X-ray detection method for fluorescence analyzer
A fluorescence analyzer and detection method technology, applied in the field of X-ray detection, can solve the problems of low grade analysis precision of the analyzer, low spectral peak recognition precision, single analysis method, etc., and achieve the effect of improving the grade analysis precision
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[0032] Concrete embodiment, comprises steps:
[0033] Step 1. Design an optical path and a spectroscopic crystal that conform to Bragg's law to separate the characteristic X-rays of the measured object;
[0034] Step 2, using a semiconductor detector to detect the separated characteristic X-rays to obtain spectral data;
[0035] Step 3, process the spectral data of the separated characteristic X-ray obtained in step 2 with the method of energy dispersion, including:
[0036] According to the prior knowledge, the Gaussian fitting method is used to process the characteristic X-rays without spectral peak overlap; the spectral peak decomposition processing is performed for the presence of spectral peak overlap;
[0037] Step 4, separately using a semiconductor detector to detect the characteristic X-rays before separation;
[0038] Step 5, process the spectral data of the characteristic X-rays before separation detected in step 4 with the method of energy dispersion, including: ...
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