The invention relates to a measurement
system and a measurement method for a
derating curve of an LED (light-emitting
diode), belonging to the technical field of detection on thermal properties of
semiconductor optoelectronic devices. According to the measurement
system disclosed by the invention, the LED to be tested, a
thermocouple and a clamp are arranged in a constant-temperature oven, and the LED to be tested and the
thermocouple are arranged in the same position on the clamp. A digital source meter is connected with the LED to be tested, and a digital universal meter is connected with the
thermocouple. The digital source meter, the digital universal meter, the clamp and the constant-temperature oven are respectively connected with a computer. The digital source meter is used for providing
forward current for driving the LED to be tested; the constant-temperature oven is used for providing a stable
environmental temperature; the thermocouple is used for detecting the actual
environmental temperature in the vicinity of the LED to the tested; the digital universal meter is used for patrol inspection on the resistance of the thermocouple; and the computer is responsible for collecting and
processing related data and outputting the graphical
derating curve to a user. Compared with the prior art, the measurement
system and method disclosed by the invention have the advantages of high efficiency, accuracy and a wide range of applications.