Apparatus for the automated testing and validation of electronic components

一种自动测试装置、电子元件的技术，应用在自动测试和验证电子元件的装置,基于MEMS系统接口模块的装置领域，能够解决破坏定时测量精度和测试结果、降低信号完整性等问题

Inactive Publication Date: 2013-12-25
UNIVERSITY OF WINDSOR
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

In addition, AC resistance becomes significant due to skin effect and electromagnetic coupling caused by radiation, degrading signal integrity
These undesired effects ultimately corrupt timing measurement accuracy and test results

Method used

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  • Apparatus for the automated testing and validation of electronic components
  • Apparatus for the automated testing and validation of electronic components
  • Apparatus for the automated testing and validation of electronic components

Examples

Experimental program
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Embodiment Construction

[0031] refer to figure 1 , which shows an automatic test equipment 10 unit for the automated testing and verification of electronic components 12 ( figure 2 ), preferably simultaneously testing a plurality of components 12 fixed to the test mold 16 before the component 12 is assembled as part of a circuit board and / or the like. The automatic test apparatus 10 as will be described is provided with a large interactive system configured to enable simultaneous high-speed testing of many different types of electronic components 12 including, by way of non-limiting example, switches, chips, resistors, diodes, etc., There is no need for significant specific customization of the mobile device and / or reconfiguration for each different mold or unit under test 16 .

[0032] exist figure 1 As shown in the large-scale interactive system 20 , the automatic test device 10 includes a main processor 22 , robotic manipulation components 26 , a test protocol controller 28 , and an interactive...

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PUM

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Abstract

An automatic test equipment (ATE) unit, which incorporates a mass interconnect system. The mass interconnect system is provided with a universal mounting table for use with receiver and test interface modules for electronically mounting and testing a variety of different types of electronic components or unit under test thereon. The mounting table test interface module incorporates MEMS based spring contacts to provide high-speed micro test-channels in order to establish signal connectivity between the components or unit under test and the tester, and which maintain the signal integrity up to 50 GHz without significant signal loss distortion.

Description

[0001] related application [0002] This application claims the benefit of US Provisional Application No. 61 / 457,404, filed March 21, 2011, entitled Interface Module for MEMS-Based Devices, under Section 119(e) of the US Patent Act. technical field [0003] The present invention provides an apparatus for automatic testing and verification of electronic components. More specifically, the present invention relates to a device comprising an interface module for a MEMS-based system, and in particular a high-speed test interface panel for testing electronic components such as chips, resistors and / or diodes used in electronic circuits or module. Background technique [0004] Almost 100% of all electronic components today are tested before being assembled on a circuit board. Such testing is highly desirable when processing circuit board assemblies at up to 80,000 components per minute per assembly line. If a single component fails, it is often more cost-effective to scrap the en...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/28G01R1/073
CPCG01R1/06716G01R31/2822G01R31/2889G01R1/073G01R31/28G01R1/0408
Inventor 拉希德·拉希德扎德纳比·坎达拉夫特马吉德·艾哈迈迪
Owner UNIVERSITY OF WINDSOR
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