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53results about How to "Need long operating lifetimes" patented technology

Intracavity OPO laser

A laser having an optical parametric oscillator for providing a preselected wavelength beam is provided. A nonlinear crystal cut for phase matching condition preferably cut for noncritical phase matching conditions for the fundamental beam wavelength and the preselected wavelength beam is located in both the optical parametric oscillator cavity and laser resonator cavity.
The optical axis of the laser resonator and the optical axis of the optical parametric oscillator cavity are at least partially separate and partially overlap. The laser crystal is located in the laser resonator cavity but not in the optical parametric oscillator cavity. Each end of the OPO nonlinear crystal that intersects the optical axes has a Brewster cut for both the fundamental and preselected wavelength beams so that the fundamental and preselected wavelength beams incident on the nonlinear crystal at approximately the Brewster angle and pass through without substantial reflection loss.
The fundamental wavelength beam is directed into the optical parametric oscillator cavity and incidents on nonlinear crystal having a Brewster cut at each end for fundamental and preselected wavelength beam without substantial reflection loss. A portion of the fundamental wavelength beam is partially converted to a preselected wavelength beam. The fundamental beam and the preselected wavelength beams are reflected back through the nonlinear crystal. Preselected wavelength beam is separated from the fundamental wavelength beam.
Owner:PHOTONICS INDS INT

Gamma radiation imaging system for non-destructive inspection of the luggage

Gamma radiation imaging system for non-destructive inspection of the luggage contains a DR sub-system, which obtains the projected image of the luggage by translationally scanning, and a CT sub-system, which obtains the tornograph image of the luggage by rotating scanning. Said DR sub-system includes a fixed gantry, a conveyor system, a radiation source mounted on the fixed gantry, front and back collimators, and the array detector. Said CT sub-system includes a rotating gantry, a conveyor system, a radiation source mounted on the rotating gantry, front and back collimators, and the array detector, wherein, the radiation source in said CT sub-system is 192Ir or 75Se radioactive isotope gamma source with high specific activity. Said gamma source is enclosed in a shield chamber with a projecting opening. The shield chamber is mounted on said rotating gantry. Said array detector is adapted for detecting gamma ray of 192Ir or 75Se radioactive isotope; The radiation source in said DR sub-system is 192Ir or 75Se radioactive isotope gamma source with high specific activity, said gamma source is enclosed in a shield chamber with a projecting opening. The shield chamber is mounted on said fixed gantry. Said array detector is adapted for detecting gamma ray of 192Ir or 75Se radioactive isotope.
Owner:TSINGHUA UNIV

Online energy dispersive X-ray diffraction analyser

An on-line EDXRD analyser including (i) a housing defining an analysis zone and having a passageway through it to allow transport of material in a process stream to pass through the analysis zone, (ii) a collimated source of polychromatic X-rays, (iii) an energy-resolving (ER)X-ray detector, (iv) a primary beam collimator disposed between the source of X-rays and the (ER)X-ray detector comprising an annular slit which defines an incident beam of polychromatic X-rays to irradiate a portion of the analysis zone, (v) a scatter collimator disposed between the primary beam collimator and the ERX-ray detector, the scatter collimator comprising an annular slit which defines a diffracted beam of X-rays scattered by the material to converge towards the ERX-ray detector, and (vi) a detector collimator comprising a conical opening which further defines the diffracted beam of X-rays scattered by the material. The ERX-ray detector measures an energy spectrum of the diffracted X-rays at a predetermined diffraction angle defined by the relative positioning of (ii) to (vi), and where one of (iv) and (v) comprises an aperture arranged to enable a detector to measure the transmission of a direct beam of X-rays through the material.
Owner:COMMONWEALTH SCI & IND RES ORG
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