122 results about "Scattering parameters" patented technology

The invention discloses an ISAC angular domain energy imaging method and an ISAC angular domain energy imaging system based on actual measurement channel response calibration ray tracing, and mainly solves the problem that an imaging model faces serious channel mismatch and cross-scene generalization limitation due to the fact that simulation data lacks physical consistency constraint in the prior art. According to the scheme, the method comprises the steps that geometric features are extracted from public map data or laser point cloud data, and an ISAC scene environment geometric model is constructed; acquiring an actual measurement channel impulse response containing multipath information by using the communication and sensing integrated equipment; performing path matching on the actual measurement channel impulse response and the ray tracing simulation channel response, inverting environment propagation parameters and correcting scattering parameters; and inputting the calibrated parameters into a ray tracking model, counting energy contribution in each space direction under the condition of a single antenna, obtaining angular domain energy distribution and confidence coefficient, and mapping the angular domain energy distribution and confidence coefficient to a spherical grid to form an imaging result. According to the method, physical mismatch between simulation and real environments is effectively eliminated, low-cost and high-precision angular domain energy imaging and confidence evaluation are realized under the condition of a single antenna, and the method can be used for imaging reconstruction of an ISAC system, environmental perception and generation of a neural network training data set.

The invention relates to the technical field of coal quality detection, in particular to an online detection method and system for the quality of coal as fired. Comprising the following steps: a multi-modal data acquisition step: respectively acquiring a microwave scattering parameter and a surface element characteristic spectrogram through a microwave chromatography sensor array and a surface spectrum detector; a physical field inversion and modeling step: reconstructing a complex dielectric constant distribution diagram based on scattering parameters, and establishing a three-dimensional physical distribution model containing density and moisture; a field-spectrum coupling deduction step: taking the characteristic spectrogram as a boundary constraint, and deducing internal chemical element distribution in combination with the complex dielectric constant distribution diagram; volume weighted quantization: executing volume weighted integration for the three-dimensional physical model and the chemical distribution, and outputting comprehensive coal quality parameters; according to the method, the detection blind area of a single technology is eliminated, and the representativeness and the safety of coal as fired total cross-section detection are remarkably improved.

The invention discloses an on-chip calibration device parasitic parameter determination and traceability method based on an inversion algorithm, and the method comprises the steps: determining eight error terms through TRL calibration which employs three calibration standard components: a straight-through calibration standard component, a reflection calibration standard component and a transmission line calibration standard component; the method comprises the following steps of: acquiring a relation between error terms in TRL calibration and SOLT calibration according to a signal flow graph, acquiring an expression for extracting a true value of a reflection coefficient of a calibration sheet through inversion according to a 12-item error correction model algorithm, substituting scattering parameters acquired by testing into an error term analytical solution of TRL calibration, solving a TRL calibration error term, and calculating the true value of the reflection coefficient of the calibration sheet according to the error term analytical solution of the TRL calibration. The reflection coefficient truth values of the open circuit and short circuit of the calibration piece and the load piece are extracted; according to the method, the extraction process of the parasitic parameters of the calibration piece is simplified, error sources introduced in the extraction process of the parasitic parameters of the calibration piece are reduced, and the extracted parasitic parameters of the calibration piece have a good effect.

The invention provides a method and system for detecting electromagnetic compatibility efficiency of a wave-absorbing material and a storage medium, and relates to the technical field of electromagnetic compatibility efficiency detection. The method comprises the following steps: firstly, carrying out first electromagnetic measurement on a target area of the electronic equipment when a wave-absorbing material is not laid to obtain a first near-field scattering parameter set; and carrying out local minimum detection and amplitude and space distribution threshold presetting on the parameter set to screen out problem resonance frequency points. And laying the to-be-measured wave-absorbing material in the target area, and carrying out second electromagnetic measurement according to the same measurement condition to obtain a second near-field scattering parameter set. And comparing the two measurement data, calculating the local variable quantity, the space average suppression degree and the peak suppression ratio of each problem resonance frequency point, and constructing a comprehensive efficiency index on the basis of the local variable quantity, the space average suppression degree and the peak suppression ratio, thereby realizing quantitative evaluation on the overall efficiency and the local hot spot suppression capability of the wave-absorbing material. And finally, judging whether the electromagnetic compatibility efficiency of the material reaches the standard or not according to the space average suppression degree and the comprehensive efficiency index. Accurate evaluation of the electromagnetic compatibility efficiency of the wave-absorbing material is realized.

The invention discloses an on-chip calibration part parasitic parameter extraction method based on a particle swarm algorithm. The method comprises the following steps: calculating a propagation constant of a transmission line to be measured through a TRL, calculating a direct-current resistance and a reflection coefficient of a calibration part to calculate line capacitance of the transmission line to be measured, establishing a calibration part parasitic parameter equivalent circuit model, and calculating a real scattering parameter of the calibration part according to a parasitic parameter; 12 error terms are calculated according to the real scattering parameters of the calibration piece and the scattering parameter measurement values; and setting a target function as a constraint condition to enable the calibration value of the transmission line to be measured to approach the real scattering parameter of the transmission line to be measured, optimizing the parasitic parameter by using a particle swarm algorithm, and outputting a group of optimal parasitic parameters. According to the method, the real scattering parameters of the transmission line are calculated by modeling the transmission line model, and the parasitic parameters are optimized by using the particle swarm optimization to aim at enabling the calibrated transmission line parameters to approach the real values, so that the accuracy of the parasitic parameters of the calibration piece is effectively ensured.

The invention provides a self-adaptive tuning matching and control system of a magnetic resonance radio frequency transmitting coil, and belongs to the technical field of magnetic resonance imaging. The system is composed of a radio frequency transmitting coil, a tuning matching circuit of the radio frequency transmitting coil, an automatic adjusting device, a scattering parameter measuring device, an upper computer interaction module, a PC and a computer processing program. During working, the system only needs to pre-store a group of optimal tuning and matching scattering parameters, after different parts of different human bodies enter the center of the body coil, tuning and matching circuits can be continuously adjusted, changes of the scattering parameters in the adjusting process are collected in real time, and the rotating direction of a tuning strip matching motor can be automatically judged; and the accurate tuning frequency and the optimal matching state are quickly obtained, so that the optimal transmitting efficiency is achieved.

The invention provides a near-field scanning rapid imaging device for the radio frequency performance of a multi-channel electrically tunable base station antenna, and relates to the technical field of radio frequency antenna testing, the device comprises a scanning assembly and a data processing module, the scanning assembly is composed of a radio frequency probe installed on a two-dimensional precision displacement platform and a vector network analyzer connected with the radio frequency probe, and the data processing module is connected with the scanning assembly. The scanning module is used for performing point-by-point scanning in an antenna near-field area along a preset plane grid path and collecting scattering parameters representing electromagnetic field characteristics at sampling points to form a near-field scanning data set; and the data processing module receives the data set, executes fast Fourier transform operation, and converts near-field data into far-field radiation characteristics so as to generate a far-field radiation pattern representing the radio frequency performance of the antenna. And the data processing module applies a preset static compensation matrix to the near-field data before conversion, so that the mutual coupling effect between the probe and the antenna is inhibited, and the accuracy of a measurement result is improved.

The invention discloses a data optimization method and system and a computing device cluster. After the data optimization system receives the physical attribute parameters of the passive device, feature extraction is carried out on the physical attribute parameters of the passive device, and poles, residuals and constant terms forming a scattering parameter frequency response curve of the passive device are obtained. The data optimization system calculates a scattering parameter frequency response curve of the passive device according to different frequencies, poles, residuals and constant terms in a set frequency range, performs passivity correction on the scattering parameter frequency response curve of the passive device, filters abnormal values in the scattering parameter frequency response curve of the passive device, or corrects the abnormal values, and finally performs passive correction on the scattering parameter frequency response curve of the passive device. And the curve is smoother. The scattering parameter of the scattering parameter frequency response curve of the passive device output by the data optimization system meets the physical property constraint. A designer selects the most suitable passive device for the radio frequency circuit based on the performance parameters of the passive device meeting the physical property constraint, so that the performance of the designed and developed radio frequency circuit is optimal.

The invention discloses a method for rapidly evaluating an S parameter of a multi-layer PCB port in a multi-stage waveguide structure, and the method comprises the steps: decomposing a system into a plurality of mutually independent subsystems, representing a propagation channel of electromagnetic energy as a signal pipeline, and representing a reflection position of the energy as a reflection node, thereby building a signal energy flow diagram of the system. On the basis, scattering parameters of the subsystems are obtained through a numerical simulation method, and a corrected BLT equation capable of representing the electromagnetic field-circuit bidirectional coupling relation between the subsystems is deduced in combination with propagation equations of all signal pipelines and scattering equations of all reflection nodes of the system; and the S parameter of the multi-layer PCB port in the multi-stage waveguide structure can be obtained by solving the equation. The method has the advantages of being simple in algorithm, accurate in result, high in efficiency and the like, is suitable for a multi-stage waveguide structure of any geometrical shape, and can achieve rapid evaluation and analysis of the electromagnetic coupling effect in electronic equipment with a waveguide-shaped shielding structure in a complex electromagnetic environment.

The present application belongs to the technical field of stealth design of aircraft shape and structure, and discloses a surface wave electromagnetic scattering characteristic quantitative analysis method based on a two-port transmission model. The surface wave electromagnetic scattering characteristic quantitative analysis method based on the two-port surface wave transmission model has an electromagnetic discontinuous structure. By loading the electromagnetic discontinuous structure, the scattering parameters of the port network are monitored, and by changing the structural parameters of the electromagnetic discontinuous structure, the influence of the structural parameters of the electromagnetic discontinuous structure on the surface wave scattering characteristic is quantitatively studied. The surface wave electromagnetic scattering characteristic quantitative analysis method can separate the spatial electromagnetic scattering component when the spatial electromagnetic wave is directly irradiated, and can analyze the electromagnetic scattering characteristic of the surface wave in the discontinuous electromagnetic structure alone, thereby laying a foundation for studying the surface wave electromagnetic scattering characteristic of the electromagnetic discontinuous structure such as a curved surface, a gap and a step, and providing guidance for the stealth design of the aircraft shape and structure.

The invention discloses a welding spot testing method and system and a computer program product, and relates to the technical field of electronic packaging, and the method comprises the steps: constructing a single welding spot testing architecture through a to-be-tested single welding spot of a chip unit, and determining a transmission parameter matrix according to a scattering parameter matrix of the single welding spot testing architecture; combined de-embedding calculation is carried out by combining a substrate open circuit transmission matrix, a substrate short circuit transmission matrix and a chip short circuit transmission matrix which are measured when the single welding spot test framework is in an open circuit structure and a short circuit structure, so that the parasitic effect of the test substrate and the chip unit and the crosstalk of adjacent structures are accurately stripped; therefore, transmission performance parameters which only reflect intrinsic characteristics of the to-be-tested single welding spot can be directly extracted, signal superposition interference and approximate estimation limitation existing in a traditional multi-point series connection test or parameter equalization method are broken through, systematic errors are eliminated, accurate measurement and fault location of electrical characteristics of the to-be-tested single welding spot are achieved, and the method is suitable for large-scale popularization and application. And the accuracy and the reliability of the welding spot test in the packaging body are obviously improved.

This application discloses a multi-port antenna design method, apparatus, electronic device, and storage medium, relating to the field of communication technology. The method includes: acquiring the scattering parameter matrix and open-circuit electric field pattern data of the multi-port antenna to be designed within the design frequency band; defining an objective function for designing the multi-port antenna according to actual antenna design requirements; generating structural parameters of the multi-port antenna, and then evaluating the objective function based on the structural parameters; calculating the deviation matrix of the evaluated objective function; determining whether the structural parameters need to be updated based on the deviation matrix; if the structural parameters need to be updated, updating the structural parameters, and then returning to the step of evaluating the objective function based on the structural parameters, until the structural parameters are determined not to need to be updated based on the deviation matrix, and then outputting the current structural parameters as the design parameters of the multi-port antenna. This application can improve the computational speed while maintaining computational accuracy, making it suitable for practical applications.

The embodiment of the invention discloses a position optimization method based on multipath scattering parameter fusion, and relates to the field of passive positioning in a complex environment. For signals interrupted due to shielding, path relevance of multi-path parameters before and after signal interruption is re-established through a multi-path component grading sorting algorithm of different time window scales, multi-path component tracking is achieved, and therefore high-precision robust positioning is achieved. According to the method, multipath parameter information of multipath signals is utilized to realize path order identification and scatterer matching of the signals, joint optimization is carried out based on multipath parameters and a geometric model, and high-precision positioning of a target and a scatterer is realized. And high-precision target positioning under strong shielding and strong multipath environments can be realized by using radio multipath signals.

The invention provides a parametric modeling method and device for a silicon-based millimeter wave on-chip component, and belongs to the technical field of integrated circuit modeling and millimeter wave circuit design. The method comprises the following steps: under a preset key parameter interpolation node, acquiring a transmission parameter of a de-embedding test structural member comprising a de-embedded component at each test frequency point; removing a parasitic effect embedded in the test structural member by using transmission matrix operation so as to obtain a transmission matrix of the de-embedded component and obtain a scattering parameter of the de-embedded component; then, through a vector fitting algorithm, obtaining a pole-residue model of the de-embedded component under the parameter interpolation node; and based on the pole-residue model under each parameter interpolation node, establishing a parameterized de-embedding model of the de-embedded component through a gravity center interpolation algorithm. According to the method, rapid and accurate modeling of silicon-based millimeter wave on-chip components of any size can be realized, and the reliability and efficiency of millimeter wave integrated circuit design are improved.

A scattering parameter measurement device based on microwave photonic mixing includes a microwave generation module 1, a signal loading module 2, a local oscillator frequency generation module 3, a multi-channel microwave photonic mixing module 4, an analog-to-digital converter (ADC) module 5, and a signal processing module 6. Along the signal output direction of the multi-channel microwave photonic mixing module 4, the ADC module 5 and the signal processing module 6 are sequentially arranged. This invention utilizes microwave photonic mixing technology and a local oscillator source with relatively small bandwidth to down-convert a high-frequency microwave signal to a fixed-frequency intermediate frequency (IF) signal. This reduces the bandwidth requirements of the receiver's electronic components and the sampling rate requirements of the ADC. It abandons the traditional superheterodyne structure and / or direct conversion structure, using a miniaturized continuous optical module as the light source for microwave photonic mixing, simplifying the system structure and reducing cost and power consumption.

This invention relates to the field of coal quality testing technology, specifically to an online method and system for detecting coal quality entering the furnace; it includes: a multimodal data acquisition step: acquiring microwave scattering parameters and surface element characteristic spectra using a microwave tomography sensor array and a surface spectrometer, respectively; a physical field inversion and modeling step: reconstructing the complex permittivity distribution map based on the scattering parameters to establish a three-dimensional physical distribution model including density and moisture; a field-spectrum coupling deduction step: using the characteristic spectra as boundary constraints, and combining them with the complex permittivity distribution map to deduce the internal chemical element distribution; and a volume-weighted quantization step: performing volume-weighted integration on the three-dimensional physical model and chemical distribution to output comprehensive coal quality parameters; this invention eliminates the detection blind spots of single technologies and significantly improves the representativeness and safety of full-section detection of coal entering the furnace.

The application relates to the technical field of circuit design, and discloses a signal simulation analysis method and system. The method comprises the following steps: building a simulation structure; acquiring scattering parameters of a main control chip substrate, a PCB board and a storage chip particle substrate respectively according to the built simulation structure; optimizing a second wiring design according to the scattering parameters of the PCB board, optimizing a third wiring design according to the scattering parameters of the storage chip particle substrate, and obtaining an optimized simulation structure; inputting the optimized simulation structure into pre-configured simulation software for signal transmission simulation test, and obtaining eye diagram data; analyzing the signal quality index of corresponding pins based on the eye diagram data, and determining whether the optimized simulation structure meets the preset transmission rate requirement according to the signal quality index; and through the above method, the interconnection link outside the main control chip and the internal wiring structure of the storage chip can be optimized simultaneously.

In one embodiment, a method implemented by an electromagnetic imaging system for imaging material within a metal container, the method comprising: transmitting to. and receiving signals from, a plurality of antennas attached to an interior wall of the metal container, the signals delivered over a plurality of channels, each of the plurality of antennas comprising a ferrite loaded, shielded half-loop antenna; measuring a plurality of scattering parameters (S-parameters) for all of the plurality of channels; calibrating the measurements; and providing an image of the material using an inversion algorithm based on the calibrated measurements.

The invention discloses a method for acquiring frequency response data of a probe, an oscilloscope and a computer storage medium, and relates to the technical field of measurement. The method comprises the following steps: for each to-be-measured frequency point of a to-be-measured probe, when a measurement point is not connected with the to-be-measured probe, acquiring a first scattering parameter of a first signal transmission path between a first interface and the measurement point by using a network analyzer; acquiring an initial scattering parameter of a second signal transmission path between the measurement point and the terminal load through the second interface; determining a second scattering parameter of the second signal transmission path according to the initial scattering parameter; determining an equivalent clamp scattering parameter according to the first scattering parameter and the second scattering parameter; when the measuring point is connected with the probe to be measured, acquiring a total scattering parameter of a total signal transmission path between the first interface and the output end of the probe to be measured by using the network analyzer; and according to the total scattering parameter and the equivalent clamp scattering parameter, determining a scattering parameter of the to-be-detected probe, and according to the scattering parameter of the to-be-detected probe, determining frequency response data of the to-be-detected probe at the corresponding frequency point.

In one embodiment, a system comprising: a container configured to store commodity; a measurement system comprising a vector network analyzer (VNA), a switch module, a plurality of cables, the container, and a plurality of antennas coupled to interior walls of the container, the switch module configured to switch signals transmitted to and received from the plurality of antennas via a plurality of channels, the VNA configured to measure scattering parameters (S-parameters) of all of the plurality of channels; a non-transitory computer readable medium comprising software; and a processor configured by the software to: de-embed a combined effect of the measurement system based on a 2-port network de-embedding technique using only a subset of the S-parameters; and provide an image of the commodity using an inversion algorithm based on input of a calibrated S-parameter after the de-embedding.

Embodiments of the present application provide a calibration device, a differential clamp, and related devices and systems. The calibration device includes a non-equivalent length reflection calibration piece for calibrating a scattering parameter of a differential signal obtained based on the differential clamp. The non-equivalent length reflection calibration piece includes a first line and a second line. An electrical length of the first line is not equivalent to an electrical length of the second line. A difference between a length of the first line and a length of the second line is within a preset range. The preset range is determined based on a bandwidth of the differential signal. Embodiments of the present application can accurately obtain the scattering parameter of the differential signal in the case of using the differential clamp.

The embodiment of the invention provides a method, equipment and system for measuring the loop contact impedance of a switch cabinet and a storage medium, and the method comprises the steps: enabling a vector network analyzer to measure a first scattering parameter when a lead load end is short-circuited, and enabling the vector network analyzer to measure a second scattering parameter when the lead load end is connected with a reference resistor, and when the lead load end is connected with the switch cabinet, the vector network analyzer measures a third scattering parameter, the vector network analyzer sends the first scattering parameter, the second scattering parameter and the third scattering parameter to the electronic equipment, and the electronic equipment sends the first scattering parameter, the second scattering parameter and the third scattering parameter to the switch cabinet based on the first scattering parameter, the second scattering parameter and the third scattering parameter. And calculating the loop contact impedance of the switch cabinet through a preset loop contact impedance calculation formula. Through the method, high-precision, online and non-contact measurement of the contact impedance of the switch cabinet is realized, the method is obviously superior to the prior art, and an innovative solution is provided for state maintenance of power equipment.

This invention discloses a rapid calculation method for the broadband electromagnetic performance of microstrip lines and microstrip-like two-port structures. It relates to the fields of electromagnetic calculation and electromagnetic compatibility-aided design technology, and includes: acquiring and preprocessing the layout data of the microstrip port conductor to be tested, generating a binary layout image; inputting the binary layout image into a pre-trained convolutional neural network, outputting a real-valued encoded prediction vector of the complex mode eigenvalues ​​of the dominant mode at a preset sampling frequency; denormalizing and decoding the prediction vector to obtain complex mode eigenvalue samples; identifying the complex mode eigenvalue samples based on a second-order analytical model and analytically extending them to obtain the broadband modal impedance of the target frequency band; obtaining the port impedance matrix according to the reconstruction relationship, and converting and outputting broadband scattering parameters and electromagnetic performance results. This invention can significantly reduce the computational overhead of full-wave frequency sweep and improve the simulation efficiency of microstrip lines and the iteration speed of EMC design.

This invention belongs to the field of radar signal processing and target detection technology, specifically relating to a statistical scattering method for clutter particles in radar detection. The method includes: acquiring single scattering parameters and simulation control parameters of the clutter particles; dynamically determining the simulation space length based on the single extinction coefficient and asymmetry factor; initializing a quasi-Monte Carlo low-discrepancy sequence; after initializing each photon packet, randomly generating a propagation step size and updating the cumulative propagation step size; when the photon packet does not exceed the boundary, determining whether scattering has occurred based on the single extinction coefficient and cumulative propagation step size; if scattering has occurred, updating the scattering direction based on the Henyey-Greenstein phase function and attenuating the energy weight; employing an adaptive dynamic threshold roulette wheel mechanism to dynamically adjust the survival probability based on scattering efficiency, photon position, and propagation direction, and maintaining statistical unbiasedness through energy weight compensation; after traversing all photon packets, calculating the total transmitted energy and total reflected energy, and calculating the equivalent extinction coefficient and radar cross section. This invention significantly improves simulation efficiency while ensuring statistical accuracy through physically guided importance sampling and a quasi-Monte Carlo low-discrepancy sequence, providing reliable support for radar anti-environmental clutter interference design.

The invention relates to the technical field of circuit design, and discloses a signal simulation analysis method and system. The method comprises the following steps: building a simulation structure; according to the built simulation structure, scattering parameters of the main control chip substrate, the PCB and the storage chip particle substrate are obtained respectively; optimizing the second wiring design according to the scattering parameters of the PCB, and optimizing the third wiring design according to the scattering parameters of the storage chip particle substrate to obtain an optimized simulation structure; inputting the optimized simulation structure into pre-configured simulation software to perform a signal transmission simulation test to obtain eye pattern data; analyzing a signal quality index of the corresponding pin based on the eye pattern data, and determining whether the optimized simulation structure meets a preset transmission rate requirement or not according to the signal quality index; in this way, the external interconnection link of the main control chip and the internal wiring structure of the storage chip can be optimized at the same time.

A radio frequency circuit optimization design method based on high-performance computing, comprising the following steps: sub-modularizing the radio frequency circuit; constructing a circuit sub-module neural network; using GPU for parallel computing based on the circuit sub-module neural network; cascading the scattering parameter results of each level of sub-module circuit to obtain the scattering parameter results of the overall circuit; searching for an optimization scheme that meets the performance index condition from the scattering parameter results of the overall circuit; finding the Pareto optimal solution for the pros and cons of the search results, and screening out the circuit that meets the actual engineering index. Compared with the traditional artificial neural network used for modeling the relationship between the design size and electrical behavior of the full-stage radio frequency circuit, the method is more flexible, can improve the reusability and accuracy of the artificial neural network model, and can accelerate the calculation by using the high parallel computing characteristics of the neural network model.

The invention provides a scattering parameter calculation method and device, a storage medium and calculation equipment, and the method comprises the steps: obtaining an equivalent circuit model corresponding to each sub-circuit module in a target circuit from a pre-constructed equivalent circuit model library, and obtaining a configuration parameter set for each equivalent circuit model; the configuration parameters at least comprise geometric dimension parameters and material attribute parameters; obtaining a frequency simulation range, and for each target frequency in the frequency simulation range, according to the configuration parameters of each equivalent circuit model, performing simulation on each equivalent circuit model under the target frequency in sequence to obtain parasitic parameters of each equivalent circuit model under the target frequency; determining a transmission matrix of each equivalent circuit model under the target frequency according to the parasitic parameters and circuit structures in the equivalent circuit models; and determining a first scattering parameter of the target circuit at the target frequency according to the transmission matrix of each equivalent circuit model at the target frequency.

The application belongs to the technical field of photonic link, and particularly relates to a photonic link fast frequency domain calculation method based on multimode coupling and sub-network growth, which comprises the following steps: S1, constructing a multimode scattering model of an optical device; S2, constructing a sub-network multimode scattering matrix; and S3, sub-network merging and optimization. The method is suitable for a photonic network containing any interconnected multi-port elements, can accurately characterize multimode propagation and coupling phenomena by using scattering parameters, can support any number of modes in a waveguide element and mode coupling effects, and can realize efficient calculation of photonic link frequency domain response through step-by-step solution of the multimode scattering matrix.

This invention discloses a method and system for detecting the dielectric properties of cells in a coplanar waveguide based on Rayleigh acoustic flow manipulation and optical tracking. It employs a closed-loop detection scheme of identification-manipulation-detection-correction, specifically: a Rayleigh acoustic flow field is generated in a fixed microdroplet; the three-dimensional motion trajectory of the cell in the fixed microdroplet is obtained through optical measurement to identify the real-time height of the cell in the Rayleigh acoustic flow field; the acoustic flow excitation parameters are optimized based on the acoustic flow suppression coefficient, and the cell is stably manipulated to the electrode gap region of the coplanar waveguide sensor using acoustic flow; broadband scattering parameters are measured using the coplanar waveguide sensor, simultaneously obtaining the precise three-dimensional position of the cell within the electrode gap region; the precise three-dimensional position and broadband scattering parameters are input into a pre-constructed mapping model to obtain the cell dielectric parameters after position deviation correction. This invention has advantages such as good biocompatibility, high position manipulation accuracy, high detection accuracy, and the ability to be arrayed for high-throughput operation.

The application discloses a microwave integrated circuit scattering parameter fast test evaluation circuit and an evaluation method, and the evaluation circuit comprises a host computer, an automatic auxiliary device, a vector network analyzer, a test fixture A, a test fixture B and a standard microwave integrated circuit. The application can meet the fast, efficient and stable test application requirements of the microwave integrated circuit scattering parameter "just-measured and just-obtained", effectively reduce the cost, time and instrument resource invalid occupation caused by the calibration of a large number of customized adaptive test fixtures and corresponding operation complexity, large operation amount, calibration and error correction and the like, and improve the test application efficiency. The application reduces the hardware and software resource consumption and occupation in the test evaluation process, and is convenient to integrate the function into the production line comprehensive capacity judgment of the microwave integrated circuit production and manufacturing, so as to meet the low-cost, high-efficiency batch production and manufacturing application requirements and integrated measurement and control technical requirements of the microwave integrated circuit.