Embodiments in accordance with the thin film write head of the present invention have a
lower pole structure, an upper pole structure, and a multilayer write gap extending from an
air bearing surface between the upper and
lower pole structures. In preferred embodiments, the write gap comprises at least two of: (a) a first layer covering a
lower pole tip portion of the lower pole structure, (b) a second layer covering turns of a
semiconductor winding, or (c) a third layer covering a winding insulation stack. In more preferred embodiments, the write gap is formed of the first, the second, and the third write gap
layers. An
advantage of a write head with a multilayer write gap is that it allows better control of write gap thickness. As such, loss of write gap thickness can be compensated for by deposition of the second write gap
layers, or by deposition of the third write gap layer. Some embodiments have one or more additional advantages in providing increased
corrosion prevention, improving the integrity of conductor insulation, and / or improving the top pole magnetic material characteristics.