57 results about "Microscopic Inspection" patented technology

An integrated interferometric and intensity based microscopic inspection system inspects semiconductor samples. A switchable illumination module provides illumination switchable between interferometric inspection and intensity based microscopic inspection modes. Complex field information is generated from interference image signals received at a sensor. Intensity based signals are used to perform the microscopic inspection. The system includes at least one illumination source for generating an illumination beam and an integrated interferometric microscope module for splitting the illumination beam into a test beam directed to the semiconductor sample and a reference beam directed to a tilted reference mirror. The beams are combined to generate an interference image at an image sensor. The tilted reference mirror is tilted with respect to the reference beam that is incident on the mirror to thereby generate fringes in the interference image. The system also includes an image sensor for acquiring the interference image from the inteferometric microscope module and intensity signals from the microscopic inspection image.

A quantitative fecal examination apparatus includes a fecal collector removably mounted on a container base, having the fecal collector provided with a suction portion for sucking a fecal specimen into the collector and then the fecal specimen is disposed into the container base for examination test or for sucking the fecal specimen for further laboratory test including microscopic inspection, and having a quantitative design in the examination apparatus for collecting the fecal sample in a pre-set quantity for more precise examination.

A test mark is provided, for use in an inspection after a display panel, TAB tapes, and a flexible board have been connected together. Defective panels can be rejected with high accuracy in the simple inspection, thereby mitigating the burden on the microscopic inspection. At a predetermined distance from each of connection areas for connecting a panel substrate, TAB tapes, and a flexible board, there are provided test marks with at least one on each component. The electrical connection is tested between each pair of the test marks to thereby determine whether the interconnection is in a good state.

The invention relates to a method for microscopic investigation of a plurality of samples. The method contains the step of arranging the samples in a sample holder that is movable, in particular in motorized and / or automatic fashion, relative to a sample illumination position in such a way that at least one of the samples is respectively successively positionable in the sample illumination position, a clearance for a deflection means respectively remaining adjacent to the sample that is currently located in the sample illumination position; the step of focusing a light stripe with an illumination objective; the step of deflecting the light stripe, once it has passed through the illumination objective, with the deflection means in such a way that the light stripe propagates at an angle different from zero degrees with respect to the optical axis of the illumination objective and has a focus in the sample illumination position; and the step of successively positioning the samples, retained with the sample holder, in the sample illumination position, and detecting the detected light emerging from the sample respectively located in the sample illumination position. The invention furthermore relates to an optical apparatus having a sample holder that holds a plurality of samples and is supported movably, in particular in motorized and / or automatic fashion, relative to a sample illumination position in such a way that at least one of the samples is respectively successively positionable in the sample illumination position.

The present invention provides a substrate appearance inspecting device which can obtain a vivid image of checked substrate conveyed from a conveying path without a high-performance device thereby executing high-precision microscopic inspection. The substrate appearance inspecting device (1) comprises the following components: a substrate conveying path (25) which moves a substrate (33) in a constant direction; a lighting part (13) which irradiates light to the substrate (33); a camera shooting part (15) which receives the reflected light which is irradiated from the lighting part (13) and reflected at the substrate (33) or penetrated light that penetrates the substrate (33); a driving part (7) which moves the lighting part (13) and the camera shooting part (15) wholly; and a controlling part (11) which controls the driving of driving part (7) to cause that the driving part (7) moves the lighting part (13) and the camera shooting part (15) along a direction same with the moving direction of the substrate (33).

The invention discloses a bifocal wave zone plate interference microscopic-inspection device based on phase grating light splitting. The bifocal wave zone plate interference microscopic-inspection device comprises a 13.5nm of n ultraviolet light source, a vacuum chamber, a vacuum air-extracting pump, an air floatation optical vibration isolation platform, an extreme ultraviolet CCD (Charge Coupled Device), a five-dimensional precision fine-adjustment platform, a five-dimensional precision fine-adjustment platform controller and a bifocal wave zone plate interference microscopic-optical assembly based on the phase grating light splitting. The bifocal wave zone plate interference microscopic-inspection device disclosed by the invention has the advantages of simple structure, good vibration resistance, high accuracy and low system cost.

The invention provides a macro inspection apparatus including: a stage on which an inspection object is placed; a light source that irradiates light on an upper surface of the inspection object from an angular direction arbitrarily selected relative to the upper surface of the inspection object; and a line sensor which is placed in an angular direction selected relative to the upper surface of the inspection object so that an optical axis thereof corresponds with an edge of the upper surface area irradiated by the light source and which receives reflected light from the edge of the upper surface area of the inspection object.

The invention relates to a microdefect integration early warning method and a device which uses the method. A microscopic inspection machine is used in sequence to detect a substrate to be detected, defects on the substrate to be detected are found and positioned and are stored into a memory unit, a data collection unit collects various pieces of detection defect data of the substrate to be detected from the memory unit, and the detection defect data is transmitted into an integration classification unit. The integration classification unit simultaneously imports a defect database, historicaldefects are analyzed and compared with an existing defect so as to judge a defect situation on the substrate to be tested, and classification integration is carried out. When necessary, when the defect achieves a certain extent of injury, an early warning mechanism is triggered to work. By use of the method, the deficiency that detection personnel manually carry out manual analysis on the detection defect data each time is omitted, and the operation state of a generation field is reflected in real time. By use of the device which uses the method, detection efficiency is improved, and cost waste brought by detection result lagging is avoided.

An automated optical inspection system includes a pulsed light source illuminating an article to be inspected thereby to generate at least one image thereof, at least one camera having a field of view, and a relative motion provider operative to provide relative motion between the camera and at least one image of at least a portion of the article. The relative motion provider may include a first continuous motion provider and a second, velocity-during-imaging-lessening motion provider. The relative motion is a superposition of a first continuous component of motion provided by the first motion provider and a second, smaller component of motion provided by the second motion provider which lessens the velocity of the at least one image relative to the camera, during imaging.

An inspection block is disclosed for use in inspection of biological matter in a container unit which has a chamber with transparent walls, the inspection block having a transverse docking passage for receiving and positioning a container unit, an observation chamber extending transversely relative to the docking passage and in communication therewith such that the biological matter located inside the container unit may be microscopically inspected through the chamber walls, transparent liquid for immersing at least part of the container unit so as to define a chamber wall / liquid optical interface for microscopic inspection therethrough. The inspection block may be made of steel, aluminum or plastic. In the latter case, the plastic inspection block may have closed cavities for containing insulating blocks and / or one or more downwardly opening air pockets retaining heat given off by a warmed work bench and / or warmed microscope stage on which the inspection block is supported during inspection.

The invention discloses a wind power plant unmanned aerial vehicle automatic inspection system and method based on a LoRaWAN positioning technology, and belongs to the technical field of wind power plant unmanned aerial vehicle inspection. The method comprises the steps: enabling the unmanned aerial vehicle to perform macroscopic inspection on the wind turbine generator of the wind power plant, and uploading a macroscopic inspection image of the wind turbine generator through the LoRa terminal; preprocessing the uploaded image data; diagnosing the macroscopic inspection image of the wind turbine generator to find out a fault image; determining a shooting position for the fault image, and determining a fault fan according to the shooting position of the fault image and the position information of the wind turbine generator; controlling the unmanned aerial vehicle to fly to a specified fault fan for microscopic inspection and shooting a high-definition image; diagnosing the high-definition image shot by the microscopic inspection to find out a fault image and determine a fault type, and storing the high-definition fault image into an expert database for next image diagnosis. The wind power plant inspection is automatic, the power consumption of manual operation of unmanned aerial vehicle inspection on a path is avoided, the cruising ability of the unmanned aerial vehicle is improved, and low-power-consumption positioning is realized.

The present invention relates to a method of preparing a strain of sugar fermenting Saccharomyces cerevisiae with capability to ferment xylose, wherein said method comprises different procedural steps. The method comprises mating a first sporulated Saccharomyces cerevisiae strain with a second Saccharomyces cerevisiae haploid strain. Thereafter, screening for mated cells is performed, growing such mated cells, and verifying that mated cells exhibit basic morphology by microscopic inspection. Thereafter, creation of a mixture of the mated cells is performed, subjecting the mixture to continuous chemostat lignocellulose cultivation and obtaining the sugar fermenting Saccharomyces cerevisiae cells with capability to ferment xylose is performed. The invention also comprises strains obtained by said method.

The invention discloses a method for inspecting acid-fast bacilli by liquid-based thin-layer cell smears. The method comprises the following steps: collecting a specimen, and collecting 2-5ml of sputum of a subject; preparing a treating liquid, and preparing a sputum pretreating liquid for inspecting acid-fast bacilli by the liquid-based thin-layer cell smears; centrifuging, adding the sputum into the prepared sputum pretreating liquid, and vibrating for multiple seconds; preparing a section, absorbing multiple milliliters of the sputum at the bottom of a sputum pretreating liquid test tube by a sucker, putting the sputum into a section preparation bin, putting the section preparation bin into a section preparation machine, and taking out the section preparation bin to dry when the section preparation machine completes the preparation; and carrying out acid-fast staining and microscopic inspection. Compared with the prior art, the method provided by the invention has the advantages that the positive incidence for inspecting acid-fast bacilli by sputum thick smears is improved by tens of times; the tuberculosis infection source can be found out as soon as possible; the tuberculosis can be treated early if being found out early; the burden of patients is relieved; the tuberculosis expansion can be controlled.

The invention discloses a stepless zooming microscopic inspection device for a full-automatic arena analyzer. The stepless zooming microscopic inspection device comprises a microscopic light-gathering system, a counting pond, a zooming objective lens barrel, a microscopic objective lens and a video camera, wherein the microscopic objective lens and the video camera are arranged on the zooming objective lens barrel; a zooming stepping motor is fixedly arranged on the zooming objective lens barrel; a transmission gear is arranged on an output shaft of the zooming stepping motor, and is meshed with a zooming gear which is sleeved on the zooming objective lens barrel; and a spacing ring is fixed on the zooming gear, and is matched with an optical coupler which is fixed on the zooming objective lens barrel through a supporting seat. Compared with the prior art, the invention has the advantages that: the stepless zooming microscopic inspection device has a simple structure and low cost; continuous stepless adjustment of optical magnification times between 20 and 100 can be realized only by using one microscopic objective lens with a fixed magnification time without replacing any lens; the microscopic inspection device can be connected with a CCD (Charge Coupled Device) video camera for quickly and continuously shooting samples in a certain area in the counting pond to provide continuous and clear images; and moreover, sampling imaging is clear in the continuous zooming process, and refocusing is not required.

The invention discloses a bifocal wave zone plate interference microscopic-inspection apparatus for detecting flat mask defect. According to the apparatus, a light source, an aperture diaphragm, a positive lens, a semi-reflecting and semi-transmitting spectroscope, a bifocal wave zone plate, a flat mask to be detected, light passes through the aperture diaphragm to form a spot light source, and then passes through a positive lens to form parallel light, parallel light passes through the semi-reflecting and semi-transmitting spectroscope and realizes incidence on the bifocal wave zone plate, 0-grade diffracted light satisfies a refraction principle, +1 grade diffracted light realizes converge under regulation and control of a bifocal wave zone plate phase function, and light having the phase information of the surface of the flat mask to be detected is reflected to form a return light path. By employing a bifocal wave zone plate interference system of reference light and test light common path, bifocal wave zone plate realizes diffraction condition of coexistence focal length and no focal length, Compared with a several sheets lens transmission group system, quantity of the lens transmission groups can be reduced, The bifocal wave zone plate interference microscopic system realizes synchronous detection function of amplitude-type defect and phase-type defect.

The invention provides an identification method of a counterfeit refurbished plastic packaging device. The identification method comprises the following steps: S1, inspecting appearance physical features of the device through- microscope amplification; S2, inspecting internal physical features of the device by using an X ray; S3, inspecting internal physical features of the device by using an acoustic scanning microscope; S4, removing a packaging material of the device in a manner of combining laser unsealing and acid unsealing; S5, performing microscopic inspection on the internal physical features of the device by using a microscope; S6, performing energy spectrum analysis on a bonding lead material inside the device; S7, inspecting chip structure features by using the scanning microscope; S8, judging whether the appearance physical features, the internal physical features, the bonding lead material and the chip structure features of the device are consistent with those of an original factory device and judging whether the device is the counterfeit refurbished device if any one or more of the appearance physical features, the internal physical features, the bonding lead materialand the chip structure features are inconsistent with those of the original factory device. The identification method provided in the invention can effectively identify the counterfeit refurbished plastic packaging device and prevent or reduce the reliability risk caused by the use of the counterfeit refurbished plastic sealing device in a complete machine.

The invention provides full-automatic microscopic scanning equipment which comprises a bearing seat, a driving component and an automatic microscopic inspection component. The driving component comprises a lifting box discharging component, a lifting box collecting component and a slice transverse moving component, the lifting box discharging component and the lifting box collecting component bothcomprise a fixing seat, a lifting guide plate and a lifting driving piece, wherein the lifting driving piece comprises a lifting driving motor, a lifting conveying belt and a lifting box, a sample glass slide is arranged in the lifting box; the slicing transverse moving part comprises a supporting seat, a transverse moving fixing rod and a transverse moving driving part, the transverse moving driving part comprises a transverse moving driving motor, a transverse moving conveying belt and a driving baffle plate, and the automatic microscopic inspection component comprises an automatic microscope and a limiting seat. According to the full-automatic microscopic scanning equipment, the driving of loading and unloading of the sample glass slide, the driving of a scanning station and the automatic scanning are automatically carried out, so that the scanning efficiency is improved, and the problem that the scanning efficiency is low due to the manual loading and unloading driving and the driving of the scanning station is effectively prevented.

The present invention relates to a microscopic examination device comprising a microscope and a sample preparation arrangement for preparing one or more samples to be examined in said microscope, said preparing including pipetting one or more liquids into one or more sample receptacles for said one or more samples, said sample preparation arrangement comprising a base and a receiving structure adapted to receive said one or more sample receptacles, said sample preparation arrangement further comprising a pipetting guide movably fixed or fixable in relation to the receiving structure, said pipetting guide comprising one or more pipette guiding structures positionable in relation to said one or more sample receptacles by pivoting said pipetting guide in relation to said base. A method of preparing one or more samples for microscopic examination is also part of the present invention.

The invention belongs to the technical field of electronic product processing and production, and discloses a wafer detecting method. The method includes S1, providing a wafer detection device with atleast macroscopic detection station and microscopic detection station, providing a wafer detection device with at least microscopic detection station and a wafer detection device with at least microscopic detection station; S2, carry that wafer to be tested to the macroscopic detection station and / or the microscopic detection station, and carrying out macroscopic detection and / or microscopic detection on the wafer to be tested; S3, removing the detected wafer from the wafer detection apparatus. The wafer detection method of the present invention can perform macroscopic and microscopic detection on a wafer by providing a wafer detection device with a macroscopic detection station and a microscopic detection station, wherein the macroscopic detection station mainly observes defects visibleto the naked eye on the wafer. The microscopic inspection station mainly observes the defects on the wafer which can not be observed by the naked eye through the microscope equipment, so that the defects caused by the processing technology can be detected and analyzed comprehensively so as to improve the wafer in time.

The invention relates to a preparation method of S-adenosylmethionine. The method comprises the steps of: (1) fermentation: fermenting Escherichia coli for 12h to obtain a thallus; keeping the fermentation level at 100g / L, conducting thallus breaking to obtain a bacterium suspended solution, adding water into trihytdroxy methyl-aminomethane, performing stirring dissolving, carrying out dilution to 1000ml, using a hydrochloric acid solution to adjust the pH value to 8.0 to obtain a Tris-Hcl buffer solution, adjusting the thallus concentration according to the performance of a high pressure homogenizer, and performing microscopic inspection to find that the thallus breaking rate is greater than 90%; (2) enzyme supernatant collection: employing a low temperature high speed centrifuge, carrying out enzymatic reaction, performing rough filtration to recover enzyme, using a hollow fiber column to remove enzyme, performing nanofiltration concentration and ion exchange, concentrating a purification solution to about 350L by a nanofilter; and (3) resin adsorption: detecting purity by HPLC, carrying out 1, 4-butanedisulfonate anion detection, and calculating the content, then performing spray drying so as to obtain an S-adenosylmethionine finished product. The method provided by the invention has the advantages of simple process, low cost and suitability for mass production, and the obtained product is more stable.

The invention discloses a microporous filter membrane slide preparation device and a method for assembling the same during slide preparation and microscopic observation. The microporous filter membrane slide preparation device comprises a cup and a microporous filter membrane. The microporous filter membrane is arranged at the bottom of the cup, a clamp ring groove of the cup is formed in the lower end surface of the cup, and a membrane mounting ring which corresponds to the clamp ring groove of the cup is fixed to the surface of the microporous filter membrane and is freely embedded in the clamp ring groove of the cup; a ring fetching slide opening is formed in the bottom of the cup. The microporous filter membrane slide preparation device and the method for assembling the same during slide preparation and microscopic observation have the advantages that the microporous filter membrane slide preparation device is of a brand-new structure, brand-new slide preparation and microscopic inspection processes are adopted, accordingly, slides can be conveniently separated after microporous filter membrane slide preparation is carried out, and fixed microscopic inspection can be carried out on the slides conveniently and quickly.

An automated optical inspection system includes a pulsed light source illuminating an article to be inspected thereby to generate at least one image thereof, at least one camera having a field of view, and a relative motion provider operative to provide relative motion between the camera and at least one image of at least a portion of the article. The relative motion provider may include a first continuous motion provider and a second, velocity-during-imaging-lessening motion provider. The relative motion is a superposition of a first continuous component of motion provided by the first motion provider and a second, smaller component of motion provided by the second motion provider which lessens the velocity of the at least one image relative to the camera, during imaging.

The present invention provides for fishing rods and methods of assembling fishing rods utilizing novel techniques including microscopic inspection and acoustic analysis to assess construction component as well as assembled fishing rods. As such, the present invention utilizes these techniques for measuring the quality and density of the bamboo fibers, which can be a basis for the selection of culms, strips of bamboo, and assembled rod blanks. The present invention also provides construction methods used to remove cell and fiber material combined with the application of epoxy reinforcements. Further, the present invention provides a method of connecting bamboo splines together using a combination of epoxy-based adhesive, vacuum pressure, and heat. Fishing rods according the present invention may also include a carbon fiber or fiberglass ferrule.

The present invention provides a seed preservation technology of immobilized microalgae by using organic synthetic polymers in the technical fields of seed preservation. Firstly, an organic syntheticpolymer fixative, sodium chloride and algae liquid are quantitatively weighed, then the organic synthetic polymer fixative, sodium chloride and algae liquid are separately added into distilled water to prepare a gel solution of a certain concentration, the organic synthetic polymer fixative gel solution is boiled and disinfected, then the organic synthetic polymer fixative gel solution is fully and evenly mixed with the algae liquid in a certain amount, the mixture is evenly dropped into a CaCl2 solution at a uniform rate by a syringe, dropping is conducted while shaking is conducted, after acertain period of time, solidified microalgae beads are formed, the formed calcium micro-alginate beads are washed several times with sterile distilled water to obtain fixed algal cells, the fixed algal cells are preserved and cultured, finally, timing sampling for a resuscitation test is conducted, culture at room temperature is conducted for 10 days, and first visual inspection and then microscopic inspection are conducted to determine whether the algal cells are alive. The preparation method is simple, liable to operate, not liable to contaminate, and longer in seed preservation time.