The invention discloses a method for measuring the number of
layers of a two-dimensional material by utilizing Goos-Haenchen displacement, which comprises the following steps: establishing a Goos-Haenchen displacement theoretical
database when a horizontal polarized
light beam is reflected on the surfaces of the two-dimensional materials with different
layers at different incident angles according to a theoretical relation model of the two-dimensional materials with different
layers and the Goos-Haenchen displacement; enabling the horizontal polarization incident
light beam to be incident to the surface of the measured two-dimensional material at a certain incident angle; measuring Goos-Hanchen shift generated by the reflected
light beam under the condition; sequentially changing the incident angles to obtain a group of Goos-Hanchen shift measurement data under different incident angles; and comparing and analyzing the measured data with theoretical data in a Goos-Hanchen shift theory
database to obtain the number of layers of the measured two-dimensional material. Compared with a traditional two-dimensional material layer number measuring method, such as a Raman spectrum method, an
atomic force microscopy method and a transmission
electron microscope method, the method is easy to operate and high in measuring efficiency, does not damage a sample and has a good application prospect.