X-ray detection method for fluorescence analyzer

A fluorescence analyzer and detection method technology, applied in the field of X-ray detection, can solve the problems of low grade analysis precision of the analyzer, low spectral peak recognition precision, single analysis method, etc., and achieve the effect of improving the grade analysis precision

Active Publication Date: 2010-07-21
BEIJING GENERAL RES INST OF MINING & METALLURGY
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Problems solved by technology

[0005] The analysis method is single, the accuracy of spectrum peak i...

Method used

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specific Embodiment

[0032] Concrete embodiment, comprises steps:

[0033] Step 1. Design an optical path and a spectroscopic crystal that conform to Bragg's law to separate the characteristic X-rays of the measured object;

[0034] Step 2, using a semiconductor detector to detect the separated characteristic X-rays to obtain spectral data;

[0035] Step 3, process the spectral data of the separated characteristic X-ray obtained in step 2 with the method of energy dispersion, including:

[0036] According to the prior knowledge, the Gaussian fitting method is used to process the characteristic X-rays without spectral peak overlap; the spectral peak decomposition processing is performed for the presence of spectral peak overlap;

[0037] Step 4, separately using a semiconductor detector to detect the characteristic X-rays before separation;

[0038] Step 5, process the spectral data of the characteristic X-rays before separation detected in step 4 with the method of energy dispersion, including: ...

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Abstract

The invention discloses an X-ray detection method for a fluorescence analyzer. The method comprises the following steps of: separating the characteristic X-ray of an object to be detected by utilizing the Bragg's law; detecting the separated characteristic X-ray by an X-ray detector to obtain spectroscopic data; processing the spectroscopic data of the separated characteristic X-ray by an energy dispersion method; detecting the characteristic X-ray of all elements before light splitting by singly using an X-ray detector with high resolution, and carrying out spectrum peak calculation by the energy dispersion method. Grade calculation is carried out on data processed by using two methods, thereby the grade analysis precision can be improved compared with that obtained by singly using one analysis method. The invention is particularly suitable for the condition that the physical property of the object to be detected has greater change and the conditions of low-grade measurement and nonmetal element measurement.

Description

technical field [0001] The invention relates to an X-ray detection method used on a fluorescence grade analyzer, in particular to an X-ray detection method used on a fluorescence analyzer. Background technique [0002] The mineral processing industry often uses X-ray fluorescence analyzers to detect the pulp grade online, and adjust the process in time to ensure product indicators. The peak detection of element characteristic X-ray is the key of X-ray fluorescence analysis technology, and its detection accuracy directly affects the grade analysis accuracy. [0003] At present, in the mineral processing industry, there are online X-ray fluorescence grade analyzers based on two working principles, one is the wavelength dispersion type; the other is the energy dispersion type. The wavelength dispersion type is to use the spectroscopic crystal to separate the characteristic X-rays of different elements to obtain the spectral peak of a certain element, and the energy dispersion ...

Claims

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Application Information

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IPC IPC(8): G01N23/223
Inventor 赵建军周俊武李杰赵宇徐宁
Owner BEIJING GENERAL RES INST OF MINING & METALLURGY
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