57 results about "Microscopic Inspection" patented technology

The invention provides a macro inspection apparatus including: a stage on which an inspection object is placed; a light source that irradiates light on an upper surface of the inspection object from an angular direction arbitrarily selected relative to the upper surface of the inspection object; and a line sensor which is placed in an angular direction selected relative to the upper surface of the inspection object so that an optical axis thereof corresponds with an edge of the upper surface area irradiated by the light source and which receives reflected light from the edge of the upper surface area of the inspection object.

A method and line for inspection of tyres, wherein: a first inspection post (12) for macroscopic inspection comprises means for rotating the tyre and means for acquiring a macroscopic image of the tyre and first means for analyzing this macroscopic image by digital image processing and for comparing the macroscopic image with a reference image and detecting any variations in shape; a second inspection post (16) for microscopic inspection comprises means for rotating the tyre and means for acquiring a microscopic image of the tyre and second means for analyzing this microscopic image by digital image processing and comparing the microscopic image with a reference image that is representative of a desired surface condition of the tire to detect any local surface variations; transfer means (50) that transfer the tire from the first post to a discharge point or to the second inspection post.

This visual inspection apparatus has a macro-inspection section and a micro-inspection section. In the micro-inspection section, a inspection stage and a microscope are loaded into a loading plate. The inspection stage can be moved in any directions of the X, Y, and Z directions, and can also be rotated in the θ direction. Moreover, a peripheral edge inspection section that acquires an enlarged image of a peripheral edge of wafer W is fixed to the loading plate. The peripheral edge inspection section is arranged so as to image the peripheral edge of wafer W held by the inspection stage.

A sample carrier (10) for microscopic examination of biological samples includes a base body (12) and a filter membrane. The base body has at least one recess (14) in which the filter membrane (16) is disposed. The filter membrane (16) makes an essentially flush closure with the surface of the sample carrier (10). The sample carrier (10) has a circular shape. Therefor, the sampler carrier (10) can be disposed in a rotatable manner, so that possibilities of microscanning the surface of the filtering membrane (16) is made.

A test mark which is used in an inspection after a display panel, TAB tapes, and a flexible board have been connected together, and electronic device incorporating the same. Defective panels can be rejected with high accuracy in the simple inspection, thereby mitigating the burden on the microscopic inspection. At a predetermined distance from each of connection areas for connecting a panel substrate, TAB tapes, and a flexible board, there are provided test marks with at least one on each component. The electrical connection is tested between each pair of the test marks to thereby determine whether the interconnection is in a good state.

The invention discloses an XYZ microscope with a vertically translatable carriage. The invention also relates to an autofocus device for microscopy of a plurality of spatially distributed samples andto a method for autofocus and microscopy of a plurality of spatially distributed biological samples by means of a microscope according to one or more of the preceding claims. The device comprises a microscope and an objective table capable of moving relative to the microscope along the z direction, the device is configured to carry out automatic focusing by evaluating the definition of digital microscopic images of an objective table at a plurality of vertical positions under the assistance of a computer. The microscope is characterized in that the objective table comprises a sliding base anda sample table supported on the sliding base, the sample table can horizontally move relative to the sliding base in the z direction, and the sliding base can horizontally move relative to the microscope in the x direction and the y direction.

The invention provides full-automatic microscopic scanning equipment which comprises a bearing seat, a driving component and an automatic microscopic inspection component. The driving component comprises a lifting box discharging component, a lifting box collecting component and a slice transverse moving component, the lifting box discharging component and the lifting box collecting component bothcomprise a fixing seat, a lifting guide plate and a lifting driving piece, wherein the lifting driving piece comprises a lifting driving motor, a lifting conveying belt and a lifting box, a sample glass slide is arranged in the lifting box; the slicing transverse moving part comprises a supporting seat, a transverse moving fixing rod and a transverse moving driving part, the transverse moving driving part comprises a transverse moving driving motor, a transverse moving conveying belt and a driving baffle plate, and the automatic microscopic inspection component comprises an automatic microscope and a limiting seat. According to the full-automatic microscopic scanning equipment, the driving of loading and unloading of the sample glass slide, the driving of a scanning station and the automatic scanning are automatically carried out, so that the scanning efficiency is improved, and the problem that the scanning efficiency is low due to the manual loading and unloading driving and the driving of the scanning station is effectively prevented.

An automated optical inspection system includes a pulsed light source illuminating an article to be inspected thereby to generate at least one image thereof, at least one camera having a field of view, and a relative motion provider operative to provide relative motion between the camera and at least one image of at least a portion of the article. The relative motion provider may include a first continuous motion provider and a second, velocity-during-imaging-lessening motion provider. The relative motion is a superposition of a first continuous component of motion provided by the first motion provider and a second, smaller component of motion provided by the second motion provider which lessens the velocity of the at least one image relative to the camera, during imaging.