High temperature calibration device and calibration method for microwave dielectric material testing

A microwave dielectric material and calibration device technology, which is applied in the direction of measuring devices, measuring electrical variables, measuring resistance/reactance/impedance, etc., can solve the problems of inability to deduct test parts and obtain the dielectric properties of materials, and achieve automatic calibration , Improve the test accuracy, and the effect of simple manufacturing process

Active Publication Date: 2017-11-03
成都恩驰微波科技有限公司
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  • Abstract
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Problems solved by technology

Because the microwave material high temperature test system is difficult to calibrate with calibration parts, it is impossible to deduct the influence of some test parts, and it is impossible to obtain very accurate dielectric properties of materials.

Method used

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  • High temperature calibration device and calibration method for microwave dielectric material testing
  • High temperature calibration device and calibration method for microwave dielectric material testing
  • High temperature calibration device and calibration method for microwave dielectric material testing

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Embodiment Construction

[0037] Embodiments of the present invention are described below through specific examples, and those skilled in the art can easily understand other advantages and effects of the present invention from the content disclosed in this specification. The present invention can also be implemented or applied through other different specific implementation modes, and various modifications or changes can be made to the details in this specification based on different viewpoints and applications without departing from the spirit of the present invention.

[0038] Please refer to accompanying drawing, present embodiment provides a kind of high-temperature calibration device for microwave dielectric material test, comprising: vector network analyzer 1, two sets of waveguides that are connected with vector network analyzer 1 respectively and the same size, each cover of waveguide includes The coaxial to waveguide conversion joint 2, cooling waveguide 3, high reflection and straight-through ...

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Abstract

The invention provides a high-temperature calibration device for microwave dielectric material testing and a calibration method thereof. The device includes: a vector network analyzer, and two sets of waveguides respectively connected to the vector network analyzer. Joints, cooling waveguides, high-reflection and straight-through conversion waveguides, heat-insulated waveguides, high-temperature waveguides, short-circuit boards, high-reflection and straight-through conversion waveguides are slotted into high-reflection inserts to form a short circuit; the calibration method includes opening the test software and opening a slot in the waveguide Control the insertion of the high-reflection insert, run the test software for automatic calibration, test the reflection coefficients S11r and S22r in the two high-temperature waveguides at room temperature, test the S11h and S22h after loading the medium sample to be tested at high temperature, and test the S11h Carry out correction; Utilize S ' 11 after microwave loss correction, calculate the complex dielectric constant of the medium sample to be tested at temperature T; This device and method can be applied in the microwave material dielectric property high-temperature test system, can further improve The test accuracy of the test system.

Description

technical field [0001] The invention belongs to the technical field of electromagnetic parameter testing of microwave and millimeter wave materials, and in particular relates to a device for calibrating microwave materials at high temperature and a calibrating method thereof. Background technique [0002] With the development of science and technology, microwave dielectric materials are widely used in various microwave fields as electromagnetic wave transmission media, such as satellite communication, microwave communication, electronic countermeasures, radar navigation, infrared remote sensing, telemetry and other systems. At the same time, aviation, aerospace And the development of military technology is very rapid, the speed of various aircraft is getting faster and faster, and the requirements for the development of high-temperature materials are becoming more and more urgent. Therefore, mastering the parameters of microwave dielectric materials is of great importance to ...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01R27/26G01R35/00
Inventor 李恩王依超郭高凤高源慈郑虎陶冰洁
Owner 成都恩驰微波科技有限公司
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