17 results about "Sample Measure" patented technology

An online monitor is provided including a sensor to measure current through a circuit breaker trip coil, and a processor configured to sample reference samples from the sensor during a first tripping sequence to generate a reference trip coil current signature waveform (“TCCSW”), compute a reference sample value for each reference sample, and add the reference sample values corresponding to a reference area to determine a reference area value. The processor is further configured to respond to detection of a second tripping sequence by sampling measured samples from the sensor to generate a measured TCCSW, computing a measured sample value for each measured sample, adding the measured sample values corresponding to a measured area to determine a measured area value, and determine whether a difference percentage between the reference area value and the measured area value exceeds an alarm limit.

This invention relates to the field of material production equipment technology, and more particularly to a material conveying device and its detection method with detection function. The device includes: a material conveying line, an online sampling mechanism, a metering hopper, a screening mechanism, a detection module, and a sample conveying mechanism. A portion of the material is sampled on the material conveying line as an inspection sample, which is then passed through the screening mechanism to be screened into the metering hopper. The metering hopper discharges material to the sample conveying mechanism, where it passes through the detection module to detect the sample data. The weight of the metering hopper and the particle size distribution of the sample measured by the detection module provide feedback on the quality of the particulate material based on the ratio of the individual volume quantity data to the sample data. This invention enables automatic sampling, separation, filtering, and detection of materials, thereby quickly and accurately obtaining the quality index of the proportion of non-compliant particles in the material, facilitating the monitoring and control of particulate material quality.

The present invention provides a sample composition estimation method and its device, a learning method and a recording medium. The sample composition estimation method comprises the following steps: obtaining a spectrum of a sample measured by a wavelength dispersion type X-ray analysis device (100); determining an analysis target element of the sample and an input wavelength range corresponding to the analysis target element; and inputting a spectrum of the input wavelength range in the spectrum of the sample into a first learning completion model (44) to estimate the chemical bonding state of the analysis target element in the sample.

This application provides a sample analysis system, which includes a sample measuring device and a control device. The control device is configured to: acquire sample information of each of a plurality of samples to be tested that are loaded onto the sample measuring device; mark one or more of the plurality of samples to be tested based on the information content of the sample information or in response to a first user operation on the sample information; and output a first control command after detecting that the sample measuring device has output test data of any marked sample on one or more test items; wherein the first control command is used to control one or more devices to output a first prompt message, the first prompt message being used to prompt that the marked sample to be tested has completed the test in the sample measuring device.

The present application provides a flow path cleaning method for an automatic sampler, which can balance the decrease of analysis throughput and the increase of cleaning solution consumption. In a flow path cleaning process (S12), when a cleaning solution is supplied by a cleaning solution supply mechanism to a flow path switched by a flow path switching mechanism among a first flow path including a nozzle for sucking a sample and a sample ring for holding the sample sucked from the nozzle, and a second flow path including a cleaning tank for cleaning at least an outer wall of the nozzle, a control device changes a flow rate of the cleaning solution supplied between measurement of a first measurement item of the sample and measurement of a second measurement item of the sample, based on first cleaning information indicating a cleaning mode corresponding to the first measurement item of the sample, and second cleaning information indicating a cleaning mode corresponding to the second measurement item of the sample measured after the first measurement item.

One or more X-ray intensities for a sample may be approximated. Measured intensities are received from an X-ray detection system at one or more diffraction angles. A sample simulation module computes simulated sample intensities from an X-ray fluorescence sample model with initial sample model parameters indicating the sample composition and / or layer thickness of one or more sample layers. A correction module applies a triangular collimator correction to the simulated sample intensities and determines a mathematical distance between the corrected simulated sample intensities and corresponding measured intensities. The sample model parameters are adjusted and the correction steps are repeated until the distance change falls below a minimal distance change. The sample model parameters regarding sample composition and / or the layer thickness associated with the corrected simulated intensities are provided as approximated concentration values of respective components contained in the measured sample and / or the layer thickness of the measured sample.

An automatic analysis device (100) is provided with an electrolyte measuring section (114) that performs measurement of an internal standard solution at least once before measurement of a potential of a sample, and in a case where measurement of the potential of the sample by the electrolyte measuring section (114) is continuously performed, the measurement operation of the internal standard solution before the measurement of the potential is changed depending on whether or not the sample measured the previous time is a high-concentration sample. Thus, an automatic analysis device and an automatic analysis method of a sample are provided, which can reduce carrying when performing electrolyte measurement, ensure measurement accuracy, and achieve improvement of the processing capacity of the entire device.

An objective of the present disclosure is to provide a technique for identifying normality level / abnormality level of sample processed by processing tool. The system according to the present disclosure comprises: a learner configured to learn a relationship between measurement data that describes a measurement result acquired by a first measuring tool and test data that describes a measurement result acquired by a second measuring tool which measures the sample after a manufacturing process for the sample is finished; and a processor that estimates, using the learner, a normality level or an abnormality level of the sample measured by the second measuring tool.

A method for evaluating a sample, the method includes performing one or more pump probe measurements, wherein a pump probe measurement includes (i) illuminating the sample by a laser pump beam that is modulated by a modulation frequency; (ii) illuminating the sample by a laser probe beam; (iii) detecting radiation resulting from the illumination of the sample; (iv) determining, based on the detected radiation, thermo-reflectance information regarding a sample region located at a depth of the sample; wherein the thermo-reflectance information comprises information about an oscillatory component of a thermal response of the sample measured during the pump probe measurement; and (v) determining a presence of one or more sample abnormalities based on the analysis results.

A sample measuring apparatus, A reagent container, and a method of measuring a sample are provided. The sample measuring apparatus includes: a container holding unit that holds a reagent container comprising an openable / closable lid portion that covers an opening of the reagent container; a reagent dispensing unit that aspirates a reagent in the reagent container with the lid portion being in an opened state and dispenses the aspirated reagent into a reaction container; a pressing unit that seals the opening, by pressing toward the opening the lid portion laid over the opening; and a measuring unit that measures components contained in a measurement specimen prepared from a sample and the reagent dispensed in the reaction container.

A solution for approximately measuring one or more X-ray intensities of a sample by an X-ray detection system that includes at least one collimator having a given angular range, a monochromator, and an X-ray detector. Measurement intensities are received from the detection system at respective one or more diffraction angles. Simulated sample intensities are calculated from an X-ray fluorescence sample model having initial sample model parameters indicative of a sample composition and / or a layer thickness of one or more sample layers. Triangular collimator corrections are applied to the simulated sample intensities, and mathematical distances between the corrected simulated sample intensities and corresponding measured intensities are determined. The sample model parameters are adjusted and the correction step is repeated until the distance change falls below the minimum distance change. Sample model parameters associated with the corrected simulated intensities are provided as approximate concentration values of the respective components contained in the measured sample and / or a layer thickness of the measured sample.

An objective of the present disclosure is to provide a technique for identifying normality level / abnormality level of sample processed by processing tool. The system according to the present disclosure comprises : a learner configured to learn a relationship between measurement data that describes a measurement result acquired by a first measuring tool and test data that describes a measurement result acquired by a second measuring tool which measures the sample after a manufacturing process for the sample is finished; and a processor that estimates, using the learner, a normality level or an abnormality level of the sample measured by the second measuring tool.

A sample measuring device reduces the frequency with which a user introduces a measurement aid into the sample measuring device is provided. A sample measuring method measures a sample using a container containing a measurement aid which is a solid. The sample measuring method includes loading a predetermined number of measurement aids into a container from a storage chamber in which a plurality of measurement aids are movably stored in a cartridge attached to a sample measuring device, dispensing the sample into the container, and measuring the sample in the container into which the measurement aid has been loaded.

A sample analysis system includes a plurality of measurement devices each configured to measure a sample to obtain a measurement result according to a measurement instruction including one or more measurement items, an identification information reader configured to read identification information of each sample of a plurality of samples measured by at least one of the plurality of measurement devices, and a computer including a storage device configured to store the measurement result. The computer is configured to perform operations for inter-instrument variability evaluation, the operations including querying the storage device to identify a set of the plurality of measurement results obtained from a plurality of target measurement devices, the set of the plurality of measurement results matching a condition for inter-instrument variability evaluation, and generating evaluation information for inter-instrument variability evaluation according to the set of the plurality of measurement results identified from the storage device.

A computer system stores a data set constituted with measurement data including measurement results of intensities of a plurality types of signals of particles contained in a sample measured using a flow cytometry, and a machine learning model configured to receive, as an input, a feature value of a first region generated by dividing an observation space using intensities of two or more types of signals as parameters based on a distribution feature of the measurement data in the observation space, and configured to output a probability of a class to which each coordinate of the observation space belongs. The computer system maps the measurement data into the observation space, divides the observation space into a plurality of the regions based on the distribution feature of the measurement data in the observation space, calculates a feature value of each region, inputs the feature value of each region into the machine learning model, and sets a gate based on the probability of the class to which each coordinate in the observation space belongs, which is output from the model.

The present invention relates to a sample measurement device (11) comprising a measurement unit (2) for measuring a sample, the sample measurement device (11) comprising: control software (3) for controlling the measurement unit (2); a data management software (4) that manages data relating to the measurement unit (2) that operates under the control of the control software (3); and an interface (5) for causing application software (6) that can be added to a system (1) including the sample measurement device (11) to utilize the data, the function of the system (1) being expanded by the application software (6) that can be added to the system (1). The purpose of the present invention is to easily expand the function of a sample measurement system.