The invention discloses a system for automatically testing the parameters of a quartz crystal oscillator, which comprises a master computer and a parameter test card connected with the main board of the master computer, wherein the parameter test card comprises a singlechip and a test circuit and a reference circuit which are connected with the singlechip respectively. The singlechip has a D/A module, an A/D module, a first counter, a second counter and a timer. The test circuit comprises a current amplification circuit, a voltage sampling resistor, a frequency dividing circuit, a first measurement gate control circuit and the crystal oscillator to be measured. The reference circuit comprises a reference frequency source, a frequency multiplication circuit, a second measurement gate control circuit and a frequency dividing and high-frequency signal latch circuit. In the invention, the test card integrates the functions of all apparatuses such as a frequency counter, a digital voltmeter and a digital oscillometer and can be directly inserted in the main board of the computer, and the fully automatic test of various parameters, such as working frequency, working current and start up time, of the quartz crystal oscillator can be realized by a control program.