Energy dispersion X ray fluorescence spectrometer

A fluorescence spectrometer and energy dispersion technology, applied in the field of fluorescence spectrometer, can solve the problem of inability to detect low-content elements and their contents, and achieve the effect of improving accuracy and efficiency

Active Publication Date: 2011-07-20
JIANGSU SKYRAY INSTR
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Problems solved by technology

[0009] The technical problem solved by the present invention is the shortcoming that the energy dispersive X-ray fluorescence spectrometer in the prior art cannot detect low content elements and their content

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  • Energy dispersion X ray fluorescence spectrometer

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Embodiment Construction

[0029] The energy dispersive X-ray fluorescence spectrometer according to the specific embodiment of the present invention adds a secondary target platform on the basis of the existing energy dispersive X-ray fluorescence spectrometer, on which the secondary target material can be placed, and the monochromatic excitation source Combined with a continuous excitation source, the primary X-ray (continuous excitation source) emitted by the X-ray generator is used to excite the sample to detect high-content elements in the sample; the secondary X-ray generated by the secondary target under the excitation of the primary X-ray (monochromatic excitation source) to excite the sample, reduce the background peak, improve the detection limit of trace elements, and detect low-level elements in the sample. Taking the mass content of lead in the test sample as an example, the detection limit of the existing energy dispersive X-ray fluorescence spectrometer testing lead is more than 100ppm (on...

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Abstract

The invention discloses an energy dispersion X ray fluorescence spectrometer, which comprises an object stage, an X ray generating device, a detector, a control system and a secondary target stage, wherein the object stage is used for bearing a sample; the X ray generating device is used for emitting primary X rays; the detector is used for detecting fluorescent light generated by the sample under the irradiation of X rays; the control system is used for receiving the fluorescent light generated by the sample and detected by the detector and analyzing the elements and element contents in the sample; the secondary target stage is used for accommodating a secondary target material; and secondary X rays generated by the secondary target material under the irradiation of primary X rays are irradiated to the sample. The primary X rays generated by the X ray generating device are used for irradiating the secondary target material and a single-color excitation source generated by the secondary target material under the irradiation of the primary X rays is used for irradiating the sample, so that low-content elements in the sample can be detected, high-content and low-content elements in the sample can be tested through one-time measurement by using the same instrument, and the testing accuracy and efficiency are greatly improved.

Description

technical field [0001] The invention relates to the field of fluorescence spectrometers, in particular to an energy dispersive X-ray fluorescence spectrometer. Background technique [0002] X-ray fluorescence spectrometer is a kind of ray analysis instrument, which is a common form of X-ray analysis instrument. X-rays use high-speed electrons to bombard the inner electrons of atoms, making them in a highly excited state, and at the same time, the outer electrons jump to the inner orbits that lack electrons; during this process, energy is released in the form of electromagnetic waves. The electromagnetic waves that release energy have high energy and small wavelength, which are invisible to the naked eye, and are called X-rays. [0003] If the X-rays generated by high-speed electron excitation are used as an excitation source (called primary X-rays) to bombard the inner electrons of other atoms, X-rays can also be generated, but the energy of this X-ray is lower than that of...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N23/223
Inventor 刘召贵张波
Owner JIANGSU SKYRAY INSTR
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