Interdigital capacitor sensor for cereal moisture percentage

A technology of interdigitated capacitance and moisture content, applied in the direction of material capacitance, etc., can solve problems such as being susceptible to interference and unable to measure the moisture content inside grains, and achieve the effects of improving sensitivity, realizing non-contact measurement, and being easy to use

Inactive Publication Date: 2009-08-05
南通艾林电子科技有限公司
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Although this method can realize non-contact measurement, it cannot measure the moisture content inside the grain because the reflected wave only reflects the moisture content on the surface of the grain
At the same time, many substances in the environment can emit infrared radiation to the outside, and this method is susceptible to interference during the measurement process

Method used

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  • Interdigital capacitor sensor for cereal moisture percentage
  • Interdigital capacitor sensor for cereal moisture percentage
  • Interdigital capacitor sensor for cereal moisture percentage

Examples

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Effect test

Embodiment 1

[0021] Interdigitated capacitance grain moisture content sensor, its composition comprises: base 1, described base connects cover plate 2, described base connects circuit board 3, described base two ends connect SMA connector 4, described circuit board is A polytetrafluoroethylene substrate 5 with a dielectric constant of 2.2 is coated with a copper plating layer with a thickness of 0.017mm on the upper and lower surfaces of the substrate, and an interdigitated capacitor 6 is processed on the copper plating layer on the upper surface. The copper plating layer 7 on the lower surface exposes the substrate non-uniformly from the inside to the outside, and the exposed shape is a square 8 .

Embodiment 2

[0023] Interdigitated capacitance grain moisture content sensor, its composition comprises: base 1, described base connects cover plate 2, described base connects circuit board 3, described base two ends connect SMA connector 4, described circuit board is A polytetrafluoroethylene substrate 5 with a dielectric constant of 2.2 is coated with a copper plating layer with a thickness of 0.017mm on the upper and lower surfaces of the substrate, and an interdigitated capacitor 6 is processed on the copper plating layer on the upper surface. The copper plating layer 7 on the lower surface exposes the substrate non-uniformly from the inside to the outside, and the exposed shape is a square 8 .

[0024] In the interdigitated capacitance grain moisture sensor, the base is made of copper or aluminum, the inner surface is plated with gold, the surface roughness is Ra<160, and Rz<6.3.

[0025] For the interdigitated capacitance grain moisture content sensor, the cover plate is made of poly...

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Abstract

The invention discloses an interdigital capacitance grain water content sensor aiming at overcoming the defects that the prior grain water content sensor uses infrared spectrum to irradiate grain, can not measure the grain water content and is easy to disturb in the grain water content measurement process. The interdigital capacitance grain water content sensor comprises a pedestal (1) which is connected with a cover plate (2) and a circuit board (3); two ends of the pedestal (1) are connected with SMA connectors (4); the circuit board (3) is a polyfluortetraethylene baseplate (5) with the specific inductive capacity being 2.2; the upper surface and the lower surface of the polyfluortetraethylene baseplate (5) are coated with copper coatings with the thicknesses of 0.017 mm; the copper coated on the upper surface is provided with an interdigital capacitor (6), and the copper coated on the lower surface unevenly protrudes from the polyfluortetraethylene baseplate (5) from inside to outside to form a square shape (8). The invention is used for measuring the grain water content.

Description

Technical field: [0001] The invention relates to an interdigitated capacitance grain moisture content sensor. Background technique: [0002] The moisture content of grain is an important parameter to evaluate its quality, and it is necessary to monitor the moisture content of grain during processing and storage. The traditional grain moisture content sensor uses infrared spectrum to irradiate the grain, and judges the moisture content of the grain by the energy of the reflected wave. Although this method can realize non-contact measurement, it cannot measure the internal moisture content of the grain because the reflected wave only reflects the moisture content of the grain surface. At the same time, many substances in the environment can emit infrared radiation to the outside, and this method is susceptible to interference during the measurement process. Invention content: [0003] The purpose of the present invention is to provide an interdigitated capacitive grain moi...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N27/22
Inventor 孙来军杨国辉
Owner 南通艾林电子科技有限公司
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