imaging module comprises a polarization splitting prism, a third quarter-wave plate and a telecentric lens; the polarization image acquisition module comprises a micro-polarization array camera and an image processing unit, and the micro-polarization array camera synchronously acquires four polarization interference images through single exposure; and the control and reconstruction module obtains measurement data of the surface topography of the to-be-measured object through a phase unwrapping algorithm and three-dimensional topography reconstruction. According to the invention, high-precision, large-field-of-view, portable and high-efficiency field detection can be realized.

The invention relates to the technical field of laser, in particular to a high-signal-to-noise-ratio modulation transfer spectrum frequency stabilization light path system. The system comprises a laser, an optical isolator, a first half-wave plate, a first polarization splitting prism, an optical fiber coupler, a second half-wave plate, a second polarization splitting prism, a first reflecting mirror, an electro-optical modulator, a second reflecting mirror and a third polarization splitting prism, wherein the first half-wave plate is used for adjusting the power of frequency stabilization light; the second half-wave plate is used for adjusting the power ratio of pump light to probe light; a first quarter-wave plate, a second quarter-wave plate, an atomic gas chamber and a photoelectric detector; after the output of the laser is isolated by the optical isolator, the first half-wave plate and the first polarization splitting prism are matched to adjust the frequency stabilization total beam power to about 5mW; the pump light is modulated by the electro-optical modulator, the probe light and the pump light reversely interact in the atomic gas chamber in an anti-phase circular polarization state, and the signal-to-noise ratio of a modulation transfer signal and the stability of a frequency stabilization system are remarkably improved.

The invention discloses a confocal alignment device and method for correlation beams of double-beam optical tweezers, and belongs to the technical field of optical tweezers. A laser light source of the device is subjected to beam expansion, then passes through a linear polarizer for polarization and a # imgabs0 # wave plate, and then enters a polarization splitting prism for beam splitting; reflected light S of the polarization splitting prism enters a first objective lens after being reflected by a first reflector and a first dichroscope, and emergent light P enters a second objective lens after being reflected by a second dichroscope; the second reflecting mirror is arranged in an S light path passing through the second dichroscope; the plano-convex lens is arranged in front of the imaging camera and is coaxial with the imaging camera; an imaging sheet fixed on the single-axis displacement platform can be moved in and out in a light path; according to the method, an imaging sheet is moved out or introduced between objective lenses which are coaxially mounted, and a light blocking sheet is moved out and introduced in an S light path, so that respective imaging of two beams of light can be realized, the radial space center position of a correlation light beam can be directly observed, and the alignment adjustment efficiency of the light trap is improved.

The invention discloses a three-channel homodyne interferometer signal processing device and method for suppressing non-orthogonal errors. The device comprises a single-frequency laser, a polarization splitting prism A, a 1 / 4 wave plate A, a first reflector, a 1 / 4 wave plate B, a second reflector and an interference signal resolving module. Wherein the polarization splitting prism A is located at the output end of the single-frequency laser; a 1 / 4 wave plate A and a first reflector are sequentially arranged in parallel in the direction of reflected light; and a 1 / 4 wave plate B and a second reflecting mirror are sequentially arranged in parallel in the transmission light direction. On the premise of repeatedly measuring the non-orthogonal angle, the non-orthogonal error of the interference signal is corrected in the analog operation process by electrically adjusting the amplitude of the interference signal.

The invention discloses a rheology-birefringence combined in-situ testing device and method based on chopper rotation frequency signals, belongs to the technical field of optical testing, and aims to solve the technical problems that an existing Spark-FB device is low in measurement accuracy and limits application scenes. The laser emitter emits a light beam along a set angle (forming an angle of 45 degrees with the horizontal plane), the light beam is converted into linearly polarized light through the polarizer, and an optical signal is modulated through the rotating chopper; the modulated light beam penetrates through a polymer sample to which a shear flow field is applied by a commercial rheometer, and transmission light carrying optical anisotropy information of the sample sequentially passes through a 1 / 4 wave plate and a polarization analyzer, and is finally received by a photoelectric detector and transmitted to a lock-in amplifier for analysis. According to the invention, an independent datum reference signal is provided through the chopper, decoupling and combination of a commercial rheometer and a birefringence light path are realized, and synchronous and accurate in-situ measurement of rheological and optical properties of a high polymer material under a deformation condition can be realized.

The application discloses a laser cavity diagnosis device and method based on double-frame delay synchronization phase shift, which comprises an excitation module and a detection module; the excitation module comprises a first laser, a first 1 / 2 wave plate, a polarization beam splitter prism, a beam splitter, an energy meter, a convex lens and a water tank; the detection module comprises a second laser, a beam expander lens group, a second 1 / 2 wave plate, a second polarization beam splitter prism, a third 1 / 2 wave plate, a first reflector, a second reflector, a fourth 1 / 2 wave plate, a third polarization beam splitter prism, a third reflector, a fourth polarization beam splitter prism, a first 1 / 4 wave plate, a first imaging lens, a first micro-polarization camera, a second 1 / 4 wave plate, a second imaging lens and a second micro-polarization camera. The application introduces a double-frame delay method in the traditional synchronous phase shift interference, overcomes the defects of the existing cavity detection technology, and realizes the observation of the instantaneous phase change in a single cavity pulsation period.