Device and method for field programmable gate array (FPGA) single event effect dynamic fault testing

A single event effect and fault testing technology, applied in the direction of measuring devices, measuring electricity, measuring electrical variables, etc., can solve the problem of not establishing a dynamic synchronization relationship, etc., to save communication ports and host computer resources, strong compatibility and scalability , the effect of simple structure

Active Publication Date: 2014-12-03
NAT SPACE SCI CENT CAS
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Problems solved by technology

[0005] The purpose of the present invention is to overcome the defect that the test method in the prior art does not establish the dynamic synchronization relationshi

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  • Device and method for field programmable gate array (FPGA) single event effect dynamic fault testing
  • Device and method for field programmable gate array (FPGA) single event effect dynamic fault testing
  • Device and method for field programmable gate array (FPGA) single event effect dynamic fault testing

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Embodiment Construction

[0047] The present invention will be further described now in conjunction with accompanying drawing.

[0048] exist figure 1 In, provided in one embodiment, the structural diagram of the FPGA single event effect dynamic fault testing device of the present invention, this device comprises: control circuit module 11, upper computer control module 12, controllable pulse laser module 15 and three-dimensional movement module 16; wherein, the host computer control module 12 is connected to the control circuit module 11, and the control circuit module 11 is also connected to the controllable pulse laser module 15.

[0049] Test device of the present invention is when FPGA is detected, the tested FPGA device 13 to be tested is installed on the described three-dimensional mobile module 16 and described tested FPGA device 13 is connected with control circuit module 11, in addition, also needs Connect the control FPGA device 14 corresponding to the tested FPGA device 13 to the control c...

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Abstract

The invention relates to a device for field programmable gate array (FPGA) single event effect dynamic fault testing. The device comprises a control circuit module (11), an upper computer control module (12), a controllable pulse laser module (15) and a three-dimensional mobile module (16), wherein the three-dimensional mobile module (16) is used for installing a tested FPGA device (13) to be tested during the testing; the upper computer control module (12) is connected with the control circuit module (11), and the control circuit module (11) is connected to the controllable pulse laser module (15). During the testing, the control circuit module (11) is further connected with the tested FPGA device (13) and a contrast tested FPGA device (14) corresponding to the tested FPGA device (13).

Description

technical field [0001] The invention relates to a single event effect detection device, in particular to an FPGA single event effect dynamic fault test device and method. Background technique [0002] The single event effect (Single Event Effect) refers to the incident of a single high-energy charged particle in space on a semiconductor device, generating a large number of electron-hole pairs that are collected by the sensitive area of ​​the device, causing the logic state of the device to be reversed, the stored data to be changed, and even the device to be permanently A phenomenon of ionizing radiation that damages. Common single event effects include Single Event Upset, Single Event Transient and Single Event Latch-up. [0003] Spacecrafts in space are always in a space radiation environment composed of charged particles, in which high-energy protons and heavy ions can cause single-event effects in semiconductor devices in the spacecraft electronic system, seriously affe...

Claims

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Application Information

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IPC IPC(8): G01R31/00G01R31/3193
Inventor 朱翔封国强韩建伟姜昱光上官士鹏马英起陈睿余永涛
Owner NAT SPACE SCI CENT CAS
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