18 results about "Open-circuit test" patented technology

The invention provides a biphase composite magnetic material magnetically controlled reactor electromagnetic transient simulation method, device and equipment and a medium, and relates to the technical field of power equipment magnetic material testing and electromagnetic transient simulation. According to the invention, the test winding is arranged on the excitation winding of the magnetically controlled reactor, and multi-dimensional means of obtaining total iron loss through an open circuit test, obtaining magnetic hysteresis loss through a frequency reduction test, obtaining copper loss and leakage reactance through a short circuit test and the like are combined, so that separation of magnetic hysteresis loss, eddy current loss and additional loss can be realized; a high-fidelity hysteresis loop and a magnetic conductivity change rule are obtained, and the nonlinear characteristic and hysteresis response of the magnetic core can be accurately captured, so that the predictive capability of equipment performance and the sensing capability of an operation state are improved.

The utility model relates to the field of ignition coil production, in particular to an ignition coil open circuit test device which comprises a bottom plate. The upper end of the bottom plate is provided with a test module, the upper end of the test module is provided with mounting support plates in bilateral symmetry, the upper sides of the front ends of the mounting support plates are provided with mounting grooves, the mounting grooves are internally provided with the sliding frame, and the right end of the sliding frame is provided with a first motor; a first lead screw is rotationally connected into the sliding frame. The first motor drives the first lead screw to rotate, the sliding frame is used for limiting rotation of the movable base and driving the movable base and a connecting part to move, the electric push rod drives the connecting base and the fountain pen to move to complete marking of the ignition coil, the second motor drives the second lead screw to rotate, and rotation of the main sliding base is limited through the main movable frame. And the main sliding seat and the clamping module are driven to move to realize automatic plugging of the connecting line, so that marking and plugging operations are synchronously completed.

The invention discloses a de-embedding measurement method and system for electrical parameters of a passive device. The de-embedding measurement method comprises the following steps: constructing an original test circuit containing a passive device to be tested, removing the passive device to be tested in the original test circuit to obtain an open-circuit test circuit, and performing short-circuit on an open circuit of the open-circuit test circuit to obtain a short-circuit test circuit; respectively measuring S parameters of each test circuit to obtain an S parameter matrix, and performing parameter conversion to obtain a corresponding Y parameter matrix; according to the Y parameter matrix, calculating an admittance parameter of the to-be-tested passive device to the ground and an impedance parameter of the to-be-tested passive device after parameter stripping, and according to the admittance parameter and the impedance parameter, calculating a Y parameter matrix of the to-be-tested passive device after de-embedding; and performing parameter conversion on the Y parameter matrix of the passive device to be tested to obtain a corresponding S parameter matrix, and extracting the required electrical parameters of the passive device through the S parameter matrix of the passive device to be tested. According to the invention, high-precision de-embedding of the passive device can be realized, and the electrical characteristics of the device to be tested can be effectively obtained.

The invention relates to the technical field of sensing product testing, in particular to a super-large array packaging conductivity testing device which comprises a wafer testing table, an open circuit testing plate and a short circuit testing plate, an objective table is installed at the top of the wafer testing table, and a swing arm positioning seat is installed at the top of the wafer testing table and on the back face of the objective table. The outer wall of the swing arm positioning seat is provided with a test probe, the top of the wafer test bench and the back surface of the swing arm positioning seat are provided with a main control unit, and the outer wall of the main control unit is connected with the swing arm positioning seat through a test line. According to the super-large array packaging conductivity testing device, the open circuit testing plate and the short circuit testing plate in the device are used for testing the to-be-tested product, and the problems that an existing testing device and an existing testing method cannot directly point-contact the two ends for measurement, the accuracy of a testing result is poor, the efficiency is low, and the product is prone to being damaged are solved.

The utility model discloses an auxiliary device for an electrical performance test of motor vehicle parts, which comprises a shell, a circuit board is arranged in the shell, a plurality of groups of circuits are arranged on the circuit board, the circuit board is respectively connected with a first port and a second port through a first connecting line and a second connecting line, and an operation panel is arranged on the shell. Each group of circuits on the circuit board is connected with a corresponding unit on the operation panel, and each group of units comprises a port A, a port B and a switch. According to the utility model, through operation of the key switches of different lines, open circuit test operation of corresponding lines can be realized. By connecting the ports A or ports of different lines to the target wire harness of the short-circuit test, the short-circuit test operation of the corresponding lines can be carried out.

1. The name of the design product: pin interrupt simulator. 2. The use of the design product: for simulating and testing the open circuit test and micro-interrupt test in the electrical performance of automotive electronic components, which is a test equipment specially meeting the standards of vehicle manufacturers. 3. The design points of the design product: in shape. 4. The picture or photo that best indicates the design points: front view. 5. The bottom surface of the design product is the part that is not easy to see or cannot be seen during use, so the top view is omitted.

The utility model discloses an open circuit test mechanism of a button cell assembly device, which can carry out electrical detection after a button cell is assembled, is high in efficiency and can find problems in time. The open circuit test mechanism of the button power assembly equipment comprises an assembly device and an open circuit test device, the assembling device comprises a workbench capable of horizontally moving, an assembling jig arranged on the workbench and a pressing assembly arranged on the moving track of the workbench. The press-fit assembly is provided with a press-fit jig capable of moving up and down, and the press-fit jig is matched with the assembly jig to perform press-fit action of the button cell; the open circuit testing device comprises a testing support arranged on the side edge of the moving track of the workbench, a positive electrode probe and a negative electrode probe, wherein the positive electrode probe and the negative electrode probe are installed on the testing support and can move up and down relatively. The positive electrode probe and the negative electrode probe are connected to an electrical testing mechanism of the device through wires. A cantilever opposite to the testing support is installed on the side edge of the workbench, a battery containing groove is formed in the cantilever, and a probe penetrating hole is formed in the bottom of the battery containing groove.

The invention relates to a configurable segmented wiring structure of an FPGA (Field Programmable Gate Array) and a test method of the configurable segmented wiring structure. According to the wiring structure, a grouping twisted connection mode is adopted, segmented wiring is divided into a plurality of wiring groups, wiring in the groups is crossed through different metal layers to achieve cyclic alternation of various lengths, connection is controlled through a configurable switch, wiring configuration of any length from 1 to n can be achieved, and modular cascade expansion of a CLB array is supported. According to the testing method based on the structure, an open-circuit test and a short-circuit exhaustion test for all physical adjacent wiring are respectively carried out in a mode of applying an excitation signal after pre-charging and floating and reading back a response, the testing time can be shortened to about 51% of that of a traditional full exhaustion test while the 100% wiring function test coverage rate is guaranteed, and the testing efficiency is improved. And the test efficiency is obviously improved. According to the invention, the flexibility, the scale expansibility and the test economy of FPGA wiring are effectively improved.

The invention relates to the field of electronic circuit production testing, and provides a multi-node circuit short circuit testing method. The method is used for detecting whether an abnormal short circuit exists between any two nodes in a multi-node circuit to be detected. Comprising the following steps: in a multi-node circuit, acquiring untested nodes as current to-be-tested nodes, and short-circuiting all untested nodes behind the current to-be-tested nodes to form short-circuit combined nodes; measuring the impedance between the current node to be measured and the short-circuit combined node; if the connection condition corresponding to the current node to be tested and the short-circuit combined node is determined to be an open circuit according to the impedance, testing the next node which is not tested; and if the connection condition corresponding to the current to-be-tested node and the short-circuit combined node is determined to be short circuit according to the impedance, independently performing impedance retest on each node in the current to-be-tested node and the short-circuit combined node, positioning an abnormal node which is short-circuited with the current to-be-tested node, and completing the test on each node which is not subjected to the test.

The utility model discloses a radio frequency line loss calibration system which comprises a comprehensive tester, a calibration clamp, a broadband matrix radio frequency switch and an upper computer, the calibration clamp is provided with a plurality of test cavities, and the test cavities comprise at least one of a short circuit test cavity and an open circuit test cavity. The broadband matrix radio frequency switch is provided with a plurality of input ports, a plurality of output ports and a plurality of radio frequency switch paths, the number of the output ports of the broadband matrix radio frequency switch is larger than that of the input ports, and each input port of the broadband matrix radio frequency switch is connected with a corresponding output port of the comprehensive tester. The input end of each radio frequency switch path is connected with the corresponding input port, the output ends of the multiple radio frequency switch paths are connected with multiple output ports of the broadband matrix radio frequency switch, and the output ports of the broadband matrix radio frequency switch are inserted into the multiple test cavities through wires. And the upper computer is respectively connected with the comprehensive tester and the broadband matrix radio frequency switch. The multi-port radio frequency line loss calibration device can meet the multi-port radio frequency line loss calibration requirement.

This utility model discloses a device for open-circuit testing of surge protectors, relating to the field of surge protector testing technology. It includes a base plate with support seats fixedly installed at each of the four corners of its lower surface, and a control device fixedly installed at one end of its upper surface. This utility model, through the setting of a limiting mechanism, can improve testing stability and reduce human error. Standardized clamping force is achieved through the combination of mechanical compression and elastic clamping. Combined with an L-shaped clamping plate to limit the horizontal displacement and vertical sway of the surge protector, it avoids product displacement caused by uneven force in traditional manual fixing, ensuring stable conduction of the test circuit and accurate results. Furthermore, the limiting mechanism simplifies the operation process and improves testing efficiency. No additional manual clamping steps are required; the operator can trigger clamping by pushing the sliding seat, and the clamping plate can be reset by pushing it back after testing. This significantly shortens the preparation and waiting time for testing a single device, adapting to the needs of large-scale continuous testing.

The present invention provides a GPS antenna power switching method and system, comprising: determining whether to activate the current power supply, performing an antenna open circuit test, and obtaining an open circuit test result; based on the open circuit test result, a central processing unit (CPU) waits for a GPS module to perform positioning and obtains a GPS module positioning result; and switching the power supply according to the GPS module positioning result. The present invention automatically detects whether an antenna is connected and automatically switches the power supply voltage to adapt to the active GPS antenna. This eliminates the need for operators to monitor the power supply voltage of the active GPS antenna to adapt the active GPS antenna, reducing routine maintenance costs and increasing reliability and ease of use.

1. The name of the design product: open circuit test table. 2. The use of the design product: for detecting open circuit and open state of circuit or device in the field of electronics and electrical. 3. The design points of the design product: in shape. 4. The picture or photo that best shows the design points: perspective view.

The invention relates to a method for detecting back drilling depth and offset degree, which comprises the following steps of: arranging a back drilling module: arranging the back drilling module in a board edge area of a printed circuit board (PCB), and drilling a test back drilling hole with the same depth as a back drilling hole to be tested on the back drilling module; determining a back drilling depth range and a test layer; a gradient copper-avoiding ring test module is arranged: a copper-avoiding ring is arranged outside each back drilling hole, and a test point is arranged in front of and behind each copper-avoiding ring respectively, that is, a copper-avoiding ring unit is formed between two adjacent test points; the test holes comprise two short-circuit test holes and four open-circuit test holes, a circuit is arranged on each layer of board, and the two short-circuit test holes and the two open-circuit test holes respectively form a communication loop with the circuit; performing a depth test; and carrying out offset degree detection. According to the invention, the test back drilling hole and the detection module are arranged in the board edge area of the printed circuit board, so that non-destructive, rapid and accurate detection is realized.

The invention relates to the technical field of equipment testing, and particularly discloses a channel open-circuit testing circuit, system and method. The channel open circuit test circuit comprises an MOS driving module, an open circuit detection module and a fault diagnosis module. The MOS driving module comprises a plurality of output ports and feedback ports, wherein the number of the feedback ports is smaller than that of output channels. The MOS driving module and a corresponding external load form an output channel through each output port, the output end of the open circuit detection module is connected with the output channel, and each feedback port of the MOS driving module is connected with the fault diagnosis module; the open circuit detection module generates an open circuit detection signal and transmits the open circuit detection signal to the MOS driving module through a to-be-detected output channel; the MOS driving module generates a diagnosis feedback signal according to the open circuit detection signal and transmits the diagnosis feedback signal to the fault diagnosis module through a corresponding feedback port; the fault diagnosis module judges whether the output channel to be detected is in an open circuit state according to the level state of the diagnosis feedback signal, and independent detection of the output channel is achieved.

A configurable resistor can be provided to allow multiple tests of a through-silicon via (TSV) testing for respective connection issues to be performed. The tests can include an open test, which checks for discontinuities or breaks (open defects) in the electrical path of the TSV; a VDDQ short test, which identifies short circuits between the TSV and the VDDQ power rails; and a VSS short test, which identifies short circuits between the TSV and the VSS ground rails.

The invention relates to an FFC cable time domain reflection impedance de-embedding measurement method and device, equipment and a medium. The method comprises the steps of obtaining a reflection voltage signal of a target cable in a tail end open circuit state, and obtaining a full-path time domain reflection waveform sequence according to the reflection voltage signal; determining a total reflection feature point based on tail end waveform data of the full-path time domain reflection waveform sequence, taking the total reflection feature point as a signal segment starting point, generating an extension signal segment converged to preset matching impedance, and splicing the extension signal segment with the full-path time domain reflection waveform sequence to obtain an extension reflection waveform sequence; according to the method, the problems of divergence and unstable physical contact of a traditional de-embedding algorithm under an open circuit test can be solved by constructing a virtual matching signal segment and segmented variable bandwidth filtering; the invention relates to high-precision measurement of characteristic impedance of an FFC cable without physical load termination.

The utility model discloses an open-short test device for simulating actual connector application, which belongs to the technical field of connector open-short test and comprises a test platform deck provided with a positioning groove. The tongue piece part comprises a tongue piece air cylinder and an extending tongue piece, and the tongue piece air cylinder drives the extending tongue piece to enable the extending tongue piece to be in contact with a contact elastic piece of the connector; the first testing part comprises a first air cylinder and a first probe, and the first air cylinder drives the first probe to approach the connector so as to carry out open circuit testing on the connector; and the second testing part comprises a second air cylinder and a second probe, and the second air cylinder drives the second probe to conduct the connector so as to carry out high-voltage and short-circuit testing on the connector. According to the utility model, open circuit and short circuit tests of the connector are realized, the correct number of pins and the number of loops of the connector can be effectively tested, and the problem that the connector test is unstable is solved.