The utility model provides an automatic
optical film thickness scanning surveying instrument, and belongs to the technical field of optical spectrum instruments. The automatic
optical film thickness scanning surveying instrument comprises a shell; the
test platform is arranged above the shell, and the
test platform is used for placing an object to be tested; the horizontal slide rail
assembly is arranged in the shell and is used for driving the
test platform to move horizontally; the supporting rod is arranged on the shell, a longitudinal sliding rail
assembly is arranged on the supporting rod, a collimating lens
barrel is arranged on the longitudinal sliding rail
assembly, an
optical fiber is installed in the collimating lens
barrel, and the longitudinal sliding rail assembly is used for driving the collimating lens
barrel to move longitudinally; wherein the horizontal slide rail assembly and the longitudinal slide rail assembly are used for adjusting the relative position between the test platform and the collimating lens barrel, so as to adjust the placing space of an object to be tested. According to the automatic
optical film thickness scanning surveying instrument, the height of the collimating lens cone is adjusted according to the size of an object to be measured, and the optical film thickness scanning surveying instrument is convenient to use.