Total reflection fluorescent microscope

a fluorescent microscope and fluorescent microscope technology, applied in the field can solve the problems of large occupying space, high cost of laser light beam producing laser beam, and high cost of total reflection fluorescent microscop

Inactive Publication Date: 2007-08-09
OLYMPUS CORP
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, the laser light source which produces the laser light beam is expensive, and additionally a monochromatic light is produced.
Therefore, the total reflection fluorescent microscope becomes further expensive, and additionally a large occupying space is also required for installing a plurality of laser light sources.

Method used

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  • Total reflection fluorescent microscope
  • Total reflection fluorescent microscope
  • Total reflection fluorescent microscope

Examples

Experimental program
Comparison scheme
Effect test

first embodiment

[0040]FIG. 1 is a diagram showing a schematic configuration of a total reflection fluorescent microscope to which the present invention is applied. In this case, FIG. 1 shows an example of an inverted microscope for performing observation by an objective lens disposed below a specimen.

[0041] In FIG. 1, a stage 2 is disposed in an upper part of a microscope main body 1. A specimen 3 is laid on the stage 2. In this case, as shown in FIG. 2, a cover glass 7 is disposed under the specimen 3. An objective lens 4 is disposed under the cover glass 7 via oil (not shown).

[0042] A revolver 5 is disposed under the specimen 3. The revolver 5 is held in the microscope main body 1. The revolver 5 holds a plurality of objective lenses 4. When the revolver 5 rotates, it is possible to selectively dispose the objective lens 4 having a magnification or a type required for the observation on an observation optical axis 6. When the revolver 5 vertically moves along the observation optical axis 6 by a...

second embodiment

MODIFICATION OF SECOND EMBODIMENT

[0103] Next, a modification of the second embodiment will be described.

[0104] The modification of the second embodiment is an example in which the illumination efficiency is raised without using the wedge prism, and will be described with reference to FIGS. 10A and 10B.

[0105] As shown in FIG. 10A, the light source 11 is movable vertically in an arrow direction along the plane crossing the illuminative light axis 18 at right angles. Moreover, the light source 11 can be positioned in two positions including a position on the illuminative light axis 18 and a lower position deviating slightly from the illuminative light axis 18.

[0106] To perform the total reflection fluorescent observation, the light source 11 is set in a position denoted with reference numeral 11′ slightly deviating from the illuminative light axis 18. Then, as shown in FIG. 10B, the light beams from the light source 11′ are formed into the parallel light beam having a predetermined ...

third embodiment

MODIFICATION OF THIRD EMBODIMENT

[0117] Next, a modification of the third embodiment will be described

[0118] The modification of the third embodiment is an example including another means for reducing the illumination unevenness, and will be described with reference to FIGS. 14A and 14B.

[0119] In this case, the wedge prism 13 is disposed in the optical path between the collector lens 12 and the condenser 14 in the same manner as in the second embodiment. Moreover, a slit in which the annular opening 25 is formed along the peripheral edge portion as shown in FIG. 14B is used as the slit 15. Further-more, in this state, the wedge prism 13 is rotated at a high speed in a direction of an arrow 33 using the illuminative light axis 18 which is a rotational center. In this case, the prism is rotated once at about 30 msec in the visual observation, or rotated at a rotation number higher than a scanning speed of photo-detection, when photo-detection means such as CCD. Accordingly, as shown ...

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Abstract

A fluorescent microscope comprises a light source, an optical illumination system which forms an optical path to irradiate a specimen with a light beam from the light source, an objective lens which condenses the light beam of the optical illumination system onto the specimen, an optical device which is disposed on the optical path of the optical illumination system and which decenters the light beam by decentering an optical axis of the optical path, and a slit which passes the light beam decentered by the optical device through a total reflection illumination region on an emission pupil surface of the objective lens.

Description

CROSS-REFERENCE TO RELATED APPLICATIONS [0001] The present application is a Divisional Application of U.S. application Ser. No. 10 / 848,626 filed May 18, 2004, which is based upon and claims the benefit of priority from prior Japanese Patent Application No. 2003-143382, filed May 21, 2003, the entire contents of which are incorporated herein by reference.BACKGROUND OF THE INVENTION [0002] 1. Field of the Invention [0003] The present invention relates to a total reflection fluorescent microscope, which can perform fluorescent observation by total reflection illumination. [0004] 2. Description of the Related Art [0005] In recent years, functions of biological cells have been vigorously analyzed. In the function analysis of the cells, attentions have been paid especially to a total reflection fluorescent microscope which acquires a total reflection fluorescent image from a cell membrane and its vicinity as a device for observing the function of the cell membrane. [0006] Total reflection...

Claims

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Application Information

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Patent Type & Authority Applications(United States)
IPC IPC(8): G02B21/06G02B21/00G02B21/10G02B21/16G02B21/26
CPCG02B21/0088G02B21/16G02B21/10
Inventor TSUCHIYA, ATSUHIROKUSAKA, KENICHIAONO, YASUSHI
Owner OLYMPUS CORP
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