The application discloses a high-frequency
signal single event transient detection method based on time
interleaving, which comprises the following steps: under the condition of no
irradiation, time
interleaving high-speed collection is performed on the output of a to-be-detected circuit to obtain a sample value D(t), and an ideal denoising value I(t) and a
noise value Z(t) at a corresponding moment are calculated;
irradiation test is performed on the to-be-detected circuit, and time
interleaving high-speed collection is performed on the high-frequency
signal of the output of the to-be-detected circuit to obtain a sample value D'(t); according to the sample value D'(t) and the
noise value Z(t) at the corresponding moment, an actual denoising value V(t) at the corresponding moment is calculated; according to the comparison result of V(t) and the ideal denoising value I(t) at the corresponding moment, the amplitude and the pulse width of the single event transient at the corresponding moment are determined; until the
irradiation test is finished, a single event transient error
characteristic distribution diagram of the to-be-detected circuit under heavy ions is obtained. The application effectively improves the pulse width precision and the amplitude precision of the single event
transient signal in the board-level test, and improves the accuracy of the test.