Test system for central processing unit (CPU) module

A CPU module and test system technology, applied in the direction of measuring electricity, measuring devices, measuring electrical variables, etc., can solve the problems of many CPU pins, complicated circuits, and complicated test operation procedures, and achieve the realization of live plugging, convenient operation, simple structure

Active Publication Date: 2013-03-20
XUJI GRP +2
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] The purpose of the present invention is to provide a test system for the CPU module to solve the current problems such as the large number of CPU

Method used

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  • Test system for central processing unit (CPU) module
  • Test system for central processing unit (CPU) module
  • Test system for central processing unit (CPU) module

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Embodiment Construction

[0021] The specific embodiments of the present invention will be further described below in conjunction with the accompanying drawings.

[0022] The overall structural block diagram of the embodiment of the present invention is as figure 1 As shown, the CPU module test system includes a computer test host and a CPU module test device, wherein the CPU module test device is composed of the following interfaces and circuits.

[0023] CPU module test interface, the power signal line, USB debugging slave port signal line, USB master port signal line, external expansion bus signal line, IO signal line, Ethernet signal line, clock backup power supply of the CPU module test device through the socket pin The signal wires are connected correspondingly, and are connected with the corresponding signal wires of the CPU module to be tested through the socket.

[0024] The USB debugging slave interface is connected to the computer testing host through the data line, the input is connected t...

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Abstract

The invention relates to a test system for a central processing unit (CPU) module. The system comprises a computer test host and a test device of the CPU module, wherein the computer test host accesses a CPU state register on the to-be-tested CPU module and executes test programs due to the fact that a universal serial bus (USB) data line penetrates through the test device of the CPU module. The test device of the CPU module comprises a test interface of the CPU module, USB debugging sub-interface, a power control circuit, a USB main interface test circuit, an external expansion bus test circuit, an input/output (IO) test circuit, an Ethernet interface test circuit, and a clock backup power test circuit. The test system not only achieves a test for quality of the CPU module, but also can locate specific faulty lines and chips. By means of the power control circuit, delayed electrifying protection of the to-be-tested CUP module and a power short circuit test can be achieved, and therefore hot plugging in the test process is achieved. The whole test system is simple in structure and convenient to operate.

Description

technical field [0001] The invention relates to a test system for a CPU module, which belongs to the technical field of electronic product manufacturing. Background technique [0002] After the CPU module is welded on the board, a comprehensive test is required to ensure that the produced CPU module has no quality problems such as short circuit or open circuit. In the existing CPU module testing method, the function and performance test of the whole machine can only be performed after the CPU module to be tested is placed in the application device. If the whole machine fails, replace the CPU module and repair it, then confirm that the original CPU module is damaged. This test method has a complicated operation process, cannot directly locate specific fault lines on the CPU module, chip damage and other quality problems, and cannot perform targeted repairs on soldering problems, and the test efficiency is low. The current CPU functions are getting stronger and stronger, the...

Claims

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Application Information

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IPC IPC(8): G01R31/02
Inventor 张锦春庞浩张长江侯高雷黄明山陈淘张志颖耿伟鹏周志辉王振举歹志阳
Owner XUJI GRP
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