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98results about How to "Satisfactory accuracy" patented technology

Camera pose estimation apparatus and method for augmented reality imaging

ActiveUS20100232727A1Satisfactory accuracyFast and efficient implementationImage enhancementImage analysis3d cameraCandidate key
An apparatus for providing an estimate for a 3D camera pose relative to a scene from 2D image data of 2D image frame provided by said camera. A candidate 2D key points detector determines candidate 2D key points from the 2D image frame. A detected 3D observations detector determines detected 3D observations from pre-recorded scene data and the candidate 2D key points. A detected 3D camera pose estimator determines a detected 3D camera pose estimate from the camera data, the detected 3D observations and the candidate 2D key points. A first storage stores the detected 2D candidate key points and the 2D image data, and outputs in response to a 3D camera pose estimate output previous 2D image data and candidate 2D key points related to a previous 3D camera pose estimate output. A second storage stores and outputs a previous 3D camera pose estimate. A tracked 3D observations detector determines tracked 3D observations from the 2D image data, the candidate 2D key points, the camera data, the previous 2D image data and candidate 2D key points, the previous 3D camera pose estimate and 3D scene model data. A pose estimate selector outputs a selected one of the detected camera pose estimate and the previous 3D camera pose estimate. A 3D camera pose estimator computes and outputs the 3D camera pose estimate from the camera data, the detected 3D observations, the tracked 3D observations and the selected 3D camera pose estimate.
Owner:APPLE INC

Layer-thickness detection methods and apparatus for wafers and the like, and polishing apparatus comprising same

Methods and apparatus are disclosed for detecting a thickness of a surficial layer (e.g., metal or insulating layer) on a workpiece (e.g., semiconductor wafer) during a process for planarizing the layer, so as to stop the process when a suitable process endpoint is reached. Layer thickness is detected based on a spectral-characteristic signal of reflected or transmitted signal light, obtained by directing a probe light onto the surface of the workpiece. Example spectral characteristics are local maxima and minima of signal-light waveform, differences or quotients of the same, a dispersion of the signal-light waveform, a component of a Fourier transform of the signal waveform, a cross-correlation function of the signal waveform. Alternatively, the zeroth order of signal light is selected for measurement, or a spatial coherence length of the probe light is compared with the degree of fineness of the pattern on the surface illuminated with the probe light. An optical model can be determined based on the comparison, and at least one of the layer thickness and the process endpoint is detected by comparing the measured signal-light intensity with the calculated theoretical signal light intensity.
Owner:NIKON CORP

Camera pose estimation apparatus and method for augmented reality imaging

ActiveUS8452080B2Satisfactory accuracyFast and efficient implementationImage enhancementImage analysis3d cameraCandidate key
An apparatus for providing an estimate for a 3D camera pose relative to a scene from 2D image data of 2D image frame provided by said camera. A candidate 2D key points detector determines candidate 2D key points from the 2D image frame. A detected 3D observations detector determines detected 3D observations from pre-recorded scene data and the candidate 2D key points. A detected 3D camera pose estimator determines a detected 3D camera pose estimate from the camera data, the detected 3D observations and the candidate 2D key points. A first storage stores the detected 2D candidate key points and the 2D image data, and outputs in response to a 3D camera pose estimate output previous 2D image data and candidate 2D key points related to a previous 3D camera pose estimate output. A second storage stores and outputs a previous 3D camera pose estimate. A tracked 3D observations detector determines tracked 3D observations from the 2D image data, the candidate 2D key points, the camera data, the previous 2D image data and candidate 2D key points, the previous 3D camera pose estimate and 3D scene model data. A pose estimate selector outputs a selected one of the detected camera pose estimate and the previous 3D camera pose estimate. A 3D camera pose estimator computes and outputs the 3D camera pose estimate from the camera data, the detected 3D observations, the tracked 3D observations and the selected 3D camera pose estimate.
Owner:APPLE INC

Composite unit of optical semiconductor device and supporting substrate and method for mounting optical semiconductor device on supporting substrate

Composite units of an optical semiconductor device and a supporting substrate are disclosed, in which the rear surface of the optical semiconductor device is provided with one or more electrode patterns and the top surface of the supporting substrate is provided with one or more electrode patterns. The optical semiconductor device and the supporting substrate are fixed to each other by once melting and solidifying one or more solder bumps which intervene between the one or more electrode patterns provided on the rear surface of the optical semiconductor device and the one or more electrode patterns provided on the top surface of the supporting substrate. A good grade of accuracy in the mutual geometric position of the optical semiconductor device and the supporting substrate is obtained in a horizontal direction due to a phenomenon called "the self alignment results" in this specification, in which a molten metal is inclined to become a ball based on surface tension. Methods for mounting an optical semiconductor device on a supporting substrate with a good grade of accuracy in the mutual geometric position therebetween in the horizontal direction, based on the same technical principle, are also disclosed. To realize the foregoing results, each of the composite units of an optical semiconductor device and supporting substrate in accordance with this invention is given various structures specific to each of them, and each of the methods in accordance with this invention is given various steps or processes specific to each of them.
Owner:NEOPHOTONICS SEMICON GK

Method and device of mobile augmented reality of underground engineering based on mixed registration

The invention relates to a method and a device of mobile augmented reality of an underground engineering based on a mixed registration. The method comprises the following steps of: standardizing the inner parameters of a video camera via two-step calibration method; designing a landmark and regarding the landmark as the initial base point of the coordinates; firstly realizing the augmented reality registration based on the landmark; binding the video camera and the tracking sensor to form a rigid body; reading the landmark based on the photogrammetric technology so as to calculate the offset between the center of the video camera and the rigid body of the tracking sensor; adding virtual information and mixing the information with the environmental scene; rendering and outputting so as to realize the augmented reality; fixing a set relay marker within the functional range of the tracking sensor; calculating out the relative coordinates of the relay marker via marking point identification and photogrammetry; calculating the offset value of the relay marker and the initial base point; and converting the offset value into the coordinate extendable matrix to be loaded to the system so as to realize the extension of the coordinate system. Compared with the prior art, the invention has the advantages of low cost, no simple dependence on the landmark or tracking sensor, no need of a global positioning system (GPS), high speed, convenience, high precision and the like, and creates conditions for enhancing the mobility of the reality technology.
Owner:TONGJI UNIV

Layered film fabrication method, layered film defect detection method, layered film defect detection device, layered film, and image display device

When inspecting a defect of a layered film having a polarizer by using an inspection polarizing filter or an inspection phase difference filter, members to be arranged in the imaging optical path are arranged in an appropriate order. A defect detection method of a layered film (11) having a polarizing plate (1) and an optical compensation layer includes: a step of applying light from a light source arranged at the polarizing plate layer side of the film surface of the layered film (11); a step of imaging a transmitting light image of the layered film (11) by an imaging unit (12) arranged at the optical compensation layer side of the film surface; and a defect detection step for detecting a defect existing on the layered film (11) according to the transmitting light image captured by the imaging unit (12). The imaging unit (12) performs imaging via an inspection polarizing filter (15) arranged on the optical path between the light source (13) and the imaging unit (12) and adjacent to the imaging unit (12); and an inspection phase difference filter (16) arranged on the optical path between the light source (13) and the imaging unit (12) and between the inspection polarizing filter (15) and the layered film (11).
Owner:NITTO DENKO CORP
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