122 results about "Micrometer scale" patented technology

Devices and methods for driving a micrometer are provided. The device includes a body, a collet, a motor, and a controller. The body is configured to be coupled to a frame of the micrometer. The collet is configured to be coupled to a ratchet of the micrometer and to rotate the ratchet. The motor is coupled to the collet and rotates the collet to rotate the ratchet. The controller controls operation of the motor.

The invention is suitable for the technical field of additive manufacturing, and provides a multi-laser power monitoring method for the field of additive manufacturing, which comprises the following steps: power calibration in a non-processing state, periodic monitoring in a printing process and power abnormity closed-loop adjustment. In the invention, the hardware cost is obviously reduced; the maintenance cost is greatly reduced; the laser state has no interference; the material adaptability is high; the monitoring precision is high; abnormal response is timely; alignment is verified through the voltage signal amplitude, manual micrometer calibration (2 hours per time in the existing scheme) is not needed, the alignment time is shortened to 10 minutes per time, and the operation efficiency is improved by 12 times; carrying out data visualization; and the laser quantity is adaptive.

The present invention discloses a substrate structure for surface-enhanced Raman scattering at an off-site and its near-field detection method. The Raman scattering substrate structure includes a substrate and two-dimensional nanosheets assembled on the substrate by a self-assembly method. The two-dimensional nanosheets are polygon structures made of a metal material with surface plasmon characteristics and having at least a pair of parallel end faces. The thickness of the two-dimensional nanosheets is in the nanometer scale, while the side length is in the micrometer scale. When one end face of the two-dimensional nanosheet is excited by an excitation light source, a surface plasmon signal that travels along the surface of the nanosheet is formed and finally output at the other end face parallel to it. The emitted signal interacts with the analyte molecules, and Raman signals are formed at positions different from the excitation light source, thereby preventing the analyte molecules from decomposing due to the irradiation of a high-density light intensity excitation light source. At the same time, the off-site acquisition of Raman signals also avoids the interference of the excitation light source.

The utility model discloses a dial indicator interval calibration device, which belongs to the technical field of dial indicator calibration and comprises a testing fixture base, a micrometer support frame is arranged on one side in the testing fixture base, a micrometer body is arranged at the upper end of the micrometer support frame, an L-shaped support frame is arranged on one side of the micrometer support frame, and the L-shaped support frame is arranged on the other side of the micrometer support frame. The upper end of the L-shaped supporting frame is provided with a fixed clamping plate, one side of the fixed clamping plate is provided with a dial indicator body, fastening bolts corresponding to the L-shaped supporting frame and the micrometer supporting frame are arranged in the testing fixture base, and an adjusting clamping assembly is arranged in the L-shaped supporting frame; according to the utility model, the micrometer is in butt joint with the dial indicator, and then the dial indicator is calibrated by adjusting the micrometer, so that the reading synchronization of the micrometer and the dial indicator is ensured, the calibration convenience and accuracy of the dial indicator are ensured, the working efficiency is improved, the adjusting and clamping assembly is arranged, the dial indicator can be conveniently clamped and fixed, and the detection efficiency is improved. The working quality is ensured.

This utility model discloses a micrometer with a support mechanism, relating to the field of micrometer technology. It includes a micrometer and an auxiliary support assembly. The micrometer includes a frame, a protruding block, and a rotating groove. The auxiliary support assembly includes a concave support plate and a rotating connector. The concave support plate is symmetrically attached to both sides of the frame and the protruding block. The rotating connector is fixed to the bottom of one side of the concave support plate and is rotatably connected to the inside of the rotating groove via a rotating rod. The two concave support plates rotate and unfold around the center of the rotating connector, providing support for the placement of the micrometer. This utility model, by setting up the auxiliary support assembly, allows the micrometer to be stably placed on a workbench for use. Furthermore, when the auxiliary support assembly is folded up, it does not affect the handheld operation of the micrometer, making it easy to carry and store.

A rack alignment device comprises a connecting rod, a vertical wire component, a micrometer and a prompt circuit, the vertical wire component is in insulation connection with a rack through the connecting rod, the vertical wire component keeps a state perpendicular to a horizontal plane, one end of the micrometer is assembled on the rack, and the other end of the micrometer is assembled on the rack. The other end of the micrometer extends towards the direction where the vertical wire component is located, the extending length of the connecting rod is consistent with the extending length of the connecting rod, and the vertical wire component is connected with the rack through the prompt circuit. According to the rack alignment device, when the rack is adjusted, the vertical wire guide component can be kept in a state perpendicular to the horizontal plane all the time, the leveling result is judged according to the contact condition of the micrometer and the vertical wire guide component by means of the prompt of the prompt circuit, operation is easy, skilled workers are not needed, and the leveling efficiency is high.

The utility model discloses a conductive contact signal method measuring device, which comprises a support, a magnetometer seat, a micrometer, an insulating part, a conductive part and an indicator, the magnetometer base is installed on one side of the support, one end of the micrometer is installed on the other side of the support in an insulating mode through the insulating part, the other end of the micrometer is an adjustable telescopic end, the conductive part is in contact connection with the micrometer and is separated from the support through the insulating part, and the indicator is electrically connected with the conductive part through a wire. The device can complete measurement only through single-person single-hand operation, and is simple in adjustment and high in measurement precision.

The invention discloses a calibration device and method for calibrating the parallelism of a measuring surface of a large outside micrometer. The device comprises a mechanical adjustment module, an optical imaging module and an image processing and calculating module, the mechanical adjusting module is used for adjusting the position of the micrometer; the optical imaging module comprises an autocollimator and a double-turning prism system, a high-resolution area array detector is arranged in the autocollimator, the double-turning prism system divides a single-path collimated light beam emitted by the autocollimator into two paths, the two paths of collimated light beams are respectively projected to two measuring surfaces of a micrometer and receive reflected light of the two paths of collimated light beams, and two independent cross images are formed on the detector; the image processing and calculating module displays a view field containing two cross images in real time, sets one image as a reference zero position, calculates the angle deviation of the other image relative to the reference zero position in the X direction and the Y direction, and converts the angle deviation into a linear parallelism deviation value. The method can realize non-contact, automatic and visual calibration in the whole process, and has the characteristics of high precision, high efficiency and high repeatability.

The application provides a preparation method and a centering device of a size-controllable ultrathin high-quality echo wall optical crystal microcavity, and the method comprises the following steps: cutting a crystal material into a wafer and grinding and thinning the crystal thickness by using a polishing disc; placing an optical crystal microcavity blank on a microscope stage, adjusting two-dimensional adjustment knobs of the stage, and making the center of the optical crystal microcavity blank coincide with an origin of an objective micrometer scale; making a clamping rod with an adhesive adhered to a bottom end penetrate a top end through hole of a clamping rod fixing frame, and making the clamping rod align with the origin of the objective micrometer scale; adjusting the height of the clamping rod, making the optical crystal microcavity blank be pasted and fixed on the bottom end of the clamping rod by ultraviolet curing glue, and completing centering; taking the clamping rod off the clamping rod fixing frame, chamfering an outer circle of the optical crystal microcavity blank; grinding the outer circle surface of the optical crystal microcavity wafer by using sandpaper; polishing the optical crystal microcavity wafer, and obtaining the optical crystal microcavity based on the polished optical crystal microcavity wafer.

The invention discloses a photoacoustic detection imaging system and method based on optical waveguide resonance sensing. The imaging system comprises a detection light source, a polarization assembly, a first focusing lens, a prism, an objective lens, a sensor, a spectroscope, a first polarization detection assembly, a second polarization detection assembly, a photoelectric detector, an exciting light source, a lens assembly, a first reflector, a second focusing lens, a second reflector, a two-dimensional mobile platform and an imaging processing terminal. The sensor is an optical waveguide resonance sensor. According to the imaging system, the combination of the sensor of the tightly limited detection electric field with extremely strong optical resonance and the coupling medium is arranged, so that the imaging system has ultra-high sensitivity and large-bandwidth photoacoustic detection capability; the exciting light irradiates the sample to generate the photoacoustic signal and acts with the coupling medium to obtain the detection light beam based on the light beam change, so that the photoacoustic microscopic imaging in a reflection mode can be realized, the three-dimensional microscopic imaging in a micrometer scale can be realized regardless of the thickness of the sample, and the depth resolution and the quality of the imaged image are greatly improved.

The invention discloses a high-precision straightness inspection device and method for a linear component, relates to the field of measurement of slender stepped shaft type linear components, and solves the problem of inaccurate measurement caused by gravity deformation, incapability of free rotation and inconformity with vertical use conditions in existing horizontal measurement. The device comprises a rotary measuring mechanism and a laser image projection measuring tool, the rotary measuring mechanism is composed of a segmented positioning frame, a split locking disc, a rotary workbench and the like, vertical fixation and middle section reference transfer of a linear component are achieved, and the lower section coaxiality is measured in cooperation with a depth micrometer; the laser projection device comprises a laser light source, a receiving target and a control unit and drives a component to rotate through a rotary workbench, and laser projection captures upper-section swing deviation. According to the method, straightness detection is completed through reference adjustment and segmented measurement. The method fits the actual working condition, the measurement precision of the lower section is less than or equal to 0.005 mm, the measurement precision of the upper section is less than or equal to 0.002 mm, the measurement time of a 4m part is less than or equal to 30 minutes, and the method is adaptive to phi 12-phi 30 parts and is suitable for high-precision detection of vertical linear parts.

The utility model discloses a supporting platform for a chip detection device, which comprises a base, a platform body and two micrometers, ruler frames of the two micrometers are respectively fixed at two ends of the base, the platform body is positioned above the base, two ends of the platform body are respectively and movably connected with mandrels of the two micrometers, and the two mandrels of the two micrometers are respectively and fixedly connected with the base. The table body is connected with one of the two micrometers in a sliding and rotating mode, and the table body is connected with the other one of the two micrometers in a rotating mode. According to the supporting platform for the chip detection device, the chip detection device is installed on the platform body, the installation height of the chip detection device installed on the platform body can be adjusted through the arrangement of the two micrometers located at the two ends of the platform body, operation is easy, accuracy is high, and a good chip testing effect is guaranteed.

Essentially, an invention deals with a method for performing a process on a part. (P) which is made from a group of ferrous metals consisting of: The nitriding action that forms on the part(P) is a composite layer(2) of considerable thickness. Between 5 and 30 micrometers and the diffusion area (3) which is located below and Contact with the composite layer (2) with a thickness between 100 micrometers and 500 micrometers; Next, The operation of wet hardening of part (P) by induction at high frequency throughout. A deep induction hardening of 0.5 mm or more is required for this process. The part (P) and it is to make that part (P) have: Surface hardness greater than or equal to 50HRC. Hardness of the aggregate layer (2) greater than or equal to 400HV0.0s, The hardness of the part is greater than or equal to 500HV0.05 at a depth of 500. micrometer, And since the high-frequency induction hardening process is performed without... Apply a protective film to the part (P) before induction hardening. The invention also involves a part (P) which is made of ferrous metals. Significant resistance to wear by abrasion and adhesion; possesses friction properties. And it has improved scratch resistance and excellent corrosion resistance;

1. Name of the product in this design: Grip part of a micrometer retainer. 2. Application of this design: The entirety containing the claimed partial design is used as a micrometer retainer, and the claimed partial design is used as the grip of the micrometer retainer. 3. The key design features of this product are the shape of the solid lines. 4. The image or photograph that best illustrates the design's key points: a 3D model. 5. Other situations requiring explanation: Solid lines represent the parts that require protection, dashed lines represent the parts that do not require protection, and single-dot lines represent the boundary between the parts that require protection and the parts that do not require protection.

The invention relates to a tool and method for measuring the diameter between pockets of an integral window type retainer, and belongs to the technical field of retainer measurement, the tool comprises a measuring platform and two sets of measuring tools, each measuring tool comprises a base, a connecting plate and a standard disc, the bearing surface of the measuring platform is in a horizontal state, and the bearing surface of the measuring platform is in a horizontal state. The base is arranged on a measuring platform, the connecting plate is fixedly arranged on the base, the standard disc is arranged on the connecting plate and located above the base, and the standard disc is used for entering a pocket and pressing a pressing slope surface of the pocket; the device further comprises a tube ruler, the tube ruler comprises a mounting rod and two micrometers arranged on the mounting rod, the mounting rod is used for being erected on the holder, the two micrometers are located on the two sides of the mounting rod, and testing needles of the micrometers are parallel to the mounting rod and used for abutting against the peripheral wall of the standard disc. The method has the advantage of improving the accuracy of measured data.

The utility model discloses an ice skate blade sharpening frame, belongs to the technical field of ice skate blade maintenance, and aims to solve the problem that the conventional ice skate blade sharpening frame cannot meet the requirement of adjusting the clamping height of an ice skate blade. Comprising a box body, a first fixing plate, a movable clamping plate and a second fixing plate are sequentially arranged from front to back, the first fixing plate and the second fixing plate are connected with the box body through a guide rail set, and the movable clamping plate is in sliding fit with the guide rail set; the first fixing plate is provided with two micrometer leveling devices, the movable clamping plate is provided with two micrometer leveling devices, and the micrometer leveling devices are the rest parts of the outer diameter micrometer without the ruler frame and the measuring anvil. And micrometric screw rods of the four micrometer leveling devices upwards face the four cracks in a one-to-one correspondence manner. According to the utility model, the alignment height of the ice skate blade is adjusted through the micrometer leveling device, the adjustment precision is high, and the two ground ice skate blades are good in levelness.

The utility model discloses a pinhole adjusting frame, include: fixed plate, adjusting plate, along the thickness direction of fixed plate floating setting in fixed plate, mount pad, activity setting in adjusting plate, and mount pad is used for installing pinhole board, a plurality of first micrometer, install in adjusting plate, and the end of first micrometer is in abutted cooperation with mount pad, so that the position of mount pad is adjusted along the length direction of fixed plate, a plurality of second micrometer, install in adjusting plate, and the end of second micrometer is in abutted cooperation with mount pad, so that the position of mount pad is adjusted along the width direction of fixed plate, a plurality of third micrometer, and third micrometer is connected to fixed plate and adjusting plate respectively, and a plurality of third micrometer cooperation, so that the position of adjusting plate is adjusted along the thickness direction of fixed plate. Realize pinhole three -dimensional high accuracy quantifiable adjustment, low in cost, easy operation, solve the low precision of manual adjustment and the difficult problem of expensive piezoelectric scheme, and it is widely applicable to industrial and laboratory scene.

The utility model discloses a soil observation micro-scale, and belongs to the technical field of soil sampling analysis. The ruler comprises a ruler body, a marking assembly and a fixing assembly, an observation groove is formed in the middle of the ruler body, and the observation groove penetrates through the ruler body and is arranged in parallel in the length direction of the ruler body; the marking assembly comprises first scales and second scales which are used for measuring the length, the first scales are arranged on the two sides of the ruler body, and the second scales are arranged on the edge, opposite to the observation groove, of the ruler body; the fixing assembly comprises at least two fixing holes, the fixing holes are formed in one end of the ruler body, and the fixing holes are used for assisting the ruler body to be fixed to the soil profile. According to the utility model, the soil sampling and analyzing process can be simplified, and a user can conveniently fix and observe the ruler body independently.

1. The name of the design product: digital micrometer. 2. The use of the design product: the design product is used for measurement. 3. The design points of the design product: in shape. 4. The picture or photo that best indicates the design points: perspective view.

The utility model provides a kind of concrete shrinkage test device, including support platform, the top two ends of support platform are symmetrically connected with first mounting bracket, the top of first mounting bracket is slidably connected with support seat, the top of support seat is connected with first micrometer, and slidingly connected with clamping plate between two first micrometers, first connecting rod is tightly connected on the side of clamping plate mutually far away, and first connecting rod and the detection end of first micrometer are coaxially arranged;Multiple second mounting brackets with rectangular distribution of first mounting bracket are slidably connected on support platform, second connecting rod is slidably connected on second mounting bracket, and the bottom of second connecting rod is coaxially connected with second pressing plate.The utility model can stably place concrete test block, when concrete test block changes, multiple micrometers can be monitored, and clamping plate and second mounting bracket can be synchronously slid, to improve the accuracy of detection data.

A parallelism measuring device for a large-size outside micrometer belongs to the technical field of measuring instruments and comprises a micrometer body, mounting seats are arranged at two ends of the micrometer body, an upper measuring head is arranged on the mounting seat at one end of the micrometer body, and a lower measuring head is arranged on the mounting seat at the other end of the micrometer body. A measuring assembly is arranged between the upper measuring head and the lower measuring head. The measuring assembly comprises a dial gauge arranged between the upper measuring head and the lower measuring head, the bottom of the dial gauge is provided with a detection probe, the bottom of the detection probe is connected with a detection rod, the bottom of the detection rod is connected with a second connecting piece, the dial gauge is provided with a first connecting piece, and the first connecting piece is connected with the upper measuring head on the micrometer body. And the second connecting piece is connected with the lower measuring head on the micrometer body. A user can conveniently detect the parallelism of two measuring surfaces of the measuring head through the measuring assembly, and the user can conveniently observe the change of a pointer on a dial plate of the dial gauge in real time through the reflection mechanism in the detection process.

The application provides an improved device for testing the water thickness expansion rate of artificial boards and veneer artificial boards, comprising a test table, a cabinet fixedly installed at the lower part of the test table, a drawer pull-installed at one side of the cabinet, a vernier caliper and a micrometer placed in the drawer, a weighing scale, a constant temperature and humidity test box and a controller placed in the cabinet, a mounting bracket fixedly installed at the upper left side of the test table, a laser detector assembly arranged in cooperation with the mounting bracket, an immersion tank fixedly embedded in the test table, and a rectangular slot for passing through the immersion tank formed in the upper part of the cabinet. The double-end screw rod is driven to rotate by rotating the screw nut, so that the moving block moves along the slide rail. After the test piece is inserted into the upper frame and the lower frame, the outer end of the jacking rod abuts against the test sample, so that the test sample is vertically immersed into the immersion tank, the test piece is separated from the inner wall of the immersion tank, the test piece is more fully contacted with water, and the test is more in line with the test standard.

The utility model discloses a steel column depth rapid comparison measuring device which comprises a gauge stand, a through hole is arranged on the upper surface of the gauge stand, a dial gauge is arranged below the gauge stand, a fixing rod of the dial gauge penetrates into the through hole from bottom to top, a measuring rod of the dial gauge extends upwards and forms a measuring area with the outer surface of the through hole, and the dial gauge is arranged in the measuring area. The cover plate is arranged on the surface of the gauge stand, and the steel column extrudes the outer end of the measuring rod to achieve size measurement and judgment. According to the utility model, the accurate numerical value of the depth of the steel column can be rapidly and accurately detected, and the problems of low measurement precision, high requirement on measurement personnel and low measurement efficiency of a general micrometer are solved.

The application belongs to the field of physical optical measurement, and particularly relates to a double-slit interference experiment device. The device comprises an optical platform, a first sheet element, a second sheet element, a first clamping groove, a second clamping groove and a micrometer. The first sheet element comprises spaced light-transmitting areas and non-light-transmitting areas. The second sheet element comprises spaced non-light-transmitting areas and light-transmitting areas. The two sheet elements are close to each other and are fixed on the first clamping groove and the second clamping groove respectively. The first clamping groove is fixed on the platform. The micrometer comprises a micrometer screw, a knob and a scale and is fixed on the platform. The end of the micrometer screw is connected with the end of the second clamping groove close to the fourth non-light-transmitting area. When the knob is rotated, the micrometer screw drives the second clamping groove to move along the axis of the micrometer screw. The light-transmitting areas and the non-light-transmitting areas of the two sheet elements are staggered to form a double slit. Compared with the prior art, the application has the advantages that the precise adjustment of the width of a single slit and the distance between double slits can be realized simultaneously, and the occurrence of the phenomenon of missing steps can be effectively avoided.

The utility model provides a spatial multi-coaxiality integrated detection device for incomplete narrow spherical parts, which comprises a platform base 1, an inner cylindrical surface measuring stand column 2, an inner spherical surface measuring stand column 3, an outer cylindrical surface measuring stand column 4 and a dial indicator 5, and is characterized in that two threaded holes are formed in the bottom of a circular inner cavity of the platform base 1, and two 180-degree arc-shaped bosses are arranged above the circular inner cavity of the platform base 1; a threaded hole is formed in the upper surface of the platform, and two small square bosses are arranged on the two sides of the circular-arc-shaped boss. The inner cylindrical surface measuring stand column 2 is a stand column, and a circular perforated structure is arranged on one side of the middle position of the stand column; the inner spherical surface measuring stand column 3 is a stand column, and a circular perforated structure is arranged on one side of the middle position of the stand column; the outer cylindrical surface measuring stand column 4 is a stand column, one side of the middle lower position of the stand column is provided with a circular structure with a hole, and a micrometer 51 is installed in the hole.

This utility model relates to the field of micrometer base technology and discloses a base structure for fixing a micrometer, including a base and a micrometer body. Symmetrical mounting plates are fixedly connected to the top of the base, and a rotating shaft is rotatably connected between the two mounting plates. One of the mounting plates is threaded with a fastening bolt for fixing the angle of the rotating shaft. A base plate is fixedly connected to the outer wall of the rotating shaft. A clamping plate is fixedly connected to one side of the top of the base plate, and a movable plate is slidably connected to the top of the base plate on the side of the clamping plate. With this base structure for fixing a micrometer, after the micrometer body is placed between the clamping plate and the movable plate, the movable plate is pushed to clamp the micrometer body with the clamping assembly and the clamping plate. The movable plate is then fixed by a limiting assembly, thus realizing the installation of the micrometer. This not only makes the installation of the micrometer more convenient, but also makes the micrometer more stable after it is installed on the base.

1. Name of the product in this design: Digital Micrometer. 2. Purpose of this design: For measuring length. 3. The key design feature of this product is its shape. 4. The image or photograph that best illustrates the design's key points: 3D view 1.

The invention provides a nano material / structure harmonic measurement-oriented nonlinear optical device and method, and relates to the technical field of optical systems. The device comprises a microscopic imaging light path for imaging samples such as nanometer materials and nanometer structures, and a nonlinear measurement light path for measuring harmonic waves of the samples. Compared with an existing optical system, the device has the advantages of being simple in design, capable of observing the surface morphology of the nanometer materials and the structures, high in expandability, good in stability and the like. According to the utility model, the nonlinear spectrum and nonlinear frequency conversion efficiency of a sample with the scale of hundreds of nanometers or several micrometers can be effectively measured by acquiring a sample image and a transmission nonlinear harmonic signal.

A micrometer head displacement system includes a micrometer head and an imaging portion. The micrometer head includes a coarse scale and a fine scale. The system is configured to: acquire at least one image of the micrometer head from the imaging portion; determine a coarse measurement based at least in part on the at least one image wherein the coarse measurement corresponds to a coarse relative position between the coarse scale and a coarse fiducial line; determine a fine measurement based at least in part on the at least one image and based on calculating an interpolated position of the a fiducial line wherein the fine measurement corresponds to a fine relative position between the fine scale and the fine fiducial line; and determine a micrometer head displacement based at least in part on summing the coarse measurement with the fine measurement.

The invention relates to the technical field of textile material processing equipment, in particular to a textile base material surface sizing material accurate dynamic blade coating device which comprises a rack, a first mounting frame, a second mounting frame, a lifting table, a plurality of micrometers and a plurality of standard tables. According to the accurate and dynamic blade coating device for the sizing material on the surface of the textile base material, the width of the textile base material is recognized through the positioning piece, the position of the textile base material is fixed, and stable conveying is ensured; the servo motor drives the spray head to reciprocate and is matched with the scraping plate to preliminarily flatten the sizing material, so that uniform spraying is realized; the first lifting piece synchronously adjusts the height of the lifting table and the second lifting piece to adapt to different base material thicknesses. The height of the scraping roller and the height of the driving roller can be independently adjusted, the micrometer and the reference table are combined for precise display, the coating thickness of the sizing material is precisely controlled, the scraping coating structure can be dynamically adjusted, the uniformity and efficiency are improved, and the device is suitable for high-precision machining of various base materials.