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3 results about "Material scattering" patented technology

Material scattering of an electromagnetic wave is scattering that is attributable to the intrinsic properties of the material through which the wave is propagating. Ionospheric scattering and Rayleigh scattering are examples of material scattering. In an optical fiber, material scattering is caused by micro-inhomogeneities in the refractive indices of the materials used to fabricate the fiber, including the dopants used to modify the refractive index profile. This article incorporates public domain material from the General Services Administration document "Federal Standard 1037C".

A high-precision track reconstruction method for a GeV-level proton beam telescope

PendingCN122362469AState predictionMaterial scattering
This invention discloses a high-precision track reconstruction method for GeV-level proton beam telescopes, comprising: setting a high-current mode to collect hit clusters of multi-particle events within a single time window; employing a layer-by-layer state prediction intelligent search algorithm based on a multiple Coulomb scattering model, starting from the first detector layer, combining initial angular dispersion and material scattering to calculate the total angular dispersion standard deviation, and determining circular candidate search regions layer by layer; performing track connection, branching, or pruning based on cluster matching within the region; updating the track direction using the connection direction of matched clusters, and superimposing the scattering angle standard deviation of the next layer of material, iteratively predicting subsequent search regions until all detector layers are traversed, outputting a high-quality candidate track set. This invention can achieve stable and efficient track reconstruction under the conditions of GeV-level proton beams with significant scattering and accumulation, providing a reliable data foundation for high-precision detector calibration.
Owner:CHINA SPALLATION NEUTRON SOURCE SCI CENT +2

Method and system for determining key dimension of low-dimensional materials by optical scattering

PendingUS20250369860A1Using optical meansIndividual particle analysisMaterial scatteringLightness
The present invention discloses a method and system for determining a key dimension of a low-dimensional material by optical scattering. The method includes: controlling a light source to be obliquely incident onto a low-dimensional material to be observed and a substrate at a set angle, wherein the set angle is able to enable a light receiving device located above or below the low-dimensional material to only receive light scattered by the low-dimensional material; converting the received scattered light into an optical image; obtaining a brightness value of each pixel in the optical image, and establishing a correspondence relationship between a position and brightness; calculating a contrast based on the correspondence relationship between the position and the brightness, and determining the key dimension of the low-dimensional material based on a pre-calibrated correspondence relationship between the contrast and the key dimension of the low-dimensional material.
Owner:SHANDONG UNIV

Curved chute blanking trajectory control method and device and storage medium

PendingCN122646546APoint cloudMaterial scattering
The application discloses a curved chute material falling trajectory control method and device and a storage medium, and relates to the field of conveying automation. Three-dimensional point cloud data of a material surface on a lower conveying belt is obtained through laser radar scanning; filtering and interpolation fitting are performed to obtain a continuous and smooth material cross-section profile curve; each frame of material cross-section profile curve is combined with a belt reference height curve obtained through calibration in the empty state, three-dimensional cross-section characteristics of a real-time material flow are solved, and a horizontal gravity center offset of the material relative to the gravity center of the center of the lower conveying belt is calculated; when the gravity center offset exceeds a preset allowable threshold, a turning plate control instruction is generated, an independently driven electric turning plate is controlled to act in cooperation until the gravity center offset corresponding to the material flow state returns to within the allowable threshold. The scheme can realize real-time sensing of the curved chute material falling state, accurate calculation of the horizontal gravity center offset of the material, automatic driving of an actuator for dynamic closed-loop correction, and effective prevention of material scattering and equipment failure caused by improper material falling.
Owner:WUXI BOTON IOT TECH CO LTD