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Method for determining an influencing variable acting on the eccentricity in a goniometer

A technology of angle measurement, action variable, applied in the field of determining the action variable that causes eccentricity in an angle measuring instrument, capable of solving problems such as the influence of electronic components

Active Publication Date: 2009-11-18
LEICA GEOSYSTEMS AG
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0007] However, in addition to the already described mechanically acting variables that have an effect on the measured eccentricity, the electronics used also have an influence

Method used

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  • Method for determining an influencing variable acting on the eccentricity in a goniometer
  • Method for determining an influencing variable acting on the eccentricity in a goniometer
  • Method for determining an influencing variable acting on the eccentricity in a goniometer

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Embodiment Construction

[0036] figure 1 The structural design of such an angle measuring instrument is schematically shown, which comprises a support element 1 with a rotating body 2 and a detector system, wherein the rotating body 2 has a plurality of sensors arranged around the center of the pattern pattern elements, and the detector system includes four optical detection elements 3. The plate-shaped rotary body 2 is arranged to be rotatable about an axis 4 relative to the carrier element 1 .

[0037] In order to determine the current rotational position of the rotating body 2 relative to the carrier element 1 or the detector system, at least some pattern elements are projected onto the detector elements 3 of the detector system. Here, the positions of the pattern elements projected onto the detector system are resolved, and the rotational position and eccentricity of the pattern center with respect to the detector center of the detector system are derived. Depending on the configuration of the d...

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Abstract

The invention relates to a method for determining at least one influencing variable acting on the eccentricity in a goniometer, using a detector arrangement consisting of four optical detector elements (3), and a rotational body comprising a plurality of pattern elements (6) arranged around a pattern centre (MZ), the rotational body being rotatably arranged about an axis (4). According to said method, at least some of the pattern elements (6) are reproduced on the detector arrangement, the positions of the pattern elements (6) reproduced on the detector arrangement are resolved, and the eccentricity of the pattern centre (MZ) in relation to a detector centre (DZ) of the detector arrangement is determined.; A plurality of such eccentricity measurements for different rotational positions enables different influencing variables acting on the current eccentricity to be separated, especially by forming units.

Description

technical field [0001] The invention relates to a method according to the preamble of claim 1 and a computer program product for determining at least one influencing variable in a goniometer which leads to a measured eccentricity. Background technique [0002] For a long time, especially in geodesy and industrial surveying, the rotation angle measuring instrument in the measuring device has been mainly used as the device and method for determining the rotation angle. With corresponding precautions, with these devices and methods it is even possible to decompose a complete circle with an accuracy of the order of a few arc seconds in units of more than a million. [0003] In order to achieve such high precision, on the one hand the position of the detector must be fixed firmly on the bearing through which the rotating body is mounted so that the rotating body can rotate around an axis relative to the detector. On the other hand, high volume stability and shape stability of th...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01D5/244G01D5/347
CPCG01D5/34707G01D5/2449G01D5/24452G01D5/3473G01D5/24466G01D18/001
Inventor 海因茨·利普纳克努特·西尔克斯贝亚特·埃比舍尔
Owner LEICA GEOSYSTEMS AG
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