35 results about "Aperture plane" patented technology

According to one embodiment, an optical test apparatus includes a first aperture, a second aperture, an image sensor, and a first lens. The first aperture includes a first aperture plane provided with a first wavelength selecting region. The second aperture includes a second aperture plane provided with a second wavelength selecting region different from the first wavelength selecting region. The image sensor is configured to image a light beam passing through the first aperture plane and the second aperture plane and reaching an imaging plane. The first lens is configured to make a light beam passing through the first aperture plane and the second aperture plane be incident on the imaging plane.

The invention aims to provide a medium-loaded ultra-wideband miniaturized double-ridged horn antenna, and belongs to the technical field of double-ridged horn antennas. A dielectric structure loaded on a horn mouth surface in the antenna comprises a dielectric lens, a dielectric flat plate and a dielectric guide section with a specific shape, and through loading of an integrated dielectric structure formed by the dielectric lens, the dielectric flat plate and the dielectric guide section, impedance mutation from a metal waveguide to a free space can be optimized, and reflection is reduced; electromagnetic waves are guided to converge, beam divergence is reduced, and the directivity and gain of a main lobe are improved; meanwhile, the wavefront of the horn mouth electromagnetic wave can be corrected to be a plane wave, phase distortion is reduced, and the far-field directivity is improved; focused electromagnetic waves are refracted, side lobes are reduced, and main lobe gain is improved. The ultra-wide-band miniaturized double-ridge horn antenna has excellent comprehensive performance of ultra wide band, miniaturization, high gain and low side lobe.

According to one embodiment, an optical test apparatus includes a first aperture, a second aperture, an image sensor, and a first lens. The first aperture includes a first aperture plane provided with a first wavelength selecting region. The second aperture includes a second aperture plane provided with a second wavelength selecting region different from the first wavelength selecting region. The image sensor is configured to image a light beam passing through the first aperture plane and the second aperture plane and reaching an imaging plane. The first lens is configured to make a light beam passing through the first aperture plane and the second aperture plane be incident on the imaging plane.

Systems and methods of imaging a sample using a charged-particle beam apparatus are disclosed. The charged-particle beam apparatus may comprise an energy discrimination device configured to filter incoming signal charged-particles having a plurality of ranges of energy levels. The energy discrimination device may include an electromagnetic charged-particle deflector configured to deflect a path of the incoming signal charged-particles based on an energy level of the incoming signal charged-particles; an aperture formed on an aperture plane, the aperture configured to allow a portion of the incoming signal charged-particles exiting the electromagnetic charged-particle deflector to pass through based on the deflection; and a control lens located upstream from the electromagnetic charged-particle deflector and configured to focus the incoming signal charged-particles on the aperture plane.

The invention discloses an X / Ku frequency band high-isolation heterogeneous common-caliber array antenna applied to satellite communication, and belongs to the technical field of common-caliber antennas. The heterogeneous common-caliber antenna comprises a parasitic patch layer, a first heterogeneous dielectric layer, a radiation patch layer, a second heterogeneous dielectric layer, a first grounding plane, a first dielectric layer, a feed network layer, a second dielectric layer, a second grounding plane and a coaxial line which are tightly attached in sequence from top to bottom. According to the heterogeneous common-caliber antenna, the X-waveband antenna and the Ku-waveband antenna share the same caliber face, the X-waveband antenna and the Ku-waveband antenna are heterogeneous in a medium nesting mode, the isolation degree of the two kinds of antennas in the same caliber face is very high, receiving and sending work can be conducted at the same time, and the miniaturization effect is outstanding; the array formation based on the heterogeneous common-caliber antenna can realize the simultaneous work of the X / Ku frequency band antennas under the half-wavelength spacing of the Ku frequency band, and the radiation performance is hardly influenced.

The invention discloses an integrated detection device and method for the shape of a large-aperture long-focal-distance axis lens, belongs to the shape detection of an off-axis lens in precision optics, and aims to solve the technical problem that the shape parameters of the off-axis lens cannot be integrally detected. The device comprises a large-aperture plane interferometer, a to-be-measured lens, a large-aperture computer-generated hologram plate, an attitude alignment module and a precise distance measurement module. A main test area, an alignment area and an off-axis calibration area are arranged on the large-aperture computer-generated hologram plate; and the attitude alignment module and the precision distance measurement module are respectively configured on a tool of a lens to be measured and a tool of a computer-generated hologram plate. The detection method comprises the following steps of: obtaining a background wavefront of the computer-generated hologram detection cavity by adopting a large-aperture standard spherical lens; the pose adjustment of the large-aperture computer-generated hologram plate and the to-be-measured lens is completed based on the large-aperture plane interferometer; measuring the transmission wavefront of the lens to be measured and deducting the background wavefront; and measuring and calculating the rear intercept of the to-be-measured lens, and calculating the off-axis amount by combining the off-axis angle.

Methods of forming oxide-based semiconductor layers include rotating a substrate around a center axis of a substrate deposition plane; heating the substrate; and emitting materials from a plurality of material sources to form an oxide-based layer on the substrate. The material sources comprise a source of oxygen species and at least other two material sources. Each material source has i) an exit aperture with an exit aperture plane and ii) a predetermined material ejection spatial distribution from the exit aperture plane, the material ejection spatial distribution having a symmetry axis which intersects the substrate at a point offset from the center axis. The exit aperture is positioned to achieve a desired layer deposition uniformity for a desired layer growth rate of the oxide-based layer.

The off-focus holographic measurement method of the planet zoom-based radio telescope of the application carries out off-focus observation on a planet as a source, obtains an actual observed beam pattern of the planet through deconvolution, establishes a theoretical far-field model of the planet, compares the theoretical far-field model of the planet with the actually observed beam pattern to calculate a redundancy value, continuously updates coefficients of Zernike polynomials through minimization of the redundancy value and iteration until an optimal phase model is determined, and determines a phase error on an aperture plane according to the phase model. The off-focus holographic measurement method of the application introduces a planet as a radio source, not only improves measurement accuracy and stability, but also enhances real-time measurement effect and multi-frequency calibration capability, significantly improves calibration accuracy and overall performance of the Tianma radio telescope, and solves many limitations of traditional surface measurement methods, such as slow measurement speed, need of additional hardware devices, great influence of weather, limited application range and the like.

The application discloses a high-speed high-resolution three-dimensional diffraction tomography method. The application sets an aperture plane control device at the rear end of the microscope light hole, controls two intensity images with different defocusing distances to be separated horizontally on the target surface of the camera and collected synchronously, and adopts spatial filtering to obtain the intensity images corresponding to the two focal planes respectively. The application adopts a ring LED as an illumination light source, lights the LED in sequence to irradiate the sample from different angles, and combines the rear end aperture plane control device, so that the intensity stacks corresponding to the two focal planes can be obtained without introducing mechanical displacement. The application establishes a double-focal-plane light intensity transmission diffraction tomography theoretical model, determines the optimal defocusing distance based on the model, and obtains the three-dimensional refractive index result of the sample through single deconvolution, so that the problem that the time resolution and the spatial resolution cannot be compatible in the non-interference light intensity diffraction tomography is effectively solved.

The invention provides an optical system and a camera, the optical system is sequentially provided with an angle optical filter and an imaging surface from an object side to an imaging side along an optical axis, the angle optical filter is arranged on a diaphragm plane of the optical system, and light is projected to the imaging surface through the angle optical filter; in the angle optical filter, the transmittance corresponding to each diaphragm angle is restrained to be the ratio of the minimum relative illuminance on the imaging surface to the relative illuminance corresponding to the diaphragm angle, and the diaphragm angle is the included angle between light rays and the optical axis when the light rays penetrate through the angle optical filter. The angle filter is configured to have different transmittance characteristics for light rays of different incident angles. When incident light rays at different angles penetrate through the angle optical filter and are projected to the imaging surface, the light rays projected to the imaging surface can realize relative illumination balance through differentiated setting of the angle optical filter on the transmittance of the incident light rays at different angles, so that the quality of a formed image is effectively improved.

This invention relates to a high-precision measurement device and adjustment calibration method for optical axis deviation in multi-aperture imaging systems, belonging to the field of multi-aperture imaging technology. Addressing the problems of current measurement devices being bulky, heavy, and expensive, this invention includes a mounting substrate and an optical axis deviation adjustment component. The multi-aperture imaging system is located on one side of the reflected light path of the optical axis deviation adjustment component. The optical axis deviation adjustment component includes a collimating light source, multiple beam splitting elements, a large-aperture plane mirror, and a light spot acquisition and analysis device. The large-aperture plane mirror completely encloses the optical axis of the multi-aperture imaging system. By adjusting the large-aperture plane mirror, the light beam reflected by N1 returns and is transmitted through N1, then focused at the focal point of the focusing lens, making the centroid of the light spot close to the center coordinates of the area array photodetector. Similarly, other beams reflected by N1 are focused at the focal point of the focusing lens. i The centroids of the reflected light spots are all located at the same position as the centroid of the N1 light spot, thus enabling the calibration of the optical axis deviation of the multi-aperture imaging system.

The present application relates to optical system adjustment technology, in order to solve the existing adjustment method error, low precision, resolution inconsistency and other problems, and proposes a kind of adjustment method of multi-channel imaging system, comprising: according to the theoretical parameters of system design, preliminary building is carried out to multi-channel imaging system;The attitude of the transmitting end primary mirror is determined by the first theodolite, small aperture plane mirror and large aperture plane mirror, the spatial position of the transmitting end secondary mirror is adjusted by the second theodolite and cross hair scale plate, the image of cross hair scale plate is coincided with the center of the second theodolite after passing through the transmitting end primary mirror and the transmitting end secondary mirror in turn, the spatial position of the slit and light source is determined, the transmitting end optical path adjustment is completed;The receiving end optical path is adjusted according to the transmitting end optical path adjustment step, then the resolution plate is installed between the transmitting end optical path and the receiving end optical path, the spatial position of the imaging lens is adjusted, so that multiple imaging cameras can capture the sharpest image of the resolution plate, and the adjustment of multi-channel imaging system is completed.

The invention discloses a terahertz near-field feed array amplitude and phase determination method based on plane wave incidence. The method comprises the following steps: 1, establishing a three-dimensional calculation model of an equiphase surface, a lens or a reflecting surface and an offset-focus feed surface; 2, the plane waves are propagated from the equiphase surface to the lens or the reflecting surface; 3, the position of a solving point is consistent with the center position of an actual feed source port plane; 4, calculating phase and amplitude parameters of each solving point of the offset-focus feed surface; 5, setting an included angle parameter between the equiphase surface and the normal of the aperture surface of the lens or the reflecting surface; 6, traversing the amplitude-phase distribution of the offset-focus array plane corresponding to each beam pointing angle in the beam scanning range; and 7, taking the amplitude-phase distribution parameter in the step 6 as input, and solving a conjugate phase of each solution point as an angle driving parameter applied by the phased-array antenna. According to the method, a unified calculation model is provided, so that the method is applicable to the two antenna designs, the calculation difference is reduced, and the design efficiency is improved.

Systems and techniques for polarization are illustrated. One embodiment includes a system for polarization imaging. The system includes a camera that is an autofocus sensor. The camera includes a main lens. An aperture plane of the main lens is overlaid with a multiplexed polarization filter, where the multiplexed polarization filter includes a plurality of sub-filters; and each sub-filter follows a distinct polarization angle. The camera includes a detector array, wherein the detector array includes a plurality of sensor pixels. The camera includes a microlens array including a plurality of microlenses overlaid over the detector array. The microlens array is placed at a focal plane of the main lens. Each microlens is: unfiltered; and configured to direct incident light to a distinct subset of the sensor pixels. The system further includes a memory storing image data and a processor configured to execute instructions to process the image data.

The invention discloses a Ritchey-Commann surface shape detection method and system based on two-angle Power iterative fitting. Belongs to the technical field of optical detection and particularly relates to the technical field of large-aperture plane mirror surface shape error detection. The objective of the invention is to efficiently process detection data of Ritchey, Common and Miwn angles and calculate an accurate and reliable real surface shape of a plane mirror. Under the condition that the defocusing error amount is unknown, the optimal Power coefficient is calculated automatically and iteratively, the detection operation process is effectively simplified, the dependence of data processing on accurate measurement of the length value of the system is reduced, and meanwhile, the precision of plane mirror surface shape recovery solution is ensured.

Embodiments of the present application relate to the technical field of antennas, and provide an antenna, a communication module, an electronic device, and an antenna design method and apparatus, for use in mitigating the problems of high structural complexity and low aperture utilization of shared-aperture antennas. The antenna comprises: at least two antenna units and a metasurface. All the antenna units operate within a same aperture plane. The operating frequency bands of at least two antenna units among all the antenna units are different. In addition, the beam transceiving directions of all the antenna units are oriented toward the metasurface.

The application discloses a method for scanning and calibrating a focal plane of a large-aperture objective lens by using a small-aperture light beam, and aims at solving the problems of high economic cost, inconvenient operation and small application range in the focal plane calibration process of a large-aperture objective lens used in a field or a large-aperture objective lens used on line in the prior art. In the application, a small-aperture parallel light source is driven by a reflecting mirror to scan a large-aperture objective lens to be measured, and the position of a detector is determined according to the state of a light spot on the detector, so that the focal plane of the objective lens to be measured is determined. Compared with the method for directly measuring the focal plane of a large-aperture objective lens to be measured by using a large-aperture parallel light pipe and a large-aperture plane mirror in the prior art, the method provided by the application is more economical, portable and convenient to operate, and has a wide application range and can be applied to the focal plane calibration of large-aperture objective lenses in various environments.

An optical system of a Transmission Electron Microscope (TEM) is configured to use a square-shaped electron beam. Preferably, the square-shaped electron beam is produced by using an aperture with a square hole positioned in an aperture plane of TEM's beam shaping aperture (typically, the C2 lens). The square beam enables exhaustive tiling and data collection, enabling the complete imaging of large biological objects. In single particle analysis, a square beam also speeds up data collection rates. These improvements come with no significant loss in imaging quality compared to the standard round beam method of imaging.

An anchoring device, including a finger-mountable work channel defining assembly defining two side walls joined at an end wall, the finger-mountable work channel defining assembly defining a finger mounting axis, the finger-mountable work channel defining assembly defining a work channel axis along one of the side walls, the finger-mountable work channel defining assembly defining an aperture lying generally in an aperture plane angled with respect to the finger mounting axis and with respect to the work channel axis, the finger-mountable work channel defining assembly defining at least one protrusion adjacent to the aperture, an anchor insertion assembly arranged for axial displacement along the work channel axis with respect to the aperture so as to intersect the aperture plane and an anchor assembly including at least an anchoring portion and a flexible elongate portion attached thereto, the anchoring portion having a pre-anchoring operative orientation and an anchoring operative orientation.

The invention discloses a method for generating a Skyrmion tube and an array thereof through tight focusing. The method comprises the following steps: constructing the Skyrmion tube or the Skyrmion tube array in a focal field in advance; the method comprises the following steps: slicing a pre-constructed focal field along an optical axis direction, and obtaining incident field distribution on an objective lens aperture surface corresponding to a slice through a tight focusing inverse operation process; coherently superposing the incident fields corresponding to all the slices to obtain total incident field distribution; and carrying out tight focusing on the total incident field by using an objective lens to obtain complex amplitude of a focal field, observing intensity and topological state distribution of the focal field in a three-dimensional space of a focusing area, and optimizing intervals between slices to obtain a tight focusing field with the skyrmion tubes or the skyrmion tube array. According to the method, the Skyrmion tube or the Skyrmion tube array is constructed in the focal field in advance, the focal field with the preset topological characteristic is obtained, and the method provided by the invention has certain universality.

A method for detecting localized tilted regions on a sample using imaging reflectometer measurements includes obtaining a first image without blocking any light reflected from the sample and obtaining a second image while blocking some light reflected from the sample at an aperture plane. The localized tilted regions are detected by comparing a first reflection intensity value of a pixel in the first image with a second reflection intensity value of a corresponding pixel in the second image.

The present application relates to the technical field of surface detection, in particular to a surface detection method and system for a large-aperture plane mirror in a vacuum environment, the method comprising constructing a full-aperture spatial discrete mapping model, layering full-aperture surface parameters according to spatial frequency, extracting common modal parameters corresponding to low-frequency surface components in each sub-aperture measurement result, explicitly introducing the common modal parameters into a stitching equation as a global constraint term, and constructing a stitching matrix; and performing block reconstruction processing on the stitching matrix. The present application effectively solves the problem of insufficient surface stitching stability under the condition of reducing the sub-aperture overlap ratio without relying on a super-large-aperture interferometer and without interrupting the existing detection system of the Ritchey-Corman method, realizes the consideration of detection efficiency and surface reconstruction accuracy, and has significant engineering practical value and promotional significance.

The invention provides a cementing device and method for a large-caliber plane optical flat, and belongs to the technical field of optical precision machinery. The adhesive binding device for the large-caliber plane optical flat comprises an annular mirror frame, the inner diameter of the mirror frame is larger than the radial outer diameter of the plane optical flat to be detected, the plane optical flat is sleeved with the mirror frame, the mirror frame and the plane optical flat are located on the same plane and share the same circle center, and a gap between the mirror frame and the plane optical flat is filled with glue; the number of the supporting assemblies is at least three, the supporting assemblies are evenly distributed around the mirror frame by a circle, the supporting assemblies penetrate through the wall face of the mirror frame in the radial direction of the mirror frame and abut against the radial periphery of the plane optical flat, and the multiple supporting assemblies are matched together to clamp and fix the plane optical flat. According to the invention, the large-aperture optical flat and the mirror frame are adhered and fixed by using an adhering method, so that the influence of gravity on the plane surface shape is reduced; through the supporting assembly penetrating through the lens frame and abutting against the optical flat, self-shaking caused by suspension of the optical flat is avoided, fixed assembly of the large-diameter optical flat is achieved, and follow-up surface shape measurement is facilitated.

This invention relates to the field of surface profile inspection technology, and particularly to a method and system for inspecting the surface profile of large-aperture plane mirrors under vacuum conditions. The method includes constructing a full-aperture spatial discrete mapping model, representing the full-aperture surface profile parameters hierarchically according to spatial frequencies, extracting common modal parameters corresponding to low-frequency surface profile components from the measurement results of each sub-aperture, and explicitly introducing these common modal parameters into the splicing equation as global constraint terms to construct a splicing matrix; and performing block reconstruction processing on the splicing matrix. This invention effectively solves the problem of insufficient surface profile splicing stability under reduced sub-aperture overlap ratios without relying on ultra-large aperture interferometers or interrupting the existing Richter-Comman method inspection system, achieving a balance between inspection efficiency and surface profile reconstruction accuracy. It has significant engineering practical value and promotional significance.

The present invention discloses a method for detecting the magnification of a large-aperture telescope, comprising: S1, installing a detection device in place according to detection requirements; S2, adjusting the pitch angle and yaw angle of the detection device so that straight interference fringes are displayed on a surface interferometer; S3, adjusting the pitch angle and yaw angle of an autocollimator, displaying the angle value between a large-aperture plane mirror and the autocollimator on the autocollimator, and setting the angle value to 0; S4, adjusting the large-aperture plane mirror to a small angle, displaying inclined interference fringes on the surface interferometer, and recording them as θ. T , the angle value displayed on the autocollimator is recorded as θ M ; S5, then adjust the large-aperture plane mirror in the opposite direction to a small angle, and the surface interferometer will show inclined interference fringes, which are recorded as θ T ， , the angle value displayed on the autocollimator is recorded as θ M ， ; S6, calculate the angular magnification M of the telescope under test 角 , and then convert it into its magnification M; S7, replace the sub-telescope and repeat steps S1-S6. This application has high detection accuracy and is easy to promote and apply.

The present invention provides a method for inspecting an object placed in a turbid fluid, the method comprising the steps of: A) generating electromagnetic radiation by a radiation source; B) emitting the electromagnetic radiation; C) modulating the amplitude or frequency of the electromagnetic radiation; D) illuminating a surface of the object at a plurality of object points with the modulated electromagnetic radiation, the illumination of the object surface occurring along an illumination beam axis; and E) focusing the electromagnetic radiation reflected from the object points toward a light receiving portion of a detector by an optical system having a focal length, the detector having an aperture having an aperture shape in an aperture plane, the aperture plane being separated from the light receiving portion by a detector distance and the aperture plane being separated from the optical system by an aperture distance, the focusing occurring along the detection beam axis. and F) detecting electromagnetic radiation reflected from the surface of the object with the receiver; and for each of the plurality of object points, G) measuring an indication of a propagation time of the electromagnetic radiation from a reference point in a beam path of the electromagnetic radiation to each object point; and H) outputting the indication of the propagation time, wherein the illumination beam axis and the detection beam axis form a parallax angle, the aperture has an aperture position in a direction perpendicular to at least the illumination beam axis or the aperture beam axis, and the surface of the object is spaced a measurement distance from the receiver.

The embodiment of the invention provides an antenna, a communication module, electronic equipment and an antenna design method and device, relates to the technical field of antennas, and aims to solve the problems of high structural complexity and low aperture utilization rate of a common-aperture antenna. The antenna comprises at least two antenna units and a metasurface. All the antenna units work in the same aperture plane. And the working frequency bands of at least two antenna units in all the antenna units are different. And the wave beam transmitting and receiving directions of all the antenna units face the metasurface.

A method to derive phase-coherent images with an interferometer, in situations where interferometric phase errors can be factorized into element-based terms (‘piston phases’) is disclosed. The method is preferably implemented completely in the image domain, without resort to aperture plane measurements of visibilities, or element-based voltage complex gains.

The invention discloses a wide-field-of-view high-resolution full-transmission visible light remote sensing optical system, relates to the technical field of optical systems, and solves the problems that an existing off-axis system introduces asymmetric aberration and is complex to process, install and adjust, a refraction system faces a chromatic aberration correction problem and is often huge in size, and a multi-camera splicing scheme increases system complexity and calibration difficulty and the like. Comprising a first lens, a second lens, a third lens, a fourth lens, a fifth lens, a sixth lens and a seventh lens which are sequentially arranged on the same optical axis in the optical axis direction, and the optical system further comprises a diaphragm face located in front of the first lens. The first lens, the second lens, the third lens, the fourth lens and the eighth lens are positive lenses, the fifth lens, the sixth lens, the seventh lens and the ninth lens are negative lenses, and a detector is arranged behind the ninth lens. The system is simple in structure, the total length of the system is extremely compressed, the cost and the space can be remarkably saved, the spectrum band ranges from 400 m to 750 nm, and the system can be used for splicing a wide-spectrum-band detector.

The present invention relates to a high-aspect-ratio micro-hole groove standard template and its preparation and characterization method. The characterization method includes: imaging the aperture plane of the micro-hole groove to be sliced, extracting the edge contour of the micro-hole groove aperture, and calculating the reference diameter of the micro-hole groove to be sliced; performing preliminary cutting of the standard template along the macro-marking line to obtain a primary slice; grinding along the macro-marking line until stopping at the medium-size marking line to obtain a secondary slice; using the medium-size marking line as the cutting path and the reference diameter as the target diameter, grinding the secondary slice layer by layer to obtain a prepared surface of the diameter section; obtaining the measured value of the prepared surface; and establishing a spatial geometric deviation model for characterizing the deviation between the prepared surface and the ideal surface of the diameter section based on the measured value and the reference diameter, performing error compensation on the measured value, and converting the measured value into the equivalent value of the ideal surface. The characterized standard template can meet the precise calibration requirements of non-destructive measurement instruments and equipment for high-aspect-ratio micro-hole grooves.