911 results about "Test region" patented technology

The invention relates to the technical field of radio frequency identification, in particular to an online test method and system for an electronic tag. The method comprises the following steps: arranging a radio frequency signal transmitting device and a radio frequency signal receiving device on a production line, and placing a to-be-tested electronic tag at a test position; according to production line speed data and environmental parameter data; testing time sequence parameter data are generated according to the staying time of the electronic tag to be tested in the testing area according to the production line speed data; generating a test threshold according to the environmental parameter data to obtain test reference data; according to the test time sequence parameter data, radio frequency excitation signals of different frequency bands are sequentially sent to the electronic tag through the controller, response signals of the electronic tag under the corresponding frequency bands are collected, and response signal data of the electronic tag are obtained. According to the invention, a test time sequence and reference data are dynamically generated according to the production line speed and environmental parameters, diagnosis and correction optimization of multi-band response signals are carried out in real time, and a more accurate test result is provided.

The invention discloses a flexible photovoltaic support aeroelastic response wind tunnel test platform and method, and the platform comprises a platform body which comprises a wind field simulation region and an experiment test region. A wind tunnel wedge is arranged at the front section of the incoming flow wind direction in the wind field simulation area; a flexible photovoltaic support model is arranged in the experimental test area; the flexible photovoltaic support model comprises a photovoltaic panel, a flexible photovoltaic panel support and a flexible photovoltaic panel base; the flexible photovoltaic panel base is fixed on the wind tunnel turntable; the photovoltaic panel is fixed on the flexible photovoltaic panel base through the flexible photovoltaic panel bracket; steel cables penetrate through the interior of the photovoltaic panel, and the steel cables on the two sides are connected with an electronic tension meter and a tightening device. Through the platform and the method, a real complex wind field environment can be simulated, dynamic response data of the support under different working conditions can be obtained, and a scientific basis is provided for design optimization and wind resistance improvement of the flexible photovoltaic support.

The invention provides a titanium plate performance analysis method and system, and relates to the technical field of metal material detection.The method comprises the steps that an optical scanner is adopted to establish a three-dimensional structure on the surface of a titanium plate, and test areas are divided; synchronously acquiring stress, hardness and conductivity data of a test point by using a multi-probe collaborative detection device; constructing a dual-branch feature extraction network, wherein the dual-branch feature extraction network comprises a surface topography feature branch and a physical feature branch; performing statistical integration on the features in the test area, calculating distribution features and determining a weight coefficient; and generating a performance analysis result through feature fusion and a multi-task output layer, and finally determining the performance grade of the titanium plate. According to the method, deep fusion of morphology information and physical characteristics is realized, and the accuracy and reliability of titanium plate performance evaluation are improved.

The present invention relates to an in-situ micro-nano impact indentation testing instrument, falling within the technical field of material micromechanical testing. The instrument comprises a nitrogen generation module, an environmental chamber, a high / low temperature loading module, an “optical-infrared” in-situ monitoring module, an “electromagnetic-piezoelectric” coupling impact module, etc. After the nitrogen is introduced into the environmental chamber and the test area is determined by microscopic imaging, the “electromagnetic-piezoelectric” coupling impact module can drive an indenter to indent a specimen. An acoustic emission sensor embedded in the high / low temperature loading module can monitor the surface crack propagation of the specimen. The “optical-infrared” in-situ monitoring module can perform real-time high-speed optical imaging and infrared imaging on the impact indentation process. The present invention can perform micro-nano impact indentation testing on the material at high or low temperatures.

The invention discloses a semiconductor probe card electrical parameter extraction method and system based on an MEMS technology, and relates to the technical field of semiconductor testing, the method comprises the following components: initialization setting: aligning an MEMS probe card to a target test area on a wafer to be tested, firmly fixing the probe card and the wafer together by using a mechanical clamping device, and setting the MEMS probe card and the wafer to be tested; by integrating the decision tree model and the genetic algorithm, accurate mapping and optimization of semiconductor wafer surface features and optimal probe contact parameters are achieved, the intelligent level of testing is improved, the test time is shortened, the test efficiency is improved, and the test cost is reduced. The self-adaptability and stability of the testing process are remarkably enhanced, real-time adjustment of probe contact parameters is ensured through a dynamic monitoring and closed-loop control mechanism, the testing error is effectively reduced, the testing precision is improved, the optimal contact parameter combination is found through an optimization algorithm, the testing period is further shortened, and the testing efficiency is improved.

A method for analyzing a sample includes introducing the sample into a vessel including a cation-exchange resin, where the cation-exchange resin has a high affinity to one or more interferent species in the sample, directing the sample through the cation-exchange resin to thereby capture one or more interference species in the cation-exchange resin to purify the sample, and releasing the purified sample from the vessel. Additionally, a method for analyzing a sample includes receiving an image depicting a diagnostic test region and a color reference chart, converting a test region image portion of the image to an analytical color space, determining first and second coordinate values characterizing the test region image portion in the analytical color space, and providing a quantitative measurement of an analyte of interest in the sample based on the first and / or second coordinate values and a predictive formula based on the color reference chart.

The invention is applicable to the technical field of PCB testing, and particularly relates to a PCB electrical performance testing method, which comprises the following steps of: acquiring test object information; wherein the object information comprises a PCB image and at least one test area, the PCB image corresponds to the PCB and reflects the circuit structure of the PCB, the test area is marked on the PCB image, and the test area comprises a main test position and an auxiliary test position; when an electrical performance test instruction is received, contact judgment information is obtained based on the test object information; when it is detected that the auxiliary test probe is in stable contact with the auxiliary test position, the control device controls the main test probe to continuously send test signals and collect test results in real time, and test analysis information is obtained based on the test results. According to the PCB electrical performance test method provided by the embodiment of the invention, the problem of high test error caused by asynchronous actions of the main test probe and the auxiliary test probe can be improved.

A method for analyzing a sample includes introducing the sample into a vessel including a cation-exchange resin, where the cation-exchange resin has a high affinity to one or more interferent species in the sample, directing the sample through the cation-exchange resin to thereby capture one or more interference species in the cation-exchange resin to purify the sample, and releasing the purified sample from the vessel. Additionally, a method for analyzing a sample includes receiving an image depicting a diagnostic test region and a color reference chart, converting a test region image portion of the image to an analytical color space, determining first and second coordinate values characterizing the test region image portion in the analytical color space, and providing a quantitative measurement of an analyte of interest in the sample based on the first and / or second coordinate values and a predictive formula based on the color reference chart.

The invention relates to the technical field of camera testing, in particular to a camera triangulation distance measurement detection method. Comprising the following steps: selecting a tested camera, and adjusting the position and angle of the camera; according to the positions of the two targets in the image, setting test areas corresponding to different view field angle pictures, and adopting an area detection mode; angular point detection is carried out on the set area, the angular points and sub-pixel-level angular points are obtained, and checkerboard center angular points are judged and corrected; according to a distortion calibration model, selecting a corresponding function to carry out distortion removal calculation on the angular point to obtain a normalized distortion-removed angular point coordinate, and converting the normalized distortion-removed angular point coordinate into an actual distortion-removed pixel coordinate; calculating the calculation distance of two target angular points of each image, establishing a normalized three-dimensional coordinate, calculating the deviation angle of the left and right angular points by using the three points, and combining the measured parameters to obtain the calculation distance of the two angular points; and calculating a precision error. According to the technical scheme, the accuracy of the internal reference calibration data and the reliability of the distortion model can be effectively verified.

The application relates to the field of concrete testing, in particular to a concrete seamless floor strength testing device and an operating method thereof. The concrete seamless floor strength testing device comprises a mounting frame, a moving driving part one, a connecting table one and a dynamic rebound apparatus; the upper end of the mounting frame is provided with the moving driving part one; the driving end of the moving driving part one is provided with the connecting table one, and the moving driving part one controls the up-down movement of the connecting table one; three dynamic rebound apparatuses are arranged on the connecting table one; the device further comprises a moving driving part two, a connecting table two and a cylinder; the connecting table one is provided with the moving driving part two; the driving end of the moving driving part two is provided with the connecting table two; three cylinders are arranged on the connecting table two; three groups of concrete seamless floor strength data are collected by the three dynamic rebound apparatuses for parallel comparison, so that the error is reduced, and the test area of the dynamic rebound apparatus is protected by the cylinder.

The invention discloses a direct visual field testing device, which relates to the technical field of testing and comprises a video auxiliary device and a marker device, the video auxiliary device realizes three-dimensional positioning and real-time video acquisition of preset eye spots through a height adjusting mechanism, an angle adjusting mechanism and a holder adjusting mechanism; the marker device realizes accurate adjustment and stable positioning of a marker in a test area through a height adjusting rod, a knuckle bearing and laser-assisted positioning; the direct visual field testing device is suitable for accurate measurement of the visual field range of a driver, can efficiently collect and record testing data, has the advantages of being convenient to operate, high in adaptability, high in precision and the like, and is widely applied to the fields of vehicle design, driving training, safety research and the like.

The invention relates to a uniformity detection method and device for a silicon-based material and a computer readable storage medium. Comprising the following steps: obtaining test luminescence brightness values corresponding to a plurality of test areas of a to-be-detected silicon-based material in a photoluminescence test process, wherein the plurality of test areas cover the whole surface area of the to-be-detected silicon-based material; according to a first standard curve of the silicon-based material to be detected, each test luminance value is converted into a test doping concentration, and the first standard curve represents a corresponding relation between the doping concentration and the luminance value; according to a membership relationship between the plurality of test doping concentrations and a preset doping concentration range, counting the total number of test qualified areas with qualified doping concentrations in the plurality of test areas; and detecting the doping concentration of the to-be-detected silicon-based material according to the total number of the test qualified areas and the total number of the test areas corresponding to the plurality of test areas. By adopting the method, the detection effect of detecting the uniformity of the silicon-based material is improved.

The invention provides a method for measuring the thickness of an epitaxial layer. The method comprises the following steps: providing a substrate; forming a doped test region in the substrate through an ion implantation process; forming an epitaxial layer on the substrate, wherein a doping concentration difference exists between the epitaxial layer and the doping test region; and based on the doping concentration difference between the epitaxial layer and the doping test region, performing thickness detection on the epitaxial layer on the doping test region through a Fourier transform infrared spectrometer to obtain the thickness of the epitaxial layer. According to the method, the thickness of the epitaxial layer can be directly measured on the production line of the semiconductor manufacturing process, the doping testing area is formed by conducting ion implantation on the substrate, the doping concentration difference exists between the doping testing area and the epitaxial layer, and therefore the testing principle of a Fourier transform infrared spectrometer (FTIR) is met. According to the method, the thickness of the epitaxial layer can be accurately monitored in real time without damaging the wafer, and the stability of semiconductor production and manufacturing is greatly improved.

The utility model relates to a mask tension test device which comprises a base, one side of the top of the base is fixedly connected with a vertical plate, one side of the top of the vertical plate is fixedly connected with a first electric telescopic rod, the tail end of the first electric telescopic rod is fixedly connected with a mounting plate, and the top of the mounting plate is fixedly connected with a second electric telescopic rod. The end of the second electric telescopic rod is fixedly connected with a metal plate, the bottom of the metal plate is fixedly connected with a stamping head, and one side of the top of the metal plate is fixedly connected with a heating box. Meanwhile, the clamping frame can clamp different positions of the mask, the tensile property of the mask can be more comprehensively tested, hot air can be continuously blown to a test area by arranging the heating box and the air supply pipeline, and the tensile property of the mask at different temperatures can be conveniently tested.

The invention relates to the technical field of friction coefficient measuring devices, and discloses a device for testing the friction coefficient of an anti-skid coating of a cultivation work ship deck. Comprising a testing platform, a friction coefficient testing mechanism arranged below the testing platform, a driving mechanism arranged on the testing platform and used for driving the friction coefficient testing mechanism to horizontally move, and a partition assembly and a water spraying assembly arranged in the middle of the lower surface of the testing platform; through the arrangement of the high-pressure nozzles, in the moving process of the testing platform, high-pressure gas can automatically clean a deck testing area through the high-pressure nozzles, dust attached to the surface of a deck is effectively removed, manual pre-cleaning is not needed, the testing efficiency is remarkably improved, meanwhile, seawater is sprayed to the designated testing area through the water spraying assembly, and the testing efficiency is improved. The environment of the residual seawater on the deck in the actual operation of the cultivation work ship is accurately simulated, and the technical problems that an existing portable sliding friction instrument needs to be manually cleaned and cannot simulate the residual seawater environment are solved.

The utility model discloses an assembling structure of a concrete resiliometer, which belongs to the technical field of concrete strength testing and comprises a base, universal wheels are fixedly assembled at four corners of the bottom of the base, a lifting mechanism is fixedly assembled at the top of the base, and an assembling frame is fixedly assembled at the top of the lifting mechanism. Through a semi-automatic testing method, the operation process of the concrete resiliometer can be standardized and simplified, and only the base needs to be controlled to move in a short distance in the testing process; and then the lifting mechanism is controlled to drive the assembling frame to adjust the height position, so that the rebound instrument can be aligned to the corresponding testing point position in the testing area, the overall strength of manual operation is reduced, and the situation that the reading is inaccurate due to the fact that manual fatigue operation is conducted on too many testing point positions is avoided.

The invention discloses a phase stirring reverberation chamber, a testing device and a testing method. The phased-array antenna is placed in the reverberation chamber cavity, the to-be-tested device is placed in the testing area in the reverberation chamber cavity, the phased-array antenna is used for carrying out beam scanning to change the state in the reverberation chamber, a field with uniform statistics is formed in the testing area, and the effect of a mechanical stirring device can be achieved in the reverberation chamber; the method which is high in operability and low in cost is provided for electromagnetic compatibility simulation and testing in the reverberation chamber. The testing process does not need a mechanical stirrer, so that the volume of the reverberation chamber cavity can be reduced and the volume of the testing area can be increased. And meanwhile, the device has the characteristics of high speed and easiness in operation, and can be widely applied to the condition of carrying out EMC test on a conventional reverberation chamber.

The invention discloses a rapid aging test device and evaluation method for an LED advertising lamp box, and relates to the field of aging test devices.The rapid aging test device comprises an end base and a supporting table, a lower test area is fixedly arranged on the upper side of the end base, a middle test area is installed on the upper side of the lower test area, and an upper test area is installed on the upper side of the middle test area; a top frame is fixedly mounted at the top of the upper test area, a supporting frame is connected to the bottom of the end seat, a base is fixedly connected to the bottom of the supporting frame, universal wheel mounting hole positions are formed in the bottom of the base, and the base is placed in the aging test room. According to the rapid aging test device for the LED advertising lamp box, the three-dimensional space of a test room is fully utilized through the layered and partitioned design, the containing capacity of a unit area is greatly improved, space waste caused by plane placement is avoided, LED lamp boxes of multiple batches and multiple models can be tested at the same time, and the test efficiency is improved.

Provided herein are systems and methods for collecting biological samples. The sample may be collected using a sample collection device, where the device is configured to prevent oxidation of the sample within the device. The sample collection device may include a component that absorbs oxygen within the device. The sample collection device may be used to preserve the sample for transport. The sample collection device may be used to preserve the sample for later analysis. The sample collection device may include a membrane with one or more test areas for detecting one or more target analytes within the sample.

A manufacturing method includes providing a substrate including a circuit region and a peripheral region, wherein the peripheral region includes a plurality of test areas; performing a via-forming process on the first substrate, wherein the via-forming process includes forming a test cell in each test area; performing a test cell inspection step to the test cells and comparing the inspection result with inspection standard to obtain a comparison result; based on the comparison result, determining whether the parameters of the via-forming process need to be modified, or whether at least a through via or cavity of the substrate is qualified or needs to be reworked, or whether the substrate needs to be scrapped; and when the through via or cavity is determined to be qualified, forming a conductive layer in the through via or disposing an electronic unit in the cavity.

A first polymer layer is formed across a package region and a test region. A first metal pattern is formed in the package region and a first test pattern is simultaneously formed in the test region. The first metal pattern has an upper portion located on the first polymer layer and a lower portion penetrating through the first polymer layer, and the first test pattern is located on the first polymer layer and has a first opening exposing the first polymer layer. A second polymer layer is formed on the first metal pattern in the package region and a second test pattern is simultaneously formed on the first test pattern in the test region. The second polymer layer has a second opening exposing the upper portion of the first metal pattern, and the second test pattern has a third opening greater than the first opening of the first test pattern.

The invention provides an epitaxial process concentration monitoring method, which comprises the following steps of: providing a substrate, and forming an N-type epitaxial layer on the substrate; a deep groove is formed in the epitaxial layer, P columns are formed in the deep groove through epitaxy, and one P-type column and one corresponding adjacent N-type column form a super junction unit; selecting at least one test area on the P column to carry out P-type ion heavy doping injection so as to form a P-type heavy doping area; and forming a metal silicide layer of which the resistance value is not higher than a preset value on the P-type heavily doped region, and performing an electrical test by using the metal silicide layer to obtain a resistance test value of the P column, the resistance test value being used for representing the quantity of charges filled in the deep trench epitaxy so as to monitor the PN charge matching state of the super junction. According to the method, the metal silicide process which is simple in process and short in period is adopted, and the purpose of monitoring the epitaxial process concentration can be achieved quickly.

The invention relates to the technical field of measurement and testing, in particular to a leakage detection method and system for transformer oil tank production, and the method comprises the steps: dividing a to-be-detected oil tank into a plurality of test regions; determining an ideal net pressure attenuation rate by using the average pressure drop rate, the pressure change rate corresponding to the temperature change and the volume change amount of the oil tank cavity in the target time period in the target test area; determining a pressure attenuation deviation degree by using the ideal net pressure attenuation rate and the actually measured net pressure attenuation rate; determining an acoustic activity weight by using the acoustic activity degree of the acoustic signal in the acoustic event and the background noise average energy of the plurality of test areas in the acoustic event; and determining a regional leakage comprehensive index by using the acoustic activity weight and the pressure attenuation deviation degree, and further determining the leakage detection condition of the oil tank by using the regional leakage comprehensive index. According to the technical scheme, the accuracy and reliability of leakage detection are effectively improved, environment temperature interference is effectively eliminated, and background noise changes are dynamically adapted.

The invention belongs to the technical field of road and bridge construction, and particularly discloses a cement lime soil roadbed compactness high-precision nondestructive testing method based on a split type ground penetrating radar. The method comprises the following steps: calibrating dielectric constants epsilon x corresponding to a standard test piece under different compaction degree kx conditions by adopting a small-size test piece differential medium combination dielectric constant transmission wave calibration method in a laboratory, and obtaining a relation fitting formula f (kx, epsilon x) of the limestone soil roadbed compaction degree kx and the dielectric constants epsilon x through data fitting; carrying out calculation processing on field limestone soil roadbed test data based on Hilbert-Huang transform signals, and calculating to obtain a dielectric constant epsilon i under a field working condition; and substituting epsilon i into a fitting formula f (kx, epsilon x), and reversely deducing the field compaction degree ki. Due to the fact that the ground penetrating radar conducts whole-line continuous detection on site, the full-range compactness index of the roadbed in the test area is calculated according to the method, and lossless, rapid and high-precision detection of the compactness index of the cement limestone soil roadbed is achieved.

A use method of the test device for simulating ion erosion of the PCCP protective layer comprises the following steps: S1, region division: selecting a test object, and firstly dividing the test object into four regions, namely a region I, a region II, a region III and a region IV; dividing each subarea into three test areas, namely a test area A, a test area B and a test area C; s2, making a test plan: executing sulfate ion erosion comparison in a partition I, executing chloride ion erosion comparison in a partition II, executing protective measure comparison in a partition III, and executing a mixed comparison test in a partition IV; s3, making a comparison scheme; s4, making a dry-wet cycle scheme; s5, preparing test conditions; s6, liquid filling is executed; s7, executing a dry-wet cycle; s8, judging whether the dry-wet cycle needs to be ended or not: if Seq is equal to L, ending the dry-wet cycle, and continuing S9; otherwise, indicating that all times of dry-wet cycle treatment is not completed, and returning to S6; s9, extracting a sample; and S10, analyzing a result.

The invention discloses a nozzle voltage adjustment method and device based on camera automatic identification printing color blocks and a storage medium, and relates to the technical field of printing device calibration, and the method comprises the steps: controlling a printing device to output a pattern containing each nozzle independent test area and color blocks; acquiring chromaticity distribution data through an image acquisition device, and extracting characteristic parameters such as brightness and saturation; determining a reference characteristic parameter based on a reference selection rule, and calculating a deviation value between each test area and the reference; an adjustment instruction is generated according to the mapping relation between the deviation value and the voltage adjustment amount, verification printing and iterative optimization are carried out after implementation until the precision is met, and through dynamic selection of a reference color block, LAB color space chromatic aberration calculation, voltage sensitivity coefficient matrix mapping and aging compensation, the adjustment precision and efficiency are improved, the dependence on artificial experience is reduced, and the adjustment precision and efficiency are improved. The method is suitable for nozzle calibration of high-precision printing equipment.

The invention provides a method and system for testing the load performance of a pier stud reserved for highway bridge reconstruction and extension, and relates to the technical field of test.The method comprises the steps that a ground foundation testing area is selected, a plurality of first testing points are selected, a testing rod is inserted into the first testing points, the testing rod is knocked, the descending depth of the testing rod is recorded, and a ground foundation performance score is obtained; surrounding the reserved pier column through an annular measuring assembly, starting a vertical laser, keeping the irradiation position of the vertical laser unchanged, lifting the annular measuring assembly, measuring a first distance, and further determining a compressive property score; and determining a load performance score according to the ground basic performance score and the compression resistance score. According to the device and the method, whether the bearing capacity of the pier column is reduced or not in the long-term bridge load bearing process can be judged, whether the pier column can continuously bear the load after reconstruction and extension or not can be judged, in the detection process, the annular measuring assembly is used for measuring the self state of the pier column, and the detection accuracy and convenience are improved.

A semiconductor structure is provided with a test region. In test region, the semiconductor structure includes a semiconductor substrate, a plurality of bit line contact structures arranged on semiconductor substrate and a plurality of wire groups. The semiconductor structure is provided with a plurality of separate active regions extending along a first direction. In first direction, each active region is electrically connected to two bit line contact structures. The plurality of wire groups are arranged along a second direction. Each wire group includes a plurality of wires extending along a third direction. In third direction, each of two bit line contact structures for each active region is connected to respective one of two bit line contact structures for active region adjacent to said each active region by a respective one of wires, so that two wire groups of the wire groups cooperate with each other to form a conductive path.

The invention provides an omni-directional explosive shock wave pressure testing system and method, the testing system comprises a plurality of testing devices, the testing devices are distributed in a to-be-tested area and establish wireless communication with a terminal, the terminal is connected with a display, the testing devices are small in size and simple in structure, and the testing devices are convenient to use. The size, the weight and the cost of the device can be greatly reduced, field installation and operation are facilitated, operation safety is improved through wireless data transmission, a large amount of field wiring is omitted, at most 20 testing devices can be connected through a terminal, manpower and material resources are greatly saved, the networking capacity of the device is improved, simultaneous measurement and data return of multiple devices are ensured, and the testing efficiency is improved. Different distribution can be performed according to different explosive shock wave test ranges, so that a more accurate shock wave pressure distribution diagram can be obtained.

The invention relates to the technical field of probe testing, in particular to a PCB probe positioning method and system and a storage medium, and the method comprises the steps: obtaining a three-dimensional contour of a bonding pad, screening interference nodes, evaluating a contact error in combination with a probe structure, analyzing the density of test points, dividing a compression region, and carrying out the statistics of a space interference probability. And probe positioning and contact verification are completed according to the error and probability sorting path. The method has the beneficial effects that the dot matrix height on the surface of the bonding pad is comprehensively sampled, the space contour of the bonding pad is reconstructed, and the edge point residual error is extracted, so that the identification of the interference node is more accurate. And in combination with CAD boundary identification of a probe end face structure, comparing a node set formed by three-dimensional sampling points of a bonding pad, and establishing a contact area error evaluation mechanism in normal distance standard deviation calculation to realize multi-dimensional contact adaptation judgment. And forming a density evaluation sequence by the ratio of the spatial distribution to the projection area of all point locations in the test area, mining a local abnormal compression state, and completing the calibration of the high-density interference area.