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14 results about "Goniometer" patented technology
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A goniometer is an instrument that either measures an angle or allows an object to be rotated to a precise angular position. The term goniometry is derived from two Greek words, gōnia, meaning angle, and metron, meaning measure.
A system for automatic sample exchange
The present application relates to the field of optical technology, and provide a kind of automatic replacement sample system.The automatic replacement sample system includes sample positioning device and automatic sample taking and placing device;Wherein, sample positioning device is connected to goniometer head, for fixing the sample to be measured;Automatic sample taking and placing device is electrically connected with sample detection experiment station, for replacing sample signal sent by sample detection experiment station, automatically replacing the sample to be measured on sample positioning device.Through installing sample positioning device on the original sample detection experiment station, and installing automatic sample taking and placing device electrically connected with the detector of sample detection experiment station, automatic sample taking and placing device can automatically replace the sample to be measured on sample positioning device according to the replacement sample signal sent by the detector, so that it avoids experimental personnel to participate in detection all the time in the process of experiment, reduces the number of experimental personnel, and then reduces detection cost, improves experimental efficiency.
Owner:INST OF HIGH ENERGY PHYSICS CHINESE ACAD OF SCI
goniometer
1. Name of the designed product: corner processing machine. 2. Use of the designed product: for processing aluminum alloy doors and windows. 3. Design points of the designed product: in shape. 4. Picture or photo that best shows the design points: perspective view.
Owner:GUANGDONG JINJIU INTELLIGENT EQUIP CO LTD
A sample displacement stage device and system for in-situ diffraction of biomacromolecule crystals
This invention provides a sample displacement stage device and system for in-situ diffraction of biomacromolecule crystals. The sample displacement stage device includes two mutually perpendicular linear motor modules: each linear motor module includes a linear slide rail, a slider, and a control module; the slide rail of one linear motor module is fixed to the slider of the other linear motor module; the slider of one linear motor module is provided with a sample well plate clamp; the slide rail of the other linear motor module is also provided with a goniometer head connecting and fixing component on its side. This application provides a sample displacement stage device and system for clamping and fixing a well plate, which can perform crystal diffraction analysis on the sample on the well plate in situ, greatly reducing the sample damage rate.
Owner:SHANGHAI ADVANCED RES INST CHINESE ACADEMY OF SCI
Motion platform
Owner:BIONANO GENOMICS INC
A method for measuring lattice constants of a close-packed hexagonal system based on spatial plane fitting
The application discloses a method for measuring close-packed hexagonal lattice constant based on space plane fitting, which comprises the following steps: firstly, obtaining the X-ray diffraction spectrum of a close-packed hexagonal crystal and indexing; secondly, converting the crystal plane spacing formula into a three-dimensional space plane equation through mathematical transformation; thirdly, calculating a plurality of groups of data according to the measured diffraction angle and performing space plane fitting to obtain a space plane equation containing an intercept; fourthly, introducing a goniometer zero drift error correction quantity to perform multiple iteration correction on the measured angle until the absolute value of the intercept of the fitting plane tends to be zero, so that the accurate value is obtained; and finally, calculating the high-precision lattice constant. The application converts the complex parameter fitting problem into an intuitive space plane fitting and intercept correction process, has clear principle and strong operability, and effectively improves the measurement precision of the close-packed hexagonal lattice constant.
Owner:NORTHWEST INSTITUTE FOR NONFERROUS METAL RESEARCH
Transmission electron microscope sample positioning limiter
The application discloses a transmission electron microscope sample feeding positioning limiter, which comprises a fixing part used for being fixed with a goniometer, a connecting part rotatably arranged with the fixing part, wherein the connecting part is provided with a first track and a second track, the first track is perpendicular to and communicates with the second track, the first track is in an arc shape, and the second track is in a straight line type; and a limiting part which is movable from the first track to the second track, two ends of the limiting part are respectively arranged outside the tracks, the limiting part is arranged towards the center of the first track, one end of the limiting part towards the center of the first track is provided with a limiting structure used for limiting a positioning pin of a sample rod. The transmission electron microscope internal ball valve damage and the reduction of the mirror tube vacuum degree caused by improper operation are avoided, the sample feeding success rate is improved, the sample rod and the ball valve are protected, and the service life of the equipment is prolonged. Meanwhile, the hand directly contacts the sample rod is avoided through the limiting part operation, and the influence of pollutants on the mirror tube vacuum environment, the sample and the vacuum pump is reduced.
Owner:SUN YAT SEN UNIV
Mechanical goniometer collar with angle lock, with a deterrent system and position sensor to prevent sheep from eating leaves.
Owner:MRS NAZILA FARHANI GHALE JOOGHI
Goniometer (DHK09-P)
Owner:ZHEJIANG CHUANGJIE FURNITURE CO LTD
Sample preparation method for annealed wafer spread resistance detection
ActiveCN117451450BResistance/reactance/impedenceFinal product manufactureGoniometerPhysical chemistry
The application relates to a sample preparation method for annealing wafer extension resistance detection, belonging to the technical field of silicon crystal detection, and comprising the following operation steps: first step: breaking a silicon wafer into two pieces; second step: repeating the first step to break the silicon wafer into a square; third step: after heating a goniometer, taking down the goniometer with a pincer and placing the goniometer on a sample preparation table; fourth step: taking a paraffin stick and uniformly coating the goniometer surface, dissolving the goniometer in hot state, and attaching a silicon wafer sample to the center of the goniometer; fifth step: starting the machine, and adjusting the position of a grinding liquid by using a cotton swab rod; sixth step: setting the grinding rotating speed and grinding time; seventh step: after grinding is completed, cleaning and wiping the silicon wafer sample; eighth step: after heating the cleaned silicon wafer sample, taking down the silicon wafer sample and placing the silicon wafer sample for cooling; ninth step: checking the state of a grinding surface.
Owner:杭州中欣晶圆半导体股份有限公司
Angle measuring instrument
The present invention relates to a goniometer (angle measuring instrument) used to measure the polarization angle that affects the crystal orientation of a metal structure by rotating an inner ring with a scale. "Reference Figure 1 of Usage" shows the device with a fixing device for securing the sample stage attached. "Reference Figure 2 of Usage" shows the device with the sample stage set up. "Reference Figure 3 of Usage" shows the device with the sample mounted on the sample stage. The sample is mounted on the bottom side of the device and observed using an inverted microscope, as shown in "Reference Figure 4 of Usage".
Owner:RESONAC CORP
Wearable tool for estimating the weight of the living human head and skull based on reference biomechanical data
UndeterminedIR114136BHinge jointMri imaging
The wearable device for estimating the weight of the head and skull of a living person based on a load cell, goniometer, and biomechanical model is a wearable device in the form of a cervical collar that is capable of non-invasively estimating the weight of the head and skull of a living and healthy person. Measuring the weight of the skull has many applications in medical sciences and anatomy. However, there are invasive and imaging methods for it. To address this challenge, a new idea has been presented for rapid measurement of head weight in living humans, which includes a shoulder support structure, two load cells mounted on the shoulders, two lever arms that transfer the force of the head weight from the chin rest and the headrest to the load cells, an inertial goniometer module for measuring the flexion and extension angles of the head, and a microcontroller board that is connected to Using a reference biomechanical model and calibration data tables from MRI imaging studies and volume-density analysis, the actual head weight is calculated from the measured forces and head angle and displayed on the display. The lever arms are connected to the headrests via spring-loaded hinge joints to eliminate errors due to initial pressure and anatomical differences.
A three-dimensional precision measurement system in accordance with the Abbe principle
The application discloses a kind of three-dimensional precision measurement systems in accordance with Abbe principle, including three-dimensional macro stage, six degrees of freedom micro stage, laser length measurement angle measurement system, three-dimensional mirror group, low expansion measurement frame, two-dimensional fine adjustment mechanism, trigger probe or cutting tool and connecting mechanism;Laser length measurement angle measurement system realizes six degrees of freedom measurement of object table, three-axis laser interferometer is as x direction, y direction, z direction length reference, ensures that measurement beams are perpendicular to each other and intersect at measurement trigger point by two-dimensional fine adjustment mechanism, locks the relative position of three-axis length reference and trigger point, establishes three-dimensional measurement system, and working mode is object table movement, measurement system is fixed, ensure that any measured point is always located on length reference or extension line during movement process.In the application, angle meter real-time feedback object table angular motion, control micro stage to carry out angular motion error compensation, macro-micro collaborative motion realizes the measurement effect of large stroke and high resolution, and measurement is realized by triggering measured object.
Owner:HEFEI UNIV OF TECH
Multi-channel imaging camera channel alignment accuracy testing device and method
The application discloses a kind of multi-channel imaging camera channel alignment precision testing device and method, solve the technical problems such as high precision requirement of existing test method based on rotary table and collimator, high test cost, low test efficiency.The testing device includes light source, target, collimator, camera support, angle measurement component and acquisition processing module;Light source is installed in the light inlet end of collimator, target is installed between light source and collimator, and is located at the focal plane of collimator;The bottom of collimator is provided with attitude adjusting device;Camera support is used to install the multi-channel imaging camera to be measured;Angle measurement component includes cube mirror and goniometer, and the angle change information of collimator is obtained by cooperation;Acquisition processing module acquires the angle change information obtained by goniometer and the target pattern information obtained by the multi-channel imaging camera to be measured, calculates and outputs the parameter information of the channel alignment precision of the multi-channel imaging camera to be measured.
Owner:XIAN INST OF OPTICS & PRECISION MECHANICS CHINESE ACAD OF SCI