10 results about "Manufacturing testing" patented technology

Disclosed is a method of manufacturing a test probe. The method includes: forming a terminal body portion by stacking a lower dry film on a substrate and filling a predetermined material into a molding groove of the lower dry film; forming a tip portion by stacking an upper dry film on the lower dry film and filling a predetermined material in a molding groove of the upper dry film; forming at least one tip by machining an upper portion of the tip portion; and removing the upper dry film and the lower dry film from the tip portion formed with the tip and the terminal body portion.

Disclosed is a method of manufacturing a test probe. The method includes: forming a terminal body portion by stacking a lower dry film on a substrate and filling a predetermined material into a molding groove of the lower dry film; forming a lower tip portion by stacking an intermediate dry film on the lower dry film and filling a predetermined material in a molding groove of the intermediate dry film; and forming an upper tip portion by stacking an upper dry film on a top of the intermediate dry film, forming a molding groove of the upper dry film, which is narrower than the molding groove of the intermediate dry film in a direction transverse to a stacking direction, and filling a predetermined material in the molding groove of the upper dry film.

Systems and methods are presented for optical proximity correction (OPC)-based generation of test patterns. A method may include accessing an input test pattern and generating an intermediate OPC test pattern set for the input test pattern, which may include performing an OPC process on the input test pattern. The OPC process may include multiple iterations, the generated intermediate OPC test pattern set may include multiple intermediate OPC test patterns, and each given intermediate OPC test pattern in the intermediate OPC test pattern set may be an output of performance of a given iteration of the OPC process. The method may also include determining one or more selected intermediate OPC test patterns from the intermediate OPC test pattern set to include in a test mask to fabricate a test circuit and obtain measurement values through which to calibrate an OPC resist model.

The invention discloses a PCB test needle point alignment method and system based on visual identification, and relates to the technical field of electronic manufacturing testing, and the method comprises the steps: firstly, determining a preset path of image collection, then calibrating a visual detection part and a conversion matrix through a calibration board, and introducing a deep learning model; feeding conveying parameters are adjusted according to the actual size of the PCB, and whether the PCB is located in a preset detection area or not is judged after feeding; image acquisition and image processing are carried out according to a preset path, a PAD point is detected based on a deep learning model, and a machine vision algorithm is used to find the circle center of the PAD point and the position of a test needle point; and according to the preset fault-tolerant threshold value, the alignment result of the test pin point is automatically judged, alarm and / or recording are / is controlled, and the scheme realizes intelligent and quantitative alignment quality judgment of the test pin point on the PCB bare board.

The disclosure relates to a method of fabricating a test socket including forming a plate-shaped first coupling block by joining a first base member made of a conductive material and a first insulating member made of an insulating material; forming a plate-shaped second coupling block by joining a second base member made of the conductive material and a second insulating member made of the insulating material; forming a first barrel accommodating hole for accommodating a part of the probe and a first support hole for supporting one end portion of the probe in the first coupling block; forming a second barrel accommodating hole for accommodating the rest of the probe and a first support hole for supporting the other end portion of the probe in the second coupling block; inserting one end of the probe into the first barrel accommodating hole to be supported on the first support hole, and inserting the other end of the probe into the second barrel accommodating hole to be supported on the second support hole; and joining the first coupling block and the second coupling block.

The utility model discloses an AOI (automatic optical inspection) equipment universal carrier for PCBA (printed circuit board assembly) product detection, relates to the technical field of electronic manufacturing PCBA testing devices, and aims to solve the technical problem that connectors, crimping parts and board edges cannot be fixed due to the fact that the connectors, the crimping parts and the board edges are flush or extend out of the board edges during PCBA detection. Comprising at least three movable supports and a plurality of movable supporting ejector pins, each movable support can move in the X-axis direction, and at least one movable supporting ejector pin is arranged in the Y-axis direction of each movable support in a sliding mode. According to the AOI equipment general carrier for PCBA product detection provided by the embodiment of the utility model, when the PCBA is detected by the AOI equipment, the carrier can flexibly move supporting points of each part and support at the bottom of a PCBA mechanism hole, so that the problem that a connector, a crimping part and a board edge are flush or extend out of the board edge and cannot be fixed during PCBA detection in the prior art is solved, the PCBA can pass an AOI test, and the detection efficiency is improved. PCBA fixation can be carried out on products with process edges and products without process edges, and AOI equipment detection of PCBA can be realized.

An inspection system may receive first measurement data of training samples after a first process step using an online measurement subsystem, wherein the first process step is prior to manufacturing test features on the one or more training samples; and receiving second measurement data of the test feature after a second process step, wherein the second process step is after manufacturing the test feature. An inspection system may determine a difference metric associated with the first and second measurement data of the test feature. An inspection system may generate a measurement model for determining a metrological measurement of the test feature based on at least one of the second measurement data or the delta metric. An inspection system may determine a value of the metrology measurement for an additional instance of the test feature based on at least one of the second measurement data or the delta metric.

An inspection system may receive first measurement data of training samples after a first process step with an in-line measurement sub-system, where the first process step is prior to fabrication of a test feature on the one or more training samples; and receive second measurement data of the test feature after a second process step, where the second process step is after fabrication of the test feature. An inspection system may determine delta metrics associated with the first and second measurement data for the test feature. An inspection system may generate a measurement model for determining metrology measurements of the test feature based on at least one of the second measurement data or the delta metrics. An inspection system may determine values of the metrology measurements for additional instances of the test feature based on at least one of the second measurement data or the delta metrics.

The disclosure relates to a method of fabricating a test socket that supports a probe stretchable in a longitudinal direction. The method of fabricating a test socket includes forming a probe hole for accommodating the probe in a base member made of a conductive material, filling the probe hole with a resin as an insulating material to a predetermined depth from an upper surface of the base member to form a probe support member; and forming a first support hole for supporting one end portion of the probe in the probe support member in the probe hole to expose the one end portion of the probe.

The utility model relates to a test fixture which comprises a base and a test piece 5, the base is used for fixing a to-be-tested product, the test piece is provided with a sampling part capable of rotating relative to the base, the sampling part is provided with a switching point, and the switching point can make contact with a test point on the to-be-tested product on the base when the sampling part rotates so as to test the to-be-tested product; according to the test fixture, the to-be-tested product is fixed through the base, and the test is carried out in a mode that the sampling points on the sampling part are in direct contact with the test points of the to-be-tested product on the base; therefore, an unnecessary signal switching part generated during signal connection of the to-be-tested product can be transferred to the to-be-tested product, so that redundant switching during signal connection of the to-be-tested product and the test fixture is reduced, and parts required for manufacturing the test fixture are greatly reduced; therefore, the purpose of simplifying the test steps and the structure of the whole test fixture is achieved, and the manufacturing cost of the test fixture is reduced.