67 results about "Micrometer scale" patented technology

The invention is suitable for the technical field of additive manufacturing, and provides a multi-laser power monitoring method for the field of additive manufacturing, which comprises the following steps: power calibration in a non-processing state, periodic monitoring in a printing process and power abnormity closed-loop adjustment. In the invention, the hardware cost is obviously reduced; the maintenance cost is greatly reduced; the laser state has no interference; the material adaptability is high; the monitoring precision is high; abnormal response is timely; alignment is verified through the voltage signal amplitude, manual micrometer calibration (2 hours per time in the existing scheme) is not needed, the alignment time is shortened to 10 minutes per time, and the operation efficiency is improved by 12 times; carrying out data visualization; and the laser quantity is adaptive.

The utility model discloses a dial indicator interval calibration device, which belongs to the technical field of dial indicator calibration and comprises a testing fixture base, a micrometer support frame is arranged on one side in the testing fixture base, a micrometer body is arranged at the upper end of the micrometer support frame, an L-shaped support frame is arranged on one side of the micrometer support frame, and the L-shaped support frame is arranged on the other side of the micrometer support frame. The upper end of the L-shaped supporting frame is provided with a fixed clamping plate, one side of the fixed clamping plate is provided with a dial indicator body, fastening bolts corresponding to the L-shaped supporting frame and the micrometer supporting frame are arranged in the testing fixture base, and an adjusting clamping assembly is arranged in the L-shaped supporting frame; according to the utility model, the micrometer is in butt joint with the dial indicator, and then the dial indicator is calibrated by adjusting the micrometer, so that the reading synchronization of the micrometer and the dial indicator is ensured, the calibration convenience and accuracy of the dial indicator are ensured, the working efficiency is improved, the adjusting and clamping assembly is arranged, the dial indicator can be conveniently clamped and fixed, and the detection efficiency is improved. The working quality is ensured.

This utility model discloses a micrometer with a support mechanism, relating to the field of micrometer technology. It includes a micrometer and an auxiliary support assembly. The micrometer includes a frame, a protruding block, and a rotating groove. The auxiliary support assembly includes a concave support plate and a rotating connector. The concave support plate is symmetrically attached to both sides of the frame and the protruding block. The rotating connector is fixed to the bottom of one side of the concave support plate and is rotatably connected to the inside of the rotating groove via a rotating rod. The two concave support plates rotate and unfold around the center of the rotating connector, providing support for the placement of the micrometer. This utility model, by setting up the auxiliary support assembly, allows the micrometer to be stably placed on a workbench for use. Furthermore, when the auxiliary support assembly is folded up, it does not affect the handheld operation of the micrometer, making it easy to carry and store.

The invention discloses a calibration device and method for calibrating the parallelism of a measuring surface of a large outside micrometer. The device comprises a mechanical adjustment module, an optical imaging module and an image processing and calculating module, the mechanical adjusting module is used for adjusting the position of the micrometer; the optical imaging module comprises an autocollimator and a double-turning prism system, a high-resolution area array detector is arranged in the autocollimator, the double-turning prism system divides a single-path collimated light beam emitted by the autocollimator into two paths, the two paths of collimated light beams are respectively projected to two measuring surfaces of a micrometer and receive reflected light of the two paths of collimated light beams, and two independent cross images are formed on the detector; the image processing and calculating module displays a view field containing two cross images in real time, sets one image as a reference zero position, calculates the angle deviation of the other image relative to the reference zero position in the X direction and the Y direction, and converts the angle deviation into a linear parallelism deviation value. The method can realize non-contact, automatic and visual calibration in the whole process, and has the characteristics of high precision, high efficiency and high repeatability.

The application provides a preparation method and a centering device of a size-controllable ultrathin high-quality echo wall optical crystal microcavity, and the method comprises the following steps: cutting a crystal material into a wafer and grinding and thinning the crystal thickness by using a polishing disc; placing an optical crystal microcavity blank on a microscope stage, adjusting two-dimensional adjustment knobs of the stage, and making the center of the optical crystal microcavity blank coincide with an origin of an objective micrometer scale; making a clamping rod with an adhesive adhered to a bottom end penetrate a top end through hole of a clamping rod fixing frame, and making the clamping rod align with the origin of the objective micrometer scale; adjusting the height of the clamping rod, making the optical crystal microcavity blank be pasted and fixed on the bottom end of the clamping rod by ultraviolet curing glue, and completing centering; taking the clamping rod off the clamping rod fixing frame, chamfering an outer circle of the optical crystal microcavity blank; grinding the outer circle surface of the optical crystal microcavity wafer by using sandpaper; polishing the optical crystal microcavity wafer, and obtaining the optical crystal microcavity based on the polished optical crystal microcavity wafer.

The utility model discloses a supporting platform for a chip detection device, which comprises a base, a platform body and two micrometers, ruler frames of the two micrometers are respectively fixed at two ends of the base, the platform body is positioned above the base, two ends of the platform body are respectively and movably connected with mandrels of the two micrometers, and the two mandrels of the two micrometers are respectively and fixedly connected with the base. The table body is connected with one of the two micrometers in a sliding and rotating mode, and the table body is connected with the other one of the two micrometers in a rotating mode. According to the supporting platform for the chip detection device, the chip detection device is installed on the platform body, the installation height of the chip detection device installed on the platform body can be adjusted through the arrangement of the two micrometers located at the two ends of the platform body, operation is easy, accuracy is high, and a good chip testing effect is guaranteed.

Essentially, an invention deals with a method for performing a process on a part. (P) which is made from a group of ferrous metals consisting of: The nitriding action that forms on the part(P) is a composite layer(2) of considerable thickness. Between 5 and 30 micrometers and the diffusion area (3) which is located below and Contact with the composite layer (2) with a thickness between 100 micrometers and 500 micrometers; Next, The operation of wet hardening of part (P) by induction at high frequency throughout. A deep induction hardening of 0.5 mm or more is required for this process. The part (P) and it is to make that part (P) have: Surface hardness greater than or equal to 50HRC. Hardness of the aggregate layer (2) greater than or equal to 400HV0.0s, The hardness of the part is greater than or equal to 500HV0.05 at a depth of 500. micrometer, And since the high-frequency induction hardening process is performed without... Apply a protective film to the part (P) before induction hardening. The invention also involves a part (P) which is made of ferrous metals. Significant resistance to wear by abrasion and adhesion; possesses friction properties. And it has improved scratch resistance and excellent corrosion resistance;

1. Name of the product in this design: Grip part of a micrometer retainer. 2. Application of this design: The entirety containing the claimed partial design is used as a micrometer retainer, and the claimed partial design is used as the grip of the micrometer retainer. 3. The key design features of this product are the shape of the solid lines. 4. The image or photograph that best illustrates the design's key points: a 3D model. 5. Other situations requiring explanation: Solid lines represent the parts that require protection, dashed lines represent the parts that do not require protection, and single-dot lines represent the boundary between the parts that require protection and the parts that do not require protection.

The utility model discloses a pinhole adjusting frame, include: fixed plate, adjusting plate, along the thickness direction of fixed plate floating setting in fixed plate, mount pad, activity setting in adjusting plate, and mount pad is used for installing pinhole board, a plurality of first micrometer, install in adjusting plate, and the end of first micrometer is in abutted cooperation with mount pad, so that the position of mount pad is adjusted along the length direction of fixed plate, a plurality of second micrometer, install in adjusting plate, and the end of second micrometer is in abutted cooperation with mount pad, so that the position of mount pad is adjusted along the width direction of fixed plate, a plurality of third micrometer, and third micrometer is connected to fixed plate and adjusting plate respectively, and a plurality of third micrometer cooperation, so that the position of adjusting plate is adjusted along the thickness direction of fixed plate. Realize pinhole three -dimensional high accuracy quantifiable adjustment, low in cost, easy operation, solve the low precision of manual adjustment and the difficult problem of expensive piezoelectric scheme, and it is widely applicable to industrial and laboratory scene.

The utility model discloses a soil observation micro-scale, and belongs to the technical field of soil sampling analysis. The ruler comprises a ruler body, a marking assembly and a fixing assembly, an observation groove is formed in the middle of the ruler body, and the observation groove penetrates through the ruler body and is arranged in parallel in the length direction of the ruler body; the marking assembly comprises first scales and second scales which are used for measuring the length, the first scales are arranged on the two sides of the ruler body, and the second scales are arranged on the edge, opposite to the observation groove, of the ruler body; the fixing assembly comprises at least two fixing holes, the fixing holes are formed in one end of the ruler body, and the fixing holes are used for assisting the ruler body to be fixed to the soil profile. According to the utility model, the soil sampling and analyzing process can be simplified, and a user can conveniently fix and observe the ruler body independently.

The utility model provides a kind of concrete shrinkage test device, including support platform, the top two ends of support platform are symmetrically connected with first mounting bracket, the top of first mounting bracket is slidably connected with support seat, the top of support seat is connected with first micrometer, and slidingly connected with clamping plate between two first micrometers, first connecting rod is tightly connected on the side of clamping plate mutually far away, and first connecting rod and the detection end of first micrometer are coaxially arranged;Multiple second mounting brackets with rectangular distribution of first mounting bracket are slidably connected on support platform, second connecting rod is slidably connected on second mounting bracket, and the bottom of second connecting rod is coaxially connected with second pressing plate.The utility model can stably place concrete test block, when concrete test block changes, multiple micrometers can be monitored, and clamping plate and second mounting bracket can be synchronously slid, to improve the accuracy of detection data.

A parallelism measuring device for a large-size outside micrometer belongs to the technical field of measuring instruments and comprises a micrometer body, mounting seats are arranged at two ends of the micrometer body, an upper measuring head is arranged on the mounting seat at one end of the micrometer body, and a lower measuring head is arranged on the mounting seat at the other end of the micrometer body. A measuring assembly is arranged between the upper measuring head and the lower measuring head. The measuring assembly comprises a dial gauge arranged between the upper measuring head and the lower measuring head, the bottom of the dial gauge is provided with a detection probe, the bottom of the detection probe is connected with a detection rod, the bottom of the detection rod is connected with a second connecting piece, the dial gauge is provided with a first connecting piece, and the first connecting piece is connected with the upper measuring head on the micrometer body. And the second connecting piece is connected with the lower measuring head on the micrometer body. A user can conveniently detect the parallelism of two measuring surfaces of the measuring head through the measuring assembly, and the user can conveniently observe the change of a pointer on a dial plate of the dial gauge in real time through the reflection mechanism in the detection process.

The application belongs to the field of physical optical measurement, and particularly relates to a double-slit interference experiment device. The device comprises an optical platform, a first sheet element, a second sheet element, a first clamping groove, a second clamping groove and a micrometer. The first sheet element comprises spaced light-transmitting areas and non-light-transmitting areas. The second sheet element comprises spaced non-light-transmitting areas and light-transmitting areas. The two sheet elements are close to each other and are fixed on the first clamping groove and the second clamping groove respectively. The first clamping groove is fixed on the platform. The micrometer comprises a micrometer screw, a knob and a scale and is fixed on the platform. The end of the micrometer screw is connected with the end of the second clamping groove close to the fourth non-light-transmitting area. When the knob is rotated, the micrometer screw drives the second clamping groove to move along the axis of the micrometer screw. The light-transmitting areas and the non-light-transmitting areas of the two sheet elements are staggered to form a double slit. Compared with the prior art, the application has the advantages that the precise adjustment of the width of a single slit and the distance between double slits can be realized simultaneously, and the occurrence of the phenomenon of missing steps can be effectively avoided.

This utility model relates to the field of micrometer base technology and discloses a base structure for fixing a micrometer, including a base and a micrometer body. Symmetrical mounting plates are fixedly connected to the top of the base, and a rotating shaft is rotatably connected between the two mounting plates. One of the mounting plates is threaded with a fastening bolt for fixing the angle of the rotating shaft. A base plate is fixedly connected to the outer wall of the rotating shaft. A clamping plate is fixedly connected to one side of the top of the base plate, and a movable plate is slidably connected to the top of the base plate on the side of the clamping plate. With this base structure for fixing a micrometer, after the micrometer body is placed between the clamping plate and the movable plate, the movable plate is pushed to clamp the micrometer body with the clamping assembly and the clamping plate. The movable plate is then fixed by a limiting assembly, thus realizing the installation of the micrometer. This not only makes the installation of the micrometer more convenient, but also makes the micrometer more stable after it is installed on the base.

1. Name of the product in this design: Digital Micrometer. 2. Purpose of this design: For measuring length. 3. The key design feature of this product is its shape. 4. The image or photograph that best illustrates the design's key points: 3D view 1.

The invention provides a nano material / structure harmonic measurement-oriented nonlinear optical device and method, and relates to the technical field of optical systems. The device comprises a microscopic imaging light path for imaging samples such as nanometer materials and nanometer structures, and a nonlinear measurement light path for measuring harmonic waves of the samples. Compared with an existing optical system, the device has the advantages of being simple in design, capable of observing the surface morphology of the nanometer materials and the structures, high in expandability, good in stability and the like. According to the utility model, the nonlinear spectrum and nonlinear frequency conversion efficiency of a sample with the scale of hundreds of nanometers or several micrometers can be effectively measured by acquiring a sample image and a transmission nonlinear harmonic signal.

A micrometer head displacement system includes a micrometer head and an imaging portion. The micrometer head includes a coarse scale and a fine scale. The system is configured to: acquire at least one image of the micrometer head from the imaging portion; determine a coarse measurement based at least in part on the at least one image wherein the coarse measurement corresponds to a coarse relative position between the coarse scale and a coarse fiducial line; determine a fine measurement based at least in part on the at least one image and based on calculating an interpolated position of the a fiducial line wherein the fine measurement corresponds to a fine relative position between the fine scale and the fine fiducial line; and determine a micrometer head displacement based at least in part on summing the coarse measurement with the fine measurement.

The invention relates to the technical field of gear precision measurement, and discloses a gear cross-rod distance conversion measurement method based on real-time temperature monitoring and thermal expansion coefficient correction, which comprises the following steps of: integrating a temperature sensing assembly at a measurement end of a gear micrometer for acquiring temperature data of a gear measurement point in real time in a cross-rod distance measurement process; a three-dimensional finite element model of the gear is established according to design parameters, material attributes and structural characteristics of the gear, and simulation analysis is performed through thermal-structural coupling. By integrating the temperature sensing assembly at the measuring end of the gear micrometer, synchronous acquisition of the actually measured temperature and cross-rod distance data of the gear is realized, and the actually measured cross-rod distance in a thermal state can be directly converted into a standard value at a target standard temperature in combination with a pre-generated effective thermal expansion coefficient and a cross-rod distance theoretical calculation model. The waiting link that the gear needs to be cooled to the room temperature in a traditional measurement process is thoroughly omitted, and the gear production detection period is greatly shortened.

This invention discloses a method for unsteady-state ultrasonic standing wave-assisted control of fusion welding. It utilizes dual ultrasonic transducers to perform dual-wave interference, forming an ultrasonic standing wave. This ultrasonic standing wave is introduced into the fusion welding process, and its action on the welding area allows for real-time control of the microstructure and properties of different parts of the weld joint. This forms a unsteady-state ultrasonic standing wave with controlled directional movement of the wave packet nodes, which is then used to regulate the microstructure and properties of the weld joint. This invention enables control over the direction and speed of movement of the unsteady-state ultrasonic standing wave wave packet nodes, allowing for regional control of the microstructure and properties of different parts of the weld joint, resulting in a more uniform joint composition and microstructure. It can solve problems such as undercut, burn-through, high residual stress, severe deformation, and columnar crystals that reduce joint performance during the welding of thin materials or fine wires, refining grains and improving joint performance. It can achieve controllable connections from the centimeter scale to the micrometer scale.

This invention discloses a method and system for quantitative analysis of the full-scale microstructure of chloride-containing silty clay, belonging to the field of geotechnical materials mechanics. The method first prepares standard samples and performs CT and NMR tests to obtain microscopic two-dimensional images and microscopic relaxation time distributions. Micrometer-level pore characteristic parameters are extracted based on image processing, and nanometer-level pore characteristic parameters are inverted based on the relaxation mechanism. The two types of parameters are compared and fused, and overlapping data are corrected to generate a full-scale pore size distribution curve covering the nanometer to micrometer scales. The pore size fractal dimension is then calculated through piecewise fitting. This invention integrates the complementary advantages of CT and NMR technologies, overcoming the limitations of single-scale analysis, and achieving integrated, full-scale characterization of the microstructure of saline soils, providing a reliable tool for revealing the evolution mechanism of their macroscopic mechanical properties.

The utility model belongs to the technical field of measurement and detection, and discloses a depth template detection tool, which comprises a base (1), a spring pressing plate (2), a standard square block (3), a pressing block (4), a depth micrometer (5), a detected depth template (6) and a gauge block (7), the base comprises a bottom plate which is horizontally arranged and a vertical plate which is vertically arranged at the left end of the bottom plate; the depth micrometer (5) is arranged at the right end of the bottom plate, the measured depth template (6) and the gauge block (7) are arranged on the bottom plate in parallel, and the left ends of the measured depth template (6) and the gauge block (7) are flush with the right end surface of the standard square block (3); a spring pressing plate (2) is arranged between the left end surface of the standard square block (3) and the vertical plate; the measured depth sample plate (6) is pressed on the bottom plate through the pressing block (4); and the length of the gauge block (7) is the same as the designed length of the measured depth sample plate (6). The device can be applied to the verification work of the depth sample plate, the accuracy of the verification result is improved, and the verification work time is shortened by 30%.

The invention relates to the field of surface treatment, and discloses a method for flattening a contact surface of a contact part and a device with the contact part, and the method comprises the steps: preparing a pressing block; the yield limit of the pressing block is larger than that of a to-be-flattened contact surface on the contact part, and the roughness of the target surface of the pressing block is smaller than the target roughness; the to-be-flattened contact surface is flapped and pressed through a pressing block, the to-be-flattened contact surface is flattened, and the roughness of the to-be-flattened contact surface is reduced to the target roughness; and the target surface is in contact with the to-be-flattened contact surface during flapping and pressing. The roughness of the surface, flapping and pressing the to-be-flattened contact surface, of the pressing block is smaller, and the roughness of the to-be-flattened contact surface can be reduced after flapping and pressing. The yield limit of the pressing block is larger than that of the to-be-flattened contact surface, so that the protrusions on the to-be-flattened contact surface are flattened due to plastic deformation, the micron-scale surface can be processed through single pressing of the pressing block, the processing efficiency is higher, and the method is simple and low in cost.

The utility model relates to the technical field of detection tools, in particular to a spring support detection tool which comprises a base and a supporting seat used for supporting a product, and the supporting seat is arranged on the base. The pedestal is provided with a fast pressing structure used for pressing and fixing a product, a first detection seat used for detecting the size of a first positioning hole, and a second detection seat used for detecting the size of a second positioning hole. The base is further provided with a fast detection structure used for detecting the specification of the fixing column, a detection pin used for detecting the size of the insertion hole, an overturning abutting structure used for detecting the flatness of the arc-shaped face and an insertion structure used for detecting the size of the insertion groove, and the detection pin and the insertion hole are in insertion fit. The detection efficiency of the spring bracket product is obviously improved, and the complexity and the error rate of manual operation are reduced at the same time.

The application relates to a mirror adjusting device, which comprises a vertical mirror, a mirror supported and installed on a vertical mirror base through a third cushion block, a back plate assembled on the vertical mirror base, a fixing device for fixing the third cushion block to stabilize the mirror, a clamping device installed around the back plate, the mirror being clamped on an optical path through the clamping device, the clamping device comprising a first clamping device, a second clamping device and another second clamping device, first top beads and second top beads of the first clamping device being oppositely arranged and matched with the mirror, third top beads and fourth top beads of the second clamping device being oppositely arranged and matched with the mirror, and fifth top beads and sixth top beads of the other second clamping device being oppositely arranged and matched with the mirror. The mirror is clamped by the top beads to realize the fixation of the mirror surface, the control of the movement direction of the clamping points is realized through flexible hinges, the fine adjustment of the action on the clamping points is realized through a micrometer and a lever arm, and the deformation of the plane mirror can be corrected in a large-scale range.

The invention discloses a method for quickly and accurately adjusting the center of a rolling mill housing. The method comprises the following steps: manufacturing a measuring device: manufacturing a long-strip-shaped bracket; mounting a measuring device: respectively mounting a theodolite at proper positions of a central line of a rolling mill housing and a central line of a window, calibrating the theodolites with a central standard plate, mounting the measuring device in the middle of the housing needing to be adjusted, tightly attaching the head of an inside micrometer to the surface of the housing, and enabling the tail of the inside micrometer to be used for observation of the theodolites, a jack is installed at the bottom of the housing needing to be adjusted; and adjusting the center line of the memorial archway and the center line of the memorial archway window: slowly pushing the corresponding jack, so that the rolling mill memorial archway can drive the inside micrometer to slowly move towards the center line of the memorial archway together, and ensuring that the tail parts of the inside micrometers of the two sets of measuring devices coincide with the center line of the theodolite. The problem that a method for rapidly and accurately adjusting the installation position of the rolling mill housing to meet the installation requirement of the rolling mill housing is lacked at present can be solved.

Disclosed example test specimen measurement apparatus include: a first measurement assembly configured to measure a first specimen dimension in a first direction, the first measurement assembly comprising: a first anvil oriented along the first direction; a first micrometer oriented along the first direction and configured to output a first measurement; a first actuator configured to actuate the first micrometer with respect to the first anvil; and a second actuator configured to actuate the first micrometer and the first anvil simultaneously along the first direction; and a second measurement assembly configured to measure a second specimen dimension in a second direction, the second measurement assembly comprising: a second anvil oriented along the second direction; a second micrometer oriented along the second dimension and configured to output a second measurement; and a third actuator configured to actuate the second micrometer with respect to the second anvil.

The present invention relates primarily to the field of 3D interconnection technologies for microelectronics, but also to any application requiring high wettability contrast on the micrometer scale. The proposed method makes it possible to manufacture a wafer (1) having a main surface (10) with solid regions (101) and micro- or nanostructured regions (102) having a wettability contrast between them of greater than 90°, preferably greater than 120°, each structured region (102) extending around the solid region (101), the wafer comprising a substrate (11) having a first level (111) mainly made of a semiconductor material and a second level (112) mainly made of a dielectric material, the solid regions and each structured region being formed on the second level of the substrate, each structured region having a plurality of protrusions (131) mainly made of said dielectric material, the wafer being such that the protrusions have faceted edges.

This invention relates to a method for measuring the thickness of the base metal of a corrugated beam steel guardrail. The measuring device mainly consists of a main structure, a data acquisition system, a display system, an operation button system, a plate thickness display device, a measurement adjustment device, and measurement acquisition and analysis software. Compared with the traditional method of using a micrometer and coating thickness gauge, which involves two separate measurements after determining the position, this device, based on the principle of a micrometer screw gauge and magnetic thickness measurement technology, achieves integrated measurement of the base metal thickness of the corrugated beam steel guardrail to meet actual testing needs. This avoids introducing errors, making the testing process simpler, more efficient, and more accurate, and has good applicability.

The invention provides a solution refractive index real-time detection method based on amplification imaging and machine vision, and the detection method comprises the following steps: step A, illuminating light emitted by an illuminating light source irradiates a micro-scale to form light carrying micro-scale information, and then the light passes through a sample flow cell and a hollow glass block in sequence, so that the refractive index of a solution is detected; the light is emitted to the image sensor; b, the emitted light is imaged on an image sensor, image information of a microscale on the image sensor is recorded, the image sensor is driven to move through a focusing algorithm until the image formed by the microscale is a clear image, and the axial position of the image sensor is recorded; analyzing the solution refractive index according to the relational expression of the axial position of the image sensor and the solution refractive index; and step C, analyzing the object image magnification times of the imaging system on the microscale through the imaging size of the microscale on the image sensor, inverting the solution refractive index, and comparing the solution refractive index with the solution refractive index obtained in the step B to improve the measurement redundancy of the system.