The invention discloses a detection
algorithm for dynamic faults of a memory, and aims to realize 100% coverage of all non-associated static faults (including single-unit faults and
coupling faults), non-associated dynamic single-unit faults (SCF) and Saa / Svv type double-unit dynamic faults (DCF). Based on the analysis of a
system fault model, the designed March YZ
algorithm is integrated with an optimized operation sequence, on the premise of reserving the fault activation,
sensitization and detection capabilities, detection sequences of dTF, dWDF, dCFtr and dCFwd type dynamic faults are emphatically adjusted, and redundant read-write cycles are eliminated. The complexity of the March YZ
algorithm is only 62n, is reduced by 8n compared with the existing March MD2 (70n), and is reduced by 4n compared with the March WY (66n); the test time is reduced by 11.4% and 6.1% respectively while full
fault coverage is realized, the operation
energy consumption of a memory is reduced by 5-15%, the area overhead of an MBIST circuit is reduced, and the method is adaptive to advanced process SoC (
System on
Chip) of 5nm and below, and can be applied to high-reliability scenes such as
automotive electronics, aeronautics and
astronautics, industrial control and the like.