11 results about "Linear stage" patented technology

The present invention relates to a device and a method for large deformation measurement and material property estimation of beam-shaped polymer materials using a stereo camera and, more specifically, to a device and a method for large deformation measurement and material property estimation of beam-shaped polymer materials using a stereo camera, the device comprising: a fixing unit for fixing an end of an object; a linear stage for applying tension to a wire embedded in the object fixed to the fixing unit in a gravity direction; a load cell for measuring the tension applied to the wire; a stereo camera for photographing a deformation curve by deforming the object in accordance with the tension applied to the wire; a data collection unit for collecting tension data measured from the load cell; and a controller for controlling at least one of the linear stage or the stereo camera.

The invention relates to a lifting device for raising and lowering a work platform (2) relative to a base frame (3), comprising a base frame (3), a work platform (2), at least one first stationary linear guide rail (4.1) attached to the base frame (3) at an acute angle, and at least one second stationary linear guide rail (4.2) attached to the base frame (3) at the same acute angle and mirror-symmetrically to the first stationary linear guide rail (4.1), at least one first movable linear guide rail (5.1) connected to the work platform (2) at an opposite acute angle, and at least one second movable linear guide rail (5.2) connected to the work platform (2) at an acute angle and mirror-symmetrically to the first movable linear guide rail (5.1), as well as at least one first sliding block element (6.1) comprising a first sliding block body (6a) which is mounted in a longitudinally adjustable manner on the first stationary linear guide rail (4.1) and a second sliding block body (6b) which is mounted in a longitudinally adjustable manner on the first movable linear guide rail (5.1) and at least a second sliding block element (6.2) comprising a third sliding block body (6c) which is mounted in a longitudinally adjustable manner on the second stationary linear guide rail (4.2) and a fourth sliding block body (6d) which is mounted in a longitudinally adjustable manner on the second movable linear guide rail (5.2).

In some examples, a wafer warpage measurement system includes a measurement unit, the measurement unit including: a wafer support assembly for transmitting rotational motion to a wafer under test supported in the measurement unit; an optical sensor; a calibration standard for calibrating the optical sensor; a linear stage actuator for transmitting a linear motion direction to the optical sensor; a wafer centering sensor for determining the centering of the wafer under test supported in the measurement unit; and a wafer alignment sensor for determining the alignment of the wafer under test supported in the measurement unit.

The application discloses a nonlinear stage equipment speed control method, comprising the following steps: S1, constructing a plurality of groups of equipment control channels, and based on dynamic evaluation of equipment fingerprints and channel capacity, adaptively matching and safely binding each group of equipment control channels with target stage equipment; S2, based on stage plot requirements, configuring corresponding motion parameters for each stage equipment; S3, acquiring current position information of the stage equipment, and combining the motion parameters, real-time planning and generating a feasible and smooth target speed curve; S4, in each control period through a high-precision timer, and according to the target speed curve, calculating motion data information and packaging into motion control instructions, and issuing to the corresponding equipment driver through the equipment control channel, driving the corresponding stage equipment to run; S5, real-time monitoring of the real-time running state of the stage equipment, the dynamic parameters of the S-shaped speed curve and the alarm information, and dynamically adjusting according to the monitoring data.

The utility model discloses a reinforcing steel bar binding equipment, including base plate, linear binding mechanism, stable support mechanism and reinforcing steel bar adding mechanism, linear binding mechanism includes side plate, linear platform, first cylinder, push plate, spool and binding rope, stable support mechanism includes second cylinder, movable plate, drive motor, transmission assembly, bracing frame and guide wheel, the reinforcing steel bar adding mechanism comprises an adding pipe, a supporting pipe, a reinforcing steel bar body and a supporting rod, through the design of a first air cylinder and a push plate, the automatic reinforcing steel bar binding process is achieved, the binding efficiency is improved, linear motion of the push plate and a movable plate is ensured through a guide sleeve and a guide rod, the operation accuracy and the binding quality are improved, and the labor intensity of workers is lowered. And through the design of a second air cylinder, a movable plate, a driving motor and a transmission assembly, stable supporting is provided for the steel bars, and the stability in the binding process is guaranteed.

An interferometer system and method capable of simultaneous refractive index and thermal defocus determination is disclosed. The system incorporates a collimating light that is spatially filtered, and expanded, and passed through a wedged shear plate and focused on a sample of known thickness. The focused light is retroreflected through the focusing optic, and reflected off the shear plate. The retroreflected light is reflected off the wedged shear plate forming two wavefronts. Where the two wavefronts spatially overlap, an observation screen is used to view the interference fringes formed. The focus optic is translated on a linear stage and the interferogram is used to determine the retroreflective condition for both the front and back surfaces of the sample. The system / method may be advantageously applied to a wide variety of optical lens materials, including but not limited to the characterization of infrared (IR) lens materials.

This invention provides a translation and angle adjustment device, comprising a linear stage, a hinge plate, and a load platform. Two linear stages are arranged at intervals along a first direction for linear movement. The hinge plate is fixedly connected to the two linear stages. The load platform is located on top of the hinge plate and is used to support the object being adjusted. The translation and angle adjustment device has a translation state and a rotation state. In the translation state, the two linear stages operate synchronously, causing the load platform to translate linearly. In the rotation state, the two linear stages operate differentially, causing the load platform to rotate. This embodiment of the translation and angle adjustment device, by directly fixing the two linear stages to the hinge plate and placing the load platform on top of the hinge plate, forms an integrated structure, avoiding structural redundancy caused by layered stacking and reducing the overall height and space occupied.

In some examples, a wafer warpage measurement system includes a measurement unit including: a wafer support assembly for transferring rotational motion to a wafer under test supported in the measurement unit; an optical sensor; the calibration standard component is used for calibrating the optical sensor; a linear platform actuator for transmitting a direction of linear motion to the optical sensor; a wafer centering sensor for determining the centering of the wafer to be measured supported in the measuring unit; and a wafer alignment sensor for determining the alignment of the wafer under test supported in the measurement unit.

The stereolithography system includes a light source configured to project an image or a light onto a substrate, a rotating mirror configured to reflect the image or the light at the substrate, an actuator coupled to a linear stage and configured to move or position the linear stage, and a controller coupled to the light source, the rotating mirror and the actuator. The controller is configured to determine a rotation speed of the rotating mirror to transition speed of the linear stage ratio that keeps the image at a fixed position, project the image or the light onto the substrate at the fixed position, and operate the actuator and the rotating mirror based on the rotation speed to transition speed ratio.

The invention provides a self-resetting filler wall frame four-broken-line load-displacement curve prediction model construction method. According to the method, the nonlinear response of the structure is decomposed into four linear stages with obvious physical significance, namely an elastic stage, an elastic-plastic stage, a plastic stage and a recovery stage. The model is based on a mechanical model and a deformation coordination relation of structural key components (prestressed steel bars, energy consumption angle steel and reinforced concrete), and analytical calculation is carried out by establishing a force balance equation of nodes. The provided four-broken-line analytical model can quickly predict the complete nonlinear response of the self-resetting framework without complex iterative calculation or large-scale finite element analysis, the original analysis process of several hours is shortened to the minute level, and the scheme comparison, selection and optimization efficiency in the design stage is greatly improved.