The invention relates to a device and a method for detecting a force thermal magnetic
coupling action of a ferromagnetic thin film, and belongs to the technical fields of
engineering materials, structure deformation and mechanical experiments. The device comprises a ferromagnetic thin film uneven stress measuring optical circuit, a film magnetic hystersis loop measuring optical circuit, a
Helmholtz coil and a power supply thereof, a test piece heating table, a thermocoupler, a force loading structure and an adjusting bracket. The film uneven stress measuring optical circuit comprises a
laser, a
beam expander, a spectroscope, a reflector, a raster, a lens, a filtering screen and a
CCD camera; and the film magnetic hystersis loop measuring optical circuit comprises a
laser, a
beam expander, a reflector, a
polarizer, a polarization analyzer and a
photodetector. The method utilizes the
Helmholtz coil to provide an even
magnetic field for the ferromagnetic thin film, utilizes the test piece heating table to heat the film, utilizes the force loading structure to carry out force loading on the film, utilizes shearing interference to measure uneven curvature of the surface of the film and further obtain the stress of the film through the curvature, and utilizes Kerr magnetooptical effect on the surface of the ferromagnetic thin film to measure a magnetic hystersis loop of the film.