32results about How to "Automate Calibration" patented technology

The invention discloses an on-site full-automatic pressure calibrator. The on-site full-automatic pressure calibrator comprises a shell, a power supply switch, a plurality of interfaces, a display, control components such as a keyboard and the like, a gas pressure generation unit, a power supply unit, a pressure detection unit, and a gas pressure control unit, wherein the gas pressure generation unit is a miniature gas pressure pump which is communicated with atmosphere; a pressure output pipeline is communicated with the gas pressure control unit; the pressure output ends of the pressure control unit are communicated in parallel and are used for accommodating a pressure standard machine in the pressure detection unit and a pressure joint of a meter to be detected; the pressure control unit is in signal connection with the pressure standard machine in the pressure detection unit; and the power supply unit is electrically connected with the gas pressure generation unit, the pressure control unit and the pressure standard machine in the pressure detection unit respectively. The on-site full-automatic pressure calibrator does not need external gas cylinders or alternating current (AC) power supplies, can automatically generate gas pressure and accurate standard pressure, has light self weight and small volume, is convenient to carry on site, and can automatically calibrate various on-site pressure meters.

The invention discloses a civil engineering measuring device, which comprises a base and a storage tank arranged on the upper surface of the base, a combined measurement frame is arranged in the storage tank, and the two ends of the combined measurement frame are equipped with a main telescopic device through a single adjustment device , the other ends of the two main telescopic devices are hinged at the corners on the adjacent sides of the storage tank, the inner side of the main telescopic device is provided with a secondary telescopic device, and one end of the two secondary telescopic devices is connected to the combined measurement and the other ends of the two secondary telescopic devices are connected in the middle of the side wall of the storage tank, and one of the main telescopic devices is provided with a pendulum measuring device, which provides a wealth of measuring devices and avoids the The calibration is repeated, and the horizontal calibration of the automatic measurement base point is realized, the error in the measurement process is reduced, the accuracy of the measurement data is improved, and the structure is simple and portable.

The invention provides a high-temperature calibration device for microwave dielectric material testing and a calibration method thereof. The device includes: a vector network analyzer, and two sets of waveguides respectively connected to the vector network analyzer. Joints, cooling waveguides, high-reflection and straight-through conversion waveguides, heat-insulated waveguides, high-temperature waveguides, short-circuit boards, high-reflection and straight-through conversion waveguides are slotted into high-reflection inserts to form a short circuit; the calibration method includes opening the test software and opening a slot in the waveguide Control the insertion of the high-reflection insert, run the test software for automatic calibration, test the reflection coefficients S11r and S22r in the two high-temperature waveguides at room temperature, test the S11h and S22h after loading the medium sample to be tested at high temperature, and test the S11h Carry out correction; Utilize S ' 11 after microwave loss correction, calculate the complex dielectric constant of the medium sample to be tested at temperature T; This device and method can be applied in the microwave material dielectric property high-temperature test system, can further improve The test accuracy of the test system.

The present invention provides a method and device for visual projection calibration, the method comprising: S1: acquiring image information; S2: identifying the touch area and display area, and the first reference corresponding to the touch area according to the image information point and the second reference point corresponding to the display area; S3: virtualize a number of target points on the identified display area, respectively calculate the input coordinates of each target point compared to the first reference point and the comparison between each target point The output coordinates of the second reference point; S4: Import the input coordinates and output coordinates corresponding to each target point into the preset training model to obtain the calibration parameters corresponding to the current touch area and display area; S5: According to the calibration The parameter calibrates the coordinate points on the touch area and the display area. By adopting the above solution, the automatic calibration of the coordinate points of the touch area and the display area can be realized without manual clicking, which effectively reduces the calibration error and improves the calibration accuracy.

The embodiment of the invention provides a flash memory chip testing method and system and relates to the field of chip testing technology. The method comprises the steps that a calibration device interface board is connected with a PMU (Parametric Measurement Unit); the PMU is connected with a PC; the calibration device interface board is replaced with a flash memory chip interface board at the same position; the PMU receives a first output instruction sent by the PC; the PMU supplies a stable first initial power source to the calibration device interface board; the PMU tests a first test voltage and a first test current corresponding to a calibration device at the same time; the PMU feeds the first test voltage and the first test current back to the PC; the PC configures a first calibration parameter; and then the PMU is calibrated. Since the calibration device interface board is replaced with the flash memory chip interface board at the same position for testing of a flash memory chip, automatic calibration can be realized, meanwhile, a calibration line is consistent with an actual test line, and the measurement precision of the flash memory chip is improved.