Swing arm type three-dimensional contourgraph

A profiler and swing arm technology, which is applied in the field of swing arm three-dimensional profiler, can solve the problems of measuring two-dimensional profile measurement range, etc.

Inactive Publication Date: 2011-01-05
INST OF OPTICS & ELECTRONICS - CHINESE ACAD OF SCI
View PDF4 Cites 27 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0005] Compared with the prior art, the present invention has the following advantages: the detector of the present invention uses a high-precision air-floating turntable to ensure measurement accuracy, and at the same time adopts the working mode of simultaneous rotation of the workpiece turntable and the cross-arm turntable to solve the problem that the traditional inspect

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Swing arm type three-dimensional contourgraph
  • Swing arm type three-dimensional contourgraph
  • Swing arm type three-dimensional contourgraph

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0023] In order to make the object, technical solution and advantages of the present invention clearer, the present invention will be described in further detail below in conjunction with specific embodiments and with reference to the accompanying drawings.

[0024] The present invention will be described in detail below in conjunction with the accompanying drawings and specific embodiments.

[0025] Such as figure 1 As shown, it is a schematic structural diagram of a swing arm type three-dimensional profiler, including a probe system 1, a cross arm 2, a column 3, a counterweight 4, a measured plane component 5, a workpiece turntable 6 and a cross arm turntable 7. Measuring head system 1, cross arm 2, column 3, counterweight 4, measured planar component 5, workpiece turntable 6 and cross arm turntable 7, one end of column 3 is located in the mounting hole of cross arm turntable 7 and is fixedly connected, and the cross arm The arm 2 is located in the mounting hole at the othe...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

The invention relates to a swing arm type three-dimensional contourgraph which comprises a measuring head system, a transverse arm, an upright post, a counter weight, a measured plane element, a workpiece turntable and a transverse arm turntable, wherein one end part of the upright post is arranged in a mounting hole of the transverse arm turntable and fixedly connected with the transverse arm turntable, and the transverse arm is arranged in another end part mounting hole of the upright post; one end part of the transverse arm is provided with the counter weight, while the other end part of the transverse arm is provided with the measuring head system; the measured plane element is arranged on the workpiece turntable; a detection end of the measuring head system is in contact with the measured plane element; and the transverse arm and the upright post are used for finishing the rotating motion of the measuring head system; and the counter weight is used for balancing the measuring head system and the transverse arm so as to guarantee the transverse arm turntable to maintain stable rotation. The contourgraph can be used for the measurement and the analysis of the three-dimensional surface profile of a heavy-caliber high-precision plane element, wherein measurable parameters comprise three-dimensional morphologies, two-dimensional morphologies, PV (Peak Value), RMS (Root Mean Square) and three-dimensional morphological volumes.

Description

technical field [0001] The invention belongs to the field of precision testing, in particular to a swing-arm type three-dimensional profiler used for three-dimensional surface profile measurement of planar components. Background technique [0002] The three-dimensional surface profile measurement of planar components is an effective means to understand the surface topography of components, the machining accuracy of machine tools and the removal amount of machine tools. The parameters involved include three-dimensional topography, two-dimensional topography, PV, RMS, three-dimensional topography volume, etc. There are two main types of profilers on the market today. One is a two-dimensional profile measuring instrument for large-scale planar components. The measurement range of this instrument can reach hundreds of millimeters, and it can be used to measure the surface profile of some radial surfaces of rotationally symmetrical planar components. The disadvantage of this inst...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
IPC IPC(8): G01B5/20G01B5/28
Inventor 景洪伟吴时彬林昭珩
Owner INST OF OPTICS & ELECTRONICS - CHINESE ACAD OF SCI
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap