The invention belongs to the technical field of an integrated circuit, in particular to a traversal test method of a configurable logic block (CLB) of a field programmable gate array (FPGA) based on a look-up table (LUT) structure. The method comprises: carrying out traversal tests on the single-point fault of an LUT, testing the multiple-point fault of the LUT, carrying out traversal tests on a distributive RAM, assigning the initial value of the trigger to be 0 or 1, carrying out level fixing on a setting terminal and a resetting terminal, leading the enabling to be invalid, and carrying out traversal tests on setting, resetting and enabling and the like. The invention can complete all the tests on the confronting manufacturing of all the CLBs in FPGA chips, and can cover all the basic logic devices, programmable code points and internal interconnection resources inside the CLBs. The configuration times, configuration difficulty and test time required by the test can all be greatly optimized.