The invention relates to the technical field of reliability test and intelligent screening of electronic components, and discloses an intelligent optimization method for secondary screening of electronic components, which comprises the following steps of: 1, firstly, constructing a multi-dimensional screening parameter
system of the electronic components; according to the method, a screening parameter
system covers four categories of
electrical performance, environmental adaptability, reliability and process consistency, and judgment deviation caused by a
single parameter is avoided; meanwhile, parameter
anomaly detection and relevance
verification are introduced, even if a
single parameter is qualified, relevance anomaly is still marked to be unqualified, and the missed judgment rate is reduced to 2% or below from traditional 8%. On the other hand, the scene
adaptation module divides the application into four grades, each grade corresponds to different parameter threshold coefficients, and it is ensured that the screening standard is matched with the scene requirement; the fault feedback module counts the fault correlation degree through FMEA, when the fault contribution degree of a certain parameter is larger than or equal to 5%, the weight of the parameter is automatically improved, the threshold value is tightened, the screening model is optimized along with actual fault data, and the
fault rate of downstream elements is reduced by 60% or above.