20 results about "Energy dispersion" patented technology

The invention discloses a high-flux electron beam quality cooperative control system and method, belongs to the technical field of electron beam control, and aims to solve the problems that the beam intensity and quality are difficult to consider, the subsystem collaboration is poor and the stability is insufficient. The cooperative control module is in communication connection with the sensing module and is used for receiving the state parameters, analyzing the state parameters based on a preset multi-target optimization algorithm and generating a cooperative control instruction, and the execution module is in communication connection with the cooperative control module and is used for receiving the cooperative control instruction and executing the cooperative control instruction according to the cooperative control instruction. Cooperative control of beam intensity and quality is realized. Through a multi-objective optimization algorithm, the limitation of traditional single parameter control is broken through, the beam intensity is larger than or equal to 100 mA, the emittance is smaller than or equal to 5 pi mm mrad and the energy dispersion is smaller than or equal to 0.5% can be achieved at the same time, and the technical problem that the beam intensity and the emittance are difficult to consider is solved.

The invention relates to the technical field of spectral measurement and analysis, and discloses an in-situ cell for rapid and continuous synchrotron radiation X-ray absorption spectrum measurement, the in-situ cell comprises a housing 1, one side of the housing 1 is provided with two through holes, and a counter electrode and a reference electrode are respectively fixed in the two through holes; the first shell and the second shell are correspondingly arranged, and square optical windows are arranged in the center of the second shell and the center of the first shell; the first shell and the second shell are each provided with a hole channel, the two hole channels are located on the two sides of the square optical window respectively, and a working electrode is fixedly arranged between the second shell and the first shell. The in-situ synchrotron radiation X-ray absorption spectrum measuring device is suitable for in-situ synchrotron radiation X-ray absorption spectrum measurement in a time-resolved energy dispersion / transmission mode, and through real-time supply and circular flow of the electrolyte on the surface of the working electrode, the uniformity of the X-ray penetrating through a solution layer is ensured, the elimination of product gas is accelerated, the influence of solution disturbance on a test signal is reduced, and the test stability is improved.

The invention provides a standing wave acceleration structure and an acceleration device. The standing wave acceleration structure comprises a light velocity section and a bunching section. The light velocity section comprises a plurality of light velocity cavities which are distributed in the axial direction of the light velocity section and are sequentially communicated. The bunching section comprises a bunching cavity and an entrance port, the bunching section is arranged at the upstream of the light velocity section along the electron beam direction, the entrance port is communicated with the bunching cavity, and the bunching cavity is communicated with the light velocity cavity at the most upstream. Wherein an accelerating electric field in the axial direction of the light velocity section is formed in the light velocity cavity, the phase of electrons entering the light velocity cavity is ahead of the maximum accelerating phase of the accelerating electric field, and the phase of the electrons after acceleration does not exceed the phase corresponding to the maximum value of the electric field intensity of the accelerating electric field. According to the acceleration structure provided by the embodiment of the invention, the energy dispersion of the electron beam can be reduced by adopting a sliding phase method, so that a smaller focus size can be obtained during subsequent quadrupole magnet focusing, the spatial resolution of the acceleration device is improved, and a better effect is achieved during fine defect detection.

The invention discloses a 10 MeV-level high-brightness ultrafast electron beam source based on quasi-linear laser wake field acceleration and a generation device thereof. Miniaturized repetition frequency ten-megawatt-level femtosecond laser interacts with a gas target capable of generating special gas flow distribution; based on a new quasi-linear laser wake field electron acceleration mechanism, the generation of a 10 MeV-level high-brightness high-performance ultrafast electron beam source can be accelerated. The device effectively solves the problem that it is difficult to accelerate generation of ultrafast electron beams with low energy dispersion, low emittance, high flow intensity, femtosecond pulse width, high brightness and high performance in a sub-ten-megawatt femtosecond laser driving wake field. Therefore, the method is expected to be widely applied to advanced fields such as ultrafast electron diffraction imaging and pumping detection, laser wake field and plasma diagnosis and measurement, high-energy particle acceleration, novel ultrafast coherent radiation source generation and the like.

The invention provides an improved camera for electron diffraction pattern analysis, and particularly relates to a device for detecting a Kikuchi diffraction pattern. The apparatus comprises: an electron column adapted to provide, in use, an electron beam directed toward the sample, the electron beam having an energy in the range of 2 keV to 50 keV, and; an imaging detector for receiving and counting electrons from the sample due to the interaction of the electron beam with the sample, the detector comprising an array of pixels and having a count rate capability of at least 2000 electrons per second for each pixel wherein: the imaging detector is adapted to provide electron energy filtering of the received electrons, the particle detector has an active region and a diffraction pattern for counting received electrons representing said diffraction pattern, and the particle detector has an inert layer on a surface on which electrons enter towards the active region of the detector, where the inert layer disperses the detection energy of 20 keV incident electrons having an energy dispersion of a full width at half maximum of less than 3.2 keV. The invention also provides a method for detecting the Kikuchi diffraction pattern.

In order to provide a charged particle beam device capable of returning to a usable state in a short time after completion of flushing processing for continuously and stably using an electron beam having a high luminance and a low energy dispersion and capable of shortening the downtime of the device, the charged particle beam device is configured as follows.　The charged particle beam device comprises: an electron source that emits electrons; an extraction electrode that faces the electron source and generates an electric field for causing the electron source to emit electrons; a first voltage power supply that applies a first voltage to the electron source in order to emit electrons from the electron source; a second voltage power supply that applies a second voltage to the extraction electrode; and a cooling device that cools the electron source. The charged particle beam device further comprises: a third voltage power supply that, in order to remove gas molecules adsorbed onto the electron source in the process of a specimen inspection, applies a third voltage having a polarity opposite to that of the first voltage to the electron source and thereby can set an electric field generated between the electron source and the extraction electrode such that the electron source is positive and the extraction electrode is negative; and a control unit for performing control so as to stop applying the first voltage from the first voltage power supply when applying the third voltage from the third voltage power supply to the electron source.

The invention discloses an X-ray residual stress testing device and method based on an energy dispersion type, and belongs to the technical field of X-ray stress testing. The testing device comprises an X-ray source, a first incident collimator, a second incident collimator, a sample table, a first diffraction collimator, a second diffraction collimator and an X-ray detector which are sequentially arranged along a light path, wherein the first incident collimator and the second incident collimator are arranged in parallel, and the first diffraction collimator and the second diffraction collimator are arranged in parallel; and an X-ray diffraction angle theta is formed between the sample table and the first diffraction collimator. According to the testing device and method provided by the invention, the rapid and nondestructive measurement of the internal residual stress of the material and the component is realized through the micro-focusing composite X light source, the confocal light path and the solid-state detector technology.

1. The name of the design product: Spectrometer shell (606 type). 2. The use of the design product: The shell for energy dispersion x fluorescence spectrometer. 3. The design points of the design product: in shape. 4. The picture or photo that best shows the design points: perspective view.

The invention discloses a characterization method for a nano structure of an X-ray photoetching grayscale mask, and relates to the technical field of micro-nano processing. The method comprises the following steps: before preparing a focused ion beam cross section, sequentially depositing a multi-layer composite protective film on the surface of a to-be-detected X-ray photoetching gray scale mask nanostructure, and sequentially comprising a first carbon layer, a first tungsten layer, a second carbon layer and a second tungsten layer from bottom to top; according to the structure, pollution of the tungsten layer is isolated through the carbon layer, the purity of interface component analysis is ensured, meanwhile, mechanical support and ion sputtering resistance are provided through the tungsten layer, the original three-dimensional shape of the nanostructure is protected, finally, focused ion beam cutting is carried out, and detection and analysis are carried out through a scanning electron microscope-energy dispersion X-ray spectrometer. Accurate characterization of the depth, the side wall morphology and the elemental components of the X-ray photoetching grayscale mask nanostructure is realized.

The application discloses a kind of MIMO multi-view radar correlation imaging method, device and medium based on image entropy, for the new problem that radar correlation imaging unit scattering intensity fluctuation with uncertainty of view angle causes radar echo and corresponding imaging unit reference signal correlation mismatch, using the strategy of "result-oriented", from the energy dispersion of imaging unit, based on the sparse reconstruction of imaging scene, join image entropy to construct new optimization model, and using soft threshold iterative shrinkage algorithm to solve the optimization model, obtain the multi-view MIMO radar correlation imaging result of high resolution.The application increases the number of imaging channels, expands the observation angle, increases the randomness of radiation field, and can achieve high-precision imaging under the condition of unit scattering intensity fluctuation.

The invention discloses an ECMO pipeline blood flow state monitoring method and system based on video analysis, and belongs to the technical field of medical monitoring. The method comprises the following steps: acquiring a video stream of an ECMO pipeline, dynamically positioning the center of the pipeline, and extracting a one-dimensional average gray scale time sequence signal; calculating a dynamic baseline for the time sequence signal, and extracting a normalized waveform event segment; an optical polarity index and a normalized energy dispersion index of the waveform event segment are calculated, the optical polarity index represents a positive and negative energy distribution difference, and the normalized energy dispersion index represents an energy concentration or dispersion form; and finally, constructing a feature vector based on the optical polarity index and the normalized energy dispersion index, and discriminating bubbles by using a classifier to realize monitoring. According to the invention, the dependence on signal absolute intensity is abandoned, and the accuracy and reliability of bubble monitoring in a complex clinical environment are obviously improved.

An image generation device according to the present invention comprises a Wien filter (108) that has a multipole structure, an operation control unit (150) that applies the same voltage to all of the poles while causing an electric field and a magnetic field that satisfy Wien conditions to be formed at the Wien filter to cause an axisymmetric lens field to be formed at the Wien filter, a lower shaft (120) that is provided below the Wien filter (108) and has a through hole (123), and an electron detector (107) that detects at least secondary electrons that have a prescribed energy from among secondary electrons dispersed by the Wien filter (108) according to energy.

The invention provides a device and method for measuring beam energy dispersion distribution by using laser, and the device comprises a central housing, the central housing comprises a closed central housing body, the left side wall of the central housing body is provided with an electron inlet, the right side wall of the central housing body is provided with a photon inlet, and the inner side wall of the central housing body is also provided with a plurality of detectors. The left side of the center shell body is further provided with an electronic movement channel in the transverse direction, and the right end of the electronic movement channel is connected with the left side wall of the center shell body and internally communicated with the center shell body. The right side of the center shell body is further provided with a photon movement channel, the photon movement channel and the electron movement channel are coaxially arranged, and the left end of the photon movement channel is connected with the center shell body and internally communicated with the center shell body. The photon motion channel is coaxially sleeved with a shielding cover, and an electron shunting field is arranged in the shielding cover. The laser and the electron beam are collided, result particles are measured and collected, initial collision conditions are deduced reversely, and fine indexes of energy dispersion of the to-be-measured beam emitter are obtained.

1. The name of the design product: Spectrometer housing (616 type). 2. The use of the design product: The housing for energy dispersion x fluorescence spectrometer. 3. The design points of the design product: in shape. 4. The picture or photo that best shows the design points: perspective view.

The application relates to a material testing method based on an energy dispersion X-ray spectrometer, and an electronic device, the testing method sets different fitting calculation peak strengths and peak positions for single-peak, overlapping-peak and light-element-dominant peaks, and cooperates with a quantitative calculation method of a peak area-sensitivity factor method, so that the success rate of material analysis and the analysis result accuracy can be effectively improved; by extracting EDX energy spectrum diagrams to perform characteristic analysis on peak fitting degrees, signal-to-noise ratios, energy intervals and total peak numbers, a random forest classifier is used to perform classification analysis on input characteristics to output energy spectrum type labels, and then corresponding algorithms in an algorithm library are automatically matched, the reproducibility of material analysis results is improved, batch processing is supported, 1000+ samples per day can be analyzed, and the testing results are reliable, accurate, and have good reproducibility.

To provide a technique capable of generating an energy selection image with high energy resolution, a wide field of view, and high sensitivity.SOLUTION: The image generator includes a Wien filter 108 having a multipole structure, an operation controller 150 configured to cause the Wien filter to form an axially symmetric lens field by applying the same voltage to all of a plurality of poles while causing the Wien filter to form an electric field and a magnetic field satisfying Wien conditions, a lower shunt 120 disposed below the Wien filter 108 and having a through-hole 123, and an electron detector 107 configured to detect secondary electrons having at least a predetermined energy among secondary electrons dispersed according to energy by the Wien filter 108.SELECTED DRAWING: Figure 1

The invention relates to the technical field of material analysis, and discloses an electroceramic material ion migration speed determination method, device, equipment and medium, and the method comprises the following steps: obtaining energy dispersion X-ray spectrum data of the surface and section of a ceramic material before and after degradation; on the basis of the energy dispersion X-ray spectrum data before and after the deterioration of the ceramic material, judging an ion migration dominant factor; and calculating the ion migration speed or diffusion coefficient by combining the energy dispersion X-ray spectrum data before and after the ceramic material is degraded and the ion migration dominant factor. Therefore, by comparing particle distribution before and after ion migration and degradation of the ceramic material, dominant factors of ion migration are judged according to variation of particle distribution before and after degradation, and migration speeds of different ions are further calculated through a formula according to migration behaviors of ions in the ceramic and particle distribution data before and after degradation. And accurate quantification of the ion migration speed of the ceramic material is realized.

The invention provides a high-sensitivity detection method and system of an energy dispersion x-ray fluorescence spectrophotometer, and relates to the technical field of x-ray fluorescence spectrum detection.Initial spectral information containing photon number distribution is obtained by collecting spectral data of a to-be-detected sample, the initial spectral information is matched with an element characteristic spectrum database for analysis, and the chemical shift effect is analyzed; generating an enhanced characteristic spectrum with an element chemical state mark; adjusting excitation parameters of a light beam screening system, and optimizing a crystal reflection condition and an incident angle to obtain matched single-wavelength excitation condition parameters; the method comprises the following steps: performing cross-correlation fusion on two-channel architecture to form multi-dimensional analysis features, establishing a hierarchical mapping relationship through hierarchical feature space transformation and recognition model adaptation, completing high-sensitivity recognition of the chemical state of the element, and performing spectral data analysis, excitation parameter optimization, dual-channel cooperative processing and hierarchical mapping modeling to obtain a high-sensitivity recognition result. And high-sensitivity identification of the chemical states of the elements in the sample is realized.

The invention provides a lens structure for increasing DOF resolution. The lens structure comprises a deflection acceleration unit, an ion focusing unit and an ion offset unit, according to the equipment provided by the invention, the focusing degree and directivity of the ion beam are remarkably improved, and the energy dispersion and spatial divergence of the ion beam are reduced, so that more ions can reach the detector. The detection sensitivity of the instrument is remarkably improved, especially for low-concentration samples. Through the deflection function of the ion deflection electrode, the ion beam can be guided to a larger range, thereby allowing the detector to be arranged in a wider area. In this way, the number and density of the detectors are increased, the layout flexibility of the detectors is improved, and the detectors can cover wider ion flight paths.

The invention relates to the technical field of water quality detection, in particular to a water quality heavy metal detection system based on energy dispersion. The system is characterized in that a sample enrichment pretreatment unit is used for carrying out target element adsorption treatment, background impurity removal treatment and immobilization film forming treatment on a water quality detection sample, and an adsorbed sample membrane is constructed; the excitation source regulation and control unit applies X-rays to the adsorbed sample diaphragm, and dynamically adjusts the irradiation position, irradiation time and irradiation intensity of the X-rays; an energy spectrum signal acquisition unit acquires an X-ray energy spectrum signal released by the adsorbed sample diaphragm under X-ray excitation, and performs intensity conversion and energy level distribution positioning processing on the X-ray energy spectrum signal based on an energy dispersion detection mechanism to form original energy spectrum signal data; the feature recognition and analysis unit constructs a heavy metal element concentration quantitative model and outputs recognition results and concentration evaluation data of various heavy metal elements. According to the invention, high-precision energy dispersion detection of heavy metal elements in water is realized.