Paper inspection method and device

A technology of electronic test papers and relative positional relationships, applied in the field of data processing, can solve problems such as increasing the error rate of answering questions

Inactive Publication Date: 2013-09-18
IEFREE BEIJING TECH
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  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

The above-mentioned test paper mode with separate test papers and answer papers makes it difficult for candidates to intuitively see the surface of each test question when filling in the answers to the test questions, which increases the error rate of answering questions
[0004] The inventor found that the reason for the above-mentioned problems is mai

Method used

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Embodiment Construction

[0039] Hereinafter, the present invention will be described in detail with reference to the drawings and examples. It should be noted that, in the case of no conflict, the embodiments in the present application and the features in the embodiments can be combined with each other.

[0040] This embodiment provides a marking system, including figure 1 The scanner and the server shown, wherein, the scanner is used to scan test papers into electronic test papers; the server connected to the scanner, the server includes: memory, used to store electronic test papers; processor, connected to the memory, used to identify Scoring for items in the electronic test paper. Preferably, the above-mentioned score can be a positive score or a negative score, that is, the score on the test paper can be the final score (positive score) of the question or the deducted score (negative score) of the question. ), so the above score is just an expression. According to different scoring methods of di...

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PUM

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Abstract

The invention discloses a paper inspection method and a paper inspection device. The method comprises the steps of obtaining an electronic test paper, wherein the electronic test paper comprises one or a plurality of test regions, each test region corresponds a question and comprises a topic region, an answer region and/or a grading region; determining the position of the answer region and/or the position of the grading region of each test in the electronic test paper; utilizing the answer regions and/or the grading regions as regions to be identified, and identifying the grade of each test from the region to be identified; and summarizing the grades of the topics in the electronic test paper. A mode for automatically inspecting the papers with the test regions and the grading regions on the same page is provided.

Description

technical field [0001] The present invention relates to the technical field of data processing, in particular to a method and device for marking examination papers. Background technique [0002] With the advent of the electronic age, in order to improve the efficiency of marking, the application of machine marking is becoming more and more extensive. Existing computer marking methods generally use the method of separating the answer sheet and the test paper, that is, the examinee fills in the answers to the test questions on an answer sheet that is independent of the test questions, and grades based on this answer sheet when scoring. This approach is to facilitate machine marking. [0003] This method makes it impossible for candidates to directly select the answer at the end of each question in the traditional way when answering questions. When answering questions, candidates need to answer on the test questions first, and then fill in the answers on the answer sheet. It ...

Claims

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Application Information

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IPC IPC(8): G06F19/00G06K9/20
Inventor 王勇
Owner IEFREE BEIJING TECH
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