Measurement system and measuring method for derating curve of LED (light-emitting diode)
A measurement system and derating technology, which is applied in the direction of heat measurement, measurement device, single semiconductor device test, etc., can solve the problems of cumbersome, impossible measurement, low test accuracy, etc., to simplify the measurement process, wide applicability, and take into account the accuracy Effect
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[0030] see figure 1 , The measurement system of the present invention includes a digital source meter 1, a constant temperature oven 2, a thermocouple 5, a fixture 4, a digital multimeter 6, a computer 7, and an LED chip to be tested or a packaged LED device or a lamp to be tested LED3. The LED3 to be tested, the thermocouple 5 and the fixture 4 are placed in the constant temperature oven 2 , and the LED3 to be tested and the thermocouple 5 are placed at the same position on the fixture 4 . Use the four-wire method to connect the digital source meter 1 and the LED 3 to be tested, use the four-wire method to connect the digital multimeter 6 and the thermocouple 5, and connect the digital source meter 1, the digital multimeter 6, the fixture 4 and the constant temperature oven 2 to the computer 7 respectively. Digital source meter 1 provides the forward current to drive the LED3 to be tested and measures the forward voltage at the same time. Digital source meter 1 has the functi...
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