Test system and test method

A test system and test method technology, applied in the field of radio frequency identification, to achieve the effect of accurate test results

Active Publication Date: 2011-11-09
SEMICON MFG INT (SHANGHAI) CORP +1
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0009] The problem to be solved by the present invention is to provide a test system and a test method to avoid the problems of cumbersome operation and inaccurate chip test in the prior art when selecting antennas for impedance matching

Method used

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Embodiment Construction

[0025] In the RF test for RFID tag chips, impedance matching is one of the important factors that determine the accuracy of the frequency response test of the chip under test. If the impedance does not match, the accuracy of the test will be greatly reduced. However, in the prior art, there is no good tuning technology for impedance matching, and the test accuracy obtained is not good.

[0026] In view of this, the present invention provides a kind of test system, including the test fixture with the chip to be tested; Comprising the test device of radio frequency signal source, receiving unit and processing and display unit, described radio frequency signal source has output radio frequency signal to described test At least one radio frequency test port of the chip under test of the fixture; the receiving unit is used to at least receive the reflected signal and the transmission signal of the radio frequency signal passing through the chip under test; the processing and display...

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Abstract

The invention provides a test system and a test method. The testing system comprises a test fixture, a test device and a differential tunable matching network, wherein the test fixture is provided with a bearing structure for loading a chip to be tested and a test port electrically connected to the chip to be tested; the test device comprises a radio frequency signal source, a receiving unit and a processing and display unit; the radio frequency signal source is provided with at least one radio frequency test port; the receiving unit is used for at least receiving a reflected signal and a transmitted signal which are generated after a radio frequency signal passes through the chip to be tested; the processing and display unit is used for processing the received radio frequency signal and displaying the processed signal; and the differential tunable matching network is provided with an input port and a differential output port and is used for tuning the impedance of a load end including the chip to be tested to make the impedance of the load end matched with the internal resistance of the test device and providing the test device to measure the characteristic of the chip to be detected in the test fixture. Compared with the prior art, the invention has the advantages that: the differential tunable matching network is provided for realizing impedance matching, the test system and the test method are easy and convenient to operate, and a more accurate test result can be acquired.

Description

technical field [0001] The invention relates to the technical field of radio frequency identification, in particular to a test system and a test method of a radio frequency identification tag chip. Background technique [0002] In recent years, radio frequency identification (Radio Frequency Identification; hereinafter referred to as RFID) has become a hot spot in the IT field, and many countries are sparing no effort to promote this technology. [0003] RFID is a non-contact automatic identification technology implemented by radio frequency communication, which automatically identifies target objects and obtains relevant data through radio frequency signals. Combining RFID technology with Internet, communication and other technologies can realize item tracking and information sharing on a global scale, so it can be widely used in many fields such as logistics management, identification, item anti-counterfeiting, public transportation, and small-amount electronic payment. M...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/28G01R27/02G01R23/02G01R27/28G01R27/06G01R25/00
Inventor 吴庆阳李广波李晓阳刘凌
Owner SEMICON MFG INT (SHANGHAI) CORP
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