The invention provides an SRAM type FPGA single particle irradiation test system and method. The test system comprises a host computer, a current monitoring acquisition plate and a test plate. The current monitoring acquisition plate comprises a current monitoring acquisition FPGA, a current acquisition unit, a power supply module and a first communication interface; the test plate comprises a control processing FPGA, a refreshing chip, an SRAM, a configuration PROM, a storage PROM, a second communication interface and a detected FPGA; the host computer is in charge of flow control and data processing; the current monitoring acquisition plate is in charge of power-on and power-off of the test plate and monitoring and testing of FPGA currents; and the test plate is in charge of processing a command sent by the host computer and performing work such as single particle overturning, single particle function interruption detection and the like. According to the invention, the refreshing chip is utilized to replace some of the reconfiguration modules in a conventional irradiation test system so that a detected chip can be more conveniently and reliably refreshed; and the system and method provided by the invention can realize static and dynamic overturning testing on a trigger, and more reliable trigger overturning data can be obtained by combing the two methods.