26 results about "Reflection illumination" patented technology

The invention discloses a fundus imaging system, which includes an optical path folding lens set, a virtual reality display, visible light fixation lamps, an illumination module, an image sensor, and a processor. The virtual reality display and the human eye are located on different sides of the optical path folding lens set. The virtual reality display forms images on the retina of the fundus of the human eye through the optical path folding lens set. The visible light fixation lamps are sequentially turned on to guide the eyeball of the human eye to rotate. When the visible light fixation lamp is turned on, the illumination module emits illumination light through the optical path folding lens set to illuminate the retina. The retina reflects the illumination light to form fundus light. The image sensor receives fundus light through the optical path folding lens set to form a sub-fundus image. The processor stitches all sub-fundus images into a full-fundus image and drives the virtual reality display to display the full fundus image.

A system includes at least a plane semi-reflecting mirror, a light source which is configured to emit a continuous illumination and an event camera to generate events when the object exhibits at least one movement. The plane semi-reflecting mirror is arranged so that it reflects at least the illumination toward the event camera in order to dazzle the camera. The system makes it possible to limit the memory and energy consumption required for monitoring.

An observation apparatus includes: an illumination optical system provided below an installation position of a multi-well plate; a reflector provided above the installation position, the reflector being configured to reflect light emitted from the illumination optical system; and an observation optical system provided below the installation position, the observation optical system being configured to condense the light reflected by the reflector. The reflector is installed such that a marginal ray to enter the observation optical system travels via a peripheral well different from an on-axis well located on an optical axis of the observation optical system before reflection due to the reflector.

This application relates to a method and device for detecting appearance defects using an integrated array optical system, belonging to the field of product appearance defect detection technology. It includes a housing, a lens holder, and a main control module. The lens holder forms a detection chamber, and its inner wall is equipped with multiple arrayed lenses, which, together with a light source cover and a light guide, constitute a uniform reflection illumination system. During detection, the object to be inspected is placed in the detection chamber, and multiple lenses simultaneously acquire multi-angle appearance images of its periphery, bottom, and top. These images are then transmitted to a host computer via the main control module for defect comparison. Through the array lenses and integrated optical design, it can achieve blind-spot-free imaging in a confined space, effectively eliminating specular reflections and shadow interference, and significantly improving the ability to acquire defect features of complex surfaces such as irregular three-dimensional surfaces and inner walls. It also possesses modular customization capabilities, allowing for rapid adaptation to various parts such as lead screws, inverters, and shock absorbers. It offers high detection efficiency and good stability, making it suitable for automated mass production.

A top plate design is described that allows a quick change of the reflector plates, for example, in the top plate assembly.  Using various techniques, the reflector plates or, in some examples, sources of illumination, are held in place by a vacuum during operation.  This technique holds the reflector plates securely without top-side fixturing, maximizing the available active area of a substrate.  A vacuum secures the panel or wafer without contacting the active areas, allowing for non-contact inspection and metrology. The top plate also facilitates the use of interchangeable reflector plates, enabling backlit or reflective illumination of the substrate’s features.

The invention relates to a for controlling a light source, the method using (a) at least one pose estimate of a camera configured to capture one or more images of a scene of interest which comprises at least one landmark, as said light source is operated to emit light which illuminates said scene of interest, (b) a landmark map comprising at least 3D location information of a plurality of landmarks comprising the at least one landmark in the scene of interest, (c) an illumination model describing a relationship between an emission illumination power and a reflection illumination power, wherein said emission illumination power is the power of light emitted by the light source to illuminate said scene of interest, and said reflection illumination power is the illumination power of light reflected by one or more landmarks in said scene of interest and received by the camera, wherein the method comprises the following steps:(1) determining, for at least one of the plurality of landmarks, at least one emission illumination power of light to be emitted by the light source, and an illumination time during which the light source should be operated to emit light which has an emission illumination power which is equal to the at least one emission illumination power, using (i) the at least one pose estimate of the camera, (ii) the 3D location information of the at least one of the plurality of landmarks, (iii) the illumination model; and (2) operating the light source to emit light which has an emission illumination power which is equal to the at least one emission illumination power, for a time period which is equal to the determined illumination time course; and (3) updating the illumination model parameters, wherein the illumination model parameters which are updated comprise reflectivity parameters of at least one landmark.

The application discloses a kind of comprehensive microscopic measurement system and its measurement method of multi-parameter synchronous measurement, solve the measurement mode single of existing microscopic measurement system, cannot realize the demand of in-situ measurement multiple optical parameters problem, specifically including objective table, transmission illumination module, imaging module and reflection illumination module;Objective table is used to carry the sample piece to be measured;Transmission illumination module is set below objective table, to emit transmission measurement light to the sample piece to be measured on objective table;Reflection illumination module is set in the side of objective table, for emitting reflection measurement light;Imaging module is set above objective table, for receiving transmission measurement light or reflection measurement light, to measure corresponding parameter.The comprehensive microscopic measurement system and its measurement method can realize the imaging of light-transmitting / non-light-transmitting sample piece, three-dimensional topography, phase modulation quantity, polarization modulation quantity and other physical measurements, meet multiple measurement requirements, significantly improve measurement efficiency and multifunctionality.

Imagining using reflected illuminated structures (“IRIS”) in accordance with embodiments of the invention are disclosed. In one embodiment, an IRIS device is provided, the IRIS device comprising: a projector; a camera; a processor operatively connected to the projector and the camera; and a memory storing instructions that, when executed by the processor, cause the image capture device to: project, using the projector, a plurality of illuminated structures onto an object having an optically transparent, translucent, or opaque surface; and capture, using the camera, image data comprising a reflection of the plurality of illuminated structures from the optically transparent, translucent, or opaque surface of the object.

This application relates to the field of visual inspection technology, specifically to a reflective illumination device and a curved surface inspection system, which can, to some extent, solve the problem of inconsistent illumination brightness on curved surfaces caused by illumination devices. This application provides a reflective illumination device and a curved surface inspection system. The curved surface inspection system includes a camera and a reflective illumination device. The reflective illumination device includes a coaxial light source and at least one reflector mechanism. The coaxial light source provides coaxial light to the test object, which includes a curved surface. The reflector mechanism facing the curved surface includes a plane reflector and an aspherical reflector. One end of the aspherical reflector is connected to one end of the plane reflector. The plane reflector and the aspherical reflector are used to supplement the illumination of the curved surface. By supplementing the illumination of the curved surface through the reflector mechanism, the illumination distribution of the curved surface is made more uniform, improving the uniformity of the image of the curved surface and further improving the inspection effect of the curved surface.

The present application relates to the technical field of near-eye display, in particular to a micro double-prism projection system for reflecting illumination light source and a near-eye display device. The micro double-prism projection system comprises an illumination light source, an image source, a first prism and a second prism, the second prism is arranged between the first prism and the image source; the second prism is used for receiving the illumination light ray output by the illumination light source and reflecting the illumination light ray twice to the image source; the image source forms an image light ray after reflecting the illumination light ray, the image light ray is refracted by the second prism and then enters the first prism, and after twice reflection in the first prism, the image light ray is shot to an exit pupil position. In the present application, the illumination light path and the imaging light path share the second prism, the illumination light ray is shot to the image source after twice reflection by the second prism, the image light ray is refracted by the second prism, then realizes twice reflection by the first prism, and then is shot to the exit pupil position, realizing light path folding and greatly reducing the volume of the projection system.

The invention discloses a high-flux wide-spectrum microscopic diffuse reflection illumination system, which comprises a multiband LED (Light Emitting Diode) light emitting module, an aspheric collimating lens group, a beam combining optical array, an achromatic lens and an output multimode optical fiber, and is characterized in that the multiband LED light emitting module comprises at least three high-power LED units with complementary central wavelengths; the aspheric collimating lens group converts divergent light beams of the LED unit into collimated light beams, the beam combining optical array realizes spatial coaxiality of all the collimated light beams through the dichroscope and combines the collimated light beams into composite full-spectrum collimated light beams, and the achromatic lens focuses the composite full-spectrum collimated light beams on the same focal plane. And the output multimode optical fiber receives the focused composite full-spectrum collimated light beam and serves as a cold light source input end of the microspectrometer. An LED pure cold light source is adopted, infrared heat radiation is avoided, and sample heat damage and catalyst inactivation can be avoided; meanwhile, aspherical collimation, dichroscope beam combination and achromatic coupling are adopted, and high-power output of the wave band of 380-830 nm is achieved.

The application relates to the technical field of line-of-sight tracking and discloses a classroom teacher behavior space-time feature fusion tracking method, which comprises the following steps: acquiring a pupil corneal reflection difference signal of teacher eye movement, locking an alias frequency according to aliasing relationship between a classroom lighting modulation frequency and an eye movement sampling rate; calculating a whiteboard glare coefficient of the signal at the frequency, quantifying phase distortion generated by whiteboard mirror reflection, lighting stroboscopic and rolling shutter coupling; analyzing the coefficient into an effective time dislocation between axes, implementing fractional delay phase equalization on an image line scanning axis component of the signal, generating a deskewing vector, and finally calculating a gaze point on a whiteboard plane based on the vector. The application can accurately remove classroom-specific optical-sampling composite noise, effectively suppress abnormal jitter of the line-of-sight signal, and significantly improve the positioning accuracy and stability of teacher board writing behavior monitoring.

An imaging system includes a housing, a light splitting element, a light valve module, and a compensation module. The light valve module is configured in a transmission path of an illumination light beam for converting the illumination light beam into an image light beam. The light splitting element is configured in the transmission path of the illumination light beam for reflecting the illumination light beam and allowing the image light beam to pass through. The compensation module is configured between the light valve module and the light splitting element. The compensation module includes a carrier element and a compensation element. The carrier element includes a placement slot. The carrier element is configured to rotate around a rotation axis. The compensation element is configured in the placement slot and located in the transmission path of the illumination light beam and the image light beam, which can improve the convenience and accuracy of adjusting the angle of the compensation element.

The present invention provides a device of photocatalytic redox reaction based on structured light illumination, comprising: a computer module, sending control instructions to structured light generation module and image acquisition module, to control generations of structured illumination field and total internal reflection illumination field, and acquisition of images of single-molecule fluorescence; the structured light generation module, comprising lasers, an acousto-optic tunable filter (AOTF) and a spatial light modulator (SLM), and controlling the lasers, the AOTF and the SLM to generate and regulate the structured illumination field for exciting a photocatalytic redox reaction, and generate and regulate the total internal reflection illumination field for exciting the single-molecule fluorescence; and, the image acquisition module, acquiring images of fluorescence signals in a process of the photocatalytic redox reaction.

The utility model relates to a zero-degree coaxial LED red light reflection device of an ophthalmologic operation microscope. A red light reflection light axis is arranged on a preset axis of a microscopic primary mirror; a microscope objective lens is arranged below the microscope primary mirror along the red light reflecting light axis; a miniature coaxial LED red light reflecting device is arranged between the microscope primary mirror and the microscope objective lens along a red light reflecting light axis; therefore, the generated light is coaxially irradiated with the microscopic primary mirror and the red light reflection light axis, and coaxial red light reflection illumination light is realized. The lens can be embedded between the left optical axis and the right optical axis of the primary mirror; a built-in integrated microscope is used for control; the zero-degree coaxial LED illumination light with an independent light source is high in illumination brightness and uniform in light spot, observation of a microscope is not affected, the zero-degree coaxial incident angle LED illumination light which is bright enough is achieved, and strong red light reflection is obtained. The device and the microscope are integrally controlled, the integrity of the microscope is realized, and the function of the microscope is improved.

The invention relates to the technical field of sight tracking, and discloses a classroom teacher behavior spatio-temporal feature fusion tracking method, which comprises the following steps: acquiring pupil and cornea reflection difference signals of teacher eye movement, and locking alias frequency according to an aliasing relationship between classroom illumination modulation frequency and eye movement sampling rate; calculating a whiteboard glare coefficient of the signal at the frequency, and quantifying phase distortion generated by whiteboard mirror reflection, illumination stroboflash and rolling shutter coupling; the coefficient is analyzed into inter-axis effective time dislocation, fractional delay phase equalization is carried out on image line scanning axis components of the signals, and a skew-free vector is generated; and finally, resolving the fixation point on the whiteboard plane based on the vector. According to the invention, the special optical-sampling composite noise of the classroom is accurately eliminated, the abnormal jitter of the sight line signal is effectively inhibited, and the positioning precision and stability of the blackboard writing behavior monitoring of the teacher are remarkably improved.

To provide a simple and compact configuration that is tolerant to deviations in angle θ and working distance D. [Solution] The device is configured to include a light source unit that splits laser light into two to generate illumination light and local light, an interference light detection unit that has a photodetector and irradiates a measurement object with the illumination light, causes the measurement light generated by reflection of the illumination light from the measurement object to interfere with the local light to generate interference light, receives the interference light with the photodetector, and generates an interference signal, which is an electrical signal, and a signal processing unit that acquires information about the vibration of the measurement object from the interference signal. At the light receiving surface of the photodetector, the beam diameter of the local light that constitutes the interference light is larger than the light receiving diameter of the photodetector, and the beam diameter of the measurement light that constitutes the interference light is sufficiently smaller than the light receiving diameter of the photodetector.

A method comprising: activating a strobed or pulsed illumination source to produce illuminating light; polarising the illuminating light in a first polarisation axis; illuminating at least part of a tall plant crop with the polarised illuminating light to produce reflected illuminating light; polarising the reflected illuminating light in a second polarisation axis transverse to the first polarisation axis to produce cross-polarised reflected illuminating light; capturing an image of at least part of the tall plant crop using the cross-polarised reflected illuminating light; and analysing the captured image to determine a condition of the tall plant crop. Also a vehicle mounted image capture system, a vehicle mounted spraying system and a plant health management system.

This utility model belongs to the field of lighting technology and discloses a diffuse reflection lighting device. Both the first and second light-blocking sections are provided with diffuse reflection layers. Direct light emitted by the lighting unit located in the installation space can be effectively intercepted by the adjacent sides of the first and second light-blocking sections, preventing direct light from illuminating the object to be illuminated below the main body of the device and causing localized overexposure or directional shadows. Furthermore, after the direct light reaches the adjacent sides of the first and second light-blocking sections, it forms diffuse reflection light under the action of the diffuse reflection layers, enhancing the uniformity of illumination on the object to be illuminated, improving the overall illumination effect of the lighting unit on the object to be illuminated, and ensuring the accuracy of subsequent visual inspection operations on the object to be illuminated. The diffuse reflection lighting device only provides diffuse reflection layers on the first and second light-blocking sections, shortening the reflection path and reducing the cost of reflection, thereby reducing the overall manufacturing cost of the light-blocking unit and decreasing the light loss rate.

A projection device and an illumination system are provided, the illumination system is used for providing an illumination beam, and the illumination system comprises a light source module, a wavelength conversion element, a light guide module and a condensation element. The light source module includes first to third excitation light sources for emitting first to third excitation beams, respectively. The wavelength conversion element is used for sequentially converting the first excitation light beam into a conversion light beam. The light guide module comprises a first full-spectrum light splitting element and a reflecting element. The second excitation light beam and the third excitation light beam are incident on the first side of the first full-spectrum light splitting element, and the conversion light beam is incident on the second side of the first full-spectrum light splitting element. The first full-spectrum light splitting element is used for guiding a first part of the illumination light beam to the first area of the light condensing element and guiding a second part of the illumination light beam to the reflecting element, and the reflecting element is used for reflecting the second part of the illumination light beam to the second area of the light condensing element. The projection device and the illumination system can effectively improve the light utilization rate.

A top plate design is described that allows a quick change of the reflector plates, for example, in the top plate assembly. Using various techniques, the reflector plates or, in some examples, sources of illumination, are held in place by a vacuum during operation. This technique holds the reflector plates securely without top-side fixturing, maximizing the available active area of a substrate. A vacuum secures the panel or wafer without contacting the active areas, allowing for non-contact inspection and metrology. The top plate also facilitates the use of interchangeable reflector plates, enabling backlit or reflective illumination of the substrate's features.

The invention provides a retroreflection structure based on parameterized representation and a design method thereof. The design method comprises the following steps: S01, defining a reference plane; s02, an array composed of a plurality of optical structures is designed on the reference plane, the optical structures are tightly arranged, and each optical structure comprises a parallelogram reference sub-plane formed by splicing two equilateral triangles; the convex cubic pyramid and the concave cubic pyramid are respectively constructed by taking the two equilateral triangles as bottom surfaces; s03, respectively defining the included angles between the three reflecting surfaces of the convex cubic pyramid and the reference plane as characteristic angle parameters i1, j1 and k1, and respectively defining the included angles between the three reflecting surfaces of the concave cubic pyramid and the reference plane as characteristic angle parameters i2, j2 and k2; and S04, by configuring the characteristic angle parameters, enabling the retroreflection structure to present the required illumination distribution. By adjusting the characteristic angle parameters, the performance of the retro-reflection structure can be optimized, and specific retro-reflection illumination distribution can be achieved.

A fundus observation apparatus includes an illumination optical system, a two-dimensional image sensor, and a deflecting member. The illumination optical system is configured to illuminate a fundus of a subject's eye with line-shaped illumination light. The two-dimensional image sensor is configured to receive returning light of the illumination light from the fundus on a movable focal plane at a position substantially conjugate optically to the fundus. The deflecting member is configured to couple an optical path of the illumination light and an optical path of the returning light and to scan the fundus with the illumination light by deflecting the illumination light in synchronization with a movement of the focal plane. The deflecting member has a configuration that allows the returning light to be transmitted through a first region and to reflect the illumination light in a second region different from the first region.

The present application provides a kind of appearance inspection device, appearance inspection method and recording medium capable of carrying out the evaluation of the object with high precision with light transmission.The above-mentioned appearance inspection device is provided with: placing part (10), places lens (L);Illumination part (20) can irradiate multiple shapes of illumination light to placing part (10);Camera part (30) photographs placing part (10);Drive part changes the relative position of placing part (10), illumination part (20) and camera part (30);And processor, changes the relative position and the shape of the above-mentioned illumination light and controls the camera part (30) to photograph lens (L) multiple times, the above-mentioned processor makes camera part (30) photograph lens (L) including the reflected light obtained by reflecting illumination light by lens (L) and lens (L) including the transmitted light obtained by transmitting illumination light through lens (L).

The utility model provides a one-lamp double-effect point light source device and a wall lighting system, the one-lamp double-effect point light source device comprises an annular die-casting lamp body, an annular cavity with an upward opening is formed by the annular side wall and the bottom of the annular die-casting lamp body; the first LED light sources are evenly distributed in the circumferential direction of the inner side of the annular side wall, light of the first LED light sources can penetrate through the annular side wall, and forward diffuse transmission illumination is achieved; the second LED light sources are uniformly arranged on the inner side of the bottom in an array manner, U-shaped condensing lenses with outward convex surfaces are packaged on the surfaces of the second LED light sources, and the second LED light sources are used for realizing backward wide-angle reflection illumination; the curved-surface light guide glass is embedded in the opening end face of the annular cavity in a detachable mode to form a sealed optical cavity; wherein the first LED light source and the second LED light source can be independently controlled, independently turned on or simultaneously turned on in a combined manner. According to the utility model, glare can be avoided in a small-scale space, the brightness ratio is reduced, the space oppression is reduced, and the requirements of front lighting effect and backlight are met at the same time.

The invention discloses a comprehensive microscopic measurement system for multi-parameter synchronous measurement and a measurement method thereof, and solves the problems that an existing microscopic measurement system is single in measurement mode and cannot meet the requirement for in-situ measurement of various optical parameters, and the comprehensive microscopic measurement system specifically comprises an objective table, a transmission illumination module, an imaging module and a reflection illumination module; the objective table is used for bearing a to-be-tested sample; the transmission illumination module is arranged below the objective table so as to emit transmission measurement light to a sample to be measured on the objective table; the reflection illumination module is arranged on the side surface of the objective table and is used for emitting reflection measurement light; the imaging module is arranged above the objective table and used for receiving the transmission measuring light or the reflection measuring light so as to measure corresponding parameters. According to the comprehensive microscopic measurement system and the measurement method thereof, physical measurement of imaging, three-dimensional morphology, phase modulation amount, polarization modulation amount and the like of a light-transmitting / light-proof sample to be measured can be realized, various measurement requirements are met, and the measurement efficiency and multifunctionality are remarkably improved.