Incident illumination device for a microscope
A technology of incident illumination and microscopy, applied in the direction of microscope, optics, instruments, etc., can solve the problems of difficult repeated operation and direct detection
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[0034] Described below figure 1 and figure 2 , where similar parts have the same reference numerals.
[0035] see figure 1 , schematically shows a cross-sectional view of a microscope, generally designated 100 , for studying the sample 1 . The microscope has a microscope body 4 on which a microscope stage 2 is mounted via a support member 3 . The sample 1 is placed on the microscope stage 2 and can be moved vertically by means of adjustment means in the form of a wheel 3a. Each objective lens 7 is provided on the objective turret 6 . Incident illumination 5 is provided to illuminate the sample 1 . Illumination light reflected from the sample 1 travels along the observation beam path through the tube 8 to the eyepiece 9 . The optical axis of the observation beam path is indicated with OA1.
[0036] The incident illumination device 5 comprises a light source 11 which is imaged by a first lens system 12 onto an aperture plane AE. The aperture stop 14 is arranged on the a...
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