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414 results about "Scattering parameters" patented technology

Scattering parameters or S-parameters (the elements of a scattering matrix or S-matrix) describe the electrical behavior of linear electrical networks when undergoing various steady state stimuli by electrical signals.

Microwave device impedance measurement calibration method

InactiveCN103675457AOvercome Difficult Machining ProblemsReduce the numberResistance/reactance/impedenceUltra-widebandMicrowave
The invention introduces a microwave device impedance measurement calibration method. The method comprises the following steps: (1), calculating time-delay transmission line transmission parameters through real-time measured data of straight-through calibration member scattering parameters and time-delay calibration member scattering parameters; (2), embedding a newly added virtual transmission line in an original time-delay calibration member, and calculating the transmission parameters of a virtual time-delay calibration member; (3), according to a conventional TRL calibration method, extracting calibration coefficients of a measuring clamp, and performing matrix inversion and multiplication operation to obtain a microwave device de-embedding transmission parameters; and (4), performing impedance normalization transformation on the microwave device de-embedding transmission parameters to obtain normalized microwave device normalization scattering parameters relative to system measurement reference impedance. The method makes up the measurement errors caused by inconsistence of transmission line characteristic impedance and the system measurement reference impedance, and realizes microwave device impedance measurement with an ultra wide band and high precision. At the same time, the improved microwave device impedance measurement calibration method can substantially reduce design processing requirements of a calibration device, thereby having high versatility.
Owner:NAT UNIV OF DEFENSE TECH

Method for calibrating two-port vector network analyzer based on ten-error model

The invention discloses a method for calibrating a two-port vector network analyzer based on a ten-error model, belonging to a method for calibrating a vector network analyzer. The method comprises the following steps of: selecting an error model according to the hardware topological structure of the vector network analyzer; preparing a 50-ohm short-open-thru (SOT) transmission line calibration piece of which the characteristic is known and the length is unknown for serving as a device under test (UDT), and evaluating the transmission characteristic of a UL (Unknown Line) according to the scattering parameter measured value of an SOT-UL standard piece and the scattering parameter measured value of an SOT standard piece; evaluating the normalized wave ratio of a DUT incident port during the measurement of an SO (Short-Open) standard piece according to the scattering parameter measured value and real value of the SOT-UL standard piece; and when an unknown DUT is connected, evaluating the real value of a DUT scattering parameter according to the measured value and real value of the standard piece scattering parameter and the DUT scattering parameter measured value. By adopting the method, the testing cost is lowered, and the calibration process is simplified greatly.
Owner:NANJING UNIV OF AERONAUTICS & ASTRONAUTICS

Method and device for monitoring a radio-frequency transmitter device in a magnetic resonance tomography system

ActiveUS20100167668A1Peak loading is avoidedThreshold value is exceededModulation with suppressed carrierDiagnostic recording/measuringResonance measurementVoltage amplitude
In a method and device for monitoring a radio-frequency transmit device of a magnetic resonance tomography system, having a transmitter antenna system that has a number of transmit channels, during a magnetic resonance measurement of an examination subject, a reference scattering parameter matrix of the transmitter antenna system is determined in the unloaded state, and a subject-specific scattering parameter matrix of the transmitter antenna system is determined in a state loaded with the subject of examination. Moreover, transmitter amplitude vectors are determined in time-dependent fashion that represent the radio-frequency voltage amplitudes on the individual transmit channels. On the basis of the subject-specific scattering parameter matrix, the reference scattering parameter matrix, and the transmit amplitude vectors, radio-frequency power values absorbed at particular transmit times in the subject are determined. Based on a large number of the determined radio-frequency power values, a number of monitoring values are formed. The radio-frequency transmit device is limited in its functioning when a monitoring value reaches or exceeds a prespecified boundary monitoring value.
Owner:SIEMENS HEALTHCARE GMBH

Electrically controlled detecting device for microwave medium coating and detecting method thereof

InactiveCN102590637AComply with monitoring standard requirementsEasy to handleResistance/reactance/impedenceElectricityMicrowave
The invention relates to detection of microwave coating dielectric properties, particularly to an electrically controlled detecting device for a microwave medium coating and a detecting method thereof. The detecting device is provided with a rectangular waveguide, parallel coupled microstrip electrodes, a DC stabilized voltage supply, a vector network analyzer, a computer and a short circuit plate, wherein the front end of the rectangular waveguide is connected with a port of the vector network analyzer; the parallel coupled microstrip electrodes are arranged in the middle of the rectangular waveguide; the rear end of the rectangular waveguide is connected with the short circuit plate; an output end of the DC stabilized voltage supply is connected with the parallel coupled microstrip electrodes; and the vector network analyzer is connected with an input port of the computer. The microstrip electrodes are arranged on a to-be-tested sample, placed in the end surface of the waveguide and clamped by the short circuit plate for testing, and the microstrip electrodes are connected; voltage is applied to the microstrip electrodes, so as to observe the variation of the scattering parameters; and a known air layer and a PTFE coating are tested, the dielectric constant is calculated, and electromagnetic parameters of the known coating and the testing result are compared, so as to determine the stability, the testing error and the testing precision of the testing system.
Owner:XIAMEN UNIV

Electric control radiation directional diagram reconfigurable antenna

InactiveCN102157792AInfluence of electromagnetic characteristicsHigh gainAntennasEngineeringElectric control
The invention relates to an electric control radiation directional diagram reconfigurable antenna. The reconfiguration of the directional diagram of the antenna is finished by the following steps of: (1) selecting the working frequency f of an antenna; (2) confirming an arrangement cycle of an artificial structure material unit in three directions, an antenna integral structure and a metal structure and the substrate material of a formed unit, wherein the arrangement cycle comprises geometric parameters of the substrate material and the metal structure; (3) adding a variode on an opening of the metal structure; (4) calculating the transmission spectrum S21 phase of the unit by utilizing electromagnetic simulation software, continuously changing a capacitance value of the variode, recording the corresponding phase of a scattering parameter and drawing a phase-capacitance C curve; (5) arranging an artificial material along the horizontal plane cycle, dividing the artificial structure material into N areas with equal distance, and controlling a voltage value loaded on the variode in the unused area, wherein all the areas have equal structural size and contain equal amount of units. The antenna is a controllable antenna of a broadband and can realize positive/negative 40-degree deflection or so of a main lobe of the radiation directional diagram of the antenna.
Owner:INST OF OPTICS & ELECTRONICS - CHINESE ACAD OF SCI
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