1169 results about "Test region" patented technology

Semiconductor integrated test structures are designed for electron beam inspection of semiconductor wafers. The test structures include pattern features that are formed in designated test regions of the wafer concurrently with pattern features of integrated circuits formed on the wafer. The test structures include conductive structures that are designed to enable differential charging between defective and non-defective features (or defective and non-defection portions of a given feature) to facilitate voltage contrast defect detection of CMOS devices, for example, using a single, low energy electron beam scan, notwithstanding the existence of p/n junctions in the wafer substrate or other elements/features.

A testing system for optical and electrical monitoring of a production quality and/or for determining optical and electrical properties of solar cells, comprising a first conveyor device for conveying the solar cells to a test region, a second conveyor device for moving the solar cells through the test region, a third conveyor device for conveying the solar cells out of the test region, an optical checking device located in the test region for visual checking of the solar, and an electrical checking device also located in the test region for checking electrical functions of the solar cells, the electrical checking device including an illumination device for shining light on light-sensitive surfaces of the solar cells and also including an electrical contacting device for picking up voltages and/or currents and electrical contacts of the solar cells, the first, second and third conveyor devices including a common, linear conveyor belt system which passes through the test region and has a vacuum suction device for holding the solar cells on a surface of a conveyor belt system.

This invention relates to a device for monitoring peccancy cars based on omnibearing vision sensors including a microprocessor, a monitor sensor monitoring road situations and traffic signal lamps, in which, the sensor, an omnibearing vision sensor, is connected with the microprocessor including: an image data read module, an image data file storage module, a sensor rating module, a virtual test line designing module, a designing module for roadway transit directions, a designing module for traffic signal lamp state test regions, an image spread process module, a color space transforming module, an adaptive background deduction process module, a connected region identification module, a moving car tracing module and a car paccancy judgment module with a road paccancy judgment unit for directions and a road paccancy judgment unit without roadway directions.

An optical disk device for estimating optimum recording power for high speed recording at an outer part of an optical disk, with high accuracy, even when an OPC for high speed recording at the outer part cannot be performed. The optical disk device includes a first optimum recording power calculation part for performing test recording at a first speed lower than the maximum recording speed of a test area by using recording parameters of a required recording speed to calculate first optimum recording power, and a second optimum recording power calculation part for performing test recording at a second speed to calculate second optimum recording power. The first speed is different from the second speed. The optical disk device further includes an estimation part for estimating optimum recording power for based on the first optimum recording power and the second optimum recording power.

An apparatus forms a weight for each signal path associated with an antenna of a plurality of antennas around a test zone in an over-the-air chamber by a comparison of a desired target electric field based on a radio channel model and an electric field obtainable by the plane waves associated with the test zone, the plane waves being transmittable by the antennas and being based on at least one basis waveform in each signal path.

A test structure and method for determining DRAM cell leakage. The cell leakage test structure includes a pair of buried strap test structures. Each buried strap test structure includes multiple trench capacitors formed in a silicon body. Each trench capacitor is connected to a trench sidewall diffusion by at least one buried strap. An n-well ring surrounds each buried strap test structure and divides the buried strap test structure into two separate array p-wells, one being a contact area and the other a leakage test area. The contact area includes contacts to the trench capacitor plates for the corresponding buried strap test structure. In one buried strap test structure, a layer of polysilicon, essentially covers the trench capacitors in the leakage test area to block source/drain region formation there. The other of the two buried strap test structures includes polysilicon lines simulating wordlines with source and drain regions form on either side. A buried n-band contacts the n-well rings, essentially forming an isolation tub around each array well. Cell leakage is measured by measuring leakage current in each buried strap test structure, individually, and then extracting individual leakage components from the measured result.

In sophisticated semiconductor devices including copper-based metallization systems, a substantially aluminum-free bump structure in device regions and a substantially aluminum-free wire bond structure in test regions may be formed on the basis of a manufacturing process resulting in identical final dielectric layer stacks in these device areas. Moreover, reliable wire bond connections may be obtained by providing a protection layer, such as an oxide layer, after exposing the respective contact metal, such as copper, nickel and the like, thereby providing highly uniform process conditions during the subsequent wire bonding process. The number of process steps may be reduced by making a decision as to whether a substrate is to become a product substrate or test substrate for estimating the reliability of actual semiconductor devices. For example, nickel contact elements may be formed above copper-based contact areas wherein the nickel may provide a base for wire bonding or forming a bump material thereon.

The invention discloses a paper inspection method and a paper inspection device. The method comprises the steps of obtaining an electronic test paper, wherein the electronic test paper comprises one or a plurality of test regions, each test region corresponds a question and comprises a topic region, an answer region and/or a grading region; determining the position of the answer region and/or the position of the grading region of each test in the electronic test paper; utilizing the answer regions and/or the grading regions as regions to be identified, and identifying the grade of each test from the region to be identified; and summarizing the grades of the topics in the electronic test paper. A mode for automatically inspecting the papers with the test regions and the grading regions on the same page is provided.

A multilayer optical film body includes a first and second packet of microlayers. Each packet partially transmits and partially reflects light over an extended wavelength range, such as the visible region, for normally incident light polarized along a first principal axis of the film body. In combination, the first and second packets have an intermediate reflection and transmission (e.g. 5-95% internal transmission, on average) for the normally incident light, and similar intermediate reflection/transmission (e.g. 10-90% internal transmission, on average) for oblique light. The packets are laminated or otherwise connected so that light can pass through the packets sequentially. In at least a first test area of the film body, a high frequency spectral variability of the combination of packets is less than a high frequency spectral variability of the first packet by itself, and may also be less than a high frequency spectral variability of the second packet by itself.

A method for making an OLED device includes providing a substrate having one or more test regions and one or more device regions, moving the substrate into a least one deposition chamber for deposition of at least one organic layer, and depositing the at least one organic layer through a shadowmask selectively onto the at least one device region and at least one test region on the substrate. The method also includes measuring a property of the at least one organic layer in the at least one test region, and adjusting the deposition process in accordance with the measured property.

The invention discloses a four-point bending elastic parameter measuring method and a four-point bending elastic parameter measuring system, belonging to the field of elastic parameter measurement, and solving the problems in the prior art. The four-point bending elastic parameter measuring method provided by the invention comprises the steps that an ideal uniaxial drawing (or compression) stress state is formed in a testing region by utilizing a four-point bending principle of a rectangular section beam, a determined theory relation exists among the stress value, a sample structure size and an applied load value, the strain value of a measuring point in axial and horizontal mutual orthogonal directions can be obtained by utilizing a strain paster measuring method, and further an elastic modulus and a poisson ratio of the sample can be calculated. The four-point bending elastic parameter measuring system comprises a testing loading device, a load data collecting unit, a strain data collecting unit and a data processing unit. The method provided by the invention has the advantages that the principle is simple, the test precision is high, the application range is wide, the realization is easy, the development cost is low, and the measuring system is miniaturized, desk type and manual operation equipment and has large popularizing capacity.

The invention provides a system for testing camera module stains. The system comprises a camera module and a signal processor connected with the camera module. The signal processor comprises a region division module, a brightness reading module and a calculation determination module. The region division module is used for dividing a picture acquired by the camera module into a plurality of test regions, the brightness reading module is used for reading brightness values of test points of the plurality of the test regions in the picture, the calculation determination module presets a critical contrast ratio for calculating contrast ratios between the test points and peripheral brightness, and the test points are stains if the contrast ratios are smaller than or equal to the preset critical contrast ratio. The invention further provides a method for testing camera module stains. According to the system and the method for testing camera module stains, the pictures acquired by the camera module is subjected to region division by the region division module, and the calculation determination module compares the brightness of the test points of the regions with the peripheral brightness of the test points and determines whether the contrast ratios are smaller than or equal to the preset critical contrast ratio, so that the determination is accurate, and the efficiency is high.

The invention provides an unmanned aerial vehicle airborne LiDAR point cloud filtering method based on adaptive gradient. The method comprises the following steps: obtaining point cloud data in a test region and carrying out filtering on the point cloud data; 2) establishing index for the point cloud data; 3) carrying out calculation and keeping an optimal plane in a grid; 4) selecting an elevation lowest point in a preset window as an initial seed point of a ground point; 5) calculating the distance between the optimal plane and the ground point and gradient from the ground point to the center of the optimal plane, and obtaining a ground point set according to gradient threshold; 6) serving a point in the initial ground point set as a base point, and generating a digital terrain model through an inverse distance weighted interpolation method; and 7) through the newly-generated digital terrain model, obtaining update value of the gradient threshold, repeating the steps 4)-6) and obtaining a final ground point set. The filtering method based on adaptive gradient improves algorithm operation efficiency.

A method of determining a fluid property in a subsurface region of interest of an earth formation uses measurements of seismic attributes on seismic data. For a test region, a plurality of realizations of rock properties are specified, and for each of the realizations and a selected value of a fluid property, the seismic attribute is modeled. This defines a probability density function (PDF). Comparison of the PDF of the model output with the PDF on the measured seismic data is used to determine the likelihood of the selected fluid property.

A zone isolating and testing apparatus comprising an isolation tool and a downhole flow control means and a method of using such apparatus is disclosed. The zone isolating and testing apparatus is particularly useful for testing zones during reverse circulation drilling using concentric drill string such as concentric drill pipe or concentric coiled tubing. The isolation tool of the zone isolating and testing apparatus comprises an expandable packer means and is adapted to connect to concentric drill string near the drilling means. The downhole flow control means of the zone isolating and testing apparatus comprises two valves, one for closing off the annulus between the inner tube and outer tube of the concentric drill string and the other for closing off the inner space of the inner tube. The downhole flow control means is also adapted to connect to concentric drill string near the drilling means. During testing, the isolation tool seals off the annulus between the concentric drill string and the walls of the wellbore and the downhole flow control means seals off either the annulus between the inner tube and outer tube of the concentric drill string or the inner space of the inner tube of the concentric drill string.

Disclosed is a reagent strip comprising test region(s) and reference region(s). The reference region(s) display a predetermined response to a range of possible concentrations of an analyte applied to the corresponding test region(s). Furthermore, the reference region(s) and the test region(s) are arranged on the reagent strip so as to facilitate analysis of a qualitative state of the analyte and optionally, calculation of a quantitative value of the analyte at point-of-collection. Also disclosed is a method of manufacturing such reagent strips, first involving printing the reference region(s) and the test region(s) in a continuous and alternating series on a test strip precursor substrate. The method also involves cutting the test strip precursor substrate perpendicularly to the printed columns to obtain one or more reagent strips. Also disclosed is a method encompassed in a mobile application for determining a qualitative state and optionally calculating a quantitative state of the analyte.

The invention provides a novel mobile phone camera module automatic test machine which comprises a control panel, a test area and a work machine frame, wherein a work table top and a keyboard support are arranged in the middle of the work machine frame. The test area comprises a test position and a test light source located above the test position, the test position is arranged on the work table top, the test position comprises a reset switch, a starting switch, a display signal device, a test main board, a tank chain, a product fixing mechanism, an X-Y horizontal-movement sliding platform, a light barrier, a sliding rail, a sliding sleeve and a limiting sensor, the sliding sleeve can freely slide on the sliding rail front and back, the X-Y horizontal-movement sliding platform is fixed on the sliding sleeve, and the test main board is fixed on the X-Y horizontal-movement sliding platform. Automatic test of a mobile phone camera module, comprising MTF test, stain test, damaged point test, noisy point test, VCM curve test, color uniformity and luminance uniformity test, and the like is ahieved through the novel mobile phone camera module automatic test machine. The novel mobile phone camera module automatic test machine is high in test efficiency, and suitable for modules of different pixel levels.

The invention provides a quality detection method of boring on a printed circuit board, which comprises the following steps: 1) setting one or more test areas at edge area of a workpiece, arranging a test hole pattern in the test area; 2) positioning the workpiece, boring according to the test hole pattern to form a test hole; and 3) detecting the quality of the formed test hole, and boring the pattern aperture on an effective area of the workpiece when the detected test hole is qualified,. The boring quality detection method can effectively reduce the boring disability rate of the workpiece, product processing yield rate during a boring technology can be increased, and the production cost is reduced.

A method for identifying objects in an electronic image is provided. The method includes the steps of providing an electronic source image and processing the electronic source image to identify edge pixels. The method further includes the steps of providing an electronic representation of the edge pixels and processing the electronic representation of the edge pixels to identify valid edge center pixels. The method still further includes the step of proving an electronic representation of the valid edge center pixels. Each valid edge center pixel represents the approximate center of a horizontal edge segment of a target width. The horizontal edge segment is made up of essentially contiguous edge pixels. The method also includes the steps of determining symmetry values of test regions associated with valid edge center pixels, and classifying the test regions based on factors including symmetry.

Small anechoic chambers for evaluating a wireless device under test (DUT) are characterized by a set of antennas to which a test signal is applied and for which excitation coefficients are applied such that the test signal approximates a single plane wave or a preselected superposition of plane waves in the near field of the antennas. The test-equipment antennas in the chamber may be as close as one wavelength from the boundary of a test zone in which the DUT is disposed. Hence, the test zone can be in the near field of the test-equipment antennas and the test zone can be less than a wavelength from the chamber walls. Consequently, it is possible to perform tests in a small anechoic chamber that previously required a large anechoic chamber, e.g., advanced spatial channel-model tests and antenna-pattern measurements.

The present invention discloses a PPG imaging device and a PPG measuring method. The PPG imaging device comprises a light emitting unit, a collimator unit, a beam splitter unit, an image sensing unit, and an image analysis unit. The light emitting unit provides an incident light signal. The collimator unit receives the incident light signal and transforms the incident light signal into a parallel light signal. The beam splitter unit receives the parallel light signal and reflects it to a tested region. The image sensing unit receives a reflected light signal reflected from the tested region and converts it into image signals. The image analysis unit connects with the image sensing unit and analyzes the image signals to obtain PPG signals of the tested region. The PPG imaging device may be arranged in an anti-light pollution unit, whereby to prevent from optical interference and obtain higher measurement precision.