Method for testing capacitive touch screens and testing equipment thereof

A technology of capacitive touch screen and testing method, which is applied in the direction of measuring electricity, measuring devices, measuring electrical variables, etc., can solve problems affecting production progress, not suitable for mass production, and slow testing speed, and achieve the effect of improving detection efficiency

Active Publication Date: 2012-09-05
东莞通华液晶有限公司
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] The installation test is used, although the test effect is good, but if there are defective products in the installation test, it needs to be dismantled and replaced, which will increase the working hours and affect the production progress; the method of using the circuit board chip test is not suitable for mass production; and the two-point simulation test is used However, the test position cannot cover the entire touch range, and only simulates the two key points, which cannot guarantee the complete detection of all ITO film patterns and silver lines; the test speed of the product linear test is relatively slow, and batch products If all tests are required, the testing efficiency of this method is lower

Method used

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  • Method for testing capacitive touch screens and testing equipment thereof
  • Method for testing capacitive touch screens and testing equipment thereof
  • Method for testing capacitive touch screens and testing equipment thereof

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Embodiment Construction

[0027] A test method for a capacitive touch screen according to the present invention includes IC function test, power consumption test, short circuit test and open circuit test.

[0028] The IC function test includes the following steps: writing firmware into the driver IC, reading and checking the version number of the firmware from the designated stack of the driver IC.

[0029] Described open circuit test comprises the steps:

[0030] a1. Read the capacitance value of each ITO sensor on the touch screen through the drive IC, and define the capacitance value read by each ITO sensor as the capacitance reference value of the corresponding ITO sensor;

[0031] a2. Set a metal round bar that is close to and transversely across the surface of the touch screen, and the metal round bar is parallel to the row direction of the touch screen;

[0032] a3. Roll the metal round bar from the top to the bottom of the touch screen, and each time the metal round bar passes through a row of...

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Abstract

The invention provides a method for testing capacitive touch screens, comprising a novel method for integrated circuit (IC) function test, power consumption test, short circuit test and open test. The invention also provides testing equipment for capacitive touch screens, comprising a screen testing plate and a circuit detecting plate. The screen testing plate comprises a metal cylinder and a screen positioning groove; the metal cylinder is closely pressed against the screen testing plate and two ends of the metal cylinder are respectively placed at two sides of the screen positioning groove; the circuit detecting plate comprises a power supply module, a liquid crystal display (LCD) display module, a power consumption detecting module, a testing plate connecting terminal, a microprogrammed control unit (MCU) control module and an IC chip module. The testing plate connecting terminal is connected with a testing interface of the screen testing plate. The method and the equipment which integrate the short circuit test, the open test, the IC function test and the power consumption test can be used for detection of multiple performances and lines of capacitive touch screens; and the metal cylinder is used for simultaneous one-time detection for a row of sensors, which greatly enhances detection efficiency.

Description

technical field [0001] The invention belongs to the field of display touch screens, and in particular relates to a test method and test equipment for a display touch screen. Background technique [0002] At the present stage, the ITO on the touch screen can only test its conduction and impedance after etching, and judge whether it is a qualified product by the smoothness of finger operation, that is, the current capacitive touch screen test mainly relies on IC manufacturers to cooperate with TP manufacturing Manufacturers test IC functions, but parameters such as short circuit, open circuit and power consumption, and circuit connection conditions are not tested together. [0003] At present, there are usually four test methods for mobile phone touch screens such as open circuit and short circuit: 1. Two-point simulation test; 2. Circuit board chip test; 3. Installation test; 4. Product linearity test. [0004] The installation test is used, although the test effect is good,...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/00G01R31/02
Inventor 潘翼辉
Owner 东莞通华液晶有限公司
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