64results about How to "Short integration time" patented technology

There is provided herein a system and method of seismic data collection for land and marine data that utilizes narrowband to monochromatic low-frequency non-impulsive sources designed to optimize the ability of migration/inversion algorithms to image the subsurface of the Earth, in particular, full-waveform inversion.

An apparatus for in vivo, endoscopic laser Raman spectroscopy probe and methods for its use are described. The probe comprises a fiber bundle assemble small enough to fit through an endoscope instrument channel, a novel combination of special coatings to the fiber bundle assembly, including a short-pass filter on the illumination fiber and a long-pass filter on the collection fiber bundle, a novel filter adapter comprising collimating lenses, focusing lenses, a band-pass filter, and a notch filter, and a round-to-parabolic linear array fiber bundle. The apparatus further comprises a laser to deliver illumination light and a spectrometer to analyze Raman-scattered light from a sample. The analysis of Raman spectra from in vivo measurements can discover molecular and structural changes associated with neoplastic transformations and lead to early diagnosis and treatment of cancer.

A system and method detecting fissile material. According to one embodiment, a detector includes an array of active pixel sensors wherein each active pixel sensor operable to integrate a charge generated by radiation that is incident upon the active pixel sensor by using a charge-sensing element during an integration phase. Then, a voltage signal is generated that is based upon the integrated charge intensity during a readout phase. After reading out the voltage signal during the readout phase, the active pixel sensor is reset ready to integrate again. The integration phase is typically set to a time interval that is optimal for detecting radiation from fissile material, and the system is typically able to count individual events occurring in an integration period, and to digitally sum these event counts to measure rate of radiation events.

The invention relates to an active and passive imaging readout circuit working at a linear mode APD (Avalanche Photo Diode) array, which is provided with a detector, a short circuit protection circuit, an integral circuit, an integral time control circuit, an active and passive mode switching circuit, a sampling retaining circuit and a row selection circuit, wherein an output end of the detector is connected with an input end of the short circuit protection circuit, an output end of the short circuit protection circuit is connected with an input end of the integral circuit, an output end of the integral time control circuit is connected with an input end of the active and passive mode switching circuit, one output end of the active and passive mode switching circuit is connected with a control signal end of the integral circuit, the other output end of the active and passive mode switching circuit is connected with a control signal end of the sampling retaining circuit, an output end of the integral circuit is connected with an input end of the sampling retaining circuit, an output end of the sampling retaining circuit is connected with an input end of the row selection circuit, and an output end of the row selection circuit is connected with a follow-up signal processing circuit.

A method and apparatus for determining angular displacement of one or more parts of an object (10) comprising detecting in at least one first image sensor first and second one or more distributions of Fourier-transformed speckles before and after angular displacement, respectively, and determining the displacement of the detected images; a method and apparatus for determining twist of a rotating shaft between two or more parts of the shaft subjected to a load; a method and apparatus for simultaneously determining angular displacements and surface translations of one or more parts of an object, and a method of determining the radius of angular displacement of one or more parts of an object.

The invention is directed to a method of operating an image sensor. A first integration is performed on a first photodiode of a pixel circuit to obtain at least one first image signal. A second integration is performed on a second photodiode of the pixel circuit to obtain a second image signal, the first photodiode having a photodiode area larger than the second photodiode. A third integration is performed by collecting blooming charge overflowing from the first photodiode to obtain an overflow image signal. The first integration has longest integration time and the third integration has shortest integration time among the first integration, the second integration and the third integration.

An optical device for characterizing a test surface combines a Fizeau interferometer with a polarization frequency-shifting element. Two substantially collinear, orthogonally polarized beams having respective frequencies differing by a predetermined frequency shift are generated by the polarization frequency-shifting element and projected into the Fizeau optical cavity to produce a pair of test beams and a pair of reference beams, wherein the beams in each pair have orthogonal polarization states and have frequencies differing by the predetermined frequency shift. A second, substantially equal frequency shift is introduced in the Fizeau cavity on either one of the pairs of test and reference beams, thereby generating a four-beam collinear output that produces an interferogram without tilt or short-coherence light. The invention may also be implemented by reversing the order of the Fizeau cavity and the polarization frequency-shifting element in the optical train.

The invention relates to a back lighting type TDI image sensor and an electronic shutter control method thereof. The sensor comprises a substrate, a channel and grids, wherein the channel is prepared on the substrate, and the grids are prepared on the channel and arranged in parallel; the substrate comprises block layers which are arranged longitudinally along the grids at intervals; contact surfaces of the block layers and the substrate form PN conjunctions; storage grid areas are located above the block layers, integral grid areas are located above the intervals between adjacent block layers, and block grid areas are located between the storage grid areas and the integral grid areas. By the aid of sequential control, charges collected and accumulated in integral time are taken as effective charges to be read out, and charges generated under the block layers enter adjacent charge collection areas under the grids through a drift or diffusion effect and cannot be accumulated into effective signal charges. The integral time is reduced by the aid of the method that the block layers are arranged in the substrate at intervals, and the motion blur effect is effectively reduced.

The invention discloses a high-sensitivity light spectrum acquisition and test system with a board waveband covering visible light. The high-sensitivity light spectrum acquisition and test system with the board waveband covering visible light is characterized in that: the test system is composed of a light source, an acquisition light path, a photoelectric device, a signal acquisition circuit, an ARM (Advanced RISC Machine) processing circuit and a touch display screen, wherein the light source transmits a simulated full solar spectrum into the acquisition light path by a quartz optical fiber, and the light spectrum becomes parallel light through a collimating lens, then the parallel light is irradiated to a focusing lens through a holographic grating, converged and transmitted onto a detector; a current signal of the light spectrum is converted into a voltage signal by a read-out circuit, and the voltage signal is input to the signal acquisition circuit; the signal acquisition circuit inputs a signal of the read-out circuit to the processing circuit; the signal of the read-out circuit is digitally filtered, displayed and stored by an embedded ARM signal processing software; and the touch display screen performs light spectrum acquisition and test. Compared with the prior art, the high-sensitivity light spectrum acquisition and test system with the board waveband covering visible light provided by the invention has the advantages of integrated functions of acquisition, displaying and storage, high sensitivity in weak light detection, high signal-to-noise ratio, fastness and convenience, and suitability for portable and mobile applications.

The invention discloses a time-resolved wide-spectrum CARS spectral imaging device based on high-repetition-frequency femtosecond laser. The device comprises a high-repetition-frequency femtosecond laser device, a double-pulse laser generation module and a spectral imaging platform. The high-repetition-frequency femtosecond laser device is used for generating fundamental frequency light with the high repetition frequency and inputting the fundamental frequency light into the double-pulse laser generation module. The double-pulse laser generation module is used for generating fundamental frequency light and frequency shift light which are suitable for coaxial transmission of the time-resolved CARS imaging technology. And the spectral imaging platform is used for realizing scanning type Raman spectral imaging of a to-be-detected sample. According to the invention, the wide-spectrum femtosecond laser is used as pump light and Stokes light at the same time and coherence among multiple energy levels can be established at one time, so that hyperspectral imaging of various molecules can be realized at the same time. A coherent excitation process and a detection light excitation process which are jointly realized by the pump light and Stokes light are separated in time and narrow-spectrum light is adopted as the pump light, so that a non-resonance background is effectively suppressed,and the detection sensitivity is greatly improved.

A high dynamic range (HDR) image sensing method is provided. The image sensor includes steps of: sensing an image with a long integration time by a first long integration time sensor; and sensing the image with a short integration time by a first short integration time sensor.

The invention discloses a GLONASS satellite orbit calculating method and a system thereof. The method comprises the following steps of capturing a GLONASS satellite broadcast signal, converting into GLONASS satellite data and transmitting to a time determination module; determining whether satellite reference time tb in the GLONASS satellite data is different from current reference time tb of a positioning system, if the satellite reference time tb in the GLONASS satellite data is different from the current reference time tb of the positioning system, updating the reference time tb and satellite positioning data; otherwise, keeping using the reference time tb and the satellite positioning data; transmitting the GLONASS satellite data to a GLONASS step integration orbit calculation module and finally calculating a GLONASS satellite position and a speed; comparing satellite reference time to current satellite time, if the current time is greater than the satellite reference time and a difference is in one sampling epoch interval, recalibrating the GLONASS satellite position and the speed, otherwise, selecting a GLONASS high-efficiency orbit calculation module and finally calculating the GLONASS satellite position and the speed.

A device and method solves the problems of improving precision, in particular in reducing movement of a cuvette, particularly lateral or side to side movement of a cuvette, during the measurement process. The device, which stabilizes a cuvette during a measurement read in an analyzer having a cuvette path of travel, includes: a fixed support located on a first side of the path of travel and abutting a side of the cuvette at a location that does not interfere with an optical window on the cuvette on which the measurement read takes place; and a movable support located on a second side of the path of travel and biased against a side of the cuvette at a location that does not interfere with the optical window on the cuvette on which the measurement read takes place, and which is opposite the side abutting the fixed support.

The invention discloses an electric heater for an aquarium body, the electric heater comprising an insulating tube and a heating control circuit board arranged inside the insulating tube. The heating control circuit board comprises a capacitance induction module and a single-chip microcomputer control module. An output end of the capacitance induction module is connected to an input end of the single-chip microcomputer control module. The invention also discloses an electric heating method for an aquarium body comprising following steps: the capacitance of medium in the space outside the insulating tube is collected by a detecting electrode of the capacitance induction module; the integration time of integration capacitor is detected by the single-chip microcomputer control module; the output of a power control device is controlled by the single-chip microcomputer control module. According to the electric heating method, the capacitance of medium in the space outside the insulating tube is detected by a detecting electrode of the capacitance induction module arranged inside the insulating tube; the integration time of integration capacitor is detected by the single-chip microcomputer control module. Thus, whether the heating device is immersed in the liquid or not is detected in a non-contact manner. The problem of easy corrosion of electrode by contact-type detecting is solved. The beneficial effects are: high detection sensitivity; reduced potential risk of electric heaters; prolonged service life of electric heaters.

A method of reading electrical charges produced by a photo-detector of a photo-detector matrix includes collecting and storing electrical charges produced by the photo-detector in a first capacitive element, transferring the charges stored in the first capacitive element to a second capacitive element, and reading the voltage at the terminals of the second capacitive element. The transfer followed by the reading is carried out in at least two phases: at least one first phase taking place during the collection and storage of the charges in the first capacitive element, and a second phase taking place at the end of the collection and storage of the electrical charges in the first capacitive element.