The invention relates to detection of microwave coating dielectric properties, particularly to an electrically controlled detecting device for a microwave medium coating and a detecting method thereof. The detecting device is provided with a rectangular waveguide, parallel coupled microstrip electrodes, a DC stabilized voltage supply, a vector network analyzer, a computer and a short circuit plate, wherein the front end of the rectangular waveguide is connected with a port of the vector network analyzer; the parallel coupled microstrip electrodes are arranged in the middle of the rectangular waveguide; the rear end of the rectangular waveguide is connected with the short circuit plate; an output end of the DC stabilized voltage supply is connected with the parallel coupled microstrip electrodes; and the vector network analyzer is connected with an input port of the computer. The microstrip electrodes are arranged on a to-be-tested sample, placed in the end surface of the waveguide and clamped by the short circuit plate for testing, and the microstrip electrodes are connected; voltage is applied to the microstrip electrodes, so as to observe the variation of the scattering parameters; and a known air layer and a PTFE coating are tested, the dielectric constant is calculated, and electromagnetic parameters of the known coating and the testing result are compared, so as to determine the stability, the testing error and the testing precision of the testing system.