4 results about "Microscopic Inspection" patented technology

1. Name of the product in this design: Spinneret microscopic inspection machine. 2. Purpose of this design: To inspect the micropores of the spinneret to determine whether they are blocked, whether their shape is normal, and whether there are defects such as impurities, carbonization, or damage. 3. The key design feature of this product is its shape. 4. The image or photograph that best illustrates the design's key points: a 3D model.

This invention provides a method for inspecting optical films, enabling high-precision and efficient inspection and determining the location information of defects in the thickness direction of the optical film. The invention includes a macroscopic inspection step using a first imaging mechanism and a microscopic inspection step using a second imaging mechanism. In the microscopic inspection step, based on the defect location information determined in the macroscopic inspection step, the position of the imaging field of the second imaging mechanism is controlled in a manner capable of capturing images of the defect. The focal position of the second imaging mechanism is moved to multiple locations in the thickness direction of the optical film, and images are captured at each location, thereby generating multiple captured images. An evaluation object region relative to the defect and its vicinity is determined in the composite image obtained by combining the multiple captured images. Based on the brightness values ​​within the same pixel region as the evaluation object region, a focused image is determined among the multiple captured images, and detailed information about the defect is obtained based on the focused image.

This application belongs to the field of smart water technology and relates to a pipeline leak detection method. The method includes: dividing the water supply network into zones to obtain target monitoring areas; deploying capsule robots to the target monitoring areas for dynamic inspection to obtain target survey data; the capsule robots are equipped with at least a pressure sensor, an ultrasonic flow sensor, and a camera; performing multi-source data fusion processing based on the target survey data and the target monitoring areas to obtain the target pipeline leak location; using the capsule robots to accurately locate the target pipeline leak location to obtain pipeline leak coordinates; performing leak detection based on the pipeline leak coordinates to obtain leak information; and uploading the leak information to a maintenance platform for leak alarm. This application combines macroscopic monitoring of DMA zones with microscopic inspection by capsule robots to achieve sub-meter-level positioning of leak points, reducing the false alarm rate of leak detection and improving inspection efficiency.

This invention provides an integrated wafer inspection device, including a worktable, a Y-axis moving module, a stage, a primary inspection camera, and a secondary inspection camera. The Y-axis moving module is positioned above the worktable, and the stage is located at the output end of the Y-axis moving module. The stage is used to load wafers and is equipped with a positioning mechanism that positions the wafer by pressing down on the edge ring of the wafer's top surface. The primary and secondary inspection cameras are positioned along the conveying direction of the Y-axis moving module. The primary inspection camera is used for initial wafer inspection and marking defect locations. The secondary inspection camera magnifies and re-inspects each defect location marked by the primary inspection camera, identifying the defect type and status. This invention integrates macroscopic and microscopic inspection, automatically detecting and identifying appearance defects with good inspection results and high efficiency.