The invention relates to a self-adaption
harmonic wave
confocal microscopic measurement method for the illumination of an ellipsoidal reflector, belonging to the non-linear optical measurement. According to the method, an ellipsoidal
reflection illumination system, a
confocal microscopic measurement method, a self-adaption
optical aberration correction method and a
harmonic wave microscopic methodare organically combined, so that the
harmonic wave microscopic measurement resolving power can be improved. A
femtosecond laser pulse is subjected to
beam shaping and scanning
galvanometer reflection, enters the self-adaption
optical aberration correction method and is subjected to
phase modulation and aberration correction to generate illumination beams, and the illumination beams enter an ellipsoidal reflection mirror
system and are assembled into a sample so as to generate stimulation focus light spots required by the generation of harmonic signals. The sample is stimulated by stimulationlight to simultaneously generate second and
third harmonic signal, and the second and
third harmonic signals are collected and analyzed by a double-path composited
confocal microscopic measurement
system on the right side. After being collected by a large-
numerical aperture objective lens, the harmonic signals are separated into two
wavelength signals by a bidirectional color selective mirror, are focused by a
narrow band pass filter and an imaging objective lens, are transmitted through a needle hole and are received by a
photomultiplier (PMT). An adopted harmonic wave collection module adopts a confocal collection mode. By virtue of an
apodization effect of a confocal needle hole, the interference caused by
aliasing signal noise to the analysis of the harmonic signals can be effectivelyinhibited, and the measurement resolving power of the microscopic system can be greatly improved.