3078results about "Physical parameters compensation/prevention" patented technology

An A/D converter includes a resistor ladder for generating a plurality of reference potentials, a comparing section for comparing each of the reference potentials against an input analog signal to output a thermometric code, and a dynamic encoder composed of a combinational circuit to encode the thermometric code to a binary code by responding a clock signal. The A/D conversion is finished in a single clock cycle at a high speed, with a reduced number of elements and reduced power dissipation.

The invention relates to a method of preparing signals (X and Y) to be compared to establish predistortion at the input of an amplifier (12), the signals comprising a signal (X) before amplification and a signal (Y) after amplification by said amplifier. Preparation includes time aligning (22) the signal before amplification (X) with the signal after amplification (Y) before using them to establish said predistortion. The invention preferably operates in two stages, namely a stage of coarse time alignment, in which the signal before amplification (X) is subjected to a time delay comprising an integer number of first time units, and a stage of fine time alignment, in which a delay or advance value of a fraction of the first time unit is determined.

A circuit and method measure the output voltage of a CMOS pixel in a manner that substantially reduces all columnar pattern noise due to mismatches in the signal processing circuits including the correlated double sampling amplifiers and A/D converters. The circuit includes a test switch, operatively connected between a reference voltage source and a correlated double sampling amplifier, for applying a test voltage from the reference voltage source when the state of the test switch is ON to the correlated double sampling amplifier. The reference voltage source produces a voltage corresponding to a full-scale voltage level to enable the determination of a gain error in the correlated double sampling amplifier and/or A/D converter; a voltage corresponding to ground to enable the determination of an offset error in the correlated double sampling amplifier and/or A/D converter; and a plurality of analog voltages ranging from analog ground to a full-scale voltage level to enable the determination of non-linearity errors in the A/D converter.

D/A converter of this invention including n+1 capacitors in total consisting of one terminating capacitor (C0) and n binary-weighted capacitors (C1-4) that are subjected to binary weighting ratio of 1:2:4: . . . :2⁽ⁿ⁻¹⁾, and, an inverting amplifier (INV1), further comprising: a feedback switching means (SWR5) provided between the input and output of the inverting amplifier (INV1); a switching means for terminating operation (SWR0) supplies one of two main reference voltages (VB,VT) to the terminating capacitor (C0), and then, makes connection of the terminating capacitor (C0) to the output of the inverting amplifier (INV1); a plurality of switching means for input operation (SWD1-4,SWR1-4) makes selection of one of the two main reference voltages (VB,VT) to be provided for the n binary-weighted capacitors (C1-4) depending on digital data (D1-4), and then, makes connection of the second terminal side of the n binary-weighted capacitors (C1-4) to the output of the inverting amplifier (INV1).

A DSP based SERDES performs compensation operations to support high speed de-serialization. A receiver section of the DSP based SERDES includes one or more ADCs and DSPs. The ADC operates to sample (modulated) analog serial data and to produce digitized serial data (digital representation of the modulated analog serial data). The DSP communicatively couples to the ADC and receives the digitized serial data. Based upon the known characteristics of the digitized serial data and the digitized serial data itself, the DSP determines compensation operations to be performed upon the serial data to compensate for inadequacies of the receiver and/or channel response. These compensation operations may be (1) performed on the analog serial data before digitization by the ADC; (2) applied to the ADC to modify the operation of the ADC; and/or (3) performed on the digitized serial data by the DSP or another device.

An electronic apparatus includes a CMOS image sensor and a signal processor operable to process an output signal from the CMOS image sensor. The CMOS image sensor includes the following elements: an imaging region; a reference signal generator operable to generate a reference signal; a comparator operable to compare the reference signal generated by the reference signal generator with a signal transmitted from the imaging region; a counter operable to count, in parallel with comparison performed by the comparator, a predetermined count clock and to hold a count value at the time of completion of comparison performed by the comparator; and a reference signal supply interface unit operable to supply the reference signal generated by the reference signal generator to a plurality of comparators via different signal lines, respectively.

A pipelined analog-to-digital converter (ADC) (30) with improved precision is disclosed. The pipelined ADC (30) includes a sequence of stages (20), each of which includes a sample-and-hold circuit (22), an analog-to-digital converter (23), and the functions of a digital-to-analog converter (DAC) (25), an adder (24), and a gain stage (27) at which a residue signal (RES) is generated for application to the next stage (20) in the sequence. A multiplying DAC (28) performs the functions of the DAC (25), adder (24), and gain stage (27) in the stage (20), and is based on an operational amplifier (29). Sample capacitors (C10, C20) and reference capacitors (C12₂, C22₂) receive the analog input from the sample-and-hold circuit (22) in a sample phase; parallel capacitors (C12₁, C22₁) are provided to maintain constant circuit gain. Extended reference voltages (V_REFPX, V_REFNX) at levels that exceed the output range (V₀+, V₀−) of the operational amplifier (29) are applied to the reference capacitors, in response to the digital output of the analog-to-digital converter (23) in its stage (20). The reference capacitors (C12, C22) are scaled according to the extent to which the extended reference voltages (V_REFPX, V_REFNX) exceed the op amp output levels (V₀+, V₀−). The effects of noise on the reference voltages (V_REFPX, V_REFNX) on the residue signal (RES) are thus greatly reduced.

Various embodiments of the present invention provide systems and methods for mitigating latency in a data detector feedback loop. For example, a method for reducing latency in an error corrected data retrieval system is disclosed. The method includes performing an analog to digital conversion at a sampling instant to create a digital sample, and performing a data detection on the digital sample to create a detected output. The detected output is compared with the digital sample to determine a phase error. During an interim period, the digital sample is adjusted to reflect the phase error to create an adjusted digital sample. After the interim period, the sampling instant is adjusted to reflect the phase error.

In a compensator for compensating mismatches, and in methods for such compensation, the compensator compensates for mismatches in output signals of a system with mismatches during normal operation of the system with mismatches. The compensator comprises: a mismatch estimator that monitors at least two mismatched signals output by the system with mismatches during normal operation and that generates matching parameters indicating an amount of mismatch between the at least two mismatched signals, the mismatch estimator updating the matching parameters during normal operation of the system with mismatches, and a mismatch equalizer that compensates mismatches in the mismatched signals output by the system with mismatches during normal operation of the system with mismatches in response to the matching parameters.

A novel and useful apparatus for and method of improving the quantization resolution of a time to digital converter in a digital PLL using noise shaping. The TDC quantization noise shaping scheme is effective to reduce the TDC quantization noise to acceptable levels especially in the case of integer-N channel operation. The mechanism monitors the output of the TDC circuit and adaptively generates a dither (i.e. delay) sequence based on the output. The dither sequence is applied to the frequency reference clock used in the TDC which adjusts the timing alignment between the edges of the frequency reference clock and the RF oscillator clock. The dynamic alignment changes effectively shape the quantization noise of the TDC. By shaping the quantization noise, a much finer in-band TDC resolution is achieved resulting in the quantization noise being pushed out to high frequencies where the PLL low pass characteristic effectively filters it out.

Digital to analog converter circuits and methods are provided for producing an analog output voltage indicative of a digital input signal with at least partial insensitivity to error gradients. Described are split-core resistive elements, which include a plurality of one-dimensional or multi-dimensional resistive strings, that may be used to reduce or substantially eliminate the effects that error gradients have on the linearity of the analog output voltages of a resistive string or interpolating amplifier DACs. The resistor strings that make up the split-core resistive elements are configured in such a manner that combining respective output voltages from each of the resistor strings results in an analog output voltage that is at least partially insensitive to the effects of error gradients.

A highly linear analog-to-digital (ADC) conversion system has an analog front-end device in cascade with a standard ADC converter, and a tunable digital non-linear equalizer. The equalizer corrects the quantization distortion, deviations from ideal response, and additive noises generated by the analog front-end device and ADC converter. The equalizer is formed by three main parts: Generate Function Streams Unit, Finite Impulse Response FIR filters and a summer. The equalizer receives the unequalized output from the ADC converter and generates a plurality of monomial streams in a systolic fashion. Each of the monomial streams is passed through a corresponding linear finite impulse response FIR filter. A convolution sum of all outputs from the FIR filters produces a unique equalized output with the non-linear distortion reduced to a satisfactory level. The FIR filter coefficients are determined by an Identity Equalizer Coefficient Unit, and a Test Signal Generator with different types of test signals. The FIR filter coefficients are set to minimize an error function.

Provided is a method of removing noise from digital moving picture data reducing the number of frames used in a temporal filtering operation and able to detect motion between frames easily. The method comprises a method of spatial filtering, a method of temporal filtering, and a method of performing the spatial filtering and the temporal filtering sequentially. The spatial filtering method applies a spatial filtering in a YCbCr color space, preserving a contour/edge in the image in the spatial domain, and generating a weight that is adaptive to the noise for discriminating the contour/edge in the temporal filtering operation. The temporal filtering method applies temporal filtering based on motion detection and scene change detection, compensating for global motion, the motion detection considering the brightness difference and color difference of the pixels compared between frames in the temporal filtering operation, and a weight that is adaptive to the noise for detecting the motion in the temporal filtering operation. The spatial filtering method is preferably performed first, and the temporal filtering method is performed with the result of the spatial filtering.

A method and apparatus is provided for DC level control in a line card. The method includes receiving a digital input signal, determining a first DC component value of the digital input signal at a first preselected time, and determining a second DC component value of the digital input signal at a second preselected time. The method further includes determining a difference between the first DC component value and the second DC component value. The method includes providing the first DC component value to a digital-to-analog converter in response to determining that the difference is less than a first preselected value. The apparatus includes a digital-to-analog converter and logic. The logic is coupled to the digital-to-analog converter, wherein the logic is capable of receiving a digital input signal, determining a first DC component value of the digital input signal at a first preselected time, and determining a second DC component value of the digital input signal at a second preselected time. The logic is farther capable of determining a difference between the first DC component value and the second DC component value, and providing the first DC component value to the digital-to-analog converter in response to determining that the difference is less than a first preselected value.

A time difference adder included in a system-on-chip (SOC) includes a first register unit and a second register unit. The first register unit is configured to receive first and second input signals having a first time difference, and generate a first output signal in response to a first signal. The second register unit is configured to receive third and fourth input signals having a second time difference, and generate a second output signal having a third time difference with respect to the first output signal in response to the first signal. The third time difference corresponds to a sum of the first time difference and the second time difference.