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185results about "Resistors with plural resistive elements" patented technology

DMA controller that restricts ADC from memory without interrupting generation of digital words when CPU accesses memory

DMA controller for mixed signal device. A mixed signal integrated circuit with memory control is disclosed. A data conversion circuit is provided that is operable to receive an analog input signal and convert discrete samples thereof at a predetermined sampling rate to a digital representations thereof as a plurality of digital words. A memory stores the digital words generated by the data conversion circuit. A processor is included on the integrated circuit and operable to access the memory to output select ones of the digital words for processing thereof in accordance with a predetermined processing algorithm. A memory access controller controls access to the memory by the data conversion circuit and the processor. The memory access controller is operable to restrict access to the memory by the data conversion circuit without interrupting the generation of digital words therefrom when the processor is accessing the memory, and allowing access to the memory by the data conversion circuitry when the processor is not accessing the memory, such that the data conversion circuit can transfer currently generated digital words and previously generated and non stored digital words for storage in said memory upon gaining access thereto.
Owner:SILICON LAB INC

Capacitor calibration in SAR converter

Capacitor calibration in SAR converter. A method for calibrating a switched capacitor array in a SAR data converter is disclosed, which array includes a plurality of primary capacitors having a common node plate interfaced to a common node and a switched plate interfaced to a switch that is operable to be switched between first and second reference voltages. A comparator having an input connected to the common node and a reference input connected to a comparator reference node receives a comparator reference voltage. In a first calibration step for calibrating one of the primary capacitors, a reference capacitor is provided and then, the switched plate of the select primary capacitor is connected to the first reference voltage, the switched plate of the other capacitors and the reference capacitor are connected to the second reference voltage, and the common node and the comparator reference node are driven with a driver to dispose a first voltage thereon. In a second calibration step, the common node is allowed to float, the switched plate of the select primary capacitor is connected to the second reference voltage, the switched plate of the reference capacitor is connected to the first reference voltage, and the voltage on the common node is compared to the first voltage on the comparator reference node. A determination is then made as to whether the voltage on the common node is greater than the first voltage. A plurality of trim capacitors are provided and, if in the second calibration step, the voltage on the common node was determined to be greater than the first voltage, then one of the trim capacitors is disposed in parallel with the select one of the primary capacitors and then the first and second calibrating steps are repeated.
Owner:SILICON LAB INC

Digital adjustable resistor and adjusting method thereof

Disclosed are a digital adjustable resistor and an adjusting method thereof. The digital adjustable resistor comprises a controlled resistor string and an adjustable resistor string which are connected in parallel, an approximate value of required resistance can be obtained via the controlled resistance string by means of adjusting the quantity of first resistors connected in parallel, the adjustable resistor string is connected with the controlled resistor string, the resistance of the digital adjustable resistor is adjusted by means of adjusting the quantity of second resistors connected in serial, and accordingly the required resistance is obtained. The adjusting method includes connecting a plurality of first resistors in parallel to obtain the approximate value of the required resistance; connecting a plurality of second resistors in series according to the required resistance and the approximate value of the required resistance so that the resistance of the digital adjustable resistor is adjusted; and connecting the first parallelly-connected resistors with the second serially-connected resistors in parallel to obtain the required resistance. The digital adjustable resistor and the adjusting method for the digital adjustable resistor have the advantage that small-step and high-precision adjustment of the resistor is realized.
Owner:ZHEJIANG JUEXIN MICROELECTRONICS CO LTD

SAR with partial capacitor sampling to reduce parasitic capacitance

SAR with partial capacitor sampling to reduce parasitic capacitance. An analog-to-digital convertor is disclosed with reduced parasitic capacitance on the input during a sampling operation. A charge-redistribution, binary-weighted switched-capacitor array is included having a plurality of array capacitors that each have a commonly connected plate interfaced to a first common node and a switched plate, the switched plate operable to be switched between first and second reference voltages during a redistribution phase and select ones of the capacitors additionally operable to be switched to the input during a sampling phase. Each of the array capacitors has a parasitic capacitance associated therewith. A compensation capacitor having a common plate is connected to the first common node and a switched plate, the compensation capacitor operable to be switched to the input during the sampling phase and to the first reference voltage during the redistribution phase. The compensation capacitor has a parasitic capacitance less than the parasitic capacitance of the combination of all of the non select ones of the array capacitors. A comparator compares the voltage on the first common node to a compare reference voltage during the redistribution phase. A successive approximation controller is provided for switching the switched plate of the array capacitors between the first and second reference voltages in accordance with a successive approximation algorithm during the redistribution phase.
Owner:SILICON LAB INC

High speed comparator for a SAR converter with resistor loading and resistor bias to control common mode bias

High speed comparator for a SAR converter with resistor loading and resistor bias to control common mode bias. A differential comparator having positive and negative inputs and positive and negative outputs is disclosed. The comparator includes a current source for driving current from a supply to a common node. A differential pair of transistors is disposed such that one side of the source/drain paths are tied together and to the common node, with the other side of the source/drain paths thereof for each of the transistors in the differential pair interfaced to the positive and negative outputs, respectively for applying drive thereto. A first resistor load is disposed between the positive output and a supply reference opposite in polarity to the supply. A second resistor is disposed between the negative output and the supply reference. The gate of the one of the transistors in the pair associated with the positive output is connected to the negative input and the gate of the other of the transistors in the pair is connected to the positive input. The current through the current source defines the common mode bias. A ratiometric bias circuit having associated therewith a bias resistor with a current driven there through is provided that controls the current through the current source, such that it is a ratio of the current through the bias resistor.
Owner:SILICON LAB INC

Common centroid layout for parallel resistors in an amplifier with matched AC performance

Common centroid layout for parallel resistors in an amplifier with matched AC performance. An amplifier is disclosed that is formed on a silicon substrate that includes first and second differential legs, each driving first and second resistive loads. The first resistive load comprises first and second parallel resistive loads connected on one side thereof to one end of the first differential leg and the other side of each of the first and second parallel resistive loads separately connected to a first reference voltage. The second resistive load comprises third and fourth resistive loads each connected on one side thereof to one end of the second differential leg and the other side of each of the third and fourth parallel resistive loads connected separately to the first reference voltage. Each of the first, second, third and fourth resistive loads is fabricated of a strip of resistive material disposed on the surface of the substrate and having a finite resistivity, length, width and thickness. The first parallel resistive load is disposed adjacent to a first dummy resistive strip on one side thereof, and disposed adjacent the third parallel resistive load on the opposite side thereof. The third parallel resistive load is disposed adjacent a second dummy resistive strip disposed on the diametrically opposite side thereof from the first parallel resistive load. The fourth parallel resistive load is disposed adjacent the second dummy resistive strip on the diametrically opposite side thereof from the third parallel resistive load. The second resistive load is disposed adjacent the fourth parallel resistive load and capacitively coupled thereto on the side diametrically opposite to the second dummy resistive strip. The second parallel resistive load is disposed adjacent a third dummy resistive strip on the side thereof diametrically opposite to the fourth parallel resistive load and capacitively coupled thereto. The first, second and third dummy resistive strips are connected to a second reference voltage.
Owner:SILICON LAB INC
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